CA2353301A1 - Method and apparatus for determining reflective optical quality using gray-scale patterns - Google Patents
Method and apparatus for determining reflective optical quality using gray-scale patterns Download PDFInfo
- Publication number
- CA2353301A1 CA2353301A1 CA002353301A CA2353301A CA2353301A1 CA 2353301 A1 CA2353301 A1 CA 2353301A1 CA 002353301 A CA002353301 A CA 002353301A CA 2353301 A CA2353301 A CA 2353301A CA 2353301 A1 CA2353301 A1 CA 2353301A1
- Authority
- CA
- Canada
- Prior art keywords
- product
- image
- determining
- optical quality
- phase
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 66
- 238000000034 method Methods 0.000 title claims abstract description 63
- 230000000737 periodic effect Effects 0.000 claims description 6
- 238000004891 communication Methods 0.000 claims description 4
- 238000009826 distribution Methods 0.000 description 13
- 238000013459 approach Methods 0.000 description 11
- 230000010363 phase shift Effects 0.000 description 6
- 230000008569 process Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 2
- 241000252233 Cyprinus carpio Species 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 201000009310 astigmatism Diseases 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
Abstract
A method of determining reflective optical quality of a reflective product includes reflecting a first gray-scale pattern off the product; obtaining a first image of the first pattern with an image pickup device after the first pattern has reflected off of the product; and determining optical quality of the product based on data obtained from the first image. An apparatus for determining reflective optical quality of such a product is also disclosed.
Description
l r METHOD ANI~ APPARATUS FOR DETERMININGy REFLECTIVE OPTICAL
QUALITY USING GRAY~SCALE PATTERNS
TECHNICAL. FIELD
[0001] The invention relates to an apparatus and method for determining reflective optical quality of a reflective product using one or more gray-scale patterns, wherein the one or more patterns are reflected off of the product.
BACKGROUND OF THE INVENTIION
QUALITY USING GRAY~SCALE PATTERNS
TECHNICAL. FIELD
[0001] The invention relates to an apparatus and method for determining reflective optical quality of a reflective product using one or more gray-scale patterns, wherein the one or more patterns are reflected off of the product.
BACKGROUND OF THE INVENTIION
[0002] A prior method far determining reflectiv~a optical quality of a reflective product, such as a front windshield for a motor vehicle, involves reflecting a point light source off of the product and onto a white screen. A camera is then used to measure intensity variations of the light as seen on the screen. This method, however. is subject to errors if reflective properties of the product are not uniform.
For example, if the product has a surface coating with variations in thickness, such variations are interpreted as variations in optical power.
DISCLOSURE OF INVENTIOICJ
For example, if the product has a surface coating with variations in thickness, such variations are interpreted as variations in optical power.
DISCLOSURE OF INVENTIOICJ
(0003] The invention overcomes the shortcomings of the prior art by providing a method and apparatus for determining reflective optical quality of a reflective product at any and all points on the product. Furthermore, the method and apparatus provide accurate and repeatable results.
[0004] Under the invention, a method of determining reflective optical quality of a reflective product includes reflecting a first gray-scale pattern off the product;
obtaining a first image of the first pattern with an image pickup device after the first pattern has reflected off the product; and determining optical quality of the product based on data obtained from the first image.
obtaining a first image of the first pattern with an image pickup device after the first pattern has reflected off the product; and determining optical quality of the product based on data obtained from the first image.
[0005] Exemplary gray-scale patterns that rnay be used to practice the method include sinusoidal gratings as well as sawtooth gratings.
Advantageously, the gray-scale patterns may be projected at the product, or generated on a reference place and reflected off of the product. Consequently, the method may be used with a variety of product and test configurations.
Advantageously, the gray-scale patterns may be projected at the product, or generated on a reference place and reflected off of the product. Consequently, the method may be used with a variety of product and test configurations.
(0006] More specifically, the method includes ~de~termining a phase for each of a plurality of pixels of the first image, wherein each pixel corresponds to a particular point on the product. One or more optical character7sfiics are then determined for each of a plurality of points on the product based on the phase at the corresponding pixel [p007] An apparatus according to the invention for determining reflective optical quality of a reflective product includes an image generating device for generating a gray-scale pattern. The apparatus further includes an image pickup device for obtaining an image of the gray-scale pattern after the pafitern has reflected off of the producfi, and an image analyzing device in communication with the image pickup device. The image analyzing device includes instructions for determining opfiical quality of fihe product based on the image of the gray-scale pattern.
[0008] These and other objects, features and advantages of the invention are readily apparent from the following detailed description of the best modes for carrying out the invention when taken in conjunction with the accompanying drawings.
BRIEF DESCRIPTION OF DRAWIINGS
[0009] FIG. 1 is a schematic view of an apparatus for practicing a method according to the invention for determining reflective optical quality of a reflective product such as a motor vehicle windshield, wherein the apparatus includes a projector for projecting a sequence of phase-shifted sinusoidal gratings onto a screen, and a camera for obtaining images of the gratings as reflected off of the windshield;
[0010] FIG. 2 is a schematic view of an alternative configuration of the apparatus, wherein the projector is positioned so as to project fihe sequence of phase-shifted sinusoidal gratings onto the windshield such that the gratings are reflected onto the screen, and the camera is positioned so as to obtain images of the gratings as seen on the screen;
[0011] FIG. 3 is a schematic view of the apparatus having a similar configuration as in FIG. 1, and showing the projector projecting a sawtooth grating onto the screen;
[0012] FIG. 4 is a sChernatic view of an object having a periodic structure, and an image of the object;
s r [0013] FIG. 5 is a schematic view of the winidshield, the screen and the camera showing the geometrical relationship therebetvveen; and [0014] FIG. 6 is a schematic view of the windshield, the screen and the camera showing a surface facet of the windshield.
BEST MODES FOR CARRYING OUT THE fNVENT10N
[0015] F1G. 1 shows an apparatus 10 according to the invention for determining reflective optical quality of a reflective product, such as a front windshield 12 for a motor vehicle. Other exemplary reflective products include mirrors, windows and any other shiny, relatively smoo'xh object. The windshield 12 is supported on a generally flat surFace 14 of an optionally rotatable work table 16.
[0016] As shown in FIG. 1, the apparatus 10 includes a projector' 18 in communication with a computer 20. The projector 18 is used to project one or more gray-scale targets or patterns onto a reference plane, such as a screen 22, which is located behind the windshield 12 at a distance do from the windshield 12. Gray-scale pattern as used herein refers to a pattern having a varying light intensity, such as sinusoidal grating or sawtooth grating, and the pattern has a well defined phase at each point that is coded by intensity. Advantageously, the projector 18 and computer 20 can be used to quickly generate and project a sequence of phase-shifted gray-scale patterns onto the screen 22. Alternatively, the apparatus 10 may include any suitable image generating device for providing one or more gray-scale patterns, such as a computer monitor, television monitor, painted pattern, or slide projector.
[0017] The apparatus 10 further includes an irnage pickup device, such as a digital camera 24, for obtaining digital images of the gray-scale patterns.
Preferably, the camera 24 is disposed in front of the windshield 12 at a distance d" from the windshield 12, as shown in F1G, 1, so as to obtain digital images of the gray-scale patterns as reflected off of the windshield 12. The camera 24 is also in communication with the computer 20, and the camera 24 transmits signals to the computer 20 corresponding to the digital images. The computer 20 is used to process the signals so as to determine optical quality of the windshield 12 as expiained below in greater detail, [0018] A method according to the invention for determining reflective optical quality of the windshield 12 involves determining one or more optical parameters or characteristics of the windshield 12 at discrete locations or points on the windshield 12. The optical characteristics are determined based on phase changes introduced to one or more gray-scale patterns by the windshield 12, as a result of the patterns being reflected off of fhe windshield 12.
[0019] Optical characteristics that may be determined include instantaneous apparent magnification, focal length, optical power. and astigmatism. In order to calculate such characteristics, wrapped vertical and horizontal phase distributions of images of the one or more gray scale patterns are first determined. As used herein, vertical and horizontal phase distributions refer to vertical and horizontal phase values, respectively, at a plurality of pixels of the images. The phase distributions may be determined using any one of several known techniques.
[0020] If the windshield 12 is stationary, a phase-shift technique is preferably utilized. Under the phase-shift technique, in order to determine the vertical phase distribution introduced by the windshield 12, the projector 18 first projects a single reference point onto the screen 22 The camera 24 then obtains an image of the reference point as reflected off of the windshield 12, and transfers the image to the computer 20 where it is stored. Next, the projector 18 projects a horizontally oriented gray-scale pattern, such as a first grating 26 of horizontal lines having a sinusoidal intensity profile and a pitch p, onto the screen 22. The canlera 24 then obtains an image of the first grating 26 as reflected off of the windshield 12, and the camera 24 transfers the image to the computer 20 where the irnage is stored.
Alternately, the reference point may be incorporated into the first grating 26, and a single image of the reference point and the first grating 26 may be obtained.
[0021] Next, the projector 18, in cooperation vvith the computer 20, shifts the first grating 26 vertically by a distance 0/n to create a second, phase-shifted grating (not shown), where n is the desired number of phase-shifted gratings to be utilized in determining the vertical phase distribution. Furthermore, should be greater than or equal to 3, and is preferably 4. The projector 18 then projects the second, phase-shifted grafting onto the screen 22. Next, the camera 24 obtains an image of the second, phase-shifted grating, and transfers the image to the computer 20 where the image is stored.
[0022] This process is continued until n images have been obtained by the camera 24, and transferred to the computer 20. Thus, the phase-shift technique involves generating a sequence of n phase-shifts:d gray-scale patterns, and obtaining images of each pattern within the sequence as reflected off of the windshield 12. Furthermore, each image comprises a plurality of pixels, and each pixel corresponds to a particular point on the windshield 12.
[0023] Because this technique involves directing the camera 24 at the windshield 12 to obtain images of the patterns as reflected off of the windshield 12, it may be referred to as a view-at approach. Alternatively, as shown in FIG. 2, the phase-shift technique may involve projecting a sequence of phase-shifted gray-scale patterns at or onto the windshield 12 such that the p~afterns are reflected off of the windshield 12 and onto the screen 22 or other reference plane. This alternative approach further involves obtaining images of the patterns as seen on the screen 22.
Such an approach may be referred to as a project-at approach. Generally, then, the method involves reflecting one or more gray-scale patterns off the windshield 12:
wherein such a description covers both view-at and project-at approaches.
[0024] Next, the computer 20 analyzes the n images to determine vertical phase <p y for each of the pixels of the images. The vertical phase ~> ,f for each pixel is determined based on light intensities at the same pixel location on the n different images, and the reference point is used to calibrate unwrapped vertical phase values. The general equation for determining p y for a particular pixel (x,y) is as follows r,-I ~.rr ~' ( ~ Y) - ;~n ~r-I ( L, Y.) sin';".
.x -: tan -' - ~ rr I > >r;
;_..~f+I(x.Y)cos -;, where I;(x,y)=light intensity at pixel (x,y) of image i. For n=4, the equation becomes'.
y> y(x,y)=arctan((lafx,Y)-12~x,Y))~(ln(X.y)-l~(x,Y)))~
[0025] The above process is then repeated u:>ing the refierence point and vertically oriented gray-scale patterns, such as a grating of vertical lines having a sinusoidal intensity and a known pitch, to determine horizontal phase ~~> ~
for each of .
the pixels of the images.
[fl026~ If the windshield 12 is moving, then a Fourier transform technique is preferably utilized to determine the phase distributions., Under the Fourier transform technique, only one horizontally oriented gray-scale pattern and one vertically oriented gray-scale pattern are required to determine the vertical phase and horizontal phase, respectively, for each of the plurality of pixels. Briefly, this technique involves obtaining an image of each pattern, and perfiorming a Fourier transform of each image. Next, each Fourier transform is edited, and an inverse Fourier transform is performed to determine the vertiical and horizontal phases for each pixel. Additions! details regarding the Fourier transform technique may be found in "Fourier-Transform Method of Fringe-Pattern Analysis for Computer-Based Topography and lnterferometry," by M. Takeda, H. ins, and S. Kobayashi, J.
Opt.
Soc. Am. 72, 156(1982), which is hereby incorporated by reference.
[0027] If the camera 24 or other image pickup device has linear intensity response, and if the intensity profiles generated by the projector 18 or other image generating device are relatively accurate, then a technique that involves generating sawtooth gratings is preferably utilized to determine the phase distributions.
Under this technique, as shown in FIG. 3, the projector 18 gE;nerates a horizontally oriented sawtooth grating 27 on the screen 22. The camera 2~4 then obtains an image of the sawtooth grating 27 as reflected off of the windshield 12, and the computer 20 acquires the image to determine a light intensity value; 1 at each pixel (x,y).
X0028] Next, the projector 18 generates a unifo~rmiy white target on the screen 22, the camera 24 obtains an image of the white target as reflected ofifi of the windshield 12, and the computer 20 acquires the innage to determine a maximum light intensity value Im;,x at each pixel (x,y). The projector 18 then generates a uniformly dark target on the screen 22, the camera ~'.4 obtains an image of the dark target as reflected off of the windshield 12, and the computer 20 acquires the image to determine a minimum light intensity value Im;~ at each pixel (x,y).
[0029] Next, the computer 20 determines the vertical phase ~p Y at each pixel using the following equation:
~ Y(x,y)=2~ (I(X~Y)-imUx~Y~~~{Imax(x,Y)-In,~n{x~yr) [0030] Similar to the phase-shift technique, the reference point is also used to calibrate unwrapped vertical phase values. Furthernnore, a second phase-shifted and/or inverted horizontally oriented sawtooth grating may be required to fill in the phase distribution where the light intensity changes rapidly.
[0031] The above process is then repeated using the reference point and one or more vertically oriented sawtooth gratings to determine horizontal phase y~
x for each of the pixels of the corresponding images. because this technique requires determination of only three variables for each pixel, phase distributions can be determined relatively quickly.
[0032] Alternatively, any other suitable technique for determining the phase distributions may be utiiized, such as a phase synchronization technique, a demodulation-convolution technique, a 3-point FouriE:r fit, or a polynomial fit fringe order technique. Furthermore, any of the techniques may involve view-at or project-at approaches.
[0033] After the vertical and horizontal phase distributions have been determined, the computer 20 then determines the partial derivatives of the vertical and horizontal phases for each pixel point. The partial derivatives of the vertical phase for a particular pixel {x,y) may be determined using the following equations:
c7~h y .(~. y~,: ~p~,~x+l,y~-r~s,(x,l~~a-k~, r.?a: ' and ,:.t.i.y)= ~,.(.~,y+ 1~.. ~,,(.r,y)+ k~
where k=-1, 0, or * 1 as needed to correct for I;he 27t ambiguity in the wrapped phase. Similarly, the partial derivatives of the horizontal phase for a particular pixel (x,y) may be determined using the following equations:
~~~n.=
(~, y) w~., (~~ + ~, o) - ~n., (~. o) ., r~~
and 10541-5'79 G'?l c (a.' y~ - ~.v ~'~, v t I) ._ (~.z ~xe .Y) ~ ~CTI
[003~L] Next, optical characteristics are deterrnined for each point on the windshield 12 by determining optical characteristics at each corresponding pixel of the images based on the phase data obtained at each pixel. For example, instantaneous apparent vertical magnification my and instantaneous apparent horizontal magnification mXmay be determined at each pixel (x,y) using the following equations:
r~a,,(:r, y) :~ p ,(x,Y) / ~~'-(x, y), and ~rr.,(~,y)= Pr(x~y)l Wpt {.x,y)' ~7r where p y (x,y) and p x (x,y) are the vertical reference phase gradienfi and horizontal reference phase gradient, respectively, at a particular pixel {x,y). As used herein, reference phase gradient at a pixel (x,y) refers to the rate of phase change at pixel (x,y) when apparent magnification is 1,0. In other words, reference phase gradient is the rate of phase change at a particular pixel of an undistorted image.
[0035 The derivation of the above equations regarding instantaneous apparent magnification will now be explained. Generally, apparent magnification m, for a typical mirror is defined as the ratio of the angle subtended by the image of an object, which is referred to as image angle, to the angle subtended by the abject, which is referred to as object angle. For mirrors with varying apparent magnification values, instantaneous apparent magnification m in a direction ro o is defined as the ratio of the change of image angle to object angle, and is represented by the following equation:
m(cu o)=iim~ co ->OA cu ,l/.\ cu a=dog .,/dc~ o, where ~ co ; is the subtended image angle, and D. ~x~ o is the subtended object angle.
[0036] 1n the case where the object has a periodic structure, as shown in FlG.
4, such that each object point has a well defined phase, then each image point will have a phase identical with the phase at the Corresponding object point For example, the phase at a particular image point p, is identical to t'he phase at the corresponding object point Pc. Because do=a ;~dy;=dcu o~dyo, the equation for m then becomes' crrn-,, carp;
rrz .:; . .. ~ ..
dy" ~~Y, where c~ o is the object phase and c~ ; is the image' phase.
[0037] For a particular image point (x,y), vertical and horizontal apparent magnifications mY(x,y) and mx(x,y), respectively, may be represented as;
ru, (x., y ) _ ~ '' ~~o'~ ~ and ~v;
art tx, .Y) urr.~(v,,)e)= ~~ .
c9y, [0038] Thus, to determine magnification at a particular point on a mirror, the reference phase gradient is divided by the phase gradient as influenced by the mirror.
[0039] The reference phase gradients p Y and ~~ x may be determined using any suitable approach, such as a geometric approach. F=or simplicity, the discussion to follow will focus only on the relationship between the vertical reference phase gradient p Y and the configuration of the apparatus 1~D. A similar approach may also be utilized to determine the horizontal reference phase gradient p x.
[0040] FIG. 5 shows the windshield 12 having a reference plane that is perpendicular to a target T, which is projected on screen 22. Target -(' comprises a gray-scale pattern having a varying light intensity profile and a pitch p.
With this configuration, windshield 12 produces an image I of t:he target T. For example, when looking at a point Q on windshield 12, point P on target T can be seen as image point P'. Using the chain rule, the relationship between p y, for a particular image pixel (x,y), and the configuration of the apparatus 10 can be written as c.(~t, d1y- dcv"
~y. t. ~.. i, ) ,- _. ._... , cth~, dW ,, cly where fi c,(x,y) is the phase at pixel (x,y), co ~ is the angle of altitude and is optically equivalent to the previously described object angle cu ~,, h~ is the height of target point P, which corresponds to pixel (x,y), dc~ O/Clhp equals 2~c Ip, and day ~dy is a constant o of the apparatus 10. The relationship can, therefore, be rewritten as:
~ nx dhr ~~'~ ( ~x' 'r~ ~ p~ dlv ,, [0041 In order to calculate the distance hp, the wrapped vertical phase distribution must be unwrapped using one of several !known algorithms to obtain the unwrapped vertical phase cT~ y at each pixel. The distance hN may then be determined by the following equation:
hp=(~~ yo(x,y)-d' o)p'~' hpo where w ~o is the unwrapped vertical phase at a reference pixel (x,y~), <.f~
y(x,y) is the unwrapped vertical phase at pixel (x,y), and h~,~, is a constant representing the height at point (x,yo).
(0042 FIG. 6 shows that point C,t may be located on a facet of the windshield 12, wherein the facet has a surface normal n at an angle cx to the reference plane.
Furthermore, the point Q is within a distance ~ (not shown) of the reference plane, where ~ is much less than vertical distance h~ from the camera 24 to point Q.
The error in calculating the reference phase gradient at point Q is approximately a> Iz,,, Given the above, dhpldcu "may be expressed as follows:
dh~, _ _ ~l ~ ., c.lcn,. cas'' (ay, ... 2a ~ , [0043] The distance d1 may be represented by the following equation:
d..L =[h~/sin(c=> ~)-~ hP/sin{co ~,)]cos(o~ ~-2a )=[h~/Sin(cu ~)+ h~/Sin(co ~,)]cos(co p-cu ;), where w p=arctan(hP/zp) and a~ "=arctan(h~lz~}. i~istance z~ (or alternately angle cu ") can be determined based on a standard camera calibration which relates coordinate location (x,y) to z~ through function Z(xy). Distance z" can, therefore, be expressed as:
z"=Z(x,y), Distance zP may then be expressed as:
z~=~-Z(x,y) j0044] The reference phase gradients may also be measured using a procedure such as described below in detail. First, a tE~st mirror that is optically flat is installed into a test arrangement. Next, a reference point Po is displayed on the screen 22, and Po is used to define unwrapped phase ~~ o. The picture point Po~
corresponding to point Po is then located. Next, the phase at Po' is determined by the following equation:
~~~ ~-~~Y)= ~'o(x~.Yo'~' i)- Po(.z,Yn)-~ k~r, c:lv where k=1,0, or + 1 as needed to correct for the Zn ambiguifiy in the wrapped phase. The reference phase gradient may then be determined from the following equation:
dly,,(r, Y) c/cp,~(x,)y) _dCU,. _ P,, ( ~~, )% ) _., .... ~y-~~ fl) ''..
where dh~,/d«~ "may be determined as described above in detail.
[0045 Once instantaneous apparent magnification values have been determined at each pixel, additional optical characteristics of the windshield 12 may be determined. For example, optical power OP at each pixel may be determined in the x and y directions. Based on the thin lens formula and triangle relationships, the relationship between the instantaneous apparent magnification m and focal length f which is the reciprocal of OP, for a view-at approach 'is.
1/m=1-1 ((1/da+ l/d~)~, where do is the distance from the windshield 12 to the screen 22, and d~ is the distance from the windshield 12 to the view point, such as the camera 24. For this equation to be valid, the fiocal length f must satisfy one of the two following conditions. either f<0, or f>1/(1ldo.r 1/dv). If f>1/(1/d"+ 1Id~), then the windshield 12 functions as a positive lens and forms a real image. In this case, the camera 24 must be between the windshield 12 and the real image.
~osa~-~7s [0046] Given the above expression for m, the vertical optical power OPY and the horizontal optical power OPx may be determined at each pixel (x,y) from the following equations:
OPy(x,y)=1/fy(x,y)=('l/do~ 11d")(1-1lmY(x,y)), and OPx(x,Y)=1 /fK(x~Y)-(~ /da".1 /d~){1-~ ImX{x,Y)) where my and mx are the instantaneous apparent magnifications in the vertical and horizontal directions, respectively. With these equations, OPy and OPx are determined based on the vertical position of the camera 24 relative to the windshield 12.
(00~#TJ Because optical power of the windshie'Id 12 is a function of the angle the windshield 12 is tipped toward or away from the camera 24 or view point.
it is beneficial to determine optical power based on a standard view angle. Vertical optical power normal to a surface or facet of the windshield 12, OPNy, may be determined at each pixel (x,y) from the following equation:
1lfY{x,y)={1ldar 1/d")(1-1lmY(x,Y))cos(c~~ ~ cx ).
where ct~ .~ is the angle of altitude, and cx is the angle between a line normal to the particular surface or facet of the windshield 12, on which the corresponding material point (x,y) is disposed, and a line normal to a reference surface or plane of the windshield 12.
[004$] Additionally, vertical and horizontal focal lengths fy and fX, respectively, may be determined at each pixel (x,y) by taking the' reciprocals of the vertical and horizontal optical powers OPy and OPx, respectively, at each pixel (x,y), X0049] For a project-at approach, the relationship between the instantaneous apparent magnification m and the focal length f is:
rn=~{d~.~. db)f-d~db)/(d;~, where d~ is the distance from the windshield 12 to the projector 18, and da is the distance from the windshield 12 to the screen 22. Focal lengths and optical powers in the x and y directions may then be determined for each pixel using this relationship.
_-_T-__. __ [0050] In order to evaluate optical distortion perceived by a human observer, it is helpful to have an optical measure that accounts fon the distance the observer will be from the windshield 12 during use. One Such optical measure is standardized apparent magnification mj which may be used to evaluate optical effects as perceived by the occupant when looking at an object at infinity while located a standard distance de from the windshield 12. Using the above equations involving instantaneous apparent magnification m and focal! length f, the standardized apparent magnification m~ may be expressed as:
v -1 r.r.i. _ . 1 _ .-. ~ .- ._~ _ ( 1 _ ~ c!,, / c~~, + c15. l d,. ~ ( i ... l /
rrr~ ~ ~
(.l l c.!.,. n 1 / ~o ~.f where m and f are determined in the x or y directions, as necessary, using the procedure described above in detail. With this equation, standardized apparent magnification ms may be determined in the x and y directions at each pixel.
[0051] Another aspect of the invention involves evaluating astigmatic characteristics of the windshield 12. If the instantaneous apparent magnification rn for a particular point (x,y) is not the same in all directions, then the windshield 12 is astigmatic at point (x,y). In such a Case, point (x,y) will have a maximum instantaneous apparent magnification a in a certain direction t) , and a minimum instantaneous apparent magnification b in a direction perpendicular to 0 , where l7 is referred to as cylinder axis angle.
[0052] Discrete phase differences may be used to determine maximum and minimum instantaneous apparent magnifications a and b, as well as cylinder angle ~:_:.~
for each point on the windshield 12. The discrete phase differences are expressed by the following equations;
"rP,,, = S~,u(x,7' + ! ) - r~,,(.~, J') ~- ~ (crc" ~a- Jas'' ) l crUlp,., 4 ,,~', = rP.,(~', y+ 1 ) °- y~,.(x, Y) _ [-i:.s~(~a - fr) I crb~lh.,, ~~.,_~'.,(i+l,y)-rP.,-(t~..Y)=((~r.sv-~-hc')Icrb~p", and ~_,.4j,, ° rP~,(~ ~- J, 1')~- rlo.(.x~.Y) _ (-c.~(ct- h)! crl~.~~=',.~
where c = cos (B), s = sin (8), )yvy is the vertical difference in vertical phase c(> y, n ~,~Y
is the vertical difference in horizontal phase c~ x, ~ Xi x is the horizontal difference in horizontal phase fi x, and ~ ,~Y is the horizontal difference in vertical phase cp Y, These equations reduce to the following:
,S --- A ,.V~,. l p~. + !~ .y~P.~, l P,. = 1 1 c:) + 1 / b;
~' '= ~.,~n,,.P,. - Q,,r/~~. l p~, _ (.I I a- 1 / h~cos(2H):
U = - 14(n ,W.,. / ~,~ ))n v~., l P., ) + t.'z ~ = 1 /. tt - 1 / h;
a = 2 / (,S + f~); h = 2 / (.S - D); and H -:;: Q.5 arctan~(~ ,,~P., / P., + ~ .,~P,, l I?,. ~ l ~~~
[U053] Optical characteristics such as focal length, optical power and standardized apparent magnification may then be determined for each pixel using the maximum and minimum instantaneous apparent magnifications a and b, and the above equations.
[0054] Vertical disparity may also be evaluated for the windshield 12.
Vertical disparity, experienced by an observer looking at an abject at infinity, is the difiference in altitude angle between the direction to the image of the object as seen from the left eye of the observer, and the direction to the image of the object as seen from the right eye. In order to calculate vertical disparity, the wrapped vertical phase distribution must be unwrapped using one of several) known algorithms to obtain the unwrapped vertical phase ~ Y at each pixel. Nexa, the vertical disparity ~l ~
is determined for each pixel (x,y) using the following equation:
~ e(x,Y)=arcfian(LP (~ Y(x~Y)-fi y(x+ xG~Y))12n ]Ido, where do is the distance from the windshield 12 to the screen 22, xe is the horizontal distance corresponding to the interocular spacing (approximately 65 to 70 millimeters) projected to the windshield 12, and p is the pitch ofi the particular gray-scale pattern. It should be noted that vertical disparity evaluations are most useful for reflective products that produce relatively accurate images, such as flat mirrors.
[0055] Next, the optical characteristics for each point on the windshield 12 may be evaluated to determine whether the optical quality of the windshield 12 is acceptable. For example, the optical characteristics for each point may be compared with predetermined, acceptable values. As another example, the compufier 20 may generate one or more output images or profiles that graphically represent optical characteristics of the windshield 12. Furthermore, such images or profiles may be color coded so that potential problem areas of the windshield 12 may be easily identified.
60056] Advantageously, by utilizing gray-scale patterns rather than black and white patterns known as binary patterns, the method and apparatus enable optical characteristics to be determined at al( points on the windshield 12.
Consequently, the apparatus and method of the invention provide ;a significantly more complete determination of opfiical quality of the windshield 12 compared with prior art apparatuses and methods. Because the optical characteristics of the windshield are determined by the computer 20, the invention also provides an efficient and accurate determination of optical quality of the windshield 12. Furthermore, because the method preferably includes determining standardized apparent magnification, optical performance of the windshield 12 in use conditions may be effectively predicted.
[0057] While embodiments of the invention have been illustrated and described, it is not intended that these embodimE>nts illustrate and describe all possible forms of the invention. Rather, the words used in the specification are words of description rather than limitation, and it is understood that various changes may be made without departing from the spirit and scope of the invention.
n___~.~_. T
[0008] These and other objects, features and advantages of the invention are readily apparent from the following detailed description of the best modes for carrying out the invention when taken in conjunction with the accompanying drawings.
BRIEF DESCRIPTION OF DRAWIINGS
[0009] FIG. 1 is a schematic view of an apparatus for practicing a method according to the invention for determining reflective optical quality of a reflective product such as a motor vehicle windshield, wherein the apparatus includes a projector for projecting a sequence of phase-shifted sinusoidal gratings onto a screen, and a camera for obtaining images of the gratings as reflected off of the windshield;
[0010] FIG. 2 is a schematic view of an alternative configuration of the apparatus, wherein the projector is positioned so as to project fihe sequence of phase-shifted sinusoidal gratings onto the windshield such that the gratings are reflected onto the screen, and the camera is positioned so as to obtain images of the gratings as seen on the screen;
[0011] FIG. 3 is a schematic view of the apparatus having a similar configuration as in FIG. 1, and showing the projector projecting a sawtooth grating onto the screen;
[0012] FIG. 4 is a sChernatic view of an object having a periodic structure, and an image of the object;
s r [0013] FIG. 5 is a schematic view of the winidshield, the screen and the camera showing the geometrical relationship therebetvveen; and [0014] FIG. 6 is a schematic view of the windshield, the screen and the camera showing a surface facet of the windshield.
BEST MODES FOR CARRYING OUT THE fNVENT10N
[0015] F1G. 1 shows an apparatus 10 according to the invention for determining reflective optical quality of a reflective product, such as a front windshield 12 for a motor vehicle. Other exemplary reflective products include mirrors, windows and any other shiny, relatively smoo'xh object. The windshield 12 is supported on a generally flat surFace 14 of an optionally rotatable work table 16.
[0016] As shown in FIG. 1, the apparatus 10 includes a projector' 18 in communication with a computer 20. The projector 18 is used to project one or more gray-scale targets or patterns onto a reference plane, such as a screen 22, which is located behind the windshield 12 at a distance do from the windshield 12. Gray-scale pattern as used herein refers to a pattern having a varying light intensity, such as sinusoidal grating or sawtooth grating, and the pattern has a well defined phase at each point that is coded by intensity. Advantageously, the projector 18 and computer 20 can be used to quickly generate and project a sequence of phase-shifted gray-scale patterns onto the screen 22. Alternatively, the apparatus 10 may include any suitable image generating device for providing one or more gray-scale patterns, such as a computer monitor, television monitor, painted pattern, or slide projector.
[0017] The apparatus 10 further includes an irnage pickup device, such as a digital camera 24, for obtaining digital images of the gray-scale patterns.
Preferably, the camera 24 is disposed in front of the windshield 12 at a distance d" from the windshield 12, as shown in F1G, 1, so as to obtain digital images of the gray-scale patterns as reflected off of the windshield 12. The camera 24 is also in communication with the computer 20, and the camera 24 transmits signals to the computer 20 corresponding to the digital images. The computer 20 is used to process the signals so as to determine optical quality of the windshield 12 as expiained below in greater detail, [0018] A method according to the invention for determining reflective optical quality of the windshield 12 involves determining one or more optical parameters or characteristics of the windshield 12 at discrete locations or points on the windshield 12. The optical characteristics are determined based on phase changes introduced to one or more gray-scale patterns by the windshield 12, as a result of the patterns being reflected off of fhe windshield 12.
[0019] Optical characteristics that may be determined include instantaneous apparent magnification, focal length, optical power. and astigmatism. In order to calculate such characteristics, wrapped vertical and horizontal phase distributions of images of the one or more gray scale patterns are first determined. As used herein, vertical and horizontal phase distributions refer to vertical and horizontal phase values, respectively, at a plurality of pixels of the images. The phase distributions may be determined using any one of several known techniques.
[0020] If the windshield 12 is stationary, a phase-shift technique is preferably utilized. Under the phase-shift technique, in order to determine the vertical phase distribution introduced by the windshield 12, the projector 18 first projects a single reference point onto the screen 22 The camera 24 then obtains an image of the reference point as reflected off of the windshield 12, and transfers the image to the computer 20 where it is stored. Next, the projector 18 projects a horizontally oriented gray-scale pattern, such as a first grating 26 of horizontal lines having a sinusoidal intensity profile and a pitch p, onto the screen 22. The canlera 24 then obtains an image of the first grating 26 as reflected off of the windshield 12, and the camera 24 transfers the image to the computer 20 where the irnage is stored.
Alternately, the reference point may be incorporated into the first grating 26, and a single image of the reference point and the first grating 26 may be obtained.
[0021] Next, the projector 18, in cooperation vvith the computer 20, shifts the first grating 26 vertically by a distance 0/n to create a second, phase-shifted grating (not shown), where n is the desired number of phase-shifted gratings to be utilized in determining the vertical phase distribution. Furthermore, should be greater than or equal to 3, and is preferably 4. The projector 18 then projects the second, phase-shifted grafting onto the screen 22. Next, the camera 24 obtains an image of the second, phase-shifted grating, and transfers the image to the computer 20 where the image is stored.
[0022] This process is continued until n images have been obtained by the camera 24, and transferred to the computer 20. Thus, the phase-shift technique involves generating a sequence of n phase-shifts:d gray-scale patterns, and obtaining images of each pattern within the sequence as reflected off of the windshield 12. Furthermore, each image comprises a plurality of pixels, and each pixel corresponds to a particular point on the windshield 12.
[0023] Because this technique involves directing the camera 24 at the windshield 12 to obtain images of the patterns as reflected off of the windshield 12, it may be referred to as a view-at approach. Alternatively, as shown in FIG. 2, the phase-shift technique may involve projecting a sequence of phase-shifted gray-scale patterns at or onto the windshield 12 such that the p~afterns are reflected off of the windshield 12 and onto the screen 22 or other reference plane. This alternative approach further involves obtaining images of the patterns as seen on the screen 22.
Such an approach may be referred to as a project-at approach. Generally, then, the method involves reflecting one or more gray-scale patterns off the windshield 12:
wherein such a description covers both view-at and project-at approaches.
[0024] Next, the computer 20 analyzes the n images to determine vertical phase <p y for each of the pixels of the images. The vertical phase ~> ,f for each pixel is determined based on light intensities at the same pixel location on the n different images, and the reference point is used to calibrate unwrapped vertical phase values. The general equation for determining p y for a particular pixel (x,y) is as follows r,-I ~.rr ~' ( ~ Y) - ;~n ~r-I ( L, Y.) sin';".
.x -: tan -' - ~ rr I > >r;
;_..~f+I(x.Y)cos -;, where I;(x,y)=light intensity at pixel (x,y) of image i. For n=4, the equation becomes'.
y> y(x,y)=arctan((lafx,Y)-12~x,Y))~(ln(X.y)-l~(x,Y)))~
[0025] The above process is then repeated u:>ing the refierence point and vertically oriented gray-scale patterns, such as a grating of vertical lines having a sinusoidal intensity and a known pitch, to determine horizontal phase ~~> ~
for each of .
the pixels of the images.
[fl026~ If the windshield 12 is moving, then a Fourier transform technique is preferably utilized to determine the phase distributions., Under the Fourier transform technique, only one horizontally oriented gray-scale pattern and one vertically oriented gray-scale pattern are required to determine the vertical phase and horizontal phase, respectively, for each of the plurality of pixels. Briefly, this technique involves obtaining an image of each pattern, and perfiorming a Fourier transform of each image. Next, each Fourier transform is edited, and an inverse Fourier transform is performed to determine the vertiical and horizontal phases for each pixel. Additions! details regarding the Fourier transform technique may be found in "Fourier-Transform Method of Fringe-Pattern Analysis for Computer-Based Topography and lnterferometry," by M. Takeda, H. ins, and S. Kobayashi, J.
Opt.
Soc. Am. 72, 156(1982), which is hereby incorporated by reference.
[0027] If the camera 24 or other image pickup device has linear intensity response, and if the intensity profiles generated by the projector 18 or other image generating device are relatively accurate, then a technique that involves generating sawtooth gratings is preferably utilized to determine the phase distributions.
Under this technique, as shown in FIG. 3, the projector 18 gE;nerates a horizontally oriented sawtooth grating 27 on the screen 22. The camera 2~4 then obtains an image of the sawtooth grating 27 as reflected off of the windshield 12, and the computer 20 acquires the image to determine a light intensity value; 1 at each pixel (x,y).
X0028] Next, the projector 18 generates a unifo~rmiy white target on the screen 22, the camera 24 obtains an image of the white target as reflected ofifi of the windshield 12, and the computer 20 acquires the innage to determine a maximum light intensity value Im;,x at each pixel (x,y). The projector 18 then generates a uniformly dark target on the screen 22, the camera ~'.4 obtains an image of the dark target as reflected off of the windshield 12, and the computer 20 acquires the image to determine a minimum light intensity value Im;~ at each pixel (x,y).
[0029] Next, the computer 20 determines the vertical phase ~p Y at each pixel using the following equation:
~ Y(x,y)=2~ (I(X~Y)-imUx~Y~~~{Imax(x,Y)-In,~n{x~yr) [0030] Similar to the phase-shift technique, the reference point is also used to calibrate unwrapped vertical phase values. Furthernnore, a second phase-shifted and/or inverted horizontally oriented sawtooth grating may be required to fill in the phase distribution where the light intensity changes rapidly.
[0031] The above process is then repeated using the reference point and one or more vertically oriented sawtooth gratings to determine horizontal phase y~
x for each of the pixels of the corresponding images. because this technique requires determination of only three variables for each pixel, phase distributions can be determined relatively quickly.
[0032] Alternatively, any other suitable technique for determining the phase distributions may be utiiized, such as a phase synchronization technique, a demodulation-convolution technique, a 3-point FouriE:r fit, or a polynomial fit fringe order technique. Furthermore, any of the techniques may involve view-at or project-at approaches.
[0033] After the vertical and horizontal phase distributions have been determined, the computer 20 then determines the partial derivatives of the vertical and horizontal phases for each pixel point. The partial derivatives of the vertical phase for a particular pixel {x,y) may be determined using the following equations:
c7~h y .(~. y~,: ~p~,~x+l,y~-r~s,(x,l~~a-k~, r.?a: ' and ,:.t.i.y)= ~,.(.~,y+ 1~.. ~,,(.r,y)+ k~
where k=-1, 0, or * 1 as needed to correct for I;he 27t ambiguity in the wrapped phase. Similarly, the partial derivatives of the horizontal phase for a particular pixel (x,y) may be determined using the following equations:
~~~n.=
(~, y) w~., (~~ + ~, o) - ~n., (~. o) ., r~~
and 10541-5'79 G'?l c (a.' y~ - ~.v ~'~, v t I) ._ (~.z ~xe .Y) ~ ~CTI
[003~L] Next, optical characteristics are deterrnined for each point on the windshield 12 by determining optical characteristics at each corresponding pixel of the images based on the phase data obtained at each pixel. For example, instantaneous apparent vertical magnification my and instantaneous apparent horizontal magnification mXmay be determined at each pixel (x,y) using the following equations:
r~a,,(:r, y) :~ p ,(x,Y) / ~~'-(x, y), and ~rr.,(~,y)= Pr(x~y)l Wpt {.x,y)' ~7r where p y (x,y) and p x (x,y) are the vertical reference phase gradienfi and horizontal reference phase gradient, respectively, at a particular pixel {x,y). As used herein, reference phase gradient at a pixel (x,y) refers to the rate of phase change at pixel (x,y) when apparent magnification is 1,0. In other words, reference phase gradient is the rate of phase change at a particular pixel of an undistorted image.
[0035 The derivation of the above equations regarding instantaneous apparent magnification will now be explained. Generally, apparent magnification m, for a typical mirror is defined as the ratio of the angle subtended by the image of an object, which is referred to as image angle, to the angle subtended by the abject, which is referred to as object angle. For mirrors with varying apparent magnification values, instantaneous apparent magnification m in a direction ro o is defined as the ratio of the change of image angle to object angle, and is represented by the following equation:
m(cu o)=iim~ co ->OA cu ,l/.\ cu a=dog .,/dc~ o, where ~ co ; is the subtended image angle, and D. ~x~ o is the subtended object angle.
[0036] 1n the case where the object has a periodic structure, as shown in FlG.
4, such that each object point has a well defined phase, then each image point will have a phase identical with the phase at the Corresponding object point For example, the phase at a particular image point p, is identical to t'he phase at the corresponding object point Pc. Because do=a ;~dy;=dcu o~dyo, the equation for m then becomes' crrn-,, carp;
rrz .:; . .. ~ ..
dy" ~~Y, where c~ o is the object phase and c~ ; is the image' phase.
[0037] For a particular image point (x,y), vertical and horizontal apparent magnifications mY(x,y) and mx(x,y), respectively, may be represented as;
ru, (x., y ) _ ~ '' ~~o'~ ~ and ~v;
art tx, .Y) urr.~(v,,)e)= ~~ .
c9y, [0038] Thus, to determine magnification at a particular point on a mirror, the reference phase gradient is divided by the phase gradient as influenced by the mirror.
[0039] The reference phase gradients p Y and ~~ x may be determined using any suitable approach, such as a geometric approach. F=or simplicity, the discussion to follow will focus only on the relationship between the vertical reference phase gradient p Y and the configuration of the apparatus 1~D. A similar approach may also be utilized to determine the horizontal reference phase gradient p x.
[0040] FIG. 5 shows the windshield 12 having a reference plane that is perpendicular to a target T, which is projected on screen 22. Target -(' comprises a gray-scale pattern having a varying light intensity profile and a pitch p.
With this configuration, windshield 12 produces an image I of t:he target T. For example, when looking at a point Q on windshield 12, point P on target T can be seen as image point P'. Using the chain rule, the relationship between p y, for a particular image pixel (x,y), and the configuration of the apparatus 10 can be written as c.(~t, d1y- dcv"
~y. t. ~.. i, ) ,- _. ._... , cth~, dW ,, cly where fi c,(x,y) is the phase at pixel (x,y), co ~ is the angle of altitude and is optically equivalent to the previously described object angle cu ~,, h~ is the height of target point P, which corresponds to pixel (x,y), dc~ O/Clhp equals 2~c Ip, and day ~dy is a constant o of the apparatus 10. The relationship can, therefore, be rewritten as:
~ nx dhr ~~'~ ( ~x' 'r~ ~ p~ dlv ,, [0041 In order to calculate the distance hp, the wrapped vertical phase distribution must be unwrapped using one of several !known algorithms to obtain the unwrapped vertical phase cT~ y at each pixel. The distance hN may then be determined by the following equation:
hp=(~~ yo(x,y)-d' o)p'~' hpo where w ~o is the unwrapped vertical phase at a reference pixel (x,y~), <.f~
y(x,y) is the unwrapped vertical phase at pixel (x,y), and h~,~, is a constant representing the height at point (x,yo).
(0042 FIG. 6 shows that point C,t may be located on a facet of the windshield 12, wherein the facet has a surface normal n at an angle cx to the reference plane.
Furthermore, the point Q is within a distance ~ (not shown) of the reference plane, where ~ is much less than vertical distance h~ from the camera 24 to point Q.
The error in calculating the reference phase gradient at point Q is approximately a> Iz,,, Given the above, dhpldcu "may be expressed as follows:
dh~, _ _ ~l ~ ., c.lcn,. cas'' (ay, ... 2a ~ , [0043] The distance d1 may be represented by the following equation:
d..L =[h~/sin(c=> ~)-~ hP/sin{co ~,)]cos(o~ ~-2a )=[h~/Sin(cu ~)+ h~/Sin(co ~,)]cos(co p-cu ;), where w p=arctan(hP/zp) and a~ "=arctan(h~lz~}. i~istance z~ (or alternately angle cu ") can be determined based on a standard camera calibration which relates coordinate location (x,y) to z~ through function Z(xy). Distance z" can, therefore, be expressed as:
z"=Z(x,y), Distance zP may then be expressed as:
z~=~-Z(x,y) j0044] The reference phase gradients may also be measured using a procedure such as described below in detail. First, a tE~st mirror that is optically flat is installed into a test arrangement. Next, a reference point Po is displayed on the screen 22, and Po is used to define unwrapped phase ~~ o. The picture point Po~
corresponding to point Po is then located. Next, the phase at Po' is determined by the following equation:
~~~ ~-~~Y)= ~'o(x~.Yo'~' i)- Po(.z,Yn)-~ k~r, c:lv where k=1,0, or + 1 as needed to correct for the Zn ambiguifiy in the wrapped phase. The reference phase gradient may then be determined from the following equation:
dly,,(r, Y) c/cp,~(x,)y) _dCU,. _ P,, ( ~~, )% ) _., .... ~y-~~ fl) ''..
where dh~,/d«~ "may be determined as described above in detail.
[0045 Once instantaneous apparent magnification values have been determined at each pixel, additional optical characteristics of the windshield 12 may be determined. For example, optical power OP at each pixel may be determined in the x and y directions. Based on the thin lens formula and triangle relationships, the relationship between the instantaneous apparent magnification m and focal length f which is the reciprocal of OP, for a view-at approach 'is.
1/m=1-1 ((1/da+ l/d~)~, where do is the distance from the windshield 12 to the screen 22, and d~ is the distance from the windshield 12 to the view point, such as the camera 24. For this equation to be valid, the fiocal length f must satisfy one of the two following conditions. either f<0, or f>1/(1ldo.r 1/dv). If f>1/(1/d"+ 1Id~), then the windshield 12 functions as a positive lens and forms a real image. In this case, the camera 24 must be between the windshield 12 and the real image.
~osa~-~7s [0046] Given the above expression for m, the vertical optical power OPY and the horizontal optical power OPx may be determined at each pixel (x,y) from the following equations:
OPy(x,y)=1/fy(x,y)=('l/do~ 11d")(1-1lmY(x,y)), and OPx(x,Y)=1 /fK(x~Y)-(~ /da".1 /d~){1-~ ImX{x,Y)) where my and mx are the instantaneous apparent magnifications in the vertical and horizontal directions, respectively. With these equations, OPy and OPx are determined based on the vertical position of the camera 24 relative to the windshield 12.
(00~#TJ Because optical power of the windshie'Id 12 is a function of the angle the windshield 12 is tipped toward or away from the camera 24 or view point.
it is beneficial to determine optical power based on a standard view angle. Vertical optical power normal to a surface or facet of the windshield 12, OPNy, may be determined at each pixel (x,y) from the following equation:
1lfY{x,y)={1ldar 1/d")(1-1lmY(x,Y))cos(c~~ ~ cx ).
where ct~ .~ is the angle of altitude, and cx is the angle between a line normal to the particular surface or facet of the windshield 12, on which the corresponding material point (x,y) is disposed, and a line normal to a reference surface or plane of the windshield 12.
[004$] Additionally, vertical and horizontal focal lengths fy and fX, respectively, may be determined at each pixel (x,y) by taking the' reciprocals of the vertical and horizontal optical powers OPy and OPx, respectively, at each pixel (x,y), X0049] For a project-at approach, the relationship between the instantaneous apparent magnification m and the focal length f is:
rn=~{d~.~. db)f-d~db)/(d;~, where d~ is the distance from the windshield 12 to the projector 18, and da is the distance from the windshield 12 to the screen 22. Focal lengths and optical powers in the x and y directions may then be determined for each pixel using this relationship.
_-_T-__. __ [0050] In order to evaluate optical distortion perceived by a human observer, it is helpful to have an optical measure that accounts fon the distance the observer will be from the windshield 12 during use. One Such optical measure is standardized apparent magnification mj which may be used to evaluate optical effects as perceived by the occupant when looking at an object at infinity while located a standard distance de from the windshield 12. Using the above equations involving instantaneous apparent magnification m and focal! length f, the standardized apparent magnification m~ may be expressed as:
v -1 r.r.i. _ . 1 _ .-. ~ .- ._~ _ ( 1 _ ~ c!,, / c~~, + c15. l d,. ~ ( i ... l /
rrr~ ~ ~
(.l l c.!.,. n 1 / ~o ~.f where m and f are determined in the x or y directions, as necessary, using the procedure described above in detail. With this equation, standardized apparent magnification ms may be determined in the x and y directions at each pixel.
[0051] Another aspect of the invention involves evaluating astigmatic characteristics of the windshield 12. If the instantaneous apparent magnification rn for a particular point (x,y) is not the same in all directions, then the windshield 12 is astigmatic at point (x,y). In such a Case, point (x,y) will have a maximum instantaneous apparent magnification a in a certain direction t) , and a minimum instantaneous apparent magnification b in a direction perpendicular to 0 , where l7 is referred to as cylinder axis angle.
[0052] Discrete phase differences may be used to determine maximum and minimum instantaneous apparent magnifications a and b, as well as cylinder angle ~:_:.~
for each point on the windshield 12. The discrete phase differences are expressed by the following equations;
"rP,,, = S~,u(x,7' + ! ) - r~,,(.~, J') ~- ~ (crc" ~a- Jas'' ) l crUlp,., 4 ,,~', = rP.,(~', y+ 1 ) °- y~,.(x, Y) _ [-i:.s~(~a - fr) I crb~lh.,, ~~.,_~'.,(i+l,y)-rP.,-(t~..Y)=((~r.sv-~-hc')Icrb~p", and ~_,.4j,, ° rP~,(~ ~- J, 1')~- rlo.(.x~.Y) _ (-c.~(ct- h)! crl~.~~=',.~
where c = cos (B), s = sin (8), )yvy is the vertical difference in vertical phase c(> y, n ~,~Y
is the vertical difference in horizontal phase c~ x, ~ Xi x is the horizontal difference in horizontal phase fi x, and ~ ,~Y is the horizontal difference in vertical phase cp Y, These equations reduce to the following:
,S --- A ,.V~,. l p~. + !~ .y~P.~, l P,. = 1 1 c:) + 1 / b;
~' '= ~.,~n,,.P,. - Q,,r/~~. l p~, _ (.I I a- 1 / h~cos(2H):
U = - 14(n ,W.,. / ~,~ ))n v~., l P., ) + t.'z ~ = 1 /. tt - 1 / h;
a = 2 / (,S + f~); h = 2 / (.S - D); and H -:;: Q.5 arctan~(~ ,,~P., / P., + ~ .,~P,, l I?,. ~ l ~~~
[U053] Optical characteristics such as focal length, optical power and standardized apparent magnification may then be determined for each pixel using the maximum and minimum instantaneous apparent magnifications a and b, and the above equations.
[0054] Vertical disparity may also be evaluated for the windshield 12.
Vertical disparity, experienced by an observer looking at an abject at infinity, is the difiference in altitude angle between the direction to the image of the object as seen from the left eye of the observer, and the direction to the image of the object as seen from the right eye. In order to calculate vertical disparity, the wrapped vertical phase distribution must be unwrapped using one of several) known algorithms to obtain the unwrapped vertical phase ~ Y at each pixel. Nexa, the vertical disparity ~l ~
is determined for each pixel (x,y) using the following equation:
~ e(x,Y)=arcfian(LP (~ Y(x~Y)-fi y(x+ xG~Y))12n ]Ido, where do is the distance from the windshield 12 to the screen 22, xe is the horizontal distance corresponding to the interocular spacing (approximately 65 to 70 millimeters) projected to the windshield 12, and p is the pitch ofi the particular gray-scale pattern. It should be noted that vertical disparity evaluations are most useful for reflective products that produce relatively accurate images, such as flat mirrors.
[0055] Next, the optical characteristics for each point on the windshield 12 may be evaluated to determine whether the optical quality of the windshield 12 is acceptable. For example, the optical characteristics for each point may be compared with predetermined, acceptable values. As another example, the compufier 20 may generate one or more output images or profiles that graphically represent optical characteristics of the windshield 12. Furthermore, such images or profiles may be color coded so that potential problem areas of the windshield 12 may be easily identified.
60056] Advantageously, by utilizing gray-scale patterns rather than black and white patterns known as binary patterns, the method and apparatus enable optical characteristics to be determined at al( points on the windshield 12.
Consequently, the apparatus and method of the invention provide ;a significantly more complete determination of opfiical quality of the windshield 12 compared with prior art apparatuses and methods. Because the optical characteristics of the windshield are determined by the computer 20, the invention also provides an efficient and accurate determination of optical quality of the windshield 12. Furthermore, because the method preferably includes determining standardized apparent magnification, optical performance of the windshield 12 in use conditions may be effectively predicted.
[0057] While embodiments of the invention have been illustrated and described, it is not intended that these embodimE>nts illustrate and describe all possible forms of the invention. Rather, the words used in the specification are words of description rather than limitation, and it is understood that various changes may be made without departing from the spirit and scope of the invention.
n___~.~_. T
Claims (16)
1. A method of determining reflective optical quality of a reflective product, the method comprising:
reflecting a first periodic gray-scale pattern off the product;
obtaining a first image of the first pattern with an image pickup device after the first pattern has reflected off the product; and determining optical quality of the product based on data obtained from the first image.
reflecting a first periodic gray-scale pattern off the product;
obtaining a first image of the first pattern with an image pickup device after the first pattern has reflected off the product; and determining optical quality of the product based on data obtained from the first image.
2. The method of claim 1 wherein reflecting a first periodic gray-scale pattern comprises reflecting a first sinusoidal grating off the product.
3. The method of claim 1 wherein reflecting a first periodic gray-scale pattern comprises reflecting a first sawtooth grating off the product.
4. The method of claim 1 further comprising:
reflecting a second periodic gray-scale pattern off the product, wherein the second pattern is phase-shifted with respect to the first pattern; and obtaining a second image of the second pattern with an image pickup device after the second pattern has reflected off the product;
wherein determining optical quality of the product further includes determining optical quality of the product based on the second image.
reflecting a second periodic gray-scale pattern off the product, wherein the second pattern is phase-shifted with respect to the first pattern; and obtaining a second image of the second pattern with an image pickup device after the second pattern has reflected off the product;
wherein determining optical quality of the product further includes determining optical quality of the product based on the second image.
5. The method of claim 1 further comprising determining a phase for each of a plurality of pixels of the first image, wherein each pixel corresponds to a particular point on the product, and wherein determining optical quality of the product comprises determining optical quality of the product at each of a plurality of points on the product based on the phase at the corresponding pixel.
6. The method of claim 1 wherein determining optical quality of the product comprises determining apparent magnification for each of a plurality of points on the product.
7. The method of claim 1 wherein determining optical quality of the product comprises determining focal length for each of a plurality of points on the product.
8. The method of claim 1 wherein determining optical quality of the product comprises determining optical power for each of a plurality of points on the product.
9. The method of claim 1 wherein determining optical quality of the product comprises determining standardized apparent magnification for each of a plurality of points on the product.
10. The method of claim 1 wherein determining optical quality of the product comprises determining maximum apparent magnification and minimum apparent magnification for each of a plurality of points on the product.
11. The method of claim 10 wherein determining optical quality of the product comprises determining cylinder angle for each of the plurality of points on the product.
12. The method of claim 1 wherein determining optical quality of the product comprises determining vertical disparity for each of a plurality of points on the product.
13. A method of determining reflective optical quality of a reflective product, the method comprising:
projecting a sequence of phase-shifted sinusoidal gratings onto the product such that the gratings are reflected off of the product and onto a reference plane;
obtaining an image of each of the gratings within the sequence as reflected off of the product;
determining a phase for each of a plurality of pixels of the images, wherein each pixel corresponds to a particular point on the product; and determining optical quality of the product at each of a plurality of points on the product based on the phase at the corresponding pixel point.
projecting a sequence of phase-shifted sinusoidal gratings onto the product such that the gratings are reflected off of the product and onto a reference plane;
obtaining an image of each of the gratings within the sequence as reflected off of the product;
determining a phase for each of a plurality of pixels of the images, wherein each pixel corresponds to a particular point on the product; and determining optical quality of the product at each of a plurality of points on the product based on the phase at the corresponding pixel point.
14. A method of determining reflective optical quality of a reflective product, the method comprising:
positioning the product relative to an image generating device and an image pickup device such that light passing between the image generating device and the image pickup device reflects off of the product;
generating a sawtooth grating with the image generating device;
obtaining a first image of the sawtooth grating with the image pickup device, wherein the first image is influenced by the product;
generating a uniformly white target with the image generating device;
obtaining a second image of the uniformly white target with the image pickup device, wherein the second image is influenced by the product;
generating a uniformly dark target with the image generating device;
obtaining a third image of the uniformly dark target with the image pickup device wherein the third image is influenced by the product; and determining optical characteristics of the product based on the images.
positioning the product relative to an image generating device and an image pickup device such that light passing between the image generating device and the image pickup device reflects off of the product;
generating a sawtooth grating with the image generating device;
obtaining a first image of the sawtooth grating with the image pickup device, wherein the first image is influenced by the product;
generating a uniformly white target with the image generating device;
obtaining a second image of the uniformly white target with the image pickup device, wherein the second image is influenced by the product;
generating a uniformly dark target with the image generating device;
obtaining a third image of the uniformly dark target with the image pickup device wherein the third image is influenced by the product; and determining optical characteristics of the product based on the images.
15. An apparatus for determining reflective optical quality of a reflective product having light reflection properties, the apparatus comprising:
an image generating device for generating a gray-scale pattern;
an image pickup device for obtaining an image of the gray-scale pattern after the pattern has reflected off of the product; and an image analyzing device in communication with the image pickup device, the image analyzing device including instructions for determining optical quality of the product based on the image.
an image generating device for generating a gray-scale pattern;
an image pickup device for obtaining an image of the gray-scale pattern after the pattern has reflected off of the product; and an image analyzing device in communication with the image pickup device, the image analyzing device including instructions for determining optical quality of the product based on the image.
16. The method of claim 13 wherein determining a phase for each of a plurality of pixels of the images includes determining the phase for each pixel of the images based on variations in light intensities at each pixel of the images.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/332,234 US6100990A (en) | 1999-06-14 | 1999-06-14 | Method and apparatus for determining reflective optical quality using gray-scale patterns |
EP00304744A EP1061357B1 (en) | 1999-06-14 | 2000-06-05 | Method and apparatus for determining reflective optical quality |
JP2000178140A JP2001066223A (en) | 1999-06-14 | 2000-06-14 | Method for deciding quality of reflected light |
CA002353301A CA2353301A1 (en) | 1999-06-14 | 2001-07-18 | Method and apparatus for determining reflective optical quality using gray-scale patterns |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/332,234 US6100990A (en) | 1999-06-14 | 1999-06-14 | Method and apparatus for determining reflective optical quality using gray-scale patterns |
CA002353301A CA2353301A1 (en) | 1999-06-14 | 2001-07-18 | Method and apparatus for determining reflective optical quality using gray-scale patterns |
Publications (1)
Publication Number | Publication Date |
---|---|
CA2353301A1 true CA2353301A1 (en) | 2003-01-18 |
Family
ID=27789574
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002353301A Abandoned CA2353301A1 (en) | 1999-06-14 | 2001-07-18 | Method and apparatus for determining reflective optical quality using gray-scale patterns |
Country Status (4)
Country | Link |
---|---|
US (1) | US6100990A (en) |
EP (1) | EP1061357B1 (en) |
JP (1) | JP2001066223A (en) |
CA (1) | CA2353301A1 (en) |
Families Citing this family (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6208412B1 (en) | 1999-06-14 | 2001-03-27 | Visteon Global Technologies, Inc. | Method and apparatus for determining optical quality |
US6985231B2 (en) * | 2001-09-20 | 2006-01-10 | Strainoptics, Inc. | Method and apparatus for measuring the optical quality of a reflective surface |
FR2830079B1 (en) * | 2001-09-26 | 2004-04-30 | Holo 3 | METHOD AND DEVICE FOR MEASURING AT LEAST ONE GEOMETRIC SIZE OF AN OPTICALLY REFLECTIVE SURFACE |
EP1429113A4 (en) * | 2002-08-01 | 2006-06-14 | Asahi Glass Co Ltd | Curved shape inspection method and device |
DE10300482B3 (en) * | 2003-01-08 | 2004-07-08 | Uwe Peter Braun | Method and device for detecting surface defects on workpieces with shiny surfaces |
GB0415916D0 (en) * | 2004-07-16 | 2004-08-18 | Pilkington Plc | Glazing inspection |
JP4883517B2 (en) * | 2004-11-19 | 2012-02-22 | 学校法人福岡工業大学 | Three-dimensional measuring apparatus, three-dimensional measuring method, and three-dimensional measuring program |
CN101297192B (en) * | 2005-09-09 | 2012-05-30 | 萨克米伊莫拉机械合作社合作公司 | Method and device for directly monitoring object |
EP2025445B1 (en) * | 2005-09-12 | 2013-05-29 | Paul Müller GmbH & Co. KG Unternehmensbeteiligungen | Spindle with data recording element |
US7474415B2 (en) * | 2006-09-13 | 2009-01-06 | Chung Shan Institute Of Science And Technology, Armaments Bureau, M.N.D. | Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display |
US7471383B2 (en) * | 2006-12-19 | 2008-12-30 | Pilkington North America, Inc. | Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging |
US7663745B2 (en) * | 2007-02-09 | 2010-02-16 | Xerox Corporation | Plural light source and camera to detect surface flaws |
DE102007034689B4 (en) | 2007-07-12 | 2009-06-10 | Carl Zeiss Ag | Method and device for optically inspecting a surface on an object |
EP2063260A1 (en) | 2007-11-19 | 2009-05-27 | Lambda-X | Fourier transform deflectometry system and method |
JP2009126249A (en) * | 2007-11-20 | 2009-06-11 | Honda Motor Co Ltd | Vehicular information display device |
DE102007063530A1 (en) * | 2007-12-27 | 2009-07-16 | Carl Zeiss Ag | Method and device for optically inspecting a surface on an object |
US9846689B2 (en) | 2008-01-29 | 2017-12-19 | Adobe Systems Incorporated | Method and system to provide portable database functionality in an electronic form |
US8285025B2 (en) * | 2008-03-25 | 2012-10-09 | Electro Scientific Industries, Inc. | Method and apparatus for detecting defects using structured light |
CN101676712B (en) * | 2008-09-16 | 2011-03-23 | 中茂电子(深圳)有限公司 | Optical detecting system and method thereof |
FR2936605B1 (en) * | 2008-10-01 | 2014-10-31 | Saint Gobain | DEVICE FOR ANALYZING THE SURFACE OF A SUBSTRATE |
DE102008064562A1 (en) | 2008-12-29 | 2010-07-08 | Carl Zeiss Oim Gmbh | Device for optically inspecting an at least partially shiny surface on an object |
DE102009021733A1 (en) | 2009-05-12 | 2010-12-30 | Carl Zeiss Oim Gmbh | Apparatus and method for optically inspecting an article |
DE102009038965A1 (en) | 2009-08-20 | 2011-03-03 | Carl Zeiss Oim Gmbh | Apparatus and method for optically inspecting a surface on an article |
FR2951544A1 (en) * | 2009-10-21 | 2011-04-22 | Saint Gobain | METHOD FOR ANALYZING THE QUALITY OF A GLAZING |
FR2974414B1 (en) * | 2011-04-22 | 2013-04-12 | Saint Gobain | METHOD FOR ANALYZING THE QUALITY OF A GLAZING |
DE102013216566A1 (en) * | 2013-08-21 | 2015-02-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | DEVICE AND METHOD FOR DETECTING AN AT LEAST PARTIAL MIRRORING SURFACE |
JP6738730B2 (en) * | 2013-10-24 | 2020-08-12 | シグニファイ ホールディング ビー ヴィSignify Holding B.V. | Defect inspection system and method |
FR3015033B1 (en) * | 2013-12-13 | 2015-12-04 | Saint Gobain | METHOD AND DEVICE FOR ANALYZING THE SURFACE OF A SUBSTRATE |
DE102015207213B4 (en) * | 2015-04-21 | 2019-08-29 | Bayerische Motoren Werke Aktiengesellschaft | Apparatus and method for testing discs |
US9952037B2 (en) | 2015-06-26 | 2018-04-24 | Glasstech, Inc. | System and method for developing three-dimensional surface information corresponding to a contoured sheet |
US9952039B2 (en) | 2015-06-26 | 2018-04-24 | Glasstech, Inc. | System and method for measuring reflected optical distortion in contoured panels having specular surfaces |
US9851200B2 (en) | 2015-06-26 | 2017-12-26 | Glasstech, Inc. | Non-contact gaging system and method for contoured panels having specular surfaces |
US9470641B1 (en) | 2015-06-26 | 2016-10-18 | Glasstech, Inc. | System and method for measuring reflected optical distortion in contoured glass sheets |
US9841276B2 (en) | 2015-06-26 | 2017-12-12 | Glasstech, Inc. | System and method for developing three-dimensional surface information corresponding to a contoured glass sheet |
US9933251B2 (en) | 2015-06-26 | 2018-04-03 | Glasstech, Inc. | Non-contact gaging system and method for contoured glass sheets |
CN105067639B (en) * | 2015-07-20 | 2018-03-27 | 丹阳市精通眼镜技术创新服务中心有限公司 | The eyeglass defect automatic detection device and method of a kind of Grating Modulation |
CN105352439B (en) * | 2015-10-26 | 2018-01-30 | 上海交通大学 | Vehicle body parameter measuring system and method based on full raster structure |
WO2018003144A1 (en) * | 2016-06-27 | 2018-01-04 | 新日鐵住金株式会社 | Shape measurement device and shape measurement method |
JP6917781B2 (en) | 2017-05-31 | 2021-08-11 | 株式会社キーエンス | Image inspection equipment |
JP6967373B2 (en) | 2017-05-31 | 2021-11-17 | 株式会社キーエンス | Image inspection equipment |
FR3078161B1 (en) | 2018-02-22 | 2020-03-27 | Saint-Gobain Glass France | METHOD FOR SIMULATING THE OPTICAL POWER OF A LAMINATED GLASS |
FR3090088B1 (en) | 2018-12-12 | 2021-06-18 | Saint Gobain | Method of measuring geometric deviations between the curved surfaces of a plurality of materials to be evaluated and a curved surface of a reference material |
EP3899423B1 (en) * | 2018-12-21 | 2024-04-10 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Device, measurement system and method for capturing an at least partly reflective surface using two reflection patterns |
FR3101420A1 (en) | 2019-09-30 | 2021-04-02 | Saint-Gobain Glass France | Method for evaluating the optical quality of a delimited area of a glazing |
EP4092409A1 (en) | 2021-05-20 | 2022-11-23 | Saint-Gobain Glass France | Method for detecting optical defects within windshield |
EP4170327A1 (en) | 2021-10-22 | 2023-04-26 | Saint-Gobain Glass France | Method and system for detecting optical defects within a glass windshield |
Family Cites Families (44)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4076426A (en) * | 1976-06-29 | 1978-02-28 | Rca Corporation | Method for inspecting cathode-ray-tube window for objectionable cord |
JPS5953483B2 (en) * | 1978-01-27 | 1984-12-25 | 超エル・エス・アイ技術研究組合 | Mirror surface deformation distribution measuring device |
US4255055A (en) * | 1979-05-11 | 1981-03-10 | Libbey-Owens-Ford Company | Surface inspection system for detecting flatness of planar sheet materials |
US4285745A (en) * | 1979-08-01 | 1981-08-25 | Ppg Industries, Inc. | Method of determining optical quality of a laminated article |
US4461570A (en) * | 1982-06-09 | 1984-07-24 | The United States Of America As Represented By The Secretary Of The Air Force | Method for dynamically recording distortion in a transparency |
JPS60119404A (en) * | 1983-12-01 | 1985-06-26 | Nippon Sheet Glass Co Ltd | Inspecting device for distortion of plate glass |
GB8424074D0 (en) * | 1984-09-24 | 1984-10-31 | British Aerospace | Testing light transmitting articles |
JPS62239005A (en) * | 1986-04-11 | 1987-10-19 | Fuji Photo Film Co Ltd | Surface shape inspecting instrument |
JPH0615968B2 (en) * | 1986-08-11 | 1994-03-02 | 伍良 松本 | Three-dimensional shape measuring device |
DE3737632A1 (en) * | 1987-11-05 | 1989-05-24 | Sick Optik Elektronik Erwin | OPTICAL SURFACE RULING MEASURING DEVICE |
US4895448A (en) * | 1988-01-13 | 1990-01-23 | Laird Richard P | Method and apparatus for determining the surface quality of an object |
GB8826224D0 (en) * | 1988-11-09 | 1988-12-14 | Gersan Anstalt | Sensing shape of object |
CH677972A5 (en) * | 1989-01-17 | 1991-07-15 | Kern & Co Ag | |
DE3937559A1 (en) * | 1989-09-02 | 1991-03-14 | Flachglas Ag | METHOD FOR DETECTING OPTICAL ERRORS IN DISC FROM A TRANSPARENT MATERIAL, ESPECIALLY FROM GLASS |
DE4007502A1 (en) * | 1990-03-09 | 1991-09-12 | Zeiss Carl Fa | METHOD AND DEVICE FOR CONTACTLESS MEASUREMENT OF OBJECT SURFACES |
US5343294A (en) * | 1990-03-09 | 1994-08-30 | Carl-Zeiss-Stiftung | Method for analyzing periodic brightness patterns |
DE4007500A1 (en) * | 1990-03-09 | 1991-09-12 | Zeiss Carl Fa | METHOD AND DEVICE FOR CONTACTLESS MEASUREMENT OF OBJECT SURFACES |
WO1992008322A1 (en) * | 1990-10-30 | 1992-05-14 | Simco/Ramic Corporation | Color line scan video camera for inspection system |
US5146293A (en) * | 1991-05-13 | 1992-09-08 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Phase-stepping fiber-optic projected fringe system for surface topography measurements |
US5309222A (en) * | 1991-07-16 | 1994-05-03 | Mitsubishi Denki Kabushiki Kaisha | Surface undulation inspection apparatus |
DE4130237A1 (en) * | 1991-09-11 | 1993-03-18 | Zeiss Carl Fa | METHOD AND DEVICE FOR THE THREE-DIMENSIONAL OPTICAL MEASUREMENT OF OBJECT SURFACES |
US5175601A (en) * | 1991-10-15 | 1992-12-29 | Electro-Optical Information Systems | High-speed 3-D surface measurement surface inspection and reverse-CAD system |
US5225890A (en) * | 1991-10-28 | 1993-07-06 | Gencorp Inc. | Surface inspection apparatus and method |
US5311286A (en) * | 1992-04-01 | 1994-05-10 | Materials Technologies Corporation | Apparatus and method for optically measuring a surface |
US5636025A (en) * | 1992-04-23 | 1997-06-03 | Medar, Inc. | System for optically measuring the surface contour of a part using more fringe techniques |
JP2795595B2 (en) * | 1992-06-26 | 1998-09-10 | セントラル硝子株式会社 | Defect detection method for transparent plate |
US5568258A (en) * | 1992-08-25 | 1996-10-22 | Asahi Glass Company Ltd. | Method and device for measuring distortion of a transmitting beam or a surface shape of a three-dimensional object |
US5319445A (en) * | 1992-09-08 | 1994-06-07 | Fitts John M | Hidden change distribution grating and use in 3D moire measurement sensors and CMM applications |
US5471307A (en) * | 1992-09-21 | 1995-11-28 | Phase Shift Technology, Inc. | Sheet flatness measurement system and method |
US5343288A (en) * | 1992-11-23 | 1994-08-30 | Libbey-Owens-Ford Co. | Optical evaluation of automotive glass |
US5367378A (en) * | 1993-06-01 | 1994-11-22 | Industrial Technology Institute | Highlighted panel inspection |
US5581356A (en) * | 1993-06-14 | 1996-12-03 | Instruments Sa, Inc. | High purity tunable forensic light source |
US5471297A (en) * | 1993-08-31 | 1995-11-28 | Asahi Glass Company Ltd. | Method of and apparatus for measuring optical distortion |
DE4342830C1 (en) * | 1993-12-15 | 1995-04-20 | Haeusler Gerd | Device for producing strip-like light patterns |
DE4415834C2 (en) * | 1994-05-05 | 2000-12-21 | Breuckmann Gmbh | Device for measuring distances and spatial coordinates |
US5557410A (en) * | 1994-05-26 | 1996-09-17 | Lockheed Missiles & Space Company, Inc. | Method of calibrating a three-dimensional optical measurement system |
FR2720831B3 (en) * | 1994-06-02 | 1996-07-12 | Saint Gobain Vitrage | Method for measuring the optical quality of a glazing. |
US5581352A (en) * | 1994-09-22 | 1996-12-03 | Zeien; Robert | Phase shifting device with selectively activated grating generator |
GB9420638D0 (en) * | 1994-10-13 | 1994-11-30 | Moore John H | Three-dimensional digitiser |
JP3178644B2 (en) * | 1995-02-10 | 2001-06-25 | セントラル硝子株式会社 | Defect detection method for transparent plate |
JPH08328150A (en) * | 1995-05-29 | 1996-12-13 | Nippondenso Co Ltd | Projector |
AU683803B2 (en) * | 1995-10-17 | 1997-11-20 | Aluminum Company Of America | Electronic fringe analysis for determining surface contours |
US5646733A (en) * | 1996-01-29 | 1997-07-08 | Medar, Inc. | Scanning phase measuring method and system for an object at a vision station |
DE19643018B4 (en) * | 1996-10-18 | 2010-06-17 | Isra Surface Vision Gmbh | Method and device for measuring the course of reflective surfaces |
-
1999
- 1999-06-14 US US09/332,234 patent/US6100990A/en not_active Expired - Lifetime
-
2000
- 2000-06-05 EP EP00304744A patent/EP1061357B1/en not_active Expired - Lifetime
- 2000-06-14 JP JP2000178140A patent/JP2001066223A/en active Pending
-
2001
- 2001-07-18 CA CA002353301A patent/CA2353301A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP1061357A2 (en) | 2000-12-20 |
JP2001066223A (en) | 2001-03-16 |
US6100990A (en) | 2000-08-08 |
EP1061357A3 (en) | 2002-04-10 |
EP1061357B1 (en) | 2006-05-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CA2353301A1 (en) | Method and apparatus for determining reflective optical quality using gray-scale patterns | |
US6208412B1 (en) | Method and apparatus for determining optical quality | |
Sansoni et al. | A novel, adaptive system for 3-D optical profilometry using a liquid crystal light projector | |
CN110514143B (en) | Stripe projection system calibration method based on reflector | |
Saldner et al. | Profilometry using temporal phase unwrapping and a spatial light modulator based fringe projector | |
US6788210B1 (en) | Method and apparatus for three dimensional surface contouring and ranging using a digital video projection system | |
US5406342A (en) | System for determining the topography of a curved surface | |
CN110207614B (en) | High-resolution high-precision measurement system and method based on double telecentric camera matching | |
WO2001020539A1 (en) | Method and apparatus for three dimensional surface contouring and ranging using a digital video projection system | |
EP0888522A1 (en) | Method and apparatus for measuring shape of objects | |
KR20000071453A (en) | Rangefinder | |
CA2188005A1 (en) | Optical three-dimensional profilometry method based on processing speckle images in partially coherent, light, and interferometer implementing such a method | |
JPH05504842A (en) | Method and device for photoelectrically measuring objects | |
JP2024029135A (en) | Three-dimensional sensor with opposing channels | |
Zhao et al. | Adaptive high-dynamic range three-dimensional shape measurement using DMD camera | |
JPH09218022A (en) | Contour determination method for diffusion surface of work | |
CN113237437A (en) | Structured light three-dimensional shape measuring method and device based on phase coding element | |
JP3344553B2 (en) | Hologram image quality evaluation method and apparatus | |
Schoenleber et al. | Fast and flexible shape control with adaptive LCD fringe masks | |
Tay et al. | Shape identification using phase shifting interferometry and liquid-crystal phase modulator | |
JP2538435B2 (en) | Fringe phase distribution analysis method and fringe phase distribution analyzer | |
Liu et al. | Investigation of phase pattern modulation for digital fringe projection profilometry | |
Ri et al. | Pixel-to-pixel correspondence adjustment in DMD camera by moiré methodology | |
DE60027818T2 (en) | Method and apparatus for determining the reflective optical quality | |
Schwab et al. | Improved micro topography measurement by LCoS-based fringe projection and z-stitching |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FZDE | Discontinued |