CA2367732A1 - Electromagnetic wave generating source probing device, method therefor and analyzing method therefor - Google Patents

Electromagnetic wave generating source probing device, method therefor and analyzing method therefor Download PDF

Info

Publication number
CA2367732A1
CA2367732A1 CA002367732A CA2367732A CA2367732A1 CA 2367732 A1 CA2367732 A1 CA 2367732A1 CA 002367732 A CA002367732 A CA 002367732A CA 2367732 A CA2367732 A CA 2367732A CA 2367732 A1 CA2367732 A1 CA 2367732A1
Authority
CA
Canada
Prior art keywords
method therefor
electromagnetic
electromagnetic wave
electromagnetic field
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002367732A
Other languages
French (fr)
Other versions
CA2367732C (en
Inventor
Kouichi Uesaka
Kenichi Shinbo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi, Ltd.
Kouichi Uesaka
Kenichi Shinbo
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi, Ltd., Kouichi Uesaka, Kenichi Shinbo filed Critical Hitachi, Ltd.
Publication of CA2367732A1 publication Critical patent/CA2367732A1/en
Application granted granted Critical
Publication of CA2367732C publication Critical patent/CA2367732C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells

Abstract

Electromagnetic wave source detecting analyzing apparatus and method that can detect and/or analyze a source of (electromagnetic disturbing wave) representing a main factor in generating an electromagnetic field remotely of the apparatus in order to suppress the electromagnetic field intensity at the remote distance from the apparatus to below a regulated value. A magnetic field near an object is measured by a set of probes. A
position of an electromagnetic wave source is detected using a phase difference between the two probes. A
current distribution on the measured object is determined by solving simultaneous equations containing the position information and magnitudes of measured magnetic fields.
An electromagnetic field at a remote distance from the apparatus is determined from the current distribution to identify the source of the electromagnetic field.
CA002367732A 1999-04-23 2000-04-21 Electromagnetic wave generating source probing device, method therefor and analyzing method therefor Expired - Fee Related CA2367732C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP11117028A JP2000304790A (en) 1999-04-23 1999-04-23 Device and method for investigating electromagnetic wave generating source and method for analyzing the source
JP11/117028 1999-04-23
PCT/JP2000/002623 WO2000065362A1 (en) 1999-04-23 2000-04-21 Electromagnetic wave generating source probing device, method therefor and analyzing method therefor

Publications (2)

Publication Number Publication Date
CA2367732A1 true CA2367732A1 (en) 2000-11-02
CA2367732C CA2367732C (en) 2007-01-09

Family

ID=14701665

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002367732A Expired - Fee Related CA2367732C (en) 1999-04-23 2000-04-21 Electromagnetic wave generating source probing device, method therefor and analyzing method therefor

Country Status (7)

Country Link
US (2) US6411104B1 (en)
EP (1) EP1174722A4 (en)
JP (1) JP2000304790A (en)
KR (1) KR20020005701A (en)
CN (1) CN1193239C (en)
CA (1) CA2367732C (en)
WO (1) WO2000065362A1 (en)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000304790A (en) * 1999-04-23 2000-11-02 Hitachi Ltd Device and method for investigating electromagnetic wave generating source and method for analyzing the source
JP2001311756A (en) * 2000-04-28 2001-11-09 Advantest Corp Field distribution measuring method and measuring device
JP4003403B2 (en) * 2001-03-16 2007-11-07 株式会社日立製作所 Electromagnetic source search method
JP2004020403A (en) * 2002-06-18 2004-01-22 Hitachi Ltd Electronic equipment display device, electronic equipment, and its manufacturing method
JP2004069372A (en) * 2002-08-02 2004-03-04 Taiyo Yuden Co Ltd Method, apparatus and program for calculating intensity of distant electromagnetic field, and recording medium recording the program
US6963301B2 (en) * 2002-08-19 2005-11-08 G-Track Corporation System and method for near-field electromagnetic ranging
US7298314B2 (en) * 2002-08-19 2007-11-20 Q-Track Corporation Near field electromagnetic positioning system and method
US7307595B2 (en) * 2004-12-21 2007-12-11 Q-Track Corporation Near field location system and method
US7414571B2 (en) * 2002-08-19 2008-08-19 Q-Track Corporation Low frequency asset tag tracking system and method
CN100338478C (en) * 2002-08-19 2007-09-19 Q－Track股份有限公司 Near field electromagnetic positioning system and method
AU2003296197A1 (en) * 2002-12-16 2004-07-09 Wei Wu Emi measuring method and its system
JP4481578B2 (en) * 2003-02-28 2010-06-16 パナソニック株式会社 Electromagnetic wave measuring apparatus and method
JPWO2004109560A1 (en) * 2003-06-05 2006-07-20 富士通株式会社 Electromagnetic field intensity calculation device and calculation method by cooperation of circuit analysis and electromagnetic wave analysis
FR2871580B1 (en) * 2004-06-09 2006-10-27 Inrets LOCATION OF AN ELECTROMAGNETIC RADIATION SOURCE ON AN ELECTRICAL EQUIPMENT
JP4635544B2 (en) * 2004-09-29 2011-02-23 株式会社日立製作所 Electric field distribution measuring method and electric field distribution measuring apparatus
US7242176B2 (en) * 2004-12-20 2007-07-10 Dell Products, L.P. Systems and methods for evaluating electromagnetic interference
US7642973B2 (en) * 2004-12-22 2010-01-05 Panasonic Corporation Electromagnetic wave analysis apparatus and design support apparatus
EP1837666A4 (en) * 2005-01-11 2011-08-24 Taiyo Yuden Kk Electromagnetic field distribution measuring method and apparatus thereof, computer program and information recording medium
JP4619799B2 (en) * 2005-01-20 2011-01-26 太陽誘電株式会社 Electric field vector calculation method and apparatus, electric field vector calculation program, and recording medium recording the program
CN100392414C (en) * 2005-04-15 2008-06-04 中兴通讯股份有限公司 Method and device for measuring electromagnetic radiation source in electronic device
JP5170955B2 (en) * 2005-12-13 2013-03-27 パナソニック株式会社 Electromagnetic wave measuring method and electromagnetic wave measuring device
DE102006029122A1 (en) * 2006-06-22 2007-12-27 Amedo Gmbh System for determining the position of a medical instrument
CN101191806B (en) * 2006-11-29 2011-03-30 比亚迪股份有限公司 Apparatus and method for testing automobile electromagnetic sensitivity
US9063180B2 (en) * 2007-08-29 2015-06-23 Kanazawa University Electromagnetic field space distribution visualizing device, electromagnetic field space distribution visualizing method, and program thereof
US20090186588A1 (en) * 2008-01-18 2009-07-23 Nokia Corporation Method and apparatus for determining context information using electromagnetic interference patterns
JP5410827B2 (en) * 2009-04-30 2014-02-05 パナソニック株式会社 Electromagnetic wave source determination method and apparatus
JP5362599B2 (en) * 2010-01-26 2013-12-11 株式会社日立製作所 Electromagnetic source exploration method, electromagnetic source exploration program, electromagnetic source exploration device
DE102011088171A1 (en) * 2011-12-09 2013-06-13 Rhode & Schwarz Gmbh & Co. Kg Method for contactless measurement of electric field distribution in to-be tested electronic component, involves emitting or transmitting microwave signals from electronic component to be tested
CN102590642A (en) * 2012-02-29 2012-07-18 北京无线电计量测试研究所 Calibrating method and system for field uniformity of transient electromagnetic field
FR2998675B1 (en) * 2012-11-27 2015-08-07 Eads Europ Aeronautic Defence NEAR FIELD MEASURING DEVICE
US9285411B2 (en) * 2013-07-25 2016-03-15 Hitachi, Ltd Method and system for identifying an electrical noise propagation path
JP6469388B2 (en) * 2014-08-27 2019-02-13 株式会社デンソーテン Electric field strength calculation program, electric field strength calculation device, and electric field strength calculation method
JP6375956B2 (en) * 2015-01-15 2018-08-22 Tdk株式会社 Equivalent electric field strength estimation method and radiated disturbance measurement apparatus
JP7183907B2 (en) * 2019-03-27 2022-12-06 Tdk株式会社 Electromagnetic wave measurement point calculation program and radiated interference wave measurement device
CN114441865B (en) * 2022-02-10 2022-08-05 北京为准智能科技有限公司 Portable electromagnetic wave intensity distributed detection system based on smart phone

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4713768A (en) 1984-02-20 1987-12-15 Hitachi, Ltd. Method of localizing a moving body
CA1286724C (en) * 1986-03-27 1991-07-23 Richard Ralph Goulette Method and apparatus for monitoring electromagnetic emission levels
US5300879A (en) * 1990-06-18 1994-04-05 Nec Corporation Bidimensional electromagnetic emission level monitoring equipment
US5414366A (en) * 1991-04-29 1995-05-09 Electronic Development, Inc. Electromagnetic field susceptibility test apparatus and methods
JPH04329376A (en) 1991-04-30 1992-11-18 Nippon Telegr & Teleph Corp <Ntt> Electromagnetic interference source position estimating method
US5311116A (en) * 1992-04-02 1994-05-10 Electronic Development, Inc. Multi-channel electromagnetically transparent voltage waveform monitor link
JPH05281274A (en) 1992-04-03 1993-10-29 Nippon Telegr & Teleph Corp <Ntt> Three-dimensional disturbing wave source detector
KR950012094A (en) * 1993-10-04 1995-05-16 가나이 쯔또무 Physical property information measuring device
JPH07181209A (en) 1993-12-24 1995-07-21 Sharp Corp Passive imaging method of electromagnetic radiation source
DE69528479T2 (en) * 1994-01-12 2003-05-15 Advantest Corp display device
JPH10142275A (en) 1996-11-11 1998-05-29 Nec Corp Plane magnetic field measuring system
JP3684051B2 (en) * 1997-10-24 2005-08-17 株式会社リコー Electromagnetic interference measurement device
US6249248B1 (en) * 1998-04-17 2001-06-19 Advantest Corporation Radio wave visualizing method and apparatus
JP3709708B2 (en) * 1998-04-17 2005-10-26 株式会社日立製作所 Electromagnetic wave source exploration device and exploration method thereof
JP2000304790A (en) * 1999-04-23 2000-11-02 Hitachi Ltd Device and method for investigating electromagnetic wave generating source and method for analyzing the source

Also Published As

Publication number Publication date
CN1352745A (en) 2002-06-05
EP1174722A4 (en) 2008-08-20
JP2000304790A (en) 2000-11-02
CN1193239C (en) 2005-03-16
CA2367732C (en) 2007-01-09
EP1174722A1 (en) 2002-01-23
US20020153904A1 (en) 2002-10-24
US6617860B2 (en) 2003-09-09
KR20020005701A (en) 2002-01-17
WO2000065362A1 (en) 2000-11-02
US6411104B1 (en) 2002-06-25

Similar Documents

Publication Publication Date Title
CA2367732A1 (en) Electromagnetic wave generating source probing device, method therefor and analyzing method therefor
US5093622A (en) Method and apparatus for determining direction to and position of an underground conductor
CN101365966B (en) A method of and apparatus for detecting a current carrying conductor
EP0977057A3 (en) Detecting tool motion effects on nuclear magnetic resonance measurements
CA2025088A1 (en) Device for locating a boring machine
CA2335499A1 (en) Apparatus for detecting metals
CA2342647A1 (en) Super sensitive eddy-current system and method
CN101248372A (en) A method of and apparatus for determining if a buried current carrying conductor is buried above a predetermined minimum depth
US5654637A (en) Method for detecting buried high conductivity objects including scaling of voltages for eliminating noise of a particular depth
GB9910932D0 (en) Measurement of magnetic fields
CN110703336B (en) Cable positioning method based on weak magnetic detection technology
DE50013642D1 (en) METHOD AND DEVICE FOR INITIATING DETERMINATION OF THE CONVERSION RATE OF A NONMAGNETIC PHASE TO A FERROMAGNETIC PHASE OF A METALLIC WORKPIECE
US5808466A (en) Process and device for high speed measurement and characterization of magnetic materials
CN109187638A (en) A kind of high s/n ratio vortex thermal imaging testing method based on direction modulation
JP3685991B2 (en) Signal measuring method and position measuring method having noise removal function
JP3072304B2 (en) Metal detection method
JPH0353155A (en) Detector for internal defect or damage for steel material
JPS62502566A (en) Underground cable detection device and method for detecting such cables
JP3035724B2 (en) Metal detection method
JP3225517B2 (en) Calculation method of voltage waveform deviation rate
JP2003194780A (en) Iron oxide layer inspecting apparatus and method
ES2127155A1 (en) Process and apparatus for the identification of metal disc-shaped pieces
CN111722022B (en) Cable path detection method based on weak magnetic signal measurement
KR100443741B1 (en) Detection system of magnetic permeability for ferrite core by induction formula of magnetic field
JP2002040154A (en) Method and apparatus for use in location of conductor

Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed

Effective date: 20150421