CN102147435A - Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale - Google Patents

Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale Download PDF

Info

Publication number
CN102147435A
CN102147435A CN2011100443650A CN201110044365A CN102147435A CN 102147435 A CN102147435 A CN 102147435A CN 2011100443650 A CN2011100443650 A CN 2011100443650A CN 201110044365 A CN201110044365 A CN 201110044365A CN 102147435 A CN102147435 A CN 102147435A
Authority
CN
China
Prior art keywords
frequency
physical system
voltage
magnitude
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN2011100443650A
Other languages
Chinese (zh)
Other versions
CN102147435B (en
Inventor
雷海东
管桦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jianghan University
Original Assignee
Jianghan University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jianghan University filed Critical Jianghan University
Priority to CN 201110044365 priority Critical patent/CN102147435B/en
Publication of CN102147435A publication Critical patent/CN102147435A/en
Application granted granted Critical
Publication of CN102147435B publication Critical patent/CN102147435B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention discloses a method for measuring the line width and the frequency discrimination slope of the physical system of a Rubidium atom frequency scale, comprising the following steps: (1) causing a microwave polling signal to act on a physical system; (2) collecting and storing voltage values obtained after photoelectric detection signals output by a physical system are subjected to synchronous phase detection and microwave polling signal frequency values in one-to-one correspondence with the voltage values; (3) calculating the maximum value, the minimum value and the central value of the voltage values, and inquiring the frequency values in one-to-one correspondence with the maximum value, the minimum value and the central value of the voltage values, of the microwave polling signal; and (4) according to the frequency values in one-to-one correspondence with the maximum value and the minimum value of the voltage values, of the microwave polling signal, calculating the line width of the physical system; taking the central value of the voltage values as an original point; and according to the voltage values and the frequency values in one-to-one correspondence with the voltage values, of the microwave polling signal, carrying out curve fitting to obtain the frequency discrimination slope of the physical system. The method disclosed by the invention can conveniently, quickly and accurately measure the line width and the frequency discrimination slope of the physical system.

Description

The live width of the physical system of measurement Rb atom frequency marking and the method for frequency discrimination slope
Technical field
The present invention relates to the inactive type rubidium atom frequency scale field, relate in particular to a kind of live width of the physical system of measuring Rb atom frequency marking and the method for frequency discrimination slope.
Background technology
Atomic frequency standard is a kind of frequency source with good stable degree and accuracy, be widely used in location, the navigation of satellite and communicate by letter, field such as instrument and meter and astronomy.And Rb atom frequency marking becomes the atomic frequency standard that is most widely used at present because of it has advantages such as volume is little, in light weight, low in energy consumption, cost is low.
Rb atom frequency marking comprises VCXO, physical system and electronic circuit.Wherein, physical system comprises that the spectrum lamp that produces pumping light, the integrated filtering resonance bubble of storage rubidium atom, the microwave cavity of storing microwave field, generation are parallel to the photoelectric cell of the C field coil (being uniform magnetic field coil) of the static magnetic field of described microwave cavity axis, sensed light signal, microwave is coupled into the coupling ring of described microwave cavity and prevents the magnetic cup that static magnetic field penetrates.Electronic circuit specifically comprises radio frequency frequency multiplication module and comprehensive servo module.Comprehensive servo module comprises that the microprocessor that is used to produce frequency synthesis instruction, locking phase reference signal detection, the frequency synthesis instruction that is used for producing according to microprocessor produce the digital frequency synthesizer of comprehensive modulation signal and be used for carrying out the phase sensitive detection module that locking phase detects according to the locking phase reference signal detection that microprocessor produces.Radio frequency frequency multiplication module comprise that the output frequency that is used for VCXO carries out the radio frequency frequency multiplication unit of frequency multiplication and the microwave that is used for the comprehensive modulation signal that output frequency and digital frequency synthesizer through the VCXO after the described radio frequency frequency multiplication unit frequency multiplication produce is carried out obtaining after frequency multiplication and the mixing microwave interrogation signals doubly, the mixing unit.
During work, microwave doubly, the mixing unit acts on physical system with the microwave interrogation signals that produces, physical system is exported photoelectric detecting signal under the effect of microwave interrogation signals, the phase sensitive detection module is carried out locking phase to photoelectric detecting signal and is detected the generation voltage signal, microprocessor carries out voltage signal to act on VCXO after D/A changes, circulation successively, up to the locking of Rb atom frequency marking complete machine, promptly the microwave interrogation signals is just in time aimed at the centre frequency of Rb atom frequency marking.
After treating the physical system moulding, next step will verify the Rb atom frequency marking machine performance by tests such as parameter optimizations.Wherein, the live width of physical system can be selects the depth of modulation of modulation signal that reference is provided, the frequency discrimination slope of physical system can be in the electronic circuit servo loop and selects gain amplifier that reference is provided, thereby, the live width of physical system and frequency discrimination slope are references weighing the Rb atom frequency marking short-term stability, thereby become the focus of concern.
Usually, the method of traditional measurement physical system live width need during measurement, be exported different frequency signals and act on physical system in difference by sweep generator constantly by sweep generator and registering instrument, simultaneously, by the corresponding Photoelectric Detection output signal of physical system constantly of registering instrument record.The live width of physical system is a peaked half for the Photoelectric Detection output signal value, the difference of two frequencies of corresponding sweep generator.When measuring the frequency discrimination slope of physical system, need measure by phase-locked instrument.
As from the foregoing, on the one hand,, thereby make the measuring process complexity because the live width of traditional measurement physical system and frequency discrimination slope need be by peripheral instruments; On the other hand, because when adopting traditional measuring method to measure, the photoelectric detecting signal of the frequency signal of sweep generator output and registering instrument record is stored respectively, and when calculating live width and frequency discrimination slope, must guarantee that the frequency signal of sweep generator output and the photoelectric detecting signal of registering instrument record are to concern one to one, thereby, when calculating live width and frequency discrimination slope, traditional measuring method more complicated, and make mistakes easily.
Therefore, be necessary to provide the measuring method of a kind of physical system live width and frequency discrimination slope to overcome above-mentioned defective.
Summary of the invention
The purpose of this invention is to provide a kind of live width of physical system and method for frequency discrimination slope measured, can be convenient, fast and measure the live width and the frequency discrimination slope of physical system accurately.
To achieve these goals, the invention provides a kind of live width of the physical system of measuring Rb atom frequency marking and the method for frequency discrimination slope, comprising: (1) acts on the microwave interrogation signals physical system of Rb atom frequency marking; (2) gather and storage to the photoelectric detecting signal of described physical system output adopt phase-sensitive detector (PSD) carry out locking phase detect back output magnitude of voltage and with described magnitude of voltage microwave interrogation signals frequency values one to one; (3) maximal value, minimum value and the central value of the described magnitude of voltage of calculating, and the described one to one microwave interrogation signals of the maximal value of inquiry and described magnitude of voltage, minimum value and central value frequency values; (4) according to the maximal value of described magnitude of voltage and minimum value one to one two described microwave interrogation signals frequency values calculate the live width of described physical system, and be initial point and carry out curve fitting according to described magnitude of voltage and with the described one to one microwave interrogation signals of described magnitude of voltage frequency values with the central value of described magnitude of voltage, obtain the frequency discrimination slope of described physical system.
Preferably, described step (4) is specially: the maximal value of calculating and described magnitude of voltage and minimum value be the difference of two described microwave interrogation signals frequency values one to one, calculated difference
Figure BDA0000047287900000031
Doubly obtain the live width of described physical system, and be initial point and adopt least square method to carry out curve fitting according to described magnitude of voltage and with the described one to one microwave interrogation signals of described magnitude of voltage frequency values with the central value of described magnitude of voltage, obtain the frequency discrimination slope of described physical system according to the slope of matched curve.
Compared with prior art, the present invention be by directly utilize existing electronic circuit and VCXO in the Rb atom frequency marking system measure photoelectric detecting signal to physical system output carry out locking phase detect back output magnitude of voltage and with described magnitude of voltage microwave interrogation signals frequency values one to one, and come the live width and the frequency discrimination slope of computational physics system according to the magnitude of voltage that records and microwave interrogation signals frequency values, thereby the present invention measures the live width of physical system and the method for frequency discrimination slope can make things convenient for, fast and accurately measure the live width and the frequency discrimination slope of physical system.
By following description also in conjunction with the accompanying drawings, it is more clear that the present invention will become, and these accompanying drawings are used to explain embodiments of the invention.
Description of drawings
Fig. 1 measures the structural representation of Rb atom frequency marking of the method for the live width of physical system of Rb atom frequency marking and frequency discrimination slope for adopting the present invention.
Fig. 2 measures the main flow chart of the method for the live width of physical system of Rb atom frequency marking and frequency discrimination slope for the present invention.
The frequency discrimination S curve synoptic diagram that obtains behind the step S2 of Fig. 3 for the method for the live width of physical system of measuring Rb atom frequency marking through the present invention and frequency discrimination slope.
Embodiment
With reference now to accompanying drawing, describe embodiments of the invention, the similar elements label is represented similar elements in the accompanying drawing.
As shown in Figure 1, the Rb atom frequency marking that adopts the present invention to measure the method for the live width of physical system of Rb atom frequency marking and frequency discrimination slope comprises: VCXO 10, isolated amplifier 11, radio frequency frequency multiplication unit 12, microwave doubly, mixing unit 13, physical system 14, phase-sensitive detector (PSD) 15, microprocessor 16, digital frequency synthesizer 17 and D/A converter 18.Wherein, isolated amplifier 11, radio frequency frequency multiplication unit 12, microwave are doubly, mixing unit 13, phase-sensitive detector (PSD) 15, microprocessor 16, digital frequency synthesizer 17 and D/A converter 18 constitute electronic circuits.During work, send to described radio frequency frequency multiplication unit 12 after the isolation of the described isolated amplifier 11 of the output frequency of described VCXO 10 elder generation process and the amplification and carry out frequency multiplication.Simultaneously, described microprocessor 16 transmission frequency synthetic instructions produce comprehensive modulation signal for described digital frequency synthesizer 17, and sending the keying FM signal, to make described digital frequency synthesizer 17 be alternately to export described comprehensive modulation signal the cycle with the frequency of described keying FM signal.The output frequency of the described VCXO 10 of described comprehensive modulation signal and process frequency multiplication carries out producing the microwave interrogation signals after frequency multiplication and the mixing together.Described microwave interrogation signals produces quantum frequency discrimination signal through the frequency discrimination of described physical system 14, and enter described phase-sensitive detector (PSD) 15 and carry out phase demodulation, the voltage control signal U of phase demodulation generation synchronously carries out digital signal through described D/A converter 18 and can act on described VCXO 10 after the conversion of simulating signal, to adjust the output frequency f of described VCXO 10.
Fig. 2 measures the process flow diagram of the method for the live width of physical system of Rb atom frequency marking and frequency discrimination slope for the present invention.The present invention measures the live width of physical system of Rb atom frequency marking and the method for frequency discrimination slope comprises the steps:
Step S1 acts on the microwave interrogation signals physical system 14 of Rb atom frequency marking;
Step S2, gather and storage to the photoelectric detecting signal of described physical system 14 outputs adopt phase-sensitive detector (PSD) 15 carry out locking phase detect back output magnitude of voltage and with described magnitude of voltage microwave interrogation signals frequency values one to one;
Step S3 calculates maximal value, minimum value and the central value of described magnitude of voltage and the described one to one microwave interrogation signals of the maximal value of inquiry and described magnitude of voltage, minimum value and central value frequency values;
Step S4, according to the maximal value of described magnitude of voltage and minimum value one to one two described microwave interrogation signals frequency values calculate the live width of described physical system 14, and be initial point and carry out curve fitting according to described magnitude of voltage and with the described one to one microwave interrogation signals of described magnitude of voltage frequency values with the central value of described magnitude of voltage, obtain the frequency discrimination slope of described physical system 14.
As shown in Figure 3, the frequency discrimination S curve synoptic diagram that obtains behind the step S2 for the method for the live width of physical system of measuring Rb atom frequency marking through the present invention and frequency discrimination slope.The absorption curve that frequency discrimination S curve and Photoelectric Detection output signal constitute is a derived relation.Among Fig. 3, what horizontal ordinate identified is microwave interrogation signals frequency values, and it is writing down the change process of the voltage-controlled voltage U of D/A converter 18 outputs, and what ordinate identified is the magnitude of voltage that obtains through behind phase-sensitive detector (PSD) 15 phase demodulations.When the live width of computational physics system 14, at first find the maximal value V of ordinate in the frequency discrimination S curve HWith minimum value V L, and find and maximal value V HWith minimum value V LTwo of horizontal ordinate are worth f one to one 2And f 1, again according to formula
Figure BDA0000047287900000051
Can calculate the live width of physical system 14.When the frequency discrimination slope of computational physics system 14, at first find in the frequency discrimination S curve on the ordinate some Ref near 0, i.e. central value specifically is by the value of ordinate in the frequency discrimination S curve is done absolute value with zero respectively, the absolute value minimum be central value.Find after the central value, position with the point of this central value correspondence is an initial point (0,0), about it, respectively get 20 points respectively successively along horizontal ordinate, data to these 41 points carry out curve fitting by least square method then, the curvilinear equation that obtains match is y=Kx+b, and wherein the value of K is the frequency discrimination slope of physical system 14.
As mentioned above, the present invention be by directly utilize existing electronic circuit and VCXO 10 in the Rb atom frequency marking system measure photoelectric detecting signal to physical system 14 outputs carry out locking phase detect back output magnitude of voltage and with described magnitude of voltage microwave interrogation signals frequency values one to one, and come the live width and the frequency discrimination slope of computational physics system 14 according to the magnitude of voltage that records and microwave interrogation signals frequency values, thereby the present invention measures the live width of physical system 14 and the method for frequency discrimination slope can make things convenient for, fast and accurately measure the live width and the frequency discrimination slope of physical system 14.
Above invention has been described in conjunction with most preferred embodiment, but the present invention is not limited to the embodiment of above announcement, and should contain various modification, equivalent combinations of carrying out according to essence of the present invention.

Claims (2)

1. the live width of a physical system of measuring Rb atom frequency marking and the method for frequency discrimination slope comprise:
(1) the microwave interrogation signals is acted on the physical system of Rb atom frequency marking;
(2) gather and storage to the photoelectric detecting signal of described physical system output adopt phase-sensitive detector (PSD) carry out locking phase detect back output magnitude of voltage and with described magnitude of voltage microwave interrogation signals frequency values one to one;
(3) maximal value, minimum value and the central value of the described magnitude of voltage of calculating, and the described one to one microwave interrogation signals of the maximal value of inquiry and described magnitude of voltage, minimum value and central value frequency values;
(4) according to the maximal value of described magnitude of voltage and minimum value one to one two described microwave interrogation signals frequency values calculate the live width of described physical system, and be initial point and carry out curve fitting according to described magnitude of voltage and with the described one to one microwave interrogation signals of described magnitude of voltage frequency values with the central value of described magnitude of voltage, obtain the frequency discrimination slope of described physical system.
2. the method for the live width of the physical system of measurement Rb atom frequency marking as claimed in claim 1 and frequency discrimination slope is characterized in that, described step (4) is specially:
The maximal value of calculating and described magnitude of voltage and minimum value be the difference of two described microwave interrogation signals frequency values one to one, calculated difference Doubly obtain the live width of described physical system, and be initial point and adopt least square method to carry out curve fitting according to described magnitude of voltage and with the described one to one microwave interrogation signals of described magnitude of voltage frequency values with the central value of described magnitude of voltage, obtain the frequency discrimination slope of described physical system according to the slope of matched curve.
CN 201110044365 2011-02-21 2011-02-21 Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale Expired - Fee Related CN102147435B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201110044365 CN102147435B (en) 2011-02-21 2011-02-21 Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201110044365 CN102147435B (en) 2011-02-21 2011-02-21 Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale

Publications (2)

Publication Number Publication Date
CN102147435A true CN102147435A (en) 2011-08-10
CN102147435B CN102147435B (en) 2013-06-05

Family

ID=44421805

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201110044365 Expired - Fee Related CN102147435B (en) 2011-02-21 2011-02-21 Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale

Country Status (1)

Country Link
CN (1) CN102147435B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103067000A (en) * 2012-12-17 2013-04-24 江汉大学 Servo system model based on quantum system
CN104539289A (en) * 2014-11-26 2015-04-22 江汉大学 Estimation method and device for short-term stability of atomic frequency standard frequency
CN105738709A (en) * 2016-02-01 2016-07-06 江汉大学 Measurement system based on phase sensitive detection, photoelectric equipment, measurement method and device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5721514A (en) * 1995-11-22 1998-02-24 Efratom Time And Frequency Products, Inc. Digital frequency generation in atomic frequency standards using digital phase shifting
US6130583A (en) * 1997-09-01 2000-10-10 Accubeat Ltd Atomic frequency standard using digital processing in its frequency lock loop
CN101079633A (en) * 2007-05-17 2007-11-28 江汉大学 Improved passive Rb atomic frequency standard servo control method and servo control circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5721514A (en) * 1995-11-22 1998-02-24 Efratom Time And Frequency Products, Inc. Digital frequency generation in atomic frequency standards using digital phase shifting
US6130583A (en) * 1997-09-01 2000-10-10 Accubeat Ltd Atomic frequency standard using digital processing in its frequency lock loop
CN101079633A (en) * 2007-05-17 2007-11-28 江汉大学 Improved passive Rb atomic frequency standard servo control method and servo control circuit

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
黄学人: "高稳铷原子频标的参数优化及激光抽运铷原子频标研究", 《中国优秀博硕士学位论文全文数据库(博士)基础科学辑》 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103067000A (en) * 2012-12-17 2013-04-24 江汉大学 Servo system model based on quantum system
CN103067000B (en) * 2012-12-17 2016-02-10 江汉大学 Based on the servo system models of quantized system
CN104539289A (en) * 2014-11-26 2015-04-22 江汉大学 Estimation method and device for short-term stability of atomic frequency standard frequency
CN105738709A (en) * 2016-02-01 2016-07-06 江汉大学 Measurement system based on phase sensitive detection, photoelectric equipment, measurement method and device

Also Published As

Publication number Publication date
CN102147435B (en) 2013-06-05

Similar Documents

Publication Publication Date Title
CN101931405B (en) Coherent demodulation device for CPT atomic clock
CN102811056B (en) A kind of signal to noise ratio apparatus for evaluating of Rb atom frequency marking and method
CN101984559B (en) Method for improving accuracy of standard frequency of rubidium atoms
CN102095710B (en) System and method for detecting concentration of dissolved oxygen in water body on basis of fluorescence lifetime method
CN102045062B (en) Digital phase-locked loop based on Cordic algorithm
CN201514481U (en) Laser range finder
CN103048538B (en) Method for testing collective frequency of radio frequency card and tester for realizing method
CN102006068A (en) Improved rubidium atom frequency scale
CN102035549A (en) Synchronous phase discriminating device and method of rubidium atomic frequency standard
CN109239625B (en) Atomic magnetometer based on frequency calibration and measuring method
CN102201811B (en) Method and device for reducing microwave power frequency shift of atomic frequency standard
CN102147435B (en) Method for measuring line width and frequency discrimination slope of physical system of Rubidium atom frequency scale
CN102104382A (en) Method for reducing optical frequency shift of rubidium atomic frequency standard
CN108614224B (en) Automatic calibration system and method for air chamber working temperature of CPT magnetometer
CN201035143Y (en) Digital type microwave declined displacement measurement device
CN110045309B (en) Novel optical pump magnetometer precision self-detection method
CN105021904A (en) Rapid phase noise measurement system based on DDS phase shift technology and measurement method thereof
CN107290753A (en) A kind of laser measurement system and method
CN103472319B (en) A kind of close-carrier frequency phase noise correcting device based on table-look-up compensation technology
CN203881848U (en) Device for measuring linewidth and frequency-discrimination gradient of atom frequency mark based on photocell
CN205539243U (en) Atomic clock performance evaluation device
CN202758005U (en) SNR measuring device used for atomic clock
CN203872140U (en) Orthogonal lock-in amplifier device for fluorescence signal demodulation
CN202929184U (en) Helium optical pump magnetic resonance signal fully digital detection device
CN105572511A (en) Atomic clock performance evaluation device

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130605

Termination date: 20160221

CF01 Termination of patent right due to non-payment of annual fee