CN100504419C - Apparatus and method for testing photoelectric characteristic of thermo-optic switch array - Google Patents
Apparatus and method for testing photoelectric characteristic of thermo-optic switch array Download PDFInfo
- Publication number
- CN100504419C CN100504419C CNB2005100786104A CN200510078610A CN100504419C CN 100504419 C CN100504419 C CN 100504419C CN B2005100786104 A CNB2005100786104 A CN B2005100786104A CN 200510078610 A CN200510078610 A CN 200510078610A CN 100504419 C CN100504419 C CN 100504419C
- Authority
- CN
- China
- Prior art keywords
- thermo
- switch array
- test
- optical switch
- port
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Use Of Switch Circuits For Exchanges And Methods Of Control Of Multiplex Exchanges (AREA)
- Semiconductor Lasers (AREA)
Abstract
The invention relates to a thermal-optical switch array optical electric property tester, which comprises a microprocessor test control part, a test signal processing circuit, a thermal-optical switch array driving circuit, a speed test port, a tested thermal-optical switch array, detector and ondoscope, wherein the test signal processing circuit via communicating with microprocessor test control part obtains control signal, and inputs the processed test signal to relative thermal-optical switch driving circuit, to change the state of light path. The invention uses computer to control the thermal-optical switch unit of light path in right switch state, to complete the switch function of light path; and it detects the output light power and driving current of each port, to test the characteristic parameters of optical switch array, and the kept speed test port can easily test the switch speed of thermal-optical switch. The invention simplifies the process and improves the testing efficiency.
Description
Technical field
The present invention relates to the technical field of measurement and test of semiconductor photoelectronic device, be meant a kind of photoelectric characteristic of thermo-optic switch array proving installation and method that realizes that multinomial hot light switch feature parameter detects simultaneously especially.
Background technology
Dense wave division multipurpose (DWDM) technology is a kind of effective ways that solve broadband, high capacity optical fiber network communication.Thermo-optical switch is the critical component of structure dwdm system.In the research and production of thermo-optical switch, need a kind of specific checkout equipment, this equipment can detect the various optics of each port of thermo-optical switch and the overall characteristic parameter of electricity simultaneously, can possess higher detection efficient again, also simple to operate simultaneously, be fit to common operator and use.Trade information up to now and open source literature show still do not have the proving installation that satisfies above-mentioned requirements in present existing test mode and the testing apparatus.Mainly there is following defective in currently used test mode: the one, and adopt and utilize tip probe Direct Contact Heating electrode to cause the damage of heating electrode easily; The 2nd, the tip probe will be finished at microscopically with contacting of heating electrode, operation inconvenience and makeing mistakes easily; The 3rd, to finish by artificial calculating the judgement of light path, be not suitable for the test of extensive array of photoswitch; The 4th, test process needs a plurality of expensive precision currents source, and these equipment costs are very high, and also very high to the requirement of test environment.
Summary of the invention
The object of the present invention is to provide a kind of photoelectric characteristic of thermo-optic switch array proving installation, it has the advantage that cost is low, simple to operate, testing efficiency is high.
Designed a kind of photoelectric characteristic of thermo-optic switch array proving installation according to above-mentioned purpose, comprise microprocessor test control section, level shifting circuit, the test signal treatment circuit, the thermo-optical switch array column drive circuit, the velocity test port, the thermo-optic switch array that is connected with thermo-optical switch array column drive circuit and velocity test port, the detector that the thermo-optic switch array output power is measured.Wherein, microprocessor test control section is a PC, utilizes the parallel port communications control software to be connected with test signal level conversion and treatment circuit by strengthening parallel port (EPP parallel port).The test signal treatment circuit is complex programmable gate array (CPLD), links to each other with the thermo-optical switch array column drive circuit.The thermo-optical switch array column drive circuit is connected with thermo-optical switch chip heater electrode after the pressure welding by the velocity test port.Wherein, the effect of thermo-optical switch array column drive circuit is to provide the different driving electric current for different thermo-optical switchs unit.Used detector is that the detector number is corresponding with the output port number in order to the detector of reception photoswitch output port luminous power parameter.The velocity test port directly is connected with the thermo-optical switch chip heating electrode of drawing after the pressure welding, can the adjustable square wave driving signal of independent loads size of current.
The present invention by thermo-optical switch control and driving circuit control thermo-optic switch array state, realizes the switching of light path at different passages by computing machine, and the detector of each output port is surveyed the luminous power P of output simultaneously
o, the drive current size in the device also can utilize instrument to measure easily simultaneously.The parameter that the present invention detects has contained the normal attribute parameter of thermo-optical switch, as Output optical power with the P that concerns of working current
o-I
OpCurve, loss and working current concern Loss-I
OpCurve, and crosstalk, operating power, switching speed etc.; Once can finish the test of thermo-optical switch normal attribute with an equipment, and simple to operate, improve detection efficiency greatly.
Described microprocessor test control section is a PC, utilize parallel interface, serial line interface, general-purpose serial bus USB interface, or send the test steering order by industry standard architecture isa bus, peripheral component interconnect pci bus or other special purpose interface.
The test signal that microprocessor sends will be input to described test signal treatment circuit through described level shifting circuit.
Described test signal treatment circuit is complex programmable gate array (CPLD), comprises order register, command decoder, data register, output data register and on off state storer.
Described thermo-optical switch array column drive circuit can provide different drive currents for different thermo-optical switchs unit, makes each thermo-optical switch unit be in best delustring state.
The drive current size that described thermo-optical switch drive current can provide can be regulated.
The velocity test port can the adjustable square wave driving signal of independent loads size of current.
Described detector is that the detector number is corresponding with the output port number in order to the detector of reception thermo-optical switch output port luminous power parameter.
Described thermo-optical switch array is fixed on the special-purpose circuit board when being listed in test, links to each other with driving circuit by extension line after the pressure welding of thermo-optic switch array chip well heater pin.
Described tested thermo-optic switch array chip well heater adopts the mode of spun gold or Si-Al wire pressure welding to draw.
Description of drawings
For further specifying content of the present invention and characteristics, below in conjunction with drawings and Examples the present invention is done a detailed description, wherein:
Fig. 1 is the block scheme of proving installation of the present invention.
Fig. 2 is the circuit theory synoptic diagram of one embodiment of the invention.
Fig. 3 is a thermo-optical switch array column drive circuit principle schematic of the present invention.
Fig. 4 is a workflow synoptic diagram of the present invention.
Embodiment
From Fig. 1 as seen, the present invention includes: computing machine 1, level shifting circuit 2, one group of test signal treatment circuit 3, one group of thermo-optical switch array column drive circuit 4, thermo-optic switch array 5, velocity test port 6, one group of detector 7.Described computing machine also can be a single-chip microcomputer, adopts the parallel port connected mode between itself and the test signal treatment circuit, and promptly the test signal treatment circuit is connected with computing machine by the EPP parallel port.Thermo-optic switch array then is placed on the circuit board of special reservation, and thermo-optic switch array chip well heater links to each other with driving circuit by the interface on the circuit board.
Fig. 2 has provided a kind of embodiment of device shown in Figure 1, is a kind of test circuit that is suitable for 4 * 4 simplification tree type thermo-optic switch arrays.Among the figure, the computer testing control section is finished the instruction manipulation of computing machine to thermo-optic switch array mainly by the interface of computing machine and test signal treatment circuit.Computer testing software has comprised all possible routing iinformation of thermo-optical switch, it sends detecting information by computing machine EPP parallel port to the test signal treatment circuit, and the test signal treatment circuit sends driving command according to the driving circuit of detecting information to the thermo-optical switch unit of correspondence.Comprise eight road level shifting circuits and test signal treatment circuit among the figure.Level shifting circuit is converted into the compatible mutually level of fiduciary level with subordinate's circuit input with the level of different agreement.In this example, finish by eight impact dampers/line drive U1 by EPP parallel port to the level conversion of test signal treatment circuit.The test signal processing section is finished by CPLD in the present invention, comprise order register, command decoder, data register, output data register, on off state storer, and the state of finally selected thermo-optic switch array, the driving circuit to corresponding thermo-optical switch unit sends driving command.Be input to the detector from the light of each output port output of thermo-optic switch array.
Fig. 3 has provided the schematic diagram of thermo-optical switch array column drive circuit.Come the conducting of controlling and driving triode or end by driving command, thereby provide electric current or power for well heater.Variable resistor R
RarConnect with well heater, thereby can change the switch motion that the electric current that flows through well heater changes the temperature of waveguide phase modulation (PM) arm and then realizes the thermo-optical switch unit by regulating variable-resistance size.
Fig. 4 has provided the method for work of the embodiment of the invention.The present invention is when using, and concrete operations should be followed following steps:
1) send out test signal by Control Software control computer EPP parallel port, this test signal has determined thermo-optic switch array input port and output port; Test signal is imported CPLD after level conversion, CPLD sends driving command according to the state of the selected thermo-optic switch array of test signal and to the driving circuit of the thermo-optical switch of correspondence;
2) according to driving command, the driving triode conducting of corresponding driving circuit or end provides electric current to well heater, regulates the size that corresponding variable-resistance resistance can change drive current successively, monitors the output power of each output port;
3) draw output power with the curve of drive current variations, the pairing electric current of the peak value of output power curve is optimum current;
4) regulate the drive current size that variable-resistance resistance makes each switch element successively and be the optimum drive current value, detect the output power of each output port this moment, by characteristic such as calculate the loss that can obtain thermo-optic switch array, crosstalk; According to p=I
2R can calculate the thermo-optical switch power consumption;
5) deenergization at the square-wave signal of velocity test port loading current adjustable size, detects the output waveform of corresponding port, can measure the response speed of thermo-optical switch;
6) detect whether do not survey port in addition, if all surveyed, end of test (EOT), otherwise repeat above step.
Claims (10)
1. a photoelectric characteristic of thermo-optic switch array proving installation is characterized in that, this device comprises:
Microprocessor test control section,
Level shifting circuit,
The test signal treatment circuit,
The thermo-optical switch array column drive circuit,
The velocity test port,
The thermo-optic switch array that is connected with thermo-optical switch array column drive circuit and velocity test port,
The detector that the thermo-optic switch array output power is measured;
Wherein, microprocessor test control section is connected with level shifting circuit, level shifting circuit is connected with the test signal treatment circuit, the test signal treatment circuit links to each other with the thermo-optical switch array column drive circuit, the thermo-optical switch array column drive circuit is connected with thermo-optic switch array chip heater electrode after the pressure welding by the velocity test port, and detector is connected with thermo-optic switch array chip output mouth.
2. proving installation according to claim 1, it is characterized in that, described microprocessor test control section is a PC, utilize parallel interface, serial line interface, general-purpose serial bus USB interface, or send the test steering order by industry standard architecture isa bus or peripheral component interconnect pci bus.
3. proving installation according to claim 1 is characterized in that, the test signal that microprocessor sends will be input to described test signal treatment circuit through described level shifting circuit.
4. proving installation according to claim 1 is characterized in that, described test signal treatment circuit is the complex programmable gate array, comprises order register, command decoder, data register, output data register and on off state storer.
5. proving installation according to claim 1 is characterized in that, described thermo-optical switch array column drive circuit can provide different drive currents for different thermo-optical switchs unit, makes each thermo-optical switch unit be in best delustring state.
6. proving installation according to claim 1 is characterized in that, described velocity test port can the adjustable square wave driving signal of independent loads size of current.
7. proving installation according to claim 1 is characterized in that, described detector is that the detector number is corresponding with the output port number in order to the detector of reception thermo-optical switch output port luminous power parameter.
8. proving installation according to claim 1 is characterized in that, described thermo-optical switch array is fixed on the special-purpose circuit board when being listed in test, links to each other with driving circuit by extension line after the pressure welding of thermo-optic switch array chip well heater pin.
9. proving installation according to claim 1 is characterized in that, described tested thermo-optic switch array chip heater electrode adopts the mode of spun gold or Si-Al wire pressure welding to draw.
10. photoelectric characteristic of thermo-optic switch array method of testing, its step is as follows:
1) send out test signal by Control Software control computer EPP parallel port, this test signal has determined thermo-optic switch array input port and output port; Test signal is imported CPLD after level conversion, CPLD sends driving command according to the state of the selected thermo-optic switch array of test signal and to the driving circuit of the thermo-optical switch of correspondence;
2) according to driving command, the driving triode conducting of corresponding driving circuit or end provides electric current to well heater, regulates the size that corresponding variable-resistance resistance can change drive current successively, monitors the output power of each output port;
3) draw output power with the curve of drive current variations, the pairing electric current of the peak value of output power curve is optimum current;
4) regulate the drive current size that variable-resistance resistance makes each switch element successively and be the optimum drive current value, detect the output power of each output port this moment, by calculating loss, the crosstalk effect that can obtain thermo-optic switch array; According to P=I
2R can calculate the thermo-optical switch power consumption;
5) deenergization at the square-wave signal of velocity test port loading current adjustable size, detects the output waveform of corresponding port, can measure the response speed of thermo-optical switch;
6) detect whether do not survey port in addition, if all surveyed, end of test (EOT), otherwise repeat above step.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100786104A CN100504419C (en) | 2005-06-20 | 2005-06-20 | Apparatus and method for testing photoelectric characteristic of thermo-optic switch array |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100786104A CN100504419C (en) | 2005-06-20 | 2005-06-20 | Apparatus and method for testing photoelectric characteristic of thermo-optic switch array |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1885054A CN1885054A (en) | 2006-12-27 |
| CN100504419C true CN100504419C (en) | 2009-06-24 |
Family
ID=37583315
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2005100786104A Expired - Fee Related CN100504419C (en) | 2005-06-20 | 2005-06-20 | Apparatus and method for testing photoelectric characteristic of thermo-optic switch array |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100504419C (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5024356B2 (en) | 2009-11-09 | 2012-09-12 | 株式会社村田製作所 | Electrical characteristic measurement board |
| CN108008551A (en) * | 2017-12-15 | 2018-05-08 | 湖北工业大学 | A kind of thermo-optical switch and its manufacture method based on SU8 glue |
| CN110596432A (en) * | 2019-09-09 | 2019-12-20 | 武汉电信器件有限公司 | Test system for multidirectional photoelectric device |
| CN113176497B (en) * | 2021-04-21 | 2022-05-27 | 之江实验室 | Calibration method for switch unit in integrated optical switching chip |
| CN115372779B (en) * | 2022-08-18 | 2024-04-05 | 无锡芯光互连技术研究院有限公司 | Method and device for testing working state of thermo-optical switch array |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020018265A1 (en) * | 2000-05-30 | 2002-02-14 | Graves Alan F. | Dispersion discrimination and compensation system and optical switch for use therewith |
| US6504965B2 (en) * | 2000-12-07 | 2003-01-07 | Intel Corporation | Method and apparatus for self-testing and maintaining alignment of an optical beam in an optical switch |
| US6738543B1 (en) * | 2002-05-30 | 2004-05-18 | E. I. Du Pont De Nemours And Company | Hitless tunable wavelength filters |
| JP4204068B2 (en) * | 1995-12-20 | 2009-01-07 | ビーエーエスエフ ソシエタス・ヨーロピア | Stabilized hydroxylamine solution |
-
2005
- 2005-06-20 CN CNB2005100786104A patent/CN100504419C/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4204068B2 (en) * | 1995-12-20 | 2009-01-07 | ビーエーエスエフ ソシエタス・ヨーロピア | Stabilized hydroxylamine solution |
| US20020018265A1 (en) * | 2000-05-30 | 2002-02-14 | Graves Alan F. | Dispersion discrimination and compensation system and optical switch for use therewith |
| US6504965B2 (en) * | 2000-12-07 | 2003-01-07 | Intel Corporation | Method and apparatus for self-testing and maintaining alignment of an optical beam in an optical switch |
| US6738543B1 (en) * | 2002-05-30 | 2004-05-18 | E. I. Du Pont De Nemours And Company | Hitless tunable wavelength filters |
Non-Patent Citations (2)
| Title |
|---|
| SOI热光开关电学模型设计和应用. 李运涛，刘敬伟，陈少武，余金中.光子技术，第1期. 2005 * |
| 光开关矩阵控制和驱动电路及集成技术的研究进展. 李运涛，陈少武，余金中.激光与红外，第35卷第1期. 2005 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1885054A (en) | 2006-12-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN100504419C (en) | Apparatus and method for testing photoelectric characteristic of thermo-optic switch array | |
| CN201898510U (en) | Analyzing device for loss of passive component | |
| CN104090224B (en) | The on-line detecting system of a kind of power diode module working junction temperature and detection method | |
| CN102075242A (en) | Loss analysis device of passive device | |
| CN2624203Y (en) | Semiconductor laser photoelectric testing arrangement | |
| CN101408582B (en) | Method and apparatus for testing circuit board | |
| CN104807594A (en) | Automatic measuring system based on matrix switch | |
| CN101639698A (en) | Electrical test system and method of automotive body based on CAN bus | |
| CN103592477A (en) | Aerospace level capacitor test switch channel | |
| CN108761205A (en) | Cable through and the test method and tester of insulation | |
| CN103344902A (en) | LED transient thermal resistance measuring system | |
| CN100446482C (en) | Optical fiber communication network route signal processor based on FPGA and using method | |
| CN103983856B (en) | A kind of Low Voltage Differential Signal Interface Matching resistance automatic checkout equipment and method | |
| CN105182105A (en) | Automatic testing device for electric control characteristic of microannulus chip | |
| CN101344454A (en) | SLD light source automatic filtering system | |
| CN108738354A (en) | Method and ICT devices for the module comprising at least two LED for checking lighting device | |
| CN201749100U (en) | Device for testing moisture content of wood | |
| CN106681210A (en) | Integrated intelligent sensor system and data collection method | |
| CN202693267U (en) | Optical fiber test apparatus | |
| CN100535675C (en) | Portable multi-channel photoelectronic chip detection signal generating device and detection method | |
| CN108107773A (en) | A kind of multichannel data acquisition system | |
| CN104634398B (en) | A kind of excitation circuit adds high pressure system and method | |
| CN105242073A (en) | Constant temperature hot wire wind-velocity indicator detection system | |
| CN205157579U (en) | Thermostatic type hot wire anemometer detecting system | |
| CN102692941A (en) | Self-adaptive control device of optical characteristic point light intensity |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090624 Termination date: 20100620 |