CN102066957A - 磁盘驱动器仿真器及其使用方法 - Google Patents
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Abstract
一种用于测试磁盘驱动器测试系统(5)的测试槽(10)的磁盘驱动器仿真器(100),磁盘驱动器仿真器(100)包括仿真器壳体(110),置于仿真器壳体中的测试电路(200);以及置于仿真器壳体上并且与测试电路电连通的接口连接器(120)。磁盘驱动器仿真器包括与测试电路电连通的至少一个传感器(310,310B,310M,310T,320,330)。至少一个传感器选自由温度传感器(310,310B,310M,310T)、振动传感器(320)、以及湿度传感器(330)所构成的组。将测试电路配置为对于测试槽向磁盘驱动器仿真器的功率传输进行测试,对于至少一个驱动器进行监测,以及对于测试槽和磁盘驱动器仿真器之间的连接器可靠性进行监测。
Description
技术领域
本公开涉及磁盘驱动器仿真器以及对于磁盘驱动器测试槽的测试方法。
背景技术
磁盘驱动器生产商通常要对于其所生产的磁盘驱动器进行测试,以符合需求。为了测试大量串联或者并联的磁盘驱动器,就要有测试设备和技术。生产商倾向于对于大量磁盘驱动器进行同时测试或者分批测试。磁盘驱动器测试系统通常包括具有多个用于测试的测试槽的一个或者多个支架,该测试槽容纳磁盘驱动器。
邻近磁盘驱动器的测试环境被严格控制。该测试环境中的最小温度变化对于测试环境的准确性和磁盘驱动器的安全性来说至关重要。具有较高性能、较快转速和较小磁头间隙的最新一代磁盘驱动器对于振动更加敏感。过度的振动会影响测试结果的可靠性以及电连接的完整性。在测试条件下,驱动器本身可以通过支撑结构或者固定装置将振动传导到相邻单元。这种振动的“串扰”与振动的外部源结合在一起造成了碰撞故障、磁头松动、非重复性偏离(NRRO),这些会导致产量下降以及生产成本的增加。
磁盘驱动器测试系统的测试槽需要进行常规验证以及诊断测试,从而确保该测试槽能够正常运行和运转。通常,“黄金驱动器”是经过了独立验证的能够正常运行和运转的磁盘驱动器。该黄金驱动器可以用于测试测试槽的功能和性能。黄金驱动器准确性的确认验证和维持验证是复杂和昂贵的。而且,测试的数据是有限的。
发明内容
一方面,用于对磁盘驱动器测试系统的测试槽进行测试的磁盘驱动器仿真器包括仿真器壳体、放置在仿真器壳体中的测试电路、以及置于仿真器壳体上并与测试电路电连通的接口连接器。该磁盘驱动器仿真器包括至少一个与测试电路电连通的传感器。该至少一个传感器选自由温度传感器、振动传感器、以及湿度传感器所构成的组。将测试电路配置为对磁盘驱动器仿真器的测试槽的功率输送进行测试,对于至少一个传感器进行监测,以及对于测试槽和磁盘驱动器仿真器之间的连接器的可靠性进行监测(例如,通过监测连接器电阻)。
对于本发明该方面的实施例可以包括一个或者多个以下特征。在一些实施例中,仿真器壳体具有大约70mm的宽度和大约9.5mm到大约19mm之间的高度。仿真器壳体基本上是具有顶部和底部宽表面的长方形。温度传感器置于该顶部和底部宽表面的每个角附近。在一些实施例中,将仿真器壳体限定出电子区域、电动机区域、和磁头区域。温度传感器置于每个区域中。在一些实例中,接口连接器包括通用异步收发两用机连接器。电力负荷元件可以是热源,在其他实例中可以改变。在一个实例中,电力负荷元件是电动机;然而,也可以使用其他产生热量和/或产生振动的部件,比如压电器件等等。
在一些实例中,测试电路包括与至少一个温度传感器、至少一个振动传感器、以及至少一个电力负荷元件相连接的控制器。磁盘驱动器仿真器可以包括与测试电路电连通的湿度传感器,湿度传感器被配置为对测试槽的湿度等级进行监测。
另一方面,对于磁盘驱动器测试系统的测试槽的验证方法包括在磁盘驱动器仿真器和测试槽之间建立电连通,并且对测试槽实施诊断测试。该诊断测试包括磁盘驱动器仿真器和测试槽之间连接性测试、从测试槽到磁盘驱动器仿真器的功率输送测试、磁盘驱动器仿真器至少一个区域的温度等级监测、以及磁盘驱动器仿真器至少一个区域的振动等级的监测。
本发明该方面的实施例可以包括一个或者多个以下特征。在一些实施例中,对测试槽实施诊断测试进一步包括对于磁盘驱动器仿真器的湿度等级进行监测。在一些实例中,对于磁盘驱动器仿真器和测试槽之间的连接性所进行的测试包括对于测试槽中设置的通用异步收发两用机连接器进行测试。磁盘驱动器仿真器和测试槽之间的连接性测试包括确定磁盘驱动器仿真器和测试槽之间的连接电阻。在一些实施例中,从测试槽到磁盘驱动器仿真器的功率输送测试包括测试槽的电压源等级测试、测试槽的电流源等级的测试、以及测试槽的限流能力测试。
在一些实施例中,对于磁盘驱动器仿真器的至少一个区域的温度等级所进行的监测包括对于电子装置区域、电动机区域、和/或磁头区域的温度等级的监测。对于磁盘驱动器仿真器的至少一个区域的振动等级所进行的监测包括对于磁头区域的振动等级进行监测。
在一些实例中,磁盘驱动器仿真器包括仿真器壳体、放置于仿真器壳体中的测试电路、以及置于仿真器壳体上并与测试电路电连通的接口连接器。该磁盘驱动器仿真器包括至少一个与测试电路电连通的传感器。该至少一个传感器选自由温度传感器、振动传感器、以及湿度传感器所构成的组。将测试电路配置为对于测试槽至磁盘驱动器仿真器的功率输送进行测试,对于至少一个传感器进行监测,以及对于测试槽和磁盘驱动器仿真器之间的连接器的可靠性进行监测(例如,通过监测连接器电阻)。
在下面的附图和描述中,将对于本发明的一个或者多个实施例进行详细阐述。通过说明书和附图、以及权利要求使得其他特征、目的、和优点变得显而易见。
附图说明
图1是插入磁盘驱动器测试系统的测试槽中的磁盘驱动器仿真器的立体图。
图2是测试槽的立体图。
图3是磁盘驱动器仿真器的立体图。
图4是带有测试电路的磁盘驱动器仿真器的示意图。
图5是负载电路的示意图。
图6是磁盘驱动器仿真器壳体的侧视图,示出了仿真器壳体中的温度传感器和振动传感器的示例性布置。
图7是图6中所示的磁盘驱动器仿真器壳体的顶视图,示出了仿真器壳体中的温度传感器和振动传感器的示例性布置。
各个附图中,相似的参考标号表示相似的部件。
具体实施方式
磁盘驱动器仿真器100物理地(例如,在尺寸上、外型上、热辐射方面和/或振动方面)仿真或者模拟了真实的磁盘驱动器,但是其作为对于磁盘驱动器测试系统5的测试槽10进行验证的诊断工具和测试工具。在图1所述的实例中,测试槽10安装至支架20。磁盘驱动器输送器30载有磁盘驱动器仿真器100,并且可以由使用者或者机械臂进行操作,从而将其插入测试槽10的容置位(receptacle)15中。如图2所示,磁盘驱动器仿真器100置于与测试槽连接器14相接合的测试位置中。
参考图3,磁盘驱动器仿真器100包括仿真器壳体110、放置于仿真器壳体110中的测试电路200(由仿真器壳体100的剖开部分示出)、以及置于仿真器壳体110上并且与测试电路200电连通的接口连接器120。在一些实施例中,仿真器壳体110的宽度大约70mm,高度处于大约9.5mm和大约19mm之间。将接口连接器120配置为与测试槽连接器14紧密接合,该接口连接器120可以是通用异步收发两用机连接器。测试槽10通过Parallel AT Attachment(硬盘接口,也被称为IDE、ATA、ATAPI、UDMA和PATA)、SATA、SAS(Serial Attached SCSI)和/或串行连通与磁盘驱动器仿真器100进行连通。测试槽10还通过接口连接器120提供电源(例如,+5V和+12V)和地电位给磁盘驱动器仿真器100。
将磁盘驱动器仿真器100配置为对于测试槽10进行验证,并且对于与测试槽10的状况有关的问题进行诊断。磁盘驱动器仿真器100对于测试槽10的电源和地电位、通过测试槽连接器14的连通、以及测试槽10的环境控制系统进行测试,该环境控制系统对于温度、湿度、和振动进行控制。
参考图4中的磁盘驱动器仿真器100的示意图,将测试电路200配置为对于测试槽10至磁盘驱动器仿真器100的功率输送、测试槽10的温度等级和振动等级、以及测试槽10和磁盘驱动器仿真器100之间的连接器的可靠性(例如,通过监测连接器电阻)进行测试。测试电路200包括与串行连通电路202电连通的控制器210,串行连通电路202与接口连接器120的串行连通部分122电连通。控制器210与传感器系统300进行电连通,传感器系统300包括至少一个温度传感器310和至少一个振动传感器320。在一些实例中,传感器系统还包括与控制器210电连通的湿度传感器330和气流传感器340,以测试并示出提供给测试槽10的气体体积。
测试电路200包括与接口连接器120的电源部分124电连通的电源电路204。电源电路204包括调压器电路220和第一开关222以及第二开关224,每个开关都对于各自的负载电路400和各自的模拟数字转换器(未示出)的电连通进行控制。开关222、224通过控制器210进行控制。图5提供了负载电路400的实例,负载电路400包括第一开关402和第二开关404,第一开关402和第二开关404分别对于向电阻器410和电动机420的电流传输进行控制。控制器210通过与电阻器410和电动机420相关联的开关402、404对于电阻器410和电动机420的运行进行控制。负载电路400对其相应的电源(例如,+5V或+12V)进行校准。负载电路400用于对通过接口连接器120的电源部分124接入的外部电源是否正常运转进行测试。负载电路400或者第二组负载电路(未示出)可以用于切断外部电源的断路器,从而对于外部电源是否正常运转进行测试。
通过相应的开关222、224激活至少一个负载电路400并且通过各自的开关402和404控制将电流传送给电阻器410和/或电动机420,磁盘驱动器仿真器100产生热量,用于对真实磁盘驱动器的散热进行模拟。可以操作负载电路400,以产生出恒定的或者变化的热量。通过激活至少一个负载电路400并且由开关404将电流传送给电动机420,磁盘驱动器仿真器100产生振动,以对于真实磁盘驱动器的振动特性进行模拟。在一些实例中,电动机420包括与发电机420的驱动轴422偏心连接的凸轮424,从而产生或者强化振动。负载电路400置于壳体110中真实磁盘驱动器通常会产生热量和/或产生振动的地方,比如壳体110的电子装置区域130、电动机区域140、和/或磁头区域150(见图6-7)。
测试电路200包括高速连通电路206,该高速连通电路206与接口连接器120的相应高速连通部分126(例如,PATA、SATA、SAS)进行电连通。高速连通电路206与现场可编程逻辑门阵列(FPGA)230进行电连通,而现场可编程逻辑门阵列(FPGA)230与控制器210进行电连通。
温度传感器310和振动传感器320分别置于壳体110中真实磁盘驱动器通常会产生并且经受热量和振动的地方。在图6-7所示的实例中,壳体110具有内顶表面112和内底表面114,支撑接口连接器120的内前表面116、内后表面118、以及内左表面117和内又表面119。图6-7示出了壳体110内的温度传感器310和振动传感器320的示例性布置。两个温度传感器310T置于内顶壳体表面112上且在内前壳体表面116相邻的每个角附近。类似地,两个温度传感器310B置于内底壳体表面114上且在内前壳体表面116相邻的每个角附近。一个温度传感器310B置于内底壳体表面114上的电子装置区域130内(例如,为了感测出电子装置附近的温度)。一个温度传感器310T置于内顶壳体表面112上的电动机区域140内。一个温度传感器310B置于内底壳体表面114上的磁头区域150。一个温度传感器310M置于内后壳体表面118上的磁头区域150附近。一个或者多个温度传感器310T可以置于内顶壳体表面112的角附近。一个或者多个温度传感器310B置于内底壳体表面114的角附近。振动传感器320置于内底壳体表面114上的磁头区域150内。
一种验证磁盘驱动器测试系统5的测试槽10的方法包括,在磁盘驱动器仿真器100和测试槽10之间建立电连通,以及对测试槽实施诊断测试(例如,通过上述磁盘驱动器100的测试电路200)。诊断测试包括对于磁盘驱动器仿真器100和测试槽10之间的连接性进行测试,对于从测试槽10到磁盘驱动器仿真器100的功率输送进行测试,对于磁盘驱动器仿真器100的至少一个区域的温度等级进行监测,以及对于磁盘驱动器仿真器100的至少一个区域的振动等级进行监测。在一些实施例中,对测试槽10实施诊断测试还包括对于磁盘驱动器仿真器100的湿度等级进行监测。
在一些实施例中,对于磁盘驱动器仿真器100和测试槽10之间连接性的测试包括对于测试槽10中设置的通用异步收发两用机连接器14进行测试。在另外的实施例中,对于磁盘驱动器仿真器100和测试槽10之间的连接性的测试包括确定磁盘驱动器仿真器100和测试槽10之间(例如,磁盘驱动器仿真器100的测试槽连接器14和接口连接器120之间)的连接电阻。
在一些实例中,对于从测试槽10到磁盘驱动器仿真器100的功率输送的测试包括对于测试槽10的电压源等级、电流源等级、以及限流能力进行测试。例如,所连接的测试电路200(通过接口连接器120)通过测试槽连接器14的电源引脚(见图2)对于测试槽10的电压源等级、电流源等级、以及限流能力进行评估和/或监测。
虽然对测试槽10实施诊断测试,但是该方法可以包括对于电子装置区域130、电动机区域140、和/或磁头区域150的温度等级进行监测。还可以对于磁头区域150的振动等级进行监测。测试电路200通过传感器系统300相关的温度传感器310、振动传感器320、和湿度传感器330对于温度等级和振动等级进行监测,并且对于湿度等级进行可选监测。
已经描述了多个实施例。然而,可以理解,在不背离本发明的精神和范围的情况下,可以进行多种改变。因此,在下面的权利要求的范围内,还可以有其他实施例。
Claims (15)
1.一种用于测试磁盘驱动器测试系统(5)的测试槽(10)的磁盘驱动器仿真器(100),所述磁盘驱动器仿真器(100)包括:
仿真器壳体(110);
置于所述仿真器壳体(110)的测试电路(200);
置于所述仿真器壳体(110)上并且与所述测试电路(200)电连通的接口连接器(120);
与所述测试电路(200)电连通的至少一个传感器(310,310B,310M,310T,320,330),所述至少一个传感器(310,310B,310M,310T,320,330)选自由温度传感器(310,310B,310M,310T)、振动传感器(320)、以及湿度传感器(330)所构成的组;以及
与所述测试电路(200)电连通的至少一个电子负载部件(400);
其中,将所述测试电路(200)配置为对于测试槽(10)向所述磁盘驱动器仿真器(100)的功率传输进行测试,对于所述至少一个传感器(310,310B,310M,310T,320,330)进行监测,以及对于所述测试槽(10)和所述磁盘驱动器仿真器(100)之间的连接器可靠性进行监测。
2.根据权利要求1所述的磁盘驱动器仿真器(100),其特征在于,所述仿真器壳体(100)的宽度大约70mm,并且高度在大约9.5mm和大约19mm之间。
3.根据前述任意一项权利要求所述的磁盘驱动器仿真器(100),其特征在于,仿真器壳体(100)基本上是具有顶宽表面(112)和底宽表面(114)的长方形,所述温度传感器(310T)置于所述顶宽表面(112)的每个角附近,并且所述温度传感器(310B)置于所述底宽表面(114)的每个角附近。
4.根据前述任意一项权利要求所述的磁盘驱动器仿真器(100),其特征在于,所述仿真器壳体(100)限定出电子装置区域(130)、电动机区域(140)、和磁头区域(150),所述温度传感器(310,310B,310T)置于每个所述区域(130,140,150)中。
5.根据前述任意一项权利要求所述的磁盘驱动器仿真器(100),其特征在于,所述接口连接器(120)包括通用异步收发两用机连接器。
6.根据前述任意一项权利要求所述的磁盘驱动器仿真器(100),其特征在于,所述电子负载部件(400)包括热源或者电动机。
7.根据权利要求6所述的磁盘驱动器仿真器(100),其特征在于,所述电子负载部件(400)是可变的。
8.根据前述任意一项权利要求所述的磁盘驱动器仿真器(100),其特征在于,所述测试电路(200)包括与所述至少一个传感器(310,310B,310M,310T,320,330)和所述至少一个电子负载部件(400)电连通的控制器(210)。
9.一种验证磁盘驱动器测试系统(5)的测试槽(10)的方法,包括:
在磁盘驱动器仿真器(100)和测试槽(10)之间建立电连通;以及
对所述测试槽(10)实施诊断测试,所述诊断测试包括:
对于所述磁盘驱动器仿真器(100)和所述测试槽(10)之间的连接性进行测试;
对于从所述测试槽(10)到所述磁盘驱动器仿真器(100)的功率输送进行测试;
对于所述磁盘驱动器仿真器(100)的至少一个区域(130,140,150)的温度等级进行监测;以及
对于所述磁盘驱动器仿真器(100)的至少一个区域(130,140,150)的振动等级进行监测。
10.根据权利要求9所述的方法,其特征在于,对所述测试槽(10)实施诊断测试还包括对于所述磁盘驱动器仿真器(100)的湿度等级进行监测。
11.根据权利要求9或10所述的方法,其特征在于,对于所述磁盘驱动器仿真器(100)和所述测试槽(10)之间的连接性进行测试包括,对于所述测试槽(10)中设置的通用异步收发两用机连接器(14)进行测试,和/或确定所述磁盘驱动器仿真器(100)和所述测试槽(10)之间的连接电阻。
12.根据权利要求9至11中的任意一项所述的方法,其特征在于,对于从所述测试槽(10)到所述磁盘驱动器仿真器(100)的功率输送进行测试包括:
对于所述测试槽(10)的电压源等级进行测试;
对于所述测试槽(10)的电流源等级进行测试;以及
对于所述测试槽(10)的限流能力进行测试。
13.根据权利要求9至12中的任意一项所述的方法,其特征在于,对于所述磁盘驱动器仿真器(100)的至少一个区域(130,140,150)的温度等级进行监测包括对于电子装置区域(130)、电动机区域(140)、和/或磁头区域(150)的温度等级进行监测。
14.根据权利要求9至13中任意一项所述的方法,其特征在于,对于所述磁盘驱动器仿真器(100)的至少一个区域(130,140,150)的振动等级进行监测包括对于磁头区域(150)的振动等级进行监测。
15.根据权利要求9至14中任意一项所述的方法,其特征在于,所述磁盘驱动器仿真器(100)包括:
仿真器壳体(110);
置于所述仿真器壳体(110)的测试电路(200);
置于所述仿真器壳体(110)上并且与所述测试电路(200)电连通的接口连接器(120);
与所述测试电路(200)电连通的至少一个传感器(310,310B,310M,310T,320,330),所述至少一个传感器(310,310B,310M,310T,320,330)选自由温度传感器(310,310B,310M,310T)、振动传感器(320)、以及湿度传感器(330)所构成的组;以及
与所述测试电路(200)电连通的至少一个电子负载部件(400);
其中,将所述测试电路(200)配置为对于测试槽(10)向所述磁盘驱动器仿真器(100)的功率输送进行测试,对于所述至少一个传感器(310,310B,310M,310T,320,330)进行监测,以及对于所述测试槽(10)和所述磁盘驱动器仿真器(100)之间的连接器可靠性进行监测。
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- 2009-04-06 JP JP2011505082A patent/JP5319756B2/ja not_active Expired - Fee Related
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Publication number | Priority date | Publication date | Assignee | Title |
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CN103730167A (zh) * | 2012-10-16 | 2014-04-16 | 鸿富锦精密工业(深圳)有限公司 | 虚拟硬盘 |
CN107480024A (zh) * | 2017-08-10 | 2017-12-15 | 英业达科技有限公司 | 硬盘模拟器 |
CN107480024B (zh) * | 2017-08-10 | 2021-05-28 | 英业达科技有限公司 | 硬盘模拟器 |
CN111724825A (zh) * | 2019-03-19 | 2020-09-29 | 株式会社东芝 | 磁盘装置 |
Also Published As
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MY147300A (en) | 2012-11-30 |
CN102066957B (zh) | 2013-10-16 |
US7945424B2 (en) | 2011-05-17 |
WO2009129072A1 (en) | 2009-10-22 |
US20090265136A1 (en) | 2009-10-22 |
JP2011520210A (ja) | 2011-07-14 |
JP5319756B2 (ja) | 2013-10-16 |
WO2009129381A2 (en) | 2009-10-22 |
WO2009129381A3 (en) | 2010-01-14 |
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