CN100501434C - Method for parallel detecting synchronous communication chips - Google Patents
Method for parallel detecting synchronous communication chips Download PDFInfo
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- CN100501434C CN100501434C CNB2005101112927A CN200510111292A CN100501434C CN 100501434 C CN100501434 C CN 100501434C CN B2005101112927 A CNB2005101112927 A CN B2005101112927A CN 200510111292 A CN200510111292 A CN 200510111292A CN 100501434 C CN100501434 C CN 100501434C
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CNB2005101112927A CN100501434C (en) | 2005-12-08 | 2005-12-08 | Method for parallel detecting synchronous communication chips |
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CNB2005101112927A CN100501434C (en) | 2005-12-08 | 2005-12-08 | Method for parallel detecting synchronous communication chips |
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CN1979202A CN1979202A (en) | 2007-06-13 |
CN100501434C true CN100501434C (en) | 2009-06-17 |
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Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101770967A (en) * | 2009-01-03 | 2010-07-07 | 上海芯豪微电子有限公司 | Test method, device and system of common substrate integrated circuit |
CN102520340B (en) * | 2012-01-06 | 2016-08-03 | 日月光半导体制造股份有限公司 | There is semiconductor encapsulated element and the method for testing thereof of test structure |
CN104215843B (en) * | 2013-06-05 | 2017-08-08 | 上海华虹宏力半导体制造有限公司 | Improve the chip array method of chip simultaneous test |
CN106872874A (en) * | 2015-12-11 | 2017-06-20 | 华大半导体有限公司 | One kind concentrates CP method of testings for RFID label chip |
CN107918086A (en) * | 2017-11-09 | 2018-04-17 | 武汉理工大学 | One kind communication parallel intelligent detecting method of wire rod |
CN108008275B (en) * | 2017-11-20 | 2020-05-01 | 上海华力微电子有限公司 | System-on-chip production method with fault diagnosis function |
CN108919006A (en) * | 2018-07-12 | 2018-11-30 | 长江存储科技有限责任公司 | Interface Expanding mould group, aging testing system, ageing testing method and storage medium |
CN111983270A (en) * | 2020-07-30 | 2020-11-24 | 华润赛美科微电子(深圳)有限公司 | Expansion circuit, tester and test method |
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Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20140108 |
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Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI |
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Effective date of registration: 20140108 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Patentee after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Patentee before: Shanghai Huahong NEC Electronics Co., Ltd. |