CN102236597A - Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program - Google Patents

Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program Download PDF

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Publication number
CN102236597A
CN102236597A CN201010155725XA CN201010155725A CN102236597A CN 102236597 A CN102236597 A CN 102236597A CN 201010155725X A CN201010155725X A CN 201010155725XA CN 201010155725 A CN201010155725 A CN 201010155725A CN 102236597 A CN102236597 A CN 102236597A
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China
Prior art keywords
file
ict
ddb
generation method
burning
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Pending
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CN201010155725XA
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Chinese (zh)
Inventor
涂辉
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Mitac Computer Shunde Ltd
Shunda Computer Factory Co Ltd
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Mitac Computer Shunde Ltd
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Application filed by Mitac Computer Shunde Ltd filed Critical Mitac Computer Shunde Ltd
Priority to CN201010155725XA priority Critical patent/CN102236597A/en
Publication of CN102236597A publication Critical patent/CN102236597A/en
Pending legal-status Critical Current

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Abstract

The invention provides a generation method of a DDB (Distributed Data Base) file in an ICT (In Circuit Tester) test program. The generation method mainly comprises the following steps of: inputting a bar code variable to generate a binary document; reading machine characteristic information of an ICT, file information to be burned and the generated binary document; combining the read machine characteristic information, file information to be burned and generated binary document in a DDB file format to generate a DDB file which can be read by the ICT; and loading the DDB file into a memory of the ICT and burning so as to perform ICT test. The generation method of the DDB file in the ICT test program can be used for directly generating the DDB file; and only the DDB file is required to be cached into the memory of the ICT before the ICT test is performed and varying data is not required to be transmitted to the ICT by a computer, so that the time for data transmission is saved.

Description

The generation method of ICT test procedure DDB file
Technical field
The present invention relates to a kind of generation method of DDB file, relate in particular to the generation method of the DDB file in a kind of Genrad of being applicable to ICT test procedure.
Background technology
When the burning test procedure of exploitation Genrad; need some variablees of burning to enter through regular meeting; such as MAC; Checksum or the like; but the DDB file that Genrad carries (being the set of schematic diagram file and PCB file) generation instrument is mainly used in the conversion of immobilized substance; the MAC that can not be used to change; the conversion of data such as Checksum; and can only use ICT (in circuittester; be the on-line testing instrument) language produce; therefore; therefore the data of each variation all need be transferred to board by the computing machine serial port when test, be burnt on the mainboard, again; transmission speed is slow, is unfavorable for the production line test.
Summary of the invention
In view of the above problems, the invention provides a kind of generation method of ICT test procedure DDB file.
In order to achieve the above object, the present invention has adopted following technical scheme: a kind of generation method of ICT test procedure DDB file, and it is applicable in the on-line testing instrument that wherein, this method mainly may further comprise the steps: input bar code variable, to generate binary documents; Read the machine characteristic information of online tester, the fileinfo that needs burning and the binary documents of generation; With the binary documents of the machine characteristic information that reads, the fileinfo that needs burning and generation in conjunction with to generate the DDB file that reads for the on-line testing instrument; And with this DDB file load to the internal memory of on-line testing instrument and burning, thereby carry out the ICT test.
Preferable, the invention provides a kind of generation method of ICT test procedure DDB file, wherein, the machine characteristic information spinner of described on-line testing instrument will comprise machine models, the burning mode of online tester.
Compared to prior art, the generation method of ICT test procedure DDB file of the present invention, can directly generate the DDB file, only need before carrying out the ICT test this DDB file cache to the internal memory of on-line testing instrument, and the data that do not need to change are sent in the on-line testing instrument via computing machine, thereby have saved the time of data transmission.
Description of drawings
Fig. 1 is a process flow diagram of the present invention
Embodiment
Please refer to shown in Figure 1ly, be process flow diagram of the present invention.The invention provides the generation method of ICT test procedure DDB file, it mainly is applicable in the Genrad on-line testing instrument, in order to directly to generate the DDB file, to carry out the burning of ICT test.
Wherein, the generation method of this ICT test procedure DDB file mainly may further comprise the steps:
Step 101: input bar code variable, to generate binary documents;
Step 102: read the machine characteristic information of online tester, the fileinfo that needs burning and the binary documents of generation;
Step 103: with the binary documents of the machine characteristic information that reads, the fileinfo that needs burning and generation by the form of DDB file in conjunction with to generate the DDB file that can read for the on-line testing instrument; And
Step 104: with this DDB file load to the internal memory of on-line testing instrument and burning, thereby carry out the ICT test.
Wherein, the machine characteristic information spinner of described on-line testing instrument will comprise machine models, burning mode of online tester etc.
Compared to prior art, the generation method of ICT test procedure DDB file of the present invention, can directly generate the DDB file, only need before carrying out the ICT test this DDB file cache to the internal memory of on-line testing instrument, and the data that do not need to change are sent in the on-line testing instrument via computing machine, thereby have saved the time of data transmission.

Claims (2)

1. the generation method of an ICT test procedure DDB file, it is applicable in the on-line testing instrument, it is characterized in that, this method mainly may further comprise the steps:
Input bar code variable is to generate binary documents;
Read the machine characteristic information of online tester, the fileinfo that needs burning and the binary documents of generation;
With the binary documents of the machine characteristic information that reads, the fileinfo that needs burning and generation in conjunction with to generate the DDB file that reads for the on-line testing instrument; And
With this DDB file load to the internal memory of on-line testing instrument and burning, thereby carry out the ICT test.
2. the generation method of ICT test procedure DDB file according to claim 1 is characterized in that, the machine characteristic information spinner of described on-line testing instrument will comprise machine models, the burning mode of online tester.
CN201010155725XA 2010-04-27 2010-04-27 Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program Pending CN102236597A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201010155725XA CN102236597A (en) 2010-04-27 2010-04-27 Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201010155725XA CN102236597A (en) 2010-04-27 2010-04-27 Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program

Publications (1)

Publication Number Publication Date
CN102236597A true CN102236597A (en) 2011-11-09

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CN201010155725XA Pending CN102236597A (en) 2010-04-27 2010-04-27 Generation method of DDB (Distributed Data Base) file in ICT (In Circuit Tester) test program

Country Status (1)

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CN (1) CN102236597A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6352854B1 (en) * 1995-04-25 2002-03-05 Discovery Partners International, Inc. Remotely programmable matrices with memories
CN101364174A (en) * 2007-08-09 2009-02-11 鸿富锦精密工业(深圳)有限公司 Test file generation system and method for printed circuit board
CN101551769A (en) * 2009-04-28 2009-10-07 中兴通讯股份有限公司 Agglomeration method and device of configurable firmware

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6352854B1 (en) * 1995-04-25 2002-03-05 Discovery Partners International, Inc. Remotely programmable matrices with memories
CN101364174A (en) * 2007-08-09 2009-02-11 鸿富锦精密工业(深圳)有限公司 Test file generation system and method for printed circuit board
CN101551769A (en) * 2009-04-28 2009-10-07 中兴通讯股份有限公司 Agglomeration method and device of configurable firmware

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Application publication date: 20111109