CA1187628A - Spectoanalytical system - Google Patents
Spectoanalytical systemInfo
- Publication number
- CA1187628A CA1187628A CA000397537A CA397537A CA1187628A CA 1187628 A CA1187628 A CA 1187628A CA 000397537 A CA000397537 A CA 000397537A CA 397537 A CA397537 A CA 397537A CA 1187628 A CA1187628 A CA 1187628A
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- Prior art keywords
- radiation
- source
- intensity
- lamp
- wavelength
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/3103—Atomic absorption analysis
Abstract
Disclosed is an atomic absorption system comprising a radiation source that emits spectral line radiation characteristic of an element to be analyzed, an analysis region open to passage of the beam of radiation from the source and in which a sample of the substance to be analyzed is atomized, and source control circuitry for alternately energizing the source at a first intensity level to provide a radiation output that has a narrow spectral line at a wavelength of an element to be detected and at a higher intensity level to provide a radiation output of broader wavelength with intensity suppression at the wavelength of the narrow spectral line. An electronic transducer develops an electrical signal corresponding to the sensed radiation intensity of the radiation beam that passes through the analysis region, and a log ratio circuit utilizes integrated electrical signals corresponding to the to source energization intensity levels to provide background corrected concentration information on the element of interest in the analyzed sample.
Description
~3'7~;~8 This invention relates to spectroanalytical systems and more particu-larly to systems of the atomic absorption type.
In atomic absorption spectroscopy systems, sample material is atomized, a~ :iM a t'lame or :in a tubular furnace, radiation containing a spectral line of the eLement of intercst is passed through the atomized sample material, and the a'bsorption oE radiation at the particular wavelength of interest is measured.
Frequently, the radiation source is of the hollow cathode type and has a cathode that is formed of or contains the element or elements to be detected, and emits a beam consisting of a steady, intense and stable atomic spectrum of the element or elements forming the cathodeO That spectrum contains Dne or more very narrow spectral lines~ one of which is selected by a suitable wavelength selection device such as, f`or example, a grating or prism monochromatorO
It has been recognized that other factors commonly ter~ed "background"
affect the accuracy of atomic absorption measurements since total absorption (decrease in intensity of the radiation at the selected wavelength) is measuredO
Contributing to "background", are such factors as absorption due to molecules rather than free atoms, instability of the radiation source, and scattering due to particles within the sample atomization zoneO
A number of arrangements have been used to provide background compen-sation~ Double-beam photometric techniques provide compensation for changes in the source and detection systems, but do not provide adequate compensation for other background factors. In some systems, a broad bandwidth auxiliary source such as a deuterium lamp is used to pass a beam through the sample path (and the reference path in a double-beam system). Another compensation system uses a magnet to produce the Zeeman effect--two distinct, orthogonally polarized beams of radiation, one containing a wavelength nearly identical with the wavelength of the emitting source in the absence of the magnetic field and the other containing radiation of two different wavelengths which lie on either side of ~76~
the wavelength of the first beam. Among the drawbacks of the broad band reference source type of compensation system are introduction of further back-gro~md problems due to factors such as variation in the reference source and nlllent errors, while the Zeeman type of background compensation system in~rodlices :location restrictions due to the magnet, is complex and requires e:LI'bo:rate instrument:ion.
In accordance with the invention there is provided a spectroanalytical system comprising a radiation source that emits spectral line radiation characteristic of an element to be analy~ed, an analysis region open to passage of the beam of radiation from the source and in which a sample of the substance to be analyzed is atomized, source control means for alternately energizing the source at a first intensity level to provide a radiation output that has a narrow spectral line at a wavelength of an element to be detected and at a higher intensity level to provide a radiation output of broader wavelength with intensity suppression at the wavelength of said narrow spectral line, electronic transducing means for developing an electrical signal corresponding to the sensed radiation intensity of the radiation beam that passes through the analysis region, and means for utilizing the relative values of the electrical signals corresponding to the two source energization intensity levels to provide concentration information on the element in the sample analyzed.
In preferred embodiments, the radiation source is a hollow cathode lamp and the system includes first and second electrical signal storage means (e.g., sample and hold circuits), and a synchronous control for alternately storing signals from the transducing means in the two storage means in synchronism with the switching of the intensity levels of the hollow cathode lamp by the source control means~ Preferably, the current flow at background correction level is at least five times the current flow at sample intensity
In atomic absorption spectroscopy systems, sample material is atomized, a~ :iM a t'lame or :in a tubular furnace, radiation containing a spectral line of the eLement of intercst is passed through the atomized sample material, and the a'bsorption oE radiation at the particular wavelength of interest is measured.
Frequently, the radiation source is of the hollow cathode type and has a cathode that is formed of or contains the element or elements to be detected, and emits a beam consisting of a steady, intense and stable atomic spectrum of the element or elements forming the cathodeO That spectrum contains Dne or more very narrow spectral lines~ one of which is selected by a suitable wavelength selection device such as, f`or example, a grating or prism monochromatorO
It has been recognized that other factors commonly ter~ed "background"
affect the accuracy of atomic absorption measurements since total absorption (decrease in intensity of the radiation at the selected wavelength) is measuredO
Contributing to "background", are such factors as absorption due to molecules rather than free atoms, instability of the radiation source, and scattering due to particles within the sample atomization zoneO
A number of arrangements have been used to provide background compen-sation~ Double-beam photometric techniques provide compensation for changes in the source and detection systems, but do not provide adequate compensation for other background factors. In some systems, a broad bandwidth auxiliary source such as a deuterium lamp is used to pass a beam through the sample path (and the reference path in a double-beam system). Another compensation system uses a magnet to produce the Zeeman effect--two distinct, orthogonally polarized beams of radiation, one containing a wavelength nearly identical with the wavelength of the emitting source in the absence of the magnetic field and the other containing radiation of two different wavelengths which lie on either side of ~76~
the wavelength of the first beam. Among the drawbacks of the broad band reference source type of compensation system are introduction of further back-gro~md problems due to factors such as variation in the reference source and nlllent errors, while the Zeeman type of background compensation system in~rodlices :location restrictions due to the magnet, is complex and requires e:LI'bo:rate instrument:ion.
In accordance with the invention there is provided a spectroanalytical system comprising a radiation source that emits spectral line radiation characteristic of an element to be analy~ed, an analysis region open to passage of the beam of radiation from the source and in which a sample of the substance to be analyzed is atomized, source control means for alternately energizing the source at a first intensity level to provide a radiation output that has a narrow spectral line at a wavelength of an element to be detected and at a higher intensity level to provide a radiation output of broader wavelength with intensity suppression at the wavelength of said narrow spectral line, electronic transducing means for developing an electrical signal corresponding to the sensed radiation intensity of the radiation beam that passes through the analysis region, and means for utilizing the relative values of the electrical signals corresponding to the two source energization intensity levels to provide concentration information on the element in the sample analyzed.
In preferred embodiments, the radiation source is a hollow cathode lamp and the system includes first and second electrical signal storage means (e.g., sample and hold circuits), and a synchronous control for alternately storing signals from the transducing means in the two storage means in synchronism with the switching of the intensity levels of the hollow cathode lamp by the source control means~ Preferably, the current flow at background correction level is at least five times the current flow at sample intensity
- 2 _ level and in a particular system, the current flow through the hollow cathode lamp at the normal (sample) intensity level is in the order of 5-25 milliamperes and at the higher lbackground correction) intensity level is in the order of 200-500 milliamperes. Preferably the system includes means -for integrating the electrical signal developed by the transducing means, and the control provides integration interva]s inversely related to the intensities of the first and second radiation outputs, the integration interval for the sample signal in a particular embodiment, being sixty times the integration interval from the background correction signal. It will be understood that other integration intervals and source energization levels may be employed depending on the nature of the source and the type of signal processing employedO
~ n one particular embodiment, a single hollow cathode lamp is used wl~ile in another embodiment, an a~iliary unit is employed with the hollow cathode lamp to further suppress the intensity of radiation at the wavelength of the narrow spectral line.
Other features and advantages will be seen as the following description of particular embodiments progresses, in conjunction with the drawings, in which:
Fig. 1 is a block diagram of an atomic absorption spectroanalytical system in accordance with the invention;
Fig. 2 is a perspective view of a radiation source used in the system shown in Fig. l;
Fig. 3 is a schematic diagram of source driver circuitry used in the system shown in Fig. l;
Figs. 4A-4C are a series of idealized wavelength intensity plots of outputs of the radiation source in the system of Fig. l;
Figs. 5A and 5B are graphs indicating two different operating modes in accordance with the invention, -- 3 _ ~76'~3 Fig. 6 is a schematic diagram of signal processing circuitry employed in the system shown in Fig. l;
Fig. 7 is a timing diagram illustrating an operating sequence of the sys~em shown in Fig. l;
Fig. 8, on the second sheet of drawings, is a graphical showing of ab~orbane~ data obtained with the system shown in Fig. l; and Fig, 9, on the first sheet of drawings, is a persective view of a supplemental wavelength spectral line suppression device for use in another atomic absorption spectroanalytical system in accordance with the invention.
With reference to Fig. 1, the atomic absorption analytical system-shown in that figure employs structure 10 that defines an analysis region - for example, flame from c~n atomizing burner into which the sample to be analyzed is aspirated or a tubular atomizing furnace. Radiation source 12 is a hollow eathode lamp that has a cathode of the element or elements to be analyzed and directs a beam 14 of radiation through an atomic vapor in analysis region 10 to a wavelength filter or selector device 16 which is a monochromator in this embodiment. Wavelength selector 16 has photosensor 18 (e.g., a photomultiplier tube) which generates an electrical signal proportional to sensed radiation intensity which is transmitted over line 20 to signal processing circuit 22.
Circuit 22 processes that photosensor signal in response to signals from eontroller 24 and produces outputs over line 26 and 28 that are applied to log ratio circuit 30. The output of circuit 30 is applied over line 32 as an absorbance signal to appropriate output equipment 34 such as a display or a recorder. Controller 24 also applies control signals to driver circuit 36 which applies energizing signals to radiation source 12 over line 38.
Hollow cathode lamp 12, as shown in Fig. 2, includes envelope 40 that has output window 42 through which radiation beam 14 passes and a mounting base 44. Disposed within envelope 40 is a hollow cathode 46 that is supported - 4 _ 7~
by insulators ~8~ 50 and is connected to terminal 52. Cooperating anode 54 is -in the form of a ring that is supported on insulator posts 56 and is colmected to tcrminal 58.
De-tails of hollow cathode drive circuit 36 may be seen with reference to Fig. 3. ~ollow cathode Lamp 12 has its anode 54 connected to a 400-volt pow~r supply at terminal 60 and its cathode 46 connected through resistor 62 to drain electrode 64 of 450 volt N channel MOSFET electronic switch 66 (~ir National Rectifier Model 433). Source electrode 68 is connected to ground through resistor 70 and gæte electrode 72 is connected to amplifier stage 74.
~ feedback loop that includes amplifier 76 is connected between source electrode 68 and the inverting input 78 of amplifier 74~ The output of a preamplifier stage 80 is connected via resistor 82 to amplifier ~4, and the input to pre-amplifier 80 via resistor 84 is controlled by electronic selector swi~ches 86, 88, and 90. A signal on control input 92 closes switch 86 to connect voltage divider network 94 to preamplifier 80; a signal on control input 96 closes switch 88 to connect voltage divider network 98 to amplifier 80; and in the absence of a control sigrlal on either line 92 or 96, NOR circuit 100 closes switch 90 to ground the input to amplifier 80. Voltage divider network 94 includes resistor 102 and potentiometer 10~ and its output via selector switch 86 provides a first intensity level energization of hollow cathode lamp 12.
Network 98 includes resistor 106 and pDtentiometer 108 and its output via switch 88 energizes hollow cathode lamp at a second and higher intensity level.
In a first or sample mode, switch 86 is closed and the signal from divider network 94 is applied through amplifiers 80 and 74 to turn on switch 66 to provide sample current (is) flow through hollow cathode lamp 12. The output waveform 110 of source 12, as indicated in Fig. 4A in this first or sample energization mode has a narrow spectral line form with a peak 112 at wavelength . In a second or background mode, switch 88 is closed and a signal from ~ ~ ~7~
divider network 98 is applied through amplifiers 80 and 74 to operate switch 66 so that a much higher current (ig) flows through hollow cathode lamp 12, a current flow of 300 milliamperes producing an output waveform 114 as indicated in Fig. 4B, that waveform having reduced or suppressed intensity at wavelength ho as illd:icated at 11~. The half width oP sample intensity waveform 110 is, about 0.005 angstrom while the half width of broadened background correction W~veform 114 is about 0.02 angstrom, its wiclth varying from element to element.Monochromator 16 has a slit width (band pass) of about five angstroms as indicated at 118 in F~g. 4C. The two intensity curves are superimposed in Fig. 4C, the total area of the high (background correction~ intensity waveform 114 being about 60 times the area of sample intensity waveform 110.
In operation~ source 12 is alternately energized by driver circuit,36 in normal (sample) intensity mode (Fig. 4A) and in high (background) i,ntensity mode (Fig. 4B). The duration of the normal intensity mode energization is ,, nominally twelve milliseconds (but variable by controller 24), and the duration of each high intensity mode energization is nominally 300 microseconds. The graph of Figo 5A shows an operating sequence in which source 12 is energized in normal (is) intensity mode 120 for twelve milliseconds at a current that is typically less than 20 milliamperes but may be S0 milliamperes or higher; and then in background correction mode 122 for 300 microseconds with an intensity that is typically at least 200 milliamperes. The output from source 12 is integrated in each mode (with allowance of 100 microseconds for settling time) so that the integration time in sample intensity mode 120 is approximately sixty times the integration time in background intensity mode 122. The integrated signals are stored in separate sample and hold circuits and then ratioed to provlde a corrected absorbance signal. Fig. 5B is a similar graphical representation of another se~uence of system operation (particularly usef~ in analy~ers that employ an atomizer of the tubular furnace type), in ~ ~7~
which source 12 is first energized for six milliseconds in sample intensity mode 124, then energized for 300 microseconds in high intensity mode 122', and then energized for another six milliseconds in sample intensity mode 126, again provLdin~ an integration t:ime ratio of about 60.
Details oE signal processing circuit 22 may be seen with reference to ~i~, 6. That f;gure shows a single channel processing circuit, but it will be apparent tha-t similar circuitry may be utilized in dual channel systems as wellas in double beam systems. Processing circuit 22 includes preamplifier stage 130 whose output is connected via switch 132 to integrator circuit 134 that functions as a filter when switch 136 is closed. When a control signal is applied on line 1~0, DC restore loop 138 is connected from the output of ~ntegrator 134 to the input of preamplifier 130.
Connected to the output of integrator 134 are two sample and hold circuits 150, 152, circuit 150 being connected directly to integrator 134 and circuit 152 being connected through switch 154 that disconnects circuit 152 fromintegrator 134 and connects a reference voltage to circuit 152 in response to a signal on control input 155 when the system is to be used without background correction. The output of sample and hold circuit 150 is connected via amplifier 156 and input line 26 to log ratio circuit 30, and the output of sample and hold circuit 152 is connected via amplifier 158 and input line 28 to log ratio circuit 30. Connected to the output of log ratio circuit 30 via electronic switch 160 (that is closed when control input 161 is energized) is driver amplifier 162 and electronic switch 164 which provides an absorbance output on line 32. In an alternate (emission) mode of operation, the sample signal from circuit 150 may be applied over line 166 through switch 164 directlyto output line 32.
Further understanding of the operation of the system shown in Fig. 1 may be had with reference to the timing diagram of Fig. 7. That indicates a ~L~8~2~
se~uence of control signals that are generated by controller 24 and applied to signal processing circuit 22 and driver circuit 36. Pulse 180 is applied o~er l:ine 92 to close switch 86; pulses 182, 188 and 192 are applied over line 133 to cLosc switch 132; pulses 186 are applied on line 137 to close switch 136 and reset :integrator 13~; pulse lsO is applied on line 96 to close switch 88; pulse :l84 is app:Lied over line 151 to sample and hold circuit 150; pulse 194 is applied over :Line 153 to sample and hold circuit 152; pulse 196 is applied over line 161 as an I-0 update pulse; pulse 198 is a reset signal generated at the beginning of each analysis cycle; pulse 200 is a DC restore signal that is applied over line 140 to circuit 138.
With reference to Fig. 3, hollow cathode lamp 12 is energized by pulse 180 in its sample mode (typically less than a 20 milliampere current level) for a time interval that is variable in one millisecond intervals by controller 24D
Integration pulse 182 starts 100 microseconds after sample pulse 180 and terminates ten microseconds before pulse 180 terminates so that the signal from photosensor 18 is passed by ~mplifier 130 to integrator 134 (Fig. 53. Thus integrator 134 accumulates the output signal of photosensor 18 for the time duration interval determined by pulse 182. Pulse 184 of 300 microseconds duration then energizes line lSl to transfer the integrated sign~l from integrator 134 to sample and hold circuit 150. An integrator reset signal 186 on line 137 discharges the capacitor in integrator 134 and switch 132 is closed (pulse 188 of 1000 microseGonds duration) so that signal from photosensor 18 is passed with c.ircuit 134 in its filter mode. At the end of pulse 188, pulse 190 (of 310 microseconds duration) is applied on line 96 to close switch 88 and energi~e hollow cathode lamp 12 in .its high intensity mode, typically with a current of 200 or more milliamperes, to produce an output as indicated in Figo 4B; 100 microseconds later pulse 192 connects integrator 134 to photosensor 18 to accumulate the output of photosensor 18 for 200 microseonds; ten microseconds - 8 _ 7~
later pulse 194 (of 300 microseconds duration) energizes line 153 to transfer the charge ~rom integrator 134 to sample and hold circuit 152. The two signals stored in sample and hold circuits 150 and 152 are applied through ampliEiers :I56~ 158 to log ratio circuit 30. When -L-0 update pulse 196 is applied on line :L6:L to close sw:itch 160, the output of ratio circuit 30 is applied through amp:liEier 162 to output line 32 as a background corrected absorbance output which is used or displayed as desired. DC restore signal 200 generated at the end oE the analysis cycle on line 140 completes feedback loop 138 in preparation Eor the next analysis cycle. During intervals between pulses 180 and 190 current flow through tube 12 is at a quiescent level of about 0.5 milliampere.
This background correction system has been evaluated for a number of elements, including those summarized in the following table. Absorbance values were first measured with the normal (is) current to hollow cathode lamp 12 and then a'bsorbance values were measured with the background correction (iB) current to lamp 120 The resulting percent reduction in absorbance is set out in Table 1 under the heading "Modulation Depth".
_ g _ 376;;~3 Modula~ion Element is _ De~th ~g 8 200 85 ~1 16 300 27 hs 18 400 54 ~u 12 200 54 Ba 12 300 25 Be 8 200 59 Cd 8 200 94 . Co 14 400 79 Cu 10 300 70 Cr 16 400 51 Fe 14 300 50 pb 8 300 78 Mn 8 300 68 Ni 8 300 78 Pt 12 300 40 Se 16 300 49 Tl 8 300 48 Sn 8 300 47 Zn 8 300 91 Where: is = Sample peak current, mA
iB = BackgrDund peak current, mA
Modulation Depth = As - hB x 100 ~S
AS = Absorbance during sample pulse hB = Absorbance during backgro~d pulse ~7~
, , The curve in Fig. 8 illustrates the nature of background correction obtained with this system on the element manganese (a ~'modulation clepth~ of 68 percent3.
Further intensity suppression cf valley 116 in the high intensity mode (Fig. ~B) may be achieved with the auxiliary unit 200 shown in F;g. 9.
That un:Lt is inserted in radiation beam 14 between source 12 and analysis cell 10 (Fig. 1). ~s indicated in Fig. 9, unit 200 includes an envelope 202 with planar quartz windows 204, 206 at opposite ends. Ceramic disc 208 supports cathode 210 that includes the same element or elements to be analyzed as lamp 12 and has a cylindrical through passage 212. Auxi]iary unit 200 is mo~mted so that radiation beam 14 is directed through passage 212 with a lens (not shown~ between quartz windows 42 and 204 focusing cathode 46 on cathode passage 212. Cathode cylinder 210 is energized via terminal connection 218. In use, unit 200 is energized concurrently with energization of source 12 in its high current modeO ~toms of the element to be dete~ted are generated in passage 212 and absorb radiation in beam 14, producing supplemental reduction in the ralley 116--as indicated at 220 in Fig. 4B.
~ hile particular embodiments of the invention have been shown and described, various modifications thereof will be apparent to those skilled in the art and therefore it is not intended that the invention be limited to the disclosed embodiments or to details thereof and departures may be made therefrom within the spirit and scope of the invention.
~ n one particular embodiment, a single hollow cathode lamp is used wl~ile in another embodiment, an a~iliary unit is employed with the hollow cathode lamp to further suppress the intensity of radiation at the wavelength of the narrow spectral line.
Other features and advantages will be seen as the following description of particular embodiments progresses, in conjunction with the drawings, in which:
Fig. 1 is a block diagram of an atomic absorption spectroanalytical system in accordance with the invention;
Fig. 2 is a perspective view of a radiation source used in the system shown in Fig. l;
Fig. 3 is a schematic diagram of source driver circuitry used in the system shown in Fig. l;
Figs. 4A-4C are a series of idealized wavelength intensity plots of outputs of the radiation source in the system of Fig. l;
Figs. 5A and 5B are graphs indicating two different operating modes in accordance with the invention, -- 3 _ ~76'~3 Fig. 6 is a schematic diagram of signal processing circuitry employed in the system shown in Fig. l;
Fig. 7 is a timing diagram illustrating an operating sequence of the sys~em shown in Fig. l;
Fig. 8, on the second sheet of drawings, is a graphical showing of ab~orbane~ data obtained with the system shown in Fig. l; and Fig, 9, on the first sheet of drawings, is a persective view of a supplemental wavelength spectral line suppression device for use in another atomic absorption spectroanalytical system in accordance with the invention.
With reference to Fig. 1, the atomic absorption analytical system-shown in that figure employs structure 10 that defines an analysis region - for example, flame from c~n atomizing burner into which the sample to be analyzed is aspirated or a tubular atomizing furnace. Radiation source 12 is a hollow eathode lamp that has a cathode of the element or elements to be analyzed and directs a beam 14 of radiation through an atomic vapor in analysis region 10 to a wavelength filter or selector device 16 which is a monochromator in this embodiment. Wavelength selector 16 has photosensor 18 (e.g., a photomultiplier tube) which generates an electrical signal proportional to sensed radiation intensity which is transmitted over line 20 to signal processing circuit 22.
Circuit 22 processes that photosensor signal in response to signals from eontroller 24 and produces outputs over line 26 and 28 that are applied to log ratio circuit 30. The output of circuit 30 is applied over line 32 as an absorbance signal to appropriate output equipment 34 such as a display or a recorder. Controller 24 also applies control signals to driver circuit 36 which applies energizing signals to radiation source 12 over line 38.
Hollow cathode lamp 12, as shown in Fig. 2, includes envelope 40 that has output window 42 through which radiation beam 14 passes and a mounting base 44. Disposed within envelope 40 is a hollow cathode 46 that is supported - 4 _ 7~
by insulators ~8~ 50 and is connected to terminal 52. Cooperating anode 54 is -in the form of a ring that is supported on insulator posts 56 and is colmected to tcrminal 58.
De-tails of hollow cathode drive circuit 36 may be seen with reference to Fig. 3. ~ollow cathode Lamp 12 has its anode 54 connected to a 400-volt pow~r supply at terminal 60 and its cathode 46 connected through resistor 62 to drain electrode 64 of 450 volt N channel MOSFET electronic switch 66 (~ir National Rectifier Model 433). Source electrode 68 is connected to ground through resistor 70 and gæte electrode 72 is connected to amplifier stage 74.
~ feedback loop that includes amplifier 76 is connected between source electrode 68 and the inverting input 78 of amplifier 74~ The output of a preamplifier stage 80 is connected via resistor 82 to amplifier ~4, and the input to pre-amplifier 80 via resistor 84 is controlled by electronic selector swi~ches 86, 88, and 90. A signal on control input 92 closes switch 86 to connect voltage divider network 94 to preamplifier 80; a signal on control input 96 closes switch 88 to connect voltage divider network 98 to amplifier 80; and in the absence of a control sigrlal on either line 92 or 96, NOR circuit 100 closes switch 90 to ground the input to amplifier 80. Voltage divider network 94 includes resistor 102 and potentiometer 10~ and its output via selector switch 86 provides a first intensity level energization of hollow cathode lamp 12.
Network 98 includes resistor 106 and pDtentiometer 108 and its output via switch 88 energizes hollow cathode lamp at a second and higher intensity level.
In a first or sample mode, switch 86 is closed and the signal from divider network 94 is applied through amplifiers 80 and 74 to turn on switch 66 to provide sample current (is) flow through hollow cathode lamp 12. The output waveform 110 of source 12, as indicated in Fig. 4A in this first or sample energization mode has a narrow spectral line form with a peak 112 at wavelength . In a second or background mode, switch 88 is closed and a signal from ~ ~ ~7~
divider network 98 is applied through amplifiers 80 and 74 to operate switch 66 so that a much higher current (ig) flows through hollow cathode lamp 12, a current flow of 300 milliamperes producing an output waveform 114 as indicated in Fig. 4B, that waveform having reduced or suppressed intensity at wavelength ho as illd:icated at 11~. The half width oP sample intensity waveform 110 is, about 0.005 angstrom while the half width of broadened background correction W~veform 114 is about 0.02 angstrom, its wiclth varying from element to element.Monochromator 16 has a slit width (band pass) of about five angstroms as indicated at 118 in F~g. 4C. The two intensity curves are superimposed in Fig. 4C, the total area of the high (background correction~ intensity waveform 114 being about 60 times the area of sample intensity waveform 110.
In operation~ source 12 is alternately energized by driver circuit,36 in normal (sample) intensity mode (Fig. 4A) and in high (background) i,ntensity mode (Fig. 4B). The duration of the normal intensity mode energization is ,, nominally twelve milliseconds (but variable by controller 24), and the duration of each high intensity mode energization is nominally 300 microseconds. The graph of Figo 5A shows an operating sequence in which source 12 is energized in normal (is) intensity mode 120 for twelve milliseconds at a current that is typically less than 20 milliamperes but may be S0 milliamperes or higher; and then in background correction mode 122 for 300 microseconds with an intensity that is typically at least 200 milliamperes. The output from source 12 is integrated in each mode (with allowance of 100 microseconds for settling time) so that the integration time in sample intensity mode 120 is approximately sixty times the integration time in background intensity mode 122. The integrated signals are stored in separate sample and hold circuits and then ratioed to provlde a corrected absorbance signal. Fig. 5B is a similar graphical representation of another se~uence of system operation (particularly usef~ in analy~ers that employ an atomizer of the tubular furnace type), in ~ ~7~
which source 12 is first energized for six milliseconds in sample intensity mode 124, then energized for 300 microseconds in high intensity mode 122', and then energized for another six milliseconds in sample intensity mode 126, again provLdin~ an integration t:ime ratio of about 60.
Details oE signal processing circuit 22 may be seen with reference to ~i~, 6. That f;gure shows a single channel processing circuit, but it will be apparent tha-t similar circuitry may be utilized in dual channel systems as wellas in double beam systems. Processing circuit 22 includes preamplifier stage 130 whose output is connected via switch 132 to integrator circuit 134 that functions as a filter when switch 136 is closed. When a control signal is applied on line 1~0, DC restore loop 138 is connected from the output of ~ntegrator 134 to the input of preamplifier 130.
Connected to the output of integrator 134 are two sample and hold circuits 150, 152, circuit 150 being connected directly to integrator 134 and circuit 152 being connected through switch 154 that disconnects circuit 152 fromintegrator 134 and connects a reference voltage to circuit 152 in response to a signal on control input 155 when the system is to be used without background correction. The output of sample and hold circuit 150 is connected via amplifier 156 and input line 26 to log ratio circuit 30, and the output of sample and hold circuit 152 is connected via amplifier 158 and input line 28 to log ratio circuit 30. Connected to the output of log ratio circuit 30 via electronic switch 160 (that is closed when control input 161 is energized) is driver amplifier 162 and electronic switch 164 which provides an absorbance output on line 32. In an alternate (emission) mode of operation, the sample signal from circuit 150 may be applied over line 166 through switch 164 directlyto output line 32.
Further understanding of the operation of the system shown in Fig. 1 may be had with reference to the timing diagram of Fig. 7. That indicates a ~L~8~2~
se~uence of control signals that are generated by controller 24 and applied to signal processing circuit 22 and driver circuit 36. Pulse 180 is applied o~er l:ine 92 to close switch 86; pulses 182, 188 and 192 are applied over line 133 to cLosc switch 132; pulses 186 are applied on line 137 to close switch 136 and reset :integrator 13~; pulse lsO is applied on line 96 to close switch 88; pulse :l84 is app:Lied over line 151 to sample and hold circuit 150; pulse 194 is applied over :Line 153 to sample and hold circuit 152; pulse 196 is applied over line 161 as an I-0 update pulse; pulse 198 is a reset signal generated at the beginning of each analysis cycle; pulse 200 is a DC restore signal that is applied over line 140 to circuit 138.
With reference to Fig. 3, hollow cathode lamp 12 is energized by pulse 180 in its sample mode (typically less than a 20 milliampere current level) for a time interval that is variable in one millisecond intervals by controller 24D
Integration pulse 182 starts 100 microseconds after sample pulse 180 and terminates ten microseconds before pulse 180 terminates so that the signal from photosensor 18 is passed by ~mplifier 130 to integrator 134 (Fig. 53. Thus integrator 134 accumulates the output signal of photosensor 18 for the time duration interval determined by pulse 182. Pulse 184 of 300 microseconds duration then energizes line lSl to transfer the integrated sign~l from integrator 134 to sample and hold circuit 150. An integrator reset signal 186 on line 137 discharges the capacitor in integrator 134 and switch 132 is closed (pulse 188 of 1000 microseGonds duration) so that signal from photosensor 18 is passed with c.ircuit 134 in its filter mode. At the end of pulse 188, pulse 190 (of 310 microseconds duration) is applied on line 96 to close switch 88 and energi~e hollow cathode lamp 12 in .its high intensity mode, typically with a current of 200 or more milliamperes, to produce an output as indicated in Figo 4B; 100 microseconds later pulse 192 connects integrator 134 to photosensor 18 to accumulate the output of photosensor 18 for 200 microseonds; ten microseconds - 8 _ 7~
later pulse 194 (of 300 microseconds duration) energizes line 153 to transfer the charge ~rom integrator 134 to sample and hold circuit 152. The two signals stored in sample and hold circuits 150 and 152 are applied through ampliEiers :I56~ 158 to log ratio circuit 30. When -L-0 update pulse 196 is applied on line :L6:L to close sw:itch 160, the output of ratio circuit 30 is applied through amp:liEier 162 to output line 32 as a background corrected absorbance output which is used or displayed as desired. DC restore signal 200 generated at the end oE the analysis cycle on line 140 completes feedback loop 138 in preparation Eor the next analysis cycle. During intervals between pulses 180 and 190 current flow through tube 12 is at a quiescent level of about 0.5 milliampere.
This background correction system has been evaluated for a number of elements, including those summarized in the following table. Absorbance values were first measured with the normal (is) current to hollow cathode lamp 12 and then a'bsorbance values were measured with the background correction (iB) current to lamp 120 The resulting percent reduction in absorbance is set out in Table 1 under the heading "Modulation Depth".
_ g _ 376;;~3 Modula~ion Element is _ De~th ~g 8 200 85 ~1 16 300 27 hs 18 400 54 ~u 12 200 54 Ba 12 300 25 Be 8 200 59 Cd 8 200 94 . Co 14 400 79 Cu 10 300 70 Cr 16 400 51 Fe 14 300 50 pb 8 300 78 Mn 8 300 68 Ni 8 300 78 Pt 12 300 40 Se 16 300 49 Tl 8 300 48 Sn 8 300 47 Zn 8 300 91 Where: is = Sample peak current, mA
iB = BackgrDund peak current, mA
Modulation Depth = As - hB x 100 ~S
AS = Absorbance during sample pulse hB = Absorbance during backgro~d pulse ~7~
, , The curve in Fig. 8 illustrates the nature of background correction obtained with this system on the element manganese (a ~'modulation clepth~ of 68 percent3.
Further intensity suppression cf valley 116 in the high intensity mode (Fig. ~B) may be achieved with the auxiliary unit 200 shown in F;g. 9.
That un:Lt is inserted in radiation beam 14 between source 12 and analysis cell 10 (Fig. 1). ~s indicated in Fig. 9, unit 200 includes an envelope 202 with planar quartz windows 204, 206 at opposite ends. Ceramic disc 208 supports cathode 210 that includes the same element or elements to be analyzed as lamp 12 and has a cylindrical through passage 212. Auxi]iary unit 200 is mo~mted so that radiation beam 14 is directed through passage 212 with a lens (not shown~ between quartz windows 42 and 204 focusing cathode 46 on cathode passage 212. Cathode cylinder 210 is energized via terminal connection 218. In use, unit 200 is energized concurrently with energization of source 12 in its high current modeO ~toms of the element to be dete~ted are generated in passage 212 and absorb radiation in beam 14, producing supplemental reduction in the ralley 116--as indicated at 220 in Fig. 4B.
~ hile particular embodiments of the invention have been shown and described, various modifications thereof will be apparent to those skilled in the art and therefore it is not intended that the invention be limited to the disclosed embodiments or to details thereof and departures may be made therefrom within the spirit and scope of the invention.
Claims (10)
PROPERTY OR PRIVILEGE IS CLAIMED ARE DEFINED AS FOLLOWS:
1. A spectroanalytical system comprising a radiation source that emits spectral line radiation characteristic of an element to be analyzed, an analysis region open to passage of the beam of radiation from the source and in which a sample of the substance to be analyzed is atomized, source control means for alternately energizing said source at a first intensity level to provide a first radiation output that has a narrow spectral line at a wavelength of an element to be detected and at a second higher intensity level to provide a second radiation output of broader wave-length with intensity suppression at the central wavelength of said narrow spectral line, electronic transducing means for developing an electrical signal corresponding to the sensed radiation intensity of the radiation beam from said source that passes through said analysis region, means for utilizing the relative values of said electrical signals corresponding to said first and second radiation outputs to provide concentration information on said element in the sample analyzed.
2. The system of claim 1 wherein said radiation source comprises a hollow cathode lamp.
3. The system of either claim 1 or 2 and further including an auxiliary unit to further suppress the intensity of radiation at the wavelength of said narrow spectral line.
4. The system of claim 2 wherein said source control means energizes said lamp at a quiescent current level of about one milliampere during an interval between said first and second intensity level.
5. The system of claim 2 wherein said source control means includes means for energizing said lamp at a first current value to provide said first radiation output and means for energizing said lamp at a current level at least five times said first current level to provide said second radiation output.
6. The system of claim 1 and further including first and second electrical signal storage means, a synchronous control for alternately storing signals from said transducing means in said first and second storage means in synchronism with the switching of the intensity levels of said source by said source control means, and wherein said utilizing means employs the ratio of said stored signals to provide said concentration information.
7. The system of claim 6 wherein said utilizing means includes a log ratio amplifier.
8. The system of claim 7 and further including means for bypassing said log ratio amplifier for operating said spectroanalytical system in emission mode;
and means for imposing a fixed reference signal on said log ratio amplifier for operating said system in absorption mode without background correction.
and means for imposing a fixed reference signal on said log ratio amplifier for operating said system in absorption mode without background correction.
9. The system of claim 6 and further including means for integrating the electrical signal developed by said electronic transducing means, and control means providing integration intervals inversely related to the intensities of said first and second radiation outputs.
10. An atomic absorption system comprising a hollow cathode lamp that emits spectral line radiation characteristic of an element to be analyzed, an analysis region open to passage of the beam of radiation from said lamp and in which a sample of the substance to be analyzed is atomized, lamp control means for alternately energizing said lamp at a first current intensity level to provide a first radiation output that has a narrow spectral line at a wavelength of an element to be detected and at a second current intensity level at least five times higher than said first current intensity level to provide a second radiation output of broader wavelength with intensity suppression at the central wavelength of said narrow spectral line, a monochromator for isolating a relatively narrow region containing said central wavelength, electronic transducing means coupled to said monochromator for developing an electrical signal corresponding to the sense radiation intensity of the radiation beam from said lamp that passes through said analysis region, means for integrating the electrical signal developed by said electronic transducing means, control means providing integration intervals inversely related to the intensities of said first and second radiation outputs, first and second electrical signal storage means, a synchronous control for alternately storing signals from said integrating means in said first and second storage means in synchronism with the switching of the intensity levels of said lamp by said lamp control means, and means responsive to the ratio of said stored signals to provide background corrected concentration information on said element in the analyzed sample.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/240,542 US4462685A (en) | 1981-03-04 | 1981-03-04 | Spectroanalytical system |
| US240,542 | 1981-03-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1187628A true CA1187628A (en) | 1985-05-21 |
Family
ID=22906962
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000397537A Expired CA1187628A (en) | 1981-03-04 | 1982-03-03 | Spectoanalytical system |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4462685A (en) |
| JP (1) | JPS57160047A (en) |
| AU (1) | AU546278B2 (en) |
| CA (1) | CA1187628A (en) |
| DE (1) | DE3207377A1 (en) |
| FR (1) | FR2501373B1 (en) |
| GB (1) | GB2093990B (en) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60142228A (en) * | 1983-12-29 | 1985-07-27 | Sumitomo Electric Ind Ltd | Measuring method of optical fiber characteristics |
| JPS61281943A (en) * | 1985-06-07 | 1986-12-12 | Shimadzu Corp | Atomic absorption analyzing instrument |
| JPS61281942A (en) * | 1985-06-07 | 1986-12-12 | Shimadzu Corp | Light source for atomic absorption analysis |
| JP2590307B2 (en) * | 1985-12-23 | 1997-03-12 | 株式会社島津製作所 | Atomic absorption spectrometer |
| CA1261486A (en) * | 1986-04-16 | 1989-09-26 | Michael A. Lucas | Systems for the direct analysis of solid samples by atomic emission spectroscopy |
| AU586101B2 (en) * | 1986-04-16 | 1989-06-29 | Chamber Ridge Pty. Ltd. | Systems for the direct analysis of solid samples by atomic emission spectroscopy |
| JPS631937A (en) * | 1986-06-23 | 1988-01-06 | Hitachi Ltd | Spectroscopic analyser |
| DE3635684A1 (en) * | 1986-10-21 | 1988-05-05 | Gruen Optik Wetzlar Gmbh | Multispectral lamp arrangement |
| US4893259A (en) * | 1988-06-02 | 1990-01-09 | The Perkin-Elmer Corporation | Standardization of spectral lines |
| US5018856A (en) * | 1989-10-30 | 1991-05-28 | The United States Of America As Represented By The Secretary Of Agriculture | Continuum source atomic absorption spectrometry |
| US5042946A (en) * | 1990-05-02 | 1991-08-27 | Hitachi, Ltd. | Atomic absorption spectrophotometric method and apparatus |
| JP2570546B2 (en) * | 1992-04-30 | 1997-01-08 | 株式会社島津製作所 | Atomic absorption spectrophotometer |
| US5364492A (en) * | 1992-09-17 | 1994-11-15 | Varian Associates, Inc. | Method of deposing by molecular beam epitaxy |
| JP3508722B2 (en) * | 2000-12-25 | 2004-03-22 | 株式会社島津製作所 | Atomic absorption photometer |
| JP3922209B2 (en) * | 2003-05-08 | 2007-05-30 | 株式会社島津製作所 | Atomic absorption photometer |
| RU2273004C1 (en) * | 2004-10-21 | 2006-03-27 | Татьяна Васильевна Гриневич | Spectrophotometer |
| WO2016075751A1 (en) * | 2014-11-11 | 2016-05-19 | 株式会社島津製作所 | Atomic absorption photometer and atomic absorption measurement method |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3089382A (en) * | 1957-07-01 | 1963-05-14 | Shell Oil Co | Method and apparatus for analyzing fluids |
| US3370503A (en) * | 1963-12-09 | 1968-02-27 | Beckman Instruments Inc | Radiation comparison system |
| AU407994B2 (en) * | 1968-05-01 | 1970-11-06 | Commonwealth Scientific And Industrial Research Organisation | Improvements in or relating to spectroscopy and colorimetry |
| BE755253A (en) * | 1969-08-25 | 1971-02-25 | Technicon Instr | EQUIPMENT FOR THE SIMULTANEOUS ANALYSIS OF SEVERAL ELEMENTS BY ATOMIC FLUORESCENCE SPECTROSCOPY |
| US3689158A (en) * | 1971-02-16 | 1972-09-05 | Beckman Instruments Inc | Atomic absorption analyzer compensated for background absorption |
| FR2153521A5 (en) * | 1971-09-14 | 1973-05-04 | Commissariat Energie Atomique | |
| US3914054A (en) * | 1972-09-13 | 1975-10-21 | Us Energy | Zeeman effect absorption spectrometer |
| US3796499A (en) * | 1973-03-22 | 1974-03-12 | United Aircraft Corp | Method and apparatus for determining the concentration of paramagnetic material in a gas mixture |
| US3884583A (en) * | 1973-05-03 | 1975-05-20 | Gen Motors Corp | Method and apparatus for magnetically modulated resonance analysis of gas |
| JPS50103876A (en) * | 1974-01-30 | 1975-08-16 | ||
| US3937577A (en) * | 1974-05-15 | 1976-02-10 | E. I. Du Pont De Nemours And Company | Zeeman effect atomic absorption spectrometer |
| US3924950A (en) * | 1974-09-16 | 1975-12-09 | Perkin Elmer Corp | Atomic absorption spectroscopy with background correction |
| DE2456713A1 (en) * | 1974-11-30 | 1976-06-10 | Bodenseewerk Perkin Elmer Co | ATOMIC ABSORPTION SPECTROMETER |
| JPS51134687A (en) * | 1975-05-16 | 1976-11-22 | Jeol Ltd | Atomic extinction analysis method |
| JPS5425889A (en) * | 1977-07-29 | 1979-02-27 | Shimadzu Corp | Atomic absorption analysis apparatus |
-
1981
- 1981-03-04 US US06/240,542 patent/US4462685A/en not_active Expired - Lifetime
-
1982
- 1982-02-18 GB GB8204803A patent/GB2093990B/en not_active Expired
- 1982-03-02 DE DE19823207377 patent/DE3207377A1/en not_active Ceased
- 1982-03-03 FR FR8203543A patent/FR2501373B1/en not_active Expired
- 1982-03-03 JP JP57033747A patent/JPS57160047A/en active Pending
- 1982-03-03 CA CA000397537A patent/CA1187628A/en not_active Expired
- 1982-03-03 AU AU81072/82A patent/AU546278B2/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| FR2501373A1 (en) | 1982-09-10 |
| AU8107282A (en) | 1982-09-09 |
| US4462685A (en) | 1984-07-31 |
| GB2093990A (en) | 1982-09-08 |
| JPS57160047A (en) | 1982-10-02 |
| GB2093990B (en) | 1985-05-22 |
| DE3207377A1 (en) | 1982-11-11 |
| AU546278B2 (en) | 1985-08-22 |
| FR2501373B1 (en) | 1986-03-28 |
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