CA2067466A1 - Method and apparatus for testing an nvm - Google Patents

Method and apparatus for testing an nvm

Info

Publication number
CA2067466A1
CA2067466A1 CA2067466A CA2067466A CA2067466A1 CA 2067466 A1 CA2067466 A1 CA 2067466A1 CA 2067466 A CA2067466 A CA 2067466A CA 2067466 A CA2067466 A CA 2067466A CA 2067466 A1 CA2067466 A1 CA 2067466A1
Authority
CA
Canada
Prior art keywords
nvm
address space
nvms
microprocessor
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2067466A
Other languages
French (fr)
Other versions
CA2067466C (en
Inventor
Arno Muller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pitney Bowes Inc
Original Assignee
Arno Muller
Pitney Bowes Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arno Muller, Pitney Bowes Inc. filed Critical Arno Muller
Publication of CA2067466A1 publication Critical patent/CA2067466A1/en
Application granted granted Critical
Publication of CA2067466C publication Critical patent/CA2067466C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices

Abstract

Apparatus for testing an NVM comprising, a microprocessor, a plurality of NVMs respectively connected to the microprocessor, each of the NVMs having an address space for storing data therein, and the microprocessor including, structure for selecting one of the plurality of NVMs structure for byte-write-mode writing data having a predetermined page size to the selected NVM for storage in the address space thereof, structure for page-write-mode writing different data having the predetermined page size to the selected NVM for storage in the address space thereof, and structure for counting the number of changed bytes in the address space of the NVM.
CA002067466A 1991-05-03 1992-04-28 Method and apparatus for testing an nvm Expired - Fee Related CA2067466C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US69562491A 1991-05-03 1991-05-03
US695,624 1991-05-03

Publications (2)

Publication Number Publication Date
CA2067466A1 true CA2067466A1 (en) 1992-11-04
CA2067466C CA2067466C (en) 1997-07-15

Family

ID=24793783

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002067466A Expired - Fee Related CA2067466C (en) 1991-05-03 1992-04-28 Method and apparatus for testing an nvm

Country Status (4)

Country Link
US (1) US5502813A (en)
EP (1) EP0513607B1 (en)
CA (1) CA2067466C (en)
DE (1) DE69217707T2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102116834B (en) * 2010-01-05 2013-04-24 上海华虹Nec电子有限公司 Corresponding method for coordinates among different variety parameters in NVM (Non-Volatile Memory) testing

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4916623A (en) * 1982-01-29 1990-04-10 Pitney Bowes Inc. Electronic postage meter having redundant memory
US4578774A (en) * 1983-07-18 1986-03-25 Pitney Bowes Inc. System for limiting access to non-volatile memory in electronic postage meters
US4998203A (en) * 1985-03-12 1991-03-05 Digiulio Peter C Postage meter with a non-volatile memory security circuit
US4742469A (en) * 1985-10-31 1988-05-03 F.M.E. Corporation Electronic meter circuitry
US4802117A (en) * 1985-12-16 1989-01-31 Pitney Bowes Inc. Method of preserving data storage in a postal meter
JPS62266798A (en) * 1986-05-13 1987-11-19 Mitsubishi Electric Corp Nonvolatile semiconductor memory device
JPS63153799A (en) * 1986-08-08 1988-06-27 Nec Corp Semiconductor memory
JPH07109720B2 (en) * 1988-07-29 1995-11-22 三菱電機株式会社 Nonvolatile semiconductor memory device
US5021963A (en) * 1988-12-30 1991-06-04 Pitney Bowes Inc. EPM having an improvement in accounting update security
JPH03137900A (en) * 1989-07-27 1991-06-12 Nec Corp Nonvolatile semiconductor memory
US5170044A (en) * 1990-11-09 1992-12-08 Pitney Bowes Inc. Error tolerant 3x3 bit-map coding of binary data and method of decoding

Also Published As

Publication number Publication date
DE69217707T2 (en) 1997-07-31
EP0513607A2 (en) 1992-11-19
US5502813A (en) 1996-03-26
EP0513607A3 (en) 1993-11-24
DE69217707D1 (en) 1997-04-10
EP0513607B1 (en) 1997-03-05
CA2067466C (en) 1997-07-15

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Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed