CN102236597A - Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program - Google Patents
Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program Download PDFInfo
- Publication number
- CN102236597A CN102236597A CN201010155725XA CN201010155725A CN102236597A CN 102236597 A CN102236597 A CN 102236597A CN 201010155725X A CN201010155725X A CN 201010155725XA CN 201010155725 A CN201010155725 A CN 201010155725A CN 102236597 A CN102236597 A CN 102236597A
- Authority
- CN
- China
- Prior art keywords
- file
- ict
- ddb
- generation method
- burning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Abstract
The invention provides a generation method of a DDB (Distributed Data Base) file in an ICT (In Circuit Tester) test program. The generation method mainly comprises the following steps of: inputting a bar code variable to generate a binary document; reading machine characteristic information of an ICT, file information to be burned and the generated binary document; combining the read machine characteristic information, file information to be burned and generated binary document in a DDB file format to generate a DDB file which can be read by the ICT; and loading the DDB file into a memory of the ICT and burning so as to perform ICT test. The generation method of the DDB file in the ICT test program can be used for directly generating the DDB file; and only the DDB file is required to be cached into the memory of the ICT before the ICT test is performed and varying data is not required to be transmitted to the ICT by a computer, so that the time for data transmission is saved.
Description
Technical field
The present invention relates to a kind of generation method of DDB file, relate in particular to the generation method of the DDB file in a kind of Genrad of being applicable to ICT test procedure.
Background technology
When the burning test procedure of exploitation Genrad; need some variablees of burning to enter through regular meeting; such as MAC; Checksum or the like; but the DDB file that Genrad carries (being the set of schematic diagram file and PCB file) generation instrument is mainly used in the conversion of immobilized substance; the MAC that can not be used to change; the conversion of data such as Checksum; and can only use ICT (in circuittester; be the on-line testing instrument) language produce; therefore; therefore the data of each variation all need be transferred to board by the computing machine serial port when test, be burnt on the mainboard, again; transmission speed is slow, is unfavorable for the production line test.
Summary of the invention
In view of the above problems, the invention provides a kind of generation method of ICT test procedure DDB file.
In order to achieve the above object, the present invention has adopted following technical scheme: a kind of generation method of ICT test procedure DDB file, and it is applicable in the on-line testing instrument that wherein, this method mainly may further comprise the steps: input bar code variable, to generate binary documents; Read the machine characteristic information of online tester, the fileinfo that needs burning and the binary documents of generation; With the binary documents of the machine characteristic information that reads, the fileinfo that needs burning and generation in conjunction with to generate the DDB file that reads for the on-line testing instrument; And with this DDB file load to the internal memory of on-line testing instrument and burning, thereby carry out the ICT test.
Preferable, the invention provides a kind of generation method of ICT test procedure DDB file, wherein, the machine characteristic information spinner of described on-line testing instrument will comprise machine models, the burning mode of online tester.
Compared to prior art, the generation method of ICT test procedure DDB file of the present invention, can directly generate the DDB file, only need before carrying out the ICT test this DDB file cache to the internal memory of on-line testing instrument, and the data that do not need to change are sent in the on-line testing instrument via computing machine, thereby have saved the time of data transmission.
Description of drawings
Fig. 1 is a process flow diagram of the present invention
Embodiment
Please refer to shown in Figure 1ly, be process flow diagram of the present invention.The invention provides the generation method of ICT test procedure DDB file, it mainly is applicable in the Genrad on-line testing instrument, in order to directly to generate the DDB file, to carry out the burning of ICT test.
Wherein, the generation method of this ICT test procedure DDB file mainly may further comprise the steps:
Step 101: input bar code variable, to generate binary documents;
Step 102: read the machine characteristic information of online tester, the fileinfo that needs burning and the binary documents of generation;
Step 103: with the binary documents of the machine characteristic information that reads, the fileinfo that needs burning and generation by the form of DDB file in conjunction with to generate the DDB file that can read for the on-line testing instrument; And
Step 104: with this DDB file load to the internal memory of on-line testing instrument and burning, thereby carry out the ICT test.
Wherein, the machine characteristic information spinner of described on-line testing instrument will comprise machine models, burning mode of online tester etc.
Compared to prior art, the generation method of ICT test procedure DDB file of the present invention, can directly generate the DDB file, only need before carrying out the ICT test this DDB file cache to the internal memory of on-line testing instrument, and the data that do not need to change are sent in the on-line testing instrument via computing machine, thereby have saved the time of data transmission.
Claims (2)
1. the generation method of an ICT test procedure DDB file, it is applicable in the on-line testing instrument, it is characterized in that, this method mainly may further comprise the steps:
Input bar code variable is to generate binary documents;
Read the machine characteristic information of online tester, the fileinfo that needs burning and the binary documents of generation;
With the binary documents of the machine characteristic information that reads, the fileinfo that needs burning and generation in conjunction with to generate the DDB file that reads for the on-line testing instrument; And
With this DDB file load to the internal memory of on-line testing instrument and burning, thereby carry out the ICT test.
2. the generation method of ICT test procedure DDB file according to claim 1 is characterized in that, the machine characteristic information spinner of described on-line testing instrument will comprise machine models, the burning mode of online tester.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201010155725XA CN102236597A (en) | 2010-04-27 | 2010-04-27 | Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201010155725XA CN102236597A (en) | 2010-04-27 | 2010-04-27 | Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program |
Publications (1)
Publication Number | Publication Date |
---|---|
CN102236597A true CN102236597A (en) | 2011-11-09 |
Family
ID=44887265
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201010155725XA Pending CN102236597A (en) | 2010-04-27 | 2010-04-27 | Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN102236597A (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6352854B1 (en) * | 1995-04-25 | 2002-03-05 | Discovery Partners International, Inc. | Remotely programmable matrices with memories |
CN101364174A (en) * | 2007-08-09 | 2009-02-11 | 鸿富锦精密工业(深圳)有限公司 | Test file generation system and method for printed circuit board |
CN101551769A (en) * | 2009-04-28 | 2009-10-07 | 中兴通讯股份有限公司 | Agglomeration method and device of configurable firmware |
-
2010
- 2010-04-27 CN CN201010155725XA patent/CN102236597A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6352854B1 (en) * | 1995-04-25 | 2002-03-05 | Discovery Partners International, Inc. | Remotely programmable matrices with memories |
CN101364174A (en) * | 2007-08-09 | 2009-02-11 | 鸿富锦精密工业(深圳)有限公司 | Test file generation system and method for printed circuit board |
CN101551769A (en) * | 2009-04-28 | 2009-10-07 | 中兴通讯股份有限公司 | Agglomeration method and device of configurable firmware |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN104865518B (en) | A kind of CLB dynamic collocation methods of SRAM type FPGA | |
CN102184741A (en) | Method for programming serial periphery interface (SPI) FLASH | |
CN101504692A (en) | System and method for validating and testing on-chip system | |
CN104156238A (en) | Burning method capable of increasing VR chip FW burning efficiency | |
CN104575143A (en) | Information entry method and device | |
CN114660435A (en) | FPGA-based testing device | |
CN102566303B (en) | Method for automatically embedding plotting parameters into Barco plotter | |
CN111400169A (en) | Method and system for automatically generating netlist file for testing software and hardware | |
CN100407878C (en) | Method and apparatus for examining uniformity | |
CN101458653A (en) | Automatic test method for tax controller of cash register | |
CN103024055B (en) | For the Webpage compression method of mobile terminal, system and cloud server | |
CN102236597A (en) | Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program | |
CN103389418A (en) | Method and device for detecting electromagnetic compatibility | |
CN104679660A (en) | Embedded system debugging method and device based on symbol table | |
CN116737270A (en) | Equipment, system and method for rapid adaptation of instrument function | |
CN103065234B (en) | Electronic endorsement system | |
CN104182587A (en) | Method and device for generating PCB manufacturing sheet information | |
CN102054085A (en) | Circuit board production and design system and method | |
US20140218066A1 (en) | Voltage testing device and voltage testing method for cpu | |
Yan et al. | Study of the way to firmware program upgrade in FPGA reconfiguration of distributed geophysical instruments | |
JP4817121B2 (en) | Device test system, server, device tester, and pattern data setting method | |
CN105516158A (en) | Configurable protocol conversion state machine circuit structure and protocol configuration method | |
CN101055643B (en) | An image generator and method and system for chip validation | |
CN103488500A (en) | Multimedia document processing method and device | |
CN109063333A (en) | A kind of integrated emulation method and system based on IBIS model |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20111109 |