CN100559196C - Universal testing interface device and universal test system thereof - Google Patents
Universal testing interface device and universal test system thereof Download PDFInfo
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- CN100559196C CN100559196C CNB2005100485840A CN200510048584A CN100559196C CN 100559196 C CN100559196 C CN 100559196C CN B2005100485840 A CNB2005100485840 A CN B2005100485840A CN 200510048584 A CN200510048584 A CN 200510048584A CN 100559196 C CN100559196 C CN 100559196C
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Abstract
The present invention relates to a kind of its universal test system of interfacing equipment that electrical equipment is tested of being used for, belong to the observation and control technology field.A kind of universal test interface, comprise system controller, acquisition control system, system controller and instrument control bus link together, acquisition control system comprises digital watch, AD acquisition module, function generator, oscillograph, matrix switch, direct supply and all modules of AC power, above-mentioned module links together by the instrument control bus, above-mentioned module also is connected with universal test interface by system's line, universal test interface provides electric interfaces general, standard, is used for carrying out general electric and mechanical splice with the adapter of finishing different task.Realize a plurality of different tested objects are detected by changer adapter more, private adapter is connected by universal test interface with detection system, finishes different test assignments.
Description
Technical field
The present invention relates to a kind of its universal test system of interfacing equipment that electrical equipment is tested of being used for, belong to the observation and control technology field.
Background technology
The existing interfacing equipment that electrical equipment is tested belongs to tailored version equipment, adapter by functions such as system controller, special-purpose acquisition control system and special-purpose realization such as power supply, signal condition, impedance matching, level conversion, signal links constitutes, adapter is and the corresponding parts in measurand UUT unit, and it is used for carrying out the electric coupling between testing apparatus and the UUT unit.Acquisition control system generally according to specific test needs by several the constituting in the modules such as digital watch, AD acquisition module, function generator, oscillograph, matrix switch, direct supply, AC power, finish specific task.As seen, existing checkout equipment only can be tested a certain specific object, thereby checkout equipment and support equipment present diversification, complicated characteristics.And checkout equipment maneuverability is poor, the manning is many, the expense expenditure is high, forms huge guarantee position and servicing area, has had a strong impact on the raising of usefulness.
Summary of the invention
At the problems referred to above, the invention purpose is, a kind of universal testing interface device is provided, under the prerequisite that guarantees the testing apparatus function,, can be connected with a plurality of special adapters of setting with a general test interface, finish test assignment to multiple electrical equipment, reduce the kind of equipment as far as possible, and then reduce the maintenance cost of equipment, improve usefulness.Simultaneously, the invention purpose also is to provide a kind of universal test system.
For achieving the above object, technical scheme of the present invention is: a kind of universal test interface, comprise system controller, acquisition control system, system controller and instrument control bus link together, it is characterized in that, acquisition control system comprises digital watch, the AD acquisition module, function generator, oscillograph, matrix switch, the all modules of direct supply and AC power, above-mentioned module links together by the instrument control bus, above-mentioned module also is connected with universal test interface by system's line, it is general that universal test interface provides, the electric interfaces of standard, wherein each interface is connected to the test/excitation port and the matrix switch port of acquisition control system, universal test interface is used for carrying out general electric and mechanical splice with the adapter of finishing different task electric and mechanically all set accordingly.
Universal test interface is according to the difference of signal type, can select plain bore, micro coaxle hole, contact hole form that the coaxial aperture class is different for use, represents which kind of system resource to carry out electric regulation to each contact hole simultaneously.
PXI, VXI, GPIB, Serial or the PC_DAQ that described instrument control bus is a standard (being PC card) instrument control bus.
Simultaneously, a kind of universal test system of the present invention, comprise system controller, acquisition control system, system controller and instrument control bus link together, it is characterized in that, acquisition control system comprises digital watch, the AD acquisition module, function generator, oscillograph, matrix switch, the all modules of direct supply and AC power, above-mentioned module links together by the instrument control bus, above-mentioned module also is connected with universal test interface by system's line, it is general that universal test interface provides, the electric interfaces of standard, wherein each interface is connected to the test/excitation port and the matrix switch port of acquisition control system, universal test interface is electric and mechanically all set accordingly, be used for carrying out general electric and mechanical splice, be connected with the different adapter of finishing different task on the universal test interface replaceably with the adapter of finishing different task.
Universal test interface is according to the difference of signal type, can select plain bore, micro coaxle hole, contact hole form that the coaxial aperture class is different for use, represents which kind of system resource to carry out electric regulation to each contact hole simultaneously.
PXI, VXI, GPIB, Serial or the PC_DAQ that described instrument control bus is a standard (being PC card) instrument control bus.
Different adapter is realized different from power supply, signal condition, impedance matching, level conversion, signal link class function tasks.
Universal detection interface of the present invention and system thereof are based on the integrated acquisition control system of global function, with the modular system resource is platform, realize a plurality of different tested objects are detected by changer adapter more, private adapter is connected by universal test interface with detection system, finishes different test assignments.General detection system has the following advantages: 1. can expand, when increasing UUT, increase corresponding private adapter and cable thereof and get final product.2. can cut out, can match private adapter as required, realize the unitization array mode of system.3. reduce cost, owing to realized General design, same system can test a plurality of tested objects, is equivalent to the function of original a plurality of specialized equipments on function, greatly reduces equipment cost; Concerning the user, because working service personnel's minimizing has also significantly reduced cost of use.Along with the development in technology and market, general detection system certainly will become most economical, the most practical test macro.Miscellaneous electric product must just can dispatch from the factory through detecting, and universal test interface has vast market, is used widely in industries such as household electrical appliances, communications.
Description of drawings
Fig. 1 is the composition synoptic diagram of general detection system of the present invention;
Fig. 2 switch module usage synoptic diagram;
Fig. 3 is the universal test interface outside drawing.
Embodiment
As shown in Figure 1, 2, 3, among Fig. 1, the acquisition control system of general detection system is responsible for providing functions such as signal excitation, signal measurement, signal controlling, power supply, signal switching.Acquisition control system can be present popular all appts control bus PXI, VXI, GPIB, Serial and PC_DAQ (being PC card) etc.
Among Fig. 1, ICA is universal test interface.Its function provides electric interfaces general, standard, and these interfaces are connected to the test/excitation port and the matrix switch port of acquisition control system.Universal test interface is electric and mechanically all carry out corresponding setting in detail, as the design of a normal constraint ITA/ adapter.
Adapter is and the corresponding parts in UUT unit, and it is used for carrying out the electric coupling between testing tool and the UUT unit, realizes functions such as for example power supply, signal condition, impedance matching, level conversion, signal link.
Carry out electric and mechanical connection with adapter one end ITA that is connected and the ICA that is fixed on the VXI cabinet, the UUT plug and the UUT unit of the adapter other end carry out electric and mechanical connection.When changing the UUT unit, then need change corresponding adapter and get final product.
Among Fig. 1, digital watch, AD acquisition module, oscillograph are finished voltage, electric current, frequency, time, the isoparametric measurement of waveform, analytic function as all purpose instrument in system.
Function generator can the output drive signal.
When the signal of non-while of multichannel need be measured, can use the timesharing of matrix switch module to switch to different surveying instruments and measure.
Fig. 2 is the matrix switch synoptic diagram of one 4 row 16 row (4 * 16).1 need then only need (col1, switch closure row2) can be connected to surveying instrument 2 with signal 1 among the figure constantly with instrument 2 measuring-signals 1; Equally, need (col14, switch closure row4) with instrument 4 measuring-signals 14 if need.Note, in same delegation (row), can only simultaneously closed switch; And on same row (col), can simultaneously closed maximum 4 switches.Instrument among the figure can be digital watch, an oscillographic passage, function generator etc.
If will go (row) connect different voltage, switch module can also output instruction signal :+12V ,+5V ,+27V etc. export as steering order.These instructions should be to the undemanding occasion of time requirement, receive instruction such as issuing instructions to controlled device from main frame, and the time-delay of tens ms can be arranged.
To the command signal of time requirement harshness, can export with the IO module.
If there are multiple signals to measure simultaneously, then available AD acquisition module and IO module.Fig. 3 is seen in the profile signal of universal test interface.Its employing standard goes up shelf structure for 19 inches, and 9025 series " mould " (module).According to the difference of signal type, select different contact hole forms for use: plain bore, micro coaxle hole, coaxial aperture; Simultaneously each contact hole is carried out electric regulation: represent which kind of system resource.
Universal test interface shown in Figure 3 is that the center is set up with the VXI system, adopts the VXI cabinet of 13 grooves.It not only provides test resources such as all purpose instrument, also has some special modules.These special modules are finished some specific function at specific test assignment.Each perpendicular row is called " mould " among the figure, and the arrangement of mould is corresponding with the distribution of VXI module.Except that digital watch, all purpose instrument, be that pre-connection device mode is connected between other VXI modules and the universal test interface, promptly connect firmly.When need expanding, system can be used as the pre-connection device of integral replacing VXI module and front end thereof.
Application examples 1: mobile phone test
Circuit board of mobile phone detects need use resources such as function generator, oscillograph, counter, switch module, digital watch: function generator produces AC signal, analog voice signal, whether the input circuit plate is normal with the output waveform of all purpose instruments such as oscillograph, counter observation circuit board; Send instruction with switch module, whether states such as simulation start, shutdown, battery operate as normal, running down of battery respond with the output of digital watch testing circuit plate and to meet design requirement etc.
Application examples 2: tv test
The TV set circuit board test is used resources such as oscillograph, digital watch, switch module, special module: special module is used for producing video, the sound signal of television transmission, whether be input on the circuit board, be design point with the waveform of each test points of observation circuit such as oscillograph, digital watch; Cut various command signals (comprising telecommand and hard start, hard shutdown command) with switch module simultaneously, whether the output response of testing circuit is normal etc.
It should be noted last that: above embodiment is the unrestricted technical scheme of the present invention in order to explanation only, although the present invention is had been described in detail with reference to the foregoing description, those of ordinary skill in the art is to be understood that: still can make amendment or be equal to replacement the present invention, and not breaking away from any modification or partial replacement of the spirit and scope of the present invention, it all should be encompassed in the middle of the claim scope of the present invention.
Claims (7)
1, a kind of universal testing interface device, comprise system controller, acquisition control system, system controller and instrument control bus link together, it is characterized in that, acquisition control system comprises digital watch, the AD acquisition module, function generator, oscillograph, matrix switch, the all modules of direct supply and AC power, above-mentioned module links together by the instrument control bus, above-mentioned module also is connected with universal test interface by system's line, it is general that universal test interface provides, the electric interfaces of standard, wherein each interface is connected to the test/excitation port and the matrix switch port of acquisition control system, universal test interface is used for carrying out general electric and mechanical splice with the adapter of finishing different task electric and mechanically all set accordingly.
2, universal testing interface device according to claim 1, it is characterized in that, universal test interface is according to the difference of signal type, can select plain bore, micro coaxle hole, contact hole form that the coaxial aperture class is different for use, represents which kind of system resource to carry out electric regulation to each contact hole simultaneously.
3, universal testing interface device according to claim 1 and 2 is characterized in that, PXI, VXI, GPIB, Serial or the PC_DAQ that described instrument control bus is a standard (being PC card) instrument control bus.
4, a kind of universal test system, comprise system controller, acquisition control system, system controller and instrument control bus link together, it is characterized in that, acquisition control system comprises digital watch, the AD acquisition module, function generator, oscillograph, matrix switch, the all modules of direct supply and AC power, above-mentioned module links together by the instrument control bus, above-mentioned module also is connected with universal test interface by system's line, it is general that universal test interface provides, the electric interfaces of standard, wherein each interface is connected to the test/excitation port and the matrix switch port of acquisition control system, universal test interface is electric and mechanically all set accordingly, be used for carrying out general electric and mechanical splice, be connected with the different adapter of finishing different task on the universal test interface replaceably with the adapter of finishing different task.
5, universal test system according to claim 4, it is characterized in that, universal test interface is according to the difference of signal type, can select plain bore, micro coaxle hole, contact hole form that the coaxial aperture class is different for use, represents which kind of system resource to carry out electric regulation to each contact hole simultaneously.
6, according to claim 4 or 5 described universal test systems, it is characterized in that PXI, VXI, GPIB, Serial or the PC_DAQ that described instrument control bus is a standard (being PC card) instrument control bus.
7, universal test system according to claim 6 is characterized in that, different adapter is realized different from power supply, signal condition, impedance matching, level conversion, signal link class function tasks.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100485840A CN100559196C (en) | 2005-11-21 | 2005-11-21 | Universal testing interface device and universal test system thereof |
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| Application Number | Priority Date | Filing Date | Title |
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| CNB2005100485840A CN100559196C (en) | 2005-11-21 | 2005-11-21 | Universal testing interface device and universal test system thereof |
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| CN1971296A CN1971296A (en) | 2007-05-30 |
| CN100559196C true CN100559196C (en) | 2009-11-11 |
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| CNB2005100485840A Expired - Fee Related CN100559196C (en) | 2005-11-21 | 2005-11-21 | Universal testing interface device and universal test system thereof |
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| CN102169150B (en) * | 2010-12-30 | 2013-01-02 | 成都芯通科技股份有限公司 | Parallel test system based on matrix switch |
| CN102735881B (en) * | 2011-04-08 | 2014-07-02 | 中国科学院微电子研究所 | VPC-based modular test adapter with the functions of conditioning and hot swapping |
| CN102360046B (en) * | 2011-07-22 | 2013-11-06 | 株洲南车时代电气股份有限公司 | General test method for motor vehicle electrical product |
| CN103163398B (en) * | 2011-12-14 | 2016-01-27 | 中国广核集团有限公司 | Nuclear power station Berea panel reliability detection system and method |
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| CN103913692A (en) * | 2012-12-29 | 2014-07-09 | 北京谊安医疗系统股份有限公司 | Signal conditioning device for testing |
| CN105223429B (en) * | 2014-07-04 | 2018-03-06 | 苏州万龙电气集团股份有限公司 | A kind of multi-module type configuration type detection device |
| CN104614668A (en) * | 2015-02-27 | 2015-05-13 | 北京精密机电控制设备研究所 | Circuit board testing system |
| CN106645812B (en) * | 2016-10-27 | 2019-04-16 | 中国航空工业集团公司洛阳电光设备研究所 | The universal test device that a kind of pair of many types of product of aviation is tested |
| CN106773937A (en) * | 2016-12-09 | 2017-05-31 | 深圳市同立方科技有限公司 | A kind of polymorphic type signal adaptive type teaching training system |
| CN106597159A (en) * | 2016-12-12 | 2017-04-26 | 惠州市德赛西威汽车电子股份有限公司 | Automobile electrical equipment aging durability testing device and method |
| CN109298317A (en) * | 2018-10-13 | 2019-02-01 | 国营芜湖机械厂 | A kind of Intelligent test device and its test method of middle low-frequency channel |
| CN110174531B (en) * | 2019-05-24 | 2021-08-03 | 成都飞机工业（集团）有限责任公司 | Reconfigurable interface circuit for signal path of airplane/suspended object test system |
| CN111366836B (en) * | 2020-02-25 | 2022-03-29 | 上海机电工程研究所 | Safety protection circuit device suitable for test power-up of PCB (printed circuit board) maintenance test equipment |
| CN111665822B (en) * | 2020-06-09 | 2023-01-20 | 湖南中车时代通信信号有限公司 | Vehicle-mounted operation control system testing device |
| CN112083199A (en) * | 2020-09-11 | 2020-12-15 | 中国航空工业集团公司雷华电子技术研究所 | Interface adapter |
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- 2005-11-21 CN CNB2005100485840A patent/CN100559196C/en not_active Expired - Fee Related
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Granted publication date: 20091111 Termination date: 20131121 |