CA2043593A1 - Methods and apparatus for image analysis - Google Patents

Methods and apparatus for image analysis

Info

Publication number
CA2043593A1
CA2043593A1 CA2043593A CA2043593A CA2043593A1 CA 2043593 A1 CA2043593 A1 CA 2043593A1 CA 2043593 A CA2043593 A CA 2043593A CA 2043593 A CA2043593 A CA 2043593A CA 2043593 A1 CA2043593 A1 CA 2043593A1
Authority
CA
Canada
Prior art keywords
defects
methods
defective images
image
model image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2043593A
Other languages
French (fr)
Other versions
CA2043593C (en
Inventor
Henry Spalding Baird
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
American Telephone and Telegraph Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Telephone and Telegraph Co Inc filed Critical American Telephone and Telegraph Co Inc
Publication of CA2043593A1 publication Critical patent/CA2043593A1/en
Application granted granted Critical
Publication of CA2043593C publication Critical patent/CA2043593C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/214—Generating training patterns; Bootstrap methods, e.g. bagging or boosting
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/774—Generating sets of training patterns; Bootstrap methods, e.g. bagging or boosting

Abstract

Apparatus and methods for generating a set of defective images from a model image.
Defect parameters used with the apparatus and methods specify classes of defectsincluding resolution, blur, threshold, speckle, jitter, skew, distortion of width and height, offset from a baseline, and kerning The parameters further permit specification of a range of sizes of the defects and a distribution of the defects within the range. Within the apparatus, actual values for the defects are generated randomly within the specified ranges and distributions. The model image may be represented by means of pixels or by a format which describes the model image's shape. The user may specify the number and the size of the defective images. The defective images are useful for inferring accurate and efficient image classifiers for use in image recognition devices such as optical character readers.
CA002043593A 1990-06-12 1991-05-30 Methods and apparatus for image analysis Expired - Fee Related CA2043593C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/536,910 US5796410A (en) 1990-06-12 1990-06-12 Generation and use of defective images in image analysis
US536,910 1990-06-12

Publications (2)

Publication Number Publication Date
CA2043593A1 true CA2043593A1 (en) 1991-12-13
CA2043593C CA2043593C (en) 1996-01-16

Family

ID=24140423

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002043593A Expired - Fee Related CA2043593C (en) 1990-06-12 1991-05-30 Methods and apparatus for image analysis

Country Status (5)

Country Link
US (1) US5796410A (en)
EP (1) EP0461793B1 (en)
JP (1) JPH04233094A (en)
CA (1) CA2043593C (en)
DE (1) DE69130135T2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111681162A (en) * 2020-06-09 2020-09-18 创新奇智(成都)科技有限公司 Defect sample generation method and device, electronic equipment and storage medium

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SE469245B (en) * 1991-10-07 1993-06-07 Televerket DEVICE FOR SATISFACTION OF IMAGE QUALITY WITH OPTICAL PATTERN APPROACH
CA2201557A1 (en) * 1996-04-05 1997-10-05 John D. Hobby Degraded character image restoration
GB9703191D0 (en) * 1997-02-15 1997-04-02 Ncr Int Inc Method and apparatus for screening documents
DE19755133A1 (en) * 1997-12-11 1999-06-24 Siemens Ag Process monitoring system
US6469706B1 (en) * 1999-11-16 2002-10-22 International Business Machines Corporation Method and apparatus for detecting regions belonging to a specified color surface in an unsegmented image
US20010048436A1 (en) * 2000-04-03 2001-12-06 Sanger Terence David Method and apparatus for sending electronic mail using human handwriting
US6304667B1 (en) * 2000-06-21 2001-10-16 Carmen T. Reitano System and method for incorporating dyslexia detection in handwriting pattern recognition systems
JP4100885B2 (en) * 2001-07-11 2008-06-11 キヤノン株式会社 Form recognition apparatus, method, program, and storage medium
JP3978098B2 (en) * 2002-08-12 2007-09-19 株式会社日立製作所 Defect classification method and apparatus
DE10245834A1 (en) * 2002-10-01 2004-04-15 Siemens Ag Method for generating learning and / or test samples
RU2251738C2 (en) * 2003-01-28 2005-05-10 "Аби Софтвер Лтд." Method for synchronizing filled machine-readable form and its template in case of presence of deviations
EP1575002A1 (en) * 2004-03-11 2005-09-14 De La Rue International Limited Bank note simulation
CN100357957C (en) * 2004-08-10 2007-12-26 富士通株式会社 Character recognition apparatus and method for recognizing characters in image
CN100377171C (en) * 2004-08-13 2008-03-26 富士通株式会社 Method and apparatus for generating deteriorated numeral image
CN100373399C (en) * 2004-08-18 2008-03-05 富士通株式会社 Method and apparatus for establishing degradation dictionary
US8687212B2 (en) * 2009-02-24 2014-04-01 Xerox Corporation Method for protecting content of a fax confirmation sheet
HUP1200018A2 (en) 2012-01-11 2013-07-29 77 Elektronika Mueszeripari Kft Method of training a neural network, as well as a neural network
CN107274345A (en) * 2017-06-07 2017-10-20 众安信息技术服务有限公司 A kind of Chinese printable character image combining method and device
CN110689477B (en) * 2019-09-07 2023-01-10 创新奇智(重庆)科技有限公司 Universal flaw image simulation method
CN112001396B (en) * 2020-08-12 2022-08-23 浙江大学 Bearing surface deformation and character mixed defect image detection method
CN113633304B (en) * 2021-06-28 2023-11-24 北京工业大学 Method for detecting jugular vein ball socket bone wall missing in temporal bone CT image
CN113643406B (en) * 2021-08-12 2022-03-25 北京的卢深视科技有限公司 Image generation method, electronic device, and computer-readable storage medium

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US3634822A (en) * 1969-01-15 1972-01-11 Ibm Method and apparatus for style and specimen identification
US3706071A (en) * 1970-06-22 1972-12-12 Information Int Inc Binary image processor
US4658429A (en) * 1983-12-29 1987-04-14 Hitachi, Ltd. System and method for preparing a recognition dictionary
US4599693A (en) * 1984-01-16 1986-07-08 Itt Corporation Probabilistic learning system
US5054093A (en) * 1985-09-12 1991-10-01 Cooper Leon N Parallel, multi-unit, adaptive, nonlinear pattern class separator and identifier
US5077807A (en) * 1985-10-10 1991-12-31 Palantir Corp. Preprocessing means for use in a pattern classification system
US4944022A (en) * 1986-12-19 1990-07-24 Ricoh Company, Ltd. Method of creating dictionary for character recognition
US4850026A (en) * 1987-10-13 1989-07-18 Telecommunications Laboratories Dir. Gen'l Of Telecom. Ministry Of Communications Chinese multifont recognition system based on accumulable stroke features
US4876731A (en) * 1988-02-19 1989-10-24 Nynex Corporation Neural network model in pattern recognition using probabilistic contextual information
EP0356432A4 (en) * 1988-02-22 1990-12-12 Brandeau, Edward P. Digital image noise suppression method using svd block transform
US5048100A (en) * 1988-12-15 1991-09-10 Michael Kuperstein Self organizing neural network method and system for general classification of patterns
JPH0782544B2 (en) * 1989-03-24 1995-09-06 インターナショナル・ビジネス・マシーンズ・コーポレーション DP matching method and apparatus using multi-template
US5077809A (en) * 1989-05-30 1991-12-31 Farshad Ghazizadeh Optical character recognition
US5058180A (en) * 1990-04-30 1991-10-15 National Semiconductor Corporation Neural network apparatus and method for pattern recognition
US5052043A (en) * 1990-05-07 1991-09-24 Eastman Kodak Company Neural network with back propagation controlled through an output confidence measure

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111681162A (en) * 2020-06-09 2020-09-18 创新奇智(成都)科技有限公司 Defect sample generation method and device, electronic equipment and storage medium
CN111681162B (en) * 2020-06-09 2023-09-01 创新奇智(成都)科技有限公司 Defect sample generation method and device, electronic equipment and storage medium

Also Published As

Publication number Publication date
EP0461793A3 (en) 1993-04-28
EP0461793A2 (en) 1991-12-18
US5796410A (en) 1998-08-18
DE69130135D1 (en) 1998-10-15
EP0461793B1 (en) 1998-09-09
JPH04233094A (en) 1992-08-21
DE69130135T2 (en) 1999-02-25
CA2043593C (en) 1996-01-16

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