CA2079696A1 - Semiconductor integrated circuit device with fault detecting function - Google Patents

Semiconductor integrated circuit device with fault detecting function

Info

Publication number
CA2079696A1
CA2079696A1 CA2079696A CA2079696A CA2079696A1 CA 2079696 A1 CA2079696 A1 CA 2079696A1 CA 2079696 A CA2079696 A CA 2079696A CA 2079696 A CA2079696 A CA 2079696A CA 2079696 A1 CA2079696 A1 CA 2079696A1
Authority
CA
Canada
Prior art keywords
fault detecting
output signal
integrated circuit
semiconductor integrated
circuit device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2079696A
Other languages
French (fr)
Other versions
CA2079696C (en
Inventor
Yoshihiro Tanaka
Yoshio Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2079696A1 publication Critical patent/CA2079696A1/en
Application granted granted Critical
Publication of CA2079696C publication Critical patent/CA2079696C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
    • H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/118—Masterslice integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318583—Design for test

Abstract

A logic function block having an output signal potential sensing function is substituted for each of logic function blocks of which fault conditions cannot be detected on the basis of predetermined input/output signal combinations for determining whether or not the semiconductor integrated circuit device operates correctly. Probe lines and sense lines are connected only to the logic function blocks having output signal potential sensing function. The probe lines are driven from a probe line driver, and a sense line receiver reads out signals on the sense lines. Thus, without reducing fault detecting efficiency, the areas of an active region and a wiring region required for forming a fault detecting arrangement can be reduced.
CA002079696A 1991-10-03 1992-10-02 Semiconductor integrated circuit device with fault detecting function Expired - Fee Related CA2079696C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP3-256346 1991-10-03
JP3256346A JP2884847B2 (en) 1991-10-03 1991-10-03 Method of manufacturing semiconductor integrated circuit device having failure detection function

Publications (2)

Publication Number Publication Date
CA2079696A1 true CA2079696A1 (en) 1993-04-04
CA2079696C CA2079696C (en) 1999-05-11

Family

ID=17291404

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002079696A Expired - Fee Related CA2079696C (en) 1991-10-03 1992-10-02 Semiconductor integrated circuit device with fault detecting function

Country Status (4)

Country Link
US (1) US5396500A (en)
JP (1) JP2884847B2 (en)
CA (1) CA2079696C (en)
DE (1) DE4233271C2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2884847B2 (en) 1991-10-03 1999-04-19 三菱電機株式会社 Method of manufacturing semiconductor integrated circuit device having failure detection function
DE4341959C2 (en) * 1993-12-09 1997-07-03 Bosch Gmbh Robert Integrated circuit with improved wiring and method of making an integrated circuit with improved wiring
DE4406510C1 (en) * 1994-02-28 1995-07-13 Siemens Ag Integrated circuit with integrated test device
JPH09107048A (en) 1995-03-30 1997-04-22 Mitsubishi Electric Corp Semiconductor package
JP2004296928A (en) * 2003-03-27 2004-10-21 Matsushita Electric Ind Co Ltd Semiconductor device, system device using the same, and its manufacturing method
KR100641706B1 (en) * 2004-11-03 2006-11-03 주식회사 하이닉스반도체 On-chip self test circuit and self test method of signal distortion

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2261566B1 (en) * 1974-02-19 1978-01-27 Gen Radio Co
US4194113A (en) * 1978-04-13 1980-03-18 Ncr Corporation Method and apparatus for isolating faults in a logic circuit
US4395767A (en) * 1981-04-20 1983-07-26 Control Data Corporation Interconnect fault detector for LSI logic chips
JPS622552A (en) * 1985-06-27 1987-01-08 Matsushita Electric Ind Co Ltd Inspecting unit for semiconductor and inspecting method for semiconductor
US4739250A (en) * 1985-11-20 1988-04-19 Fujitsu Limited Semiconductor integrated circuit device with test circuit
US4680761A (en) * 1986-01-30 1987-07-14 Burkness Donald C Self diagnostic Cyclic Analysis Testing System (CATS) for LSI/VLSI
FR2595474B1 (en) * 1986-03-04 1988-06-24 Texas Instruments France DEVICE FOR MONITORING AND VERIFYING THE OPERATION OF BLOCKS INTERNAL TO AN INTEGRATED CIRCUIT
US4749947A (en) 1986-03-10 1988-06-07 Cross-Check Systems, Inc. Grid-based, "cross-check" test structure for testing integrated circuits
JPS63145549A (en) * 1986-12-09 1988-06-17 Hitachi Ltd Simulation method for logic circuit
US5065090A (en) * 1988-07-13 1991-11-12 Cross-Check Technology, Inc. Method for testing integrated circuits having a grid-based, "cross-check" te
JPH0247574A (en) * 1988-08-10 1990-02-16 Toshiba Corp Semiconductor integrated circuit device and operation testing method
US4937826A (en) * 1988-09-09 1990-06-26 Crosscheck Technology, Inc. Method and apparatus for sensing defects in integrated circuit elements
JPH03128475A (en) * 1989-10-13 1991-05-31 Hitachi Ltd Logic circuit with logical test function
US5202624A (en) * 1990-08-31 1993-04-13 Cross-Check Technology, Inc. Interface between ic operational circuitry for coupling test signal from internal test matrix
JP3138286B2 (en) * 1991-05-15 2001-02-26 株式会社メガチップス Test method and test apparatus for semiconductor integrated circuit
JP2884847B2 (en) 1991-10-03 1999-04-19 三菱電機株式会社 Method of manufacturing semiconductor integrated circuit device having failure detection function

Also Published As

Publication number Publication date
DE4233271A1 (en) 1993-04-08
CA2079696C (en) 1999-05-11
JP2884847B2 (en) 1999-04-19
US5396500A (en) 1995-03-07
DE4233271C2 (en) 1995-06-01
JPH0599988A (en) 1993-04-23

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Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed