CN100565218C - Integrated circuit test card - Google Patents

Integrated circuit test card Download PDF

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Publication number
CN100565218C
CN100565218C CNB200610008526XA CN200610008526A CN100565218C CN 100565218 C CN100565218 C CN 100565218C CN B200610008526X A CNB200610008526X A CN B200610008526XA CN 200610008526 A CN200610008526 A CN 200610008526A CN 100565218 C CN100565218 C CN 100565218C
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CN
China
Prior art keywords
telecommunication
face
bracing member
top bracing
card extender
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB200610008526XA
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Chinese (zh)
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CN101021549A (en
Inventor
范宏光
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MJC Probe Inc
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MJC Probe Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MJC Probe Inc filed Critical MJC Probe Inc
Priority to CNB200610008526XA priority Critical patent/CN100565218C/en
Publication of CN101021549A publication Critical patent/CN101021549A/en
Application granted granted Critical
Publication of CN100565218C publication Critical patent/CN100565218C/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

A kind of integrated circuit test card comprises: a circuit board, a plurality of contact solder joints; One probe assembly, a telecommunication card extender and a plurality of probe, this telecommunication card extender define the one first telecommunication face and second an opposing with it telecommunication face of electrically conducting, each probe electrically conducting on the first telecommunication face, the second telecommunication face with contact the solder joint electrically conducting; At least one fixation kit that turns to, one adaptation unit and an action cell, adaptation unit has a top bracing member and a fastener, top bracing member is connected in the second telecommunication face with an end, the other end then the position on circuit board, fastener is clamped on the top bracing member of position on circuit board, action cell has the second strain piece that one first strain piece and amplexiforms mutually with the first strain piece, when the uneven crooked situation in plane is arranged between telecommunication card extender and the substrate, mutual offsetting takes place by the first strain piece and the second strain piece, the telecommunication card extender is firmly supportted at predetermined horizontal level, when bearing external force, also can not change position or distortion.

Description

Integrated circuit test card
Technical field
The invention relates to a kind of integrated circuit test card, be meant especially and a kind ofly can appropriateness avoid the plane of probe assembly to be subjected to external force and bending is held in a predetermined horizontal level to keep each probe assembly plane dimension.
Background technology
Generally speaking, whether the integrated circuit that is laid on the wafer must pass through the program of testing its electrical specification in advance, good to differentiate integrated circuit.Good integrated circuit can be selected and carry out follow-up encapsulation procedure, finishes electric test that integrated circuit behind the encapsulation procedure then must carry out another time again filtering out because of the not good defective products that is caused of encapsulation procedure, and then promotes the yield of final finished.In other words, integrated circuit must can become non-defective unit by the electrical characteristics test of several in the process of manufacturing and back system.Whether the mode of testing integrated circuits now is to utilize an integrated circuit test card with a plurality of probes, directly by being contacted with integrated circuit by its probe, good to test out its electrical specification.
But, because in the process of carrying out electrical characteristics test, the plane that weld pad constituted on must parallel in fact this testing component integrated circuit, the plane that each probe tip constituted, can make this each probe on this testing component of contact during corresponding pad, stress application is on each weld pad equably, to set up the relation that is electrically connected, if the plane that the tip constituted of each probe and when being not parallel to this testing component, to cause the part probe to contact, and can't set up the relation that is electrically connected with its corresponding pad.Thus, promptly can not accurately test out the electrical specification of this testing component integrated circuit.
Whether the plane that each probe tip constituted is parallel to this testing component, depends primarily on a probe base of setting up relative position for this each probe.For this each probe can evenly be forced on the weld pad of this testing component, with present prior art, mainly be to utilize a differential screw to adjust the level of this probe base, be by by the level of probe base of differential screw microcall with the carrying probe.But differential screw has loosening situation and takes place when long-term the use, makes the plane of probe assembly keep being difficult for.
Summary of the invention
In view of this, fundamental purpose of the present invention is that a kind of integrated circuit test card is being provided, be can stationary probe the plane of assembly make its position and angle not be subjected to external force and make a variation, especially for the larger area probe assembly, middle section is that intensity is subject to external force a little less than and is out of shape, the present invention can be in the firm support of plane middle section, makes that the plane is unlikely to be subjected to external force and to be out of shape.
Edge is that for reaching above-mentioned purpose, a kind of integrated circuit test card provided by the present invention includes: a circuit board has a plurality of contact solder joints; One probe assembly, have a telecommunication card extender and a plurality of probe, this telecommunication card extender can define the one first telecommunication face and second an opposing with it telecommunication face of electrically conducting, this each probe be electrically conducting on this first telecommunication face, this second telecommunication face is to contact the solder joint electrically conducting with this; At least one fixation kit that turns to, have an adaptation unit and an action cell, this adaptation unit has a top bracing member and a fastener, this top bracing member is to be connected in this second telecommunication face with the one end, the other end then the position on this circuit board, this fastener is to be clamped on the top bracing member of position on this circuit board, this action cell has the second strain piece that one first strain piece and amplexiforms mutually with this first strain piece, be to place between this adaptation unit and this circuit board, when the uneven crooked situation in plane is arranged between this telecommunication card extender and the substrate, can by by this first strain piece and this second strain piece mutual offsetting taking place, the space that the angle skew error on two planes is caused can be compensated, and then top bracing member can firmly be fixed on the substrate, and can not be subjected to the crooked influence in both planes.Because top bracing member can be fixed on the substrate really, the telecommunication card extender can firmly be supportted at predetermined horizontal level, when bearing external force, also can not change position or distortion.
For further understanding and approval being arranged, enumerate following preferred embodiment now, and cooperate the graphic back that is illustrated in feature of the present invention and purpose:
Description of drawings
Fig. 1 is the three-dimensional exploded view of the present invention's first preferred embodiment;
Fig. 2 is the three-dimensional exploded view of another angle of preferred embodiment shown in Figure 1;
Fig. 3 is the top surface perspective of preferred embodiment shown in Figure 1;
Fig. 4 is the cut-open view of Fig. 1;
Fig. 5 is the local component decomposition map of preferred embodiment shown in Figure 1;
Fig. 6 is the upright local component decomposition map in another angle of preferred embodiment shown in Figure 1;
Fig. 7 is the local component composition figure of preferred embodiment shown in Figure 1.
Embodiment
See also Fig. 1 to Fig. 7, it is a kind of integrated circuit test card 100 that the present invention's first preferred embodiment is provided, it consists predominantly of a probe assembly 10, a detecting head positioning component 20, an elastic parts 30, a circuit board 40, a substrate 50, a plurality of plane and keeps assembly 60 and turn to fixation kit 70, wherein:
This probe assembly 10 includes a telecommunication card extender 11 and most probes 12.This telecommunication card extender 11 is the plate body of an insulation, in present embodiment is a rectangular plate body, can define one first telecommunication face 111 and one and the second opposing telecommunication face 112 of this first telecommunication face 111, the inside of this telecommunication card extender 11 is formed with the wiring (not shown) that majority is predetermined aspect, and this wiring also is communicated with this first telecommunication face 111 and this second telecommunication face 112, makes the first make contact (not shown) that is formed with a plurality of and this wiring conducting on this first telecommunication face 111 and also is formed with a plurality of and the second contact point (not shown) this wiring conducting on this second telecommunication face; Thus, the electric signal that each first make contact contacted on this first telecommunication face 111 just can be via this wiring conducting to second contact point of this second telecommunication face 112; These probes 12 are respectively the metallic conductor with predetermined elastic force, free end is arranged, be to be connected to each first make contact on these telecommunication card extender 11 first telecommunication faces 111 with the one end respectively according to predetermined aspect, the other end of these probes 12 then stretches out in outside this first telecommunication face 111, by this, the electric signal that these each probe 11 free ends are contacted, just can be by this first make contact, wiring and conducting to second contact point of this second telecommunication face 112.
Detecting head positioning component 20 is functions that snapping and location can only be provided merely, so that this telecommunication card extender 11 is carried out snapping and location; This detecting head positioning component 20 also can have additional elastic force simultaneously, makes to produce this telecommunication card extender 11 of uniform strength snapping, is produced the variation of the position height that tilts slightly when also absorbing snapping telecommunication card extender 11 with the while.
This detecting head positioning component 20 includes a fixed head 21, an interlocking plate 22, a plurality of spring 23 and a buckle 24.Wherein, this fixed head 21 is the hollow framework of a rectangular shape, and is formed with an accommodation space 211; This interlocking plate 22 is a hollow framework, and is formed with a plurality of lockholes that run through 221 on this interlocking plate 22; This interlocking plate 22 is to amplexiform on an end face of this fixed head 21 with one end; This buckle 24 is a rectangular hollow framework, and is formed with a plurality of button holes 241 of wearing, and this buckle 24 is that the free end face with one end and this interlocking plate 22 amplexiforms.
So far, this probe assembly 10 just can set in the accommodation space 211 of this detecting head positioning component 20, and by periphery and this fixed head 21 mutual butts of this first telecommunication face 111, position each probe 12 on this first telecommunication face 111 then energy by this accommodation space 211 outside stretching out in.
This elastic parts 30 includes a ccontaining plate 31 and most elasticity pins 32.This ccontaining plate 31 is an insulating board body, and its periphery is slightly less than the interior week of the accommodation space 211 of this detecting head positioning component 20, and the position then is formed with a perforation 312 in the position of central authorities; This each elasticity pin 32, made by conductive material, be to be placed through in this ccontaining plate 31 according to predetermined aspect, and its two end also stretches out in respectively outside the biend of this ccontaining plate 31, make to stretch out in the outer elasticity pin 32 of these ccontaining plate 31 biends respectively, can define first contact jaw 321 and second contact jaw 322 outside these ccontaining plate 31 other ends outside these ccontaining plate 31 1 end faces.
This elastic parts 30 is the accommodation spaces 211 that place this detecting head positioning component 20, and by first contact jaw 321 of this each elasticity pin 32 and the second contact point butt of this probe assembly 10, but the electrical specification conducting that makes this second contact point is to this elasticity pin 32.
This circuit board 40, be laid with predetermined contact solder joint on the one end, this circuit board 40 also is formed with a plurality of spring containing holes 43 that run through, be to use for the interlocking plate 22 and the buckle 24 of this detecting head positioning component 20 being clamped on this circuit board 40 by penetrating by a plurality of screws 44, so that this circuit board 40 is clamped between the buckle 24 of substrate 50 and positioning component 20, this contact solder joint is contacted with second contact jaw 322 of this elastic parts 30, make probe 12 when this probe assembly 10 contact (not shown) and during electrically conducting with a testing component, it is electric just to pass through this first make contact in regular turn, the wiring of this telecommunication card extender 11, this second contact point, whether first contact jaw 321 of this elasticity pin 32 and this second contact jaw 322 and conducting can be non-defective unit by differentiated this testing component by this circuit board just to this circuit board 40 thus; On this circuit board 40 and the locking hole 41 and that is formed with a plurality of precalculated positions adjust hole 42 in what middle position formed, and this each locking hole 41 and being connected with the through hole 311 of this elastic parts 30 respectively, this is adjusted hole 42 and then is interconnected with this perforation 312.
This substrate 50 can define one first ccontaining 51 and one opposing second ccontaining 52; This central position of first ccontaining 51, be formed with one and connect this open-work of second ccontaining 52 511, on first ccontaining 51 of this substrate 50, be formed with a plurality of locking zones 513, be somebody's turn to do in each locking zone 513 and be formed with one and run through this locking of second ccontaining 52 perforation 514 with the preset width depression.
This substrate 50 is to amplexiform on the free end face of this circuit board 40 with its periphery of first ccontaining 51, and on this first ccontaining 51 and be formed with a plurality of holes 516 of supporting, make this spring containing hole 43 that supports hole 516 and this circuit board and this corresponding, 23 on each spring of this detecting head positioning component 20 is that set is in the spring containing hole 43 of this circuit board 40, and be connected on the bolt 517 that this substrate of position 50 supports in the hole 516 with the one end, the other end then with the wearing on the button hole 541 of this buckle 24, its screw 44 then penetrates in these spring 23 inside, and with the lockhole 221 inner edge butts of its head and this interlocking plate 22, be spirally connected with its afterbody and this bolt 517 again, enable this each spring 23 and produce elastic force, make to produce this telecommunication card extender 11 of uniform strength snapping, produced the variation of the position height that tilts slightly when also absorbing snapping telecommunication card extender 11 with the while.Penetrate and pass this circuit board 40 by a plurality of screws by the ccontaining plate 31 of this elastic parts 30 again and interlocking on this substrate 50, make this substrate 50, circuit board 40 and 30 of this elastic partss form the fixing relation of relative position.Again with fixed head 21 interlockings of this detecting head positioning component 20 on this interlocking plate 22, to fix the relative position of 22 of this fixed head 21 and this interlocking plates.
Assembly 60 is kept on this each plane, includes one respectively and supports a unit 61 and a locking unit 62.This supports unit pack and contains a steel ball 611 and a supporter 612, this steel ball 611 is a Metal Ball body, be that set is in the one through hole 311 of this elastic parts 30, and a bit contact with the second telecommunication face 112 of this probe assembly 10 with its periphery, this supporter 612 is a right cylinder, be to penetrate and pass in these circuit board 40 corresponding locking holes 41 by the one of this substrate 50 locking perforation 514, and penetrate in the through hole 311 of this elastic parts 30, make an end of this supporter 612 and some butts of periphery of this steel ball 611, the other end of this supporter 612 then the position in the locking zone 513 of this substrate 50; This locking unit 62 be the position in this locking zone 513, and form the relation of clampings with this supporter 612, make and can pass through by 62 pairs of these supporter 612 clampings in this locking unit.
This turns to fixation kit 70, includes an adaptation unit 71, an action cell 72 and a locating ring 73.Please cooperate and consult Fig. 7 to Fig. 9, this adaptation unit 71, include a top bracing member 711 and a fastener 712, this top bracing member 711 is a right cylinder, be to penetrate with the open-work 511 of one end by 50 second ccontaining 52 of this substrates, and pass the perforation 311 of adjusting hole 42 and this elastic parts 30 of this circuit board 40 and be connected on the second telecommunication face 112 of this probe assembly 10, the other end is position adjusting in the zone 521 at this substrate 50 then; This fastener 712 is that adjust in the zone 521 at this position, in order to these top bracing member 711 these top bracing members 711 of clamping, by to be kept the horizontal relationship to this probe assembly 10 by this top bracing member 711.
This action cell 72 has and can change form in response to the angle difference on two crooked planes, make two crooked planes can be via this element properly breasting, be to be set in the position outside top bracing member 711, between fastener 712 and substrate 50, fastener 712 can be bearing on the substrate 50 really.
This action cell 72 includes one first strain piece 721 and one second strain piece 722, these first strain piece, 721 shaft core positions are formed with one first axis hole 723, and on one end, be formed with one first offsetting face 725, this first offsetting face 725 is one to be the state of sphere depression gradually toward shaft core position by the end face periphery, these second strain piece, 722 shaft core positions are formed with one second axis hole 724, and on one end, be formed with one second offsetting face 726, this second offsetting face 726 is one to be the state of protruding of sphere toward shaft core position gradually by the end face periphery, make this second offsetting face 726 and this first offsetting face 725 can amplexiform and do the relative angle displacement of appropriateness mutually, this first strain piece 721 and this second strain piece 722 be with its first, the mode that two offsetting faces 725726 amplexiform mutually, wear at this top bracing member 711 of adjusting in the zone 521 for the position with its first axis hole 723 and this second axis hole 724, and amplexiform with the phase back side of the first offsetting face 725 of this first strain piece 721 and second ccontaining 52 of this substrate 50; This adaptation unit 71 is the butts of the back side mutually with the second offsetting face 726 of this second strain piece 722; These locating ring 73 axle center are formed with a spacing hole 731, the aperture of this spacing hole 731 is the external diameters that are slightly larger than this adaptation unit 71, this locating ring 73 also passes through by a plurality of screw interlockings on second ccontaining 52 of this substrate 50, and make this adaptation unit 71 just in this spacing hole 731, in order to limit the position of this adaptation unit 71.
So, above-mentionedly be a kind of integrated circuit provided by the present invention and survey the main composition assembly of formula card 100 and the introduction of assembling mode thereof, then again that its use-pattern and The characteristics thereof is as follows:
Probe 12 is that framework is on telecommunication card extender 11, therefore whether the plane that the tip constituted of all probes 12 is smooth, except the dimensional accuracy of probe 12 good, the surface planarity of telecommunication card extender 11 also is a key takeaway, if but telecommunication card extender 11 does not have suitable strong support, when probe 12 contact measured objects, its reacting force promptly can make its distortion, or long-term use after, connection loosing makes offset, make telecommunication card extender 11 deflections eventually, and then the plane that the tip constituted of all probes 12 is remained on the plane of an expection.
The main emphasis of the present invention is that a strong support structure designs is arranged, and telecommunication card extender 11 can be settled on it stably, still can keep the invariant position of former setting moving through long-term use.The ultimate principle of the supporting construction that this is strong, be to keep assembly 60 with the plane each supporter 621 is locked on the substrate 50 admittedly, to keep a definite precalculated position, when telecommunication card extender 11 is detected the plane that just can keep definitely not change when a positioning component 20 snaps onto on these supporters 621.
If the area of telecommunication card extender 11 hour, as long as periphery has above-mentioned support, can keep an appropriate plane, but when the area of telecommunication card extender 11 is big, must add then that in the position of plate central authorities one or several turn to fixation kit 70, to strengthen the structural strength of plate central authorities, make telecommunication card extender 11, even probe assembly 10 can be not in use, and the reacting force when contacting with determinand is out of shape.
Turning to the top bracing member 711 in the fixation kit 70 is direct and probe assembly 10 bindings, top bracing member 711 is then fixed by fastener 712 clampings, and fastener 712 ring 73 that is positioned is withheld and is fixed on the substrate 50, Gu this top bracing member 711 promptly properly is fixed on the substrate 50, and then but the central part of guaranteeing top bracing member 711 supporting probe assemblies 10 can not be out of shape because of stressed, to keep its flatness.
Because the telecommunication card extender 11 of this probe assembly 10 is when being kept 60 rigid staybolts of assembly and support by this each plane, this telecommunication card extender 11 can be positioned on the certain level position according to be measured actual flat orientation, and top bracing member 711 is direct and telecommunication card extender 11 vertical engagement, corresponding inclination also can be done in its orientation, angle tilt for the top bracing member 711 of arranging in pairs or groups, first strain 721 and the second strain piece 722 have also been made corresponding angle correcting, fastener 712 can be fitted on the substrate 50 via first strain 721 and the second strain piece 722 really, when locating ring 73 is withheld fastener 712, can be securely fixed on the substrate 50.
Fastener 712 has following several embodiment:
(1) fastener 712 has one to place hole 713, its aperture is slightly larger than the diameter of top bracing member 711, top bracing member 711 promptly directly passes this and has placed the hole 13, has a line of rabbet joint 714 to be connected to from its surface working in addition and places hole 713, and the fastener 712 outer clamp shapes that form are enclosed within on the top bracing member 711.When using suitable external force, as screw or cam driving lever, this line of rabbet joint 714 of packing makes that the crack dwindles between the line of rabbet joint 714, then can make the distortion that places of fastener 712, makes its firm top bracing member 711 that vises, and makes both relative positions immobilize moving.
(2) fastener 712 has one to place hole 713, its aperture is slightly larger than the diameter of top bracing member 711, top bracing member 711 promptly directly passes this and places hole 713, there are one or more screws vertically to pass to this from its surface working in addition and place hole 713, use the surface of screw, fastener 712 can be fixed on the top bracing member 711 and not slippage through these screws pushing top bracing members 711.With these modes fixedly the time, hurt the surface of top bracing member 711 when the locking for fear of screw, can be at screw front end pad one cushion block or a pad, with buffering or disperse the forefront pressure of screw; Or on the correct position of top bracing member 711 processing one plane, an or neck, that is screw on these planes or neck extrude the indenture burr, also do not influence its both relative engagement.

Claims (8)

1. an integrated circuit test card is characterized in that, includes:
One circuit board has a plurality of contact solder joints;
One probe assembly, have a telecommunication card extender and a plurality of probe, this telecommunication card extender can define the one first telecommunication face and second an opposing with it telecommunication face of electrically conducting, this each probe be electrically conducting on this first telecommunication face, this second telecommunication face is to contact the solder joint electrically conducting with this;
At least one fixation kit that turns to has an adaptation unit, an action cell and locating ring, and this adaptation unit includes a top bracing member and a fastener;
One detecting head positioning component is to be connected with this circuit board, and this detecting head positioning component includes a fixed head, an interlocking plate, a plurality of spring and a buckle; This fixed head and this interlocking plate are affixed, be formed with a plurality of lockholes that run through on this interlocking plate, this interlocking plate is to amplexiform on an end face of this fixed head with one end, and this buckle is formed with a plurality of button holes of wearing, and this buckle is that the free end face with one end and this interlocking plate amplexiforms; This circuit board forms a plurality of spring containing holes that run through, and inserts respectively for these springs, and is penetrated respectively in this each spring by a plurality of screws, enables to produce elastic force by this each spring;
This top bracing member is to support to arrive in and be incorporated on this telecommunication card extender with the one end; This fastener is formed with one and places the hole and penetrate for this top bracing member, simultaneously with top bracing member is gripped; This action cell has in response to the angle difference of telecommunication card extender and base plan and changes form, make telecommunication card extender and the base plan can be through assembly thus and properly breasting, this action cell is to be set in outside the top bracing member, between fastener and substrate, fastener can be bearing on the substrate really; This locating ring is that fastener compressing is fixed on the substrate, keeps fixing orientation and position on substrate by made top bracing member by this locating ring.
2. according to the described integrated circuit test card of claim 1, it is characterized in that, also include an elastic parts, is to be electrically connected in the second telecommunication face of this telecommunication card extender and the contact solder joint of this circuit board.
3. according to the described integrated circuit test card of claim 1, it is characterized in that, described elastic parts includes a ccontaining plate and most elasticity pins, this each elasticity pin is to be placed through in this ccontaining plate according to predetermined aspect, and its two end also stretches out in respectively outside the biend of this ccontaining plate, one end and this second telecommunication are electrically connected, and the other end then is electrically connected with the solder joint that contacts of this circuit board.
4. according to the described integrated circuit test card of claim 1, it is characterized in that, also include a plurality of planes and keep assembly, this each plane keep assembly include respectively one support the unit and one the locking unit, this supports the unit is to be connected on the second telecommunication face of this telecommunication card extender, this locking unit is to be clamped on this to support on the unit, to keep maintaining a fixing horizontal relationship between this telecommunication card extender and this circuit board.
5. according to the described integrated circuit test card of claim 4, it is characterized in that, the described unit pack that supports contains a steel ball and a supporter, this steel ball is to contact with this second telecommunication face, this supporter one end and this steel ball butt, the other end then is subjected to the clamping of this locking unit, and making can be by by the clamping of this locking unit to this supporter, with keep this telecommunication card extender and this circuit board between horizontal relationship.
6. an integrated circuit test card is characterized in that, includes:
One circuit board has a plurality of contact solder joints;
One probe assembly, have a telecommunication card extender and a plurality of probe, this telecommunication card extender can define the one first telecommunication face and second an opposing with it telecommunication face of electrically conducting, this each probe be electrically conducting on this first telecommunication face, this second telecommunication face is to contact the solder joint electrically conducting with this;
At least one fixation kit that turns to has an adaptation unit, an action cell and locating ring, and this adaptation unit includes a top bracing member and a fastener;
This top bracing member is to support to arrive in and be incorporated on this telecommunication card extender with the one end, and this fastener is formed with one and places the hole and penetrate for this top bracing member, simultaneously with top bracing member is gripped; This action cell has in response to the angle difference of telecommunication card extender and base plan and changes form, make telecommunication card extender and the base plan can be through assembly thus and properly breasting, this action cell is to be set in outside the top bracing member, between fastener and substrate, fastener can be bearing on the substrate really, and this action cell has one first strain piece and one second strain piece; This locating ring is that fastener compressing is fixed on the substrate, makes to keep fixing orientation and position on substrate by made top bracing member by this locating ring;
The first strain piece shaft core position is formed with one first axis hole, and this second strain piece shaft core position is formed with one second axis hole, uses for this top bracing member to wear.
7. an integrated circuit test card is characterized in that, includes:
One circuit board has a plurality of contact solder joints;
One probe assembly, have a telecommunication card extender and a plurality of probe, this telecommunication card extender can define the one first telecommunication face and second an opposing with it telecommunication face of electrically conducting, this each probe be electrically conducting on this first telecommunication face, this second telecommunication face is to contact the solder joint electrically conducting with this;
At least one fixation kit that turns to has an adaptation unit, an action cell and locating ring, and this adaptation unit includes a top bracing member and a fastener;
This top bracing member is to support to arrive in and be incorporated on this telecommunication card extender with the one end, and this fastener is formed with one and places the hole and penetrate for this top bracing member, simultaneously with top bracing member is gripped; This action cell has in response to the angle difference of telecommunication card extender and base plan and changes form, make telecommunication card extender and the base plan can be through assembly thus and properly breasting, this action cell is to be set in outside the top bracing member, between fastener and substrate, fastener can be bearing on the substrate really, and this action cell has one first strain piece and one second strain piece; This locating ring is that fastener compressing is fixed on the substrate, makes to keep fixing orientation and position on substrate by made top bracing member by this locating ring;
The first strain piece is formed with one first offsetting face, this first offsetting face is one to be the state of sphere depression gradually toward shaft core position by the end face periphery, this second strain piece is formed with one second offsetting face, this second offsetting face is one to be the state of protruding of sphere toward shaft core position gradually by the end face periphery, this second offsetting face can be amplexiformed mutually with this first offsetting face and does appropriate relative slippage.
8. according to the described integrated circuit test card of claim 7, it is characterized in that the described fixation kit that turns to also has a locating ring, is formed with a spacing hole, make this adaptation unit position at this spacing hole.
CNB200610008526XA 2006-02-16 2006-02-16 Integrated circuit test card Expired - Fee Related CN100565218C (en)

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Application Number Priority Date Filing Date Title
CNB200610008526XA CN100565218C (en) 2006-02-16 2006-02-16 Integrated circuit test card

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Application Number Priority Date Filing Date Title
CNB200610008526XA CN100565218C (en) 2006-02-16 2006-02-16 Integrated circuit test card

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CN101021549A CN101021549A (en) 2007-08-22
CN100565218C true CN100565218C (en) 2009-12-02

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN210037903U (en) * 2019-05-15 2020-02-07 耐而达精密工程(苏州)有限公司 Supporting mechanism for chip testing
CN110265375B (en) * 2019-06-22 2020-12-11 日照亿铭科技服务有限公司 Chip substrate
CN112601411B (en) * 2020-12-04 2022-08-16 Oppo广东移动通信有限公司 Circuit board structure and electronic equipment

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