CN102819176A - Laser projection device capable of achieving splicing automatically and method thereof - Google Patents

Laser projection device capable of achieving splicing automatically and method thereof Download PDF

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Publication number
CN102819176A
CN102819176A CN2011101612891A CN201110161289A CN102819176A CN 102819176 A CN102819176 A CN 102819176A CN 2011101612891 A CN2011101612891 A CN 2011101612891A CN 201110161289 A CN201110161289 A CN 201110161289A CN 102819176 A CN102819176 A CN 102819176A
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CN
China
Prior art keywords
radium
shine
projection
light source
dimentional
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Pending
Application number
CN2011101612891A
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Chinese (zh)
Inventor
于英杰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FUGANG ELECTRONIC (KUNSHAN) CO LTD
Cheng Uei Precision Industry Co Ltd
Original Assignee
FUGANG ELECTRONIC (KUNSHAN) CO LTD
Cheng Uei Precision Industry Co Ltd
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Application filed by FUGANG ELECTRONIC (KUNSHAN) CO LTD, Cheng Uei Precision Industry Co Ltd filed Critical FUGANG ELECTRONIC (KUNSHAN) CO LTD
Priority to CN2011101612891A priority Critical patent/CN102819176A/en
Publication of CN102819176A publication Critical patent/CN102819176A/en
Pending legal-status Critical Current

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Abstract

The invention relates to a laser projection device capable of achieving splicing automatically and a method thereof. The laser projection device is provided with a plurality of groups of two-dimensional laser projection assemblies which are connected through an extension projection control system, and each assembly is provided with a laser light source, a light source detector, a lens and a driving system connected to the lens. The method is carried out through the laser projection device and includes: enabling at least two groups of two-dimensional laser projection assemblies to project laser light to form total images with frames; confirming that the frames of the total images are overlapped to form an overlapping zone; enabling one of the two groups of two-dimensional laser projection assemblies to send laser light and serve as laser light emitters, and enabling the other group of two-dimensional laser projection assemblies to drive the lens to perform scanning and serve as laser light source detectors; confirming that the two groups of two-dimensional laser projection assemblies point to the same point in the overlapping zone; and converting one group of two-dimensional laser projection assemblies into another laser light emitters. The laser projection device capable of achieving splicing automatically and the method of the laser projection device save time and can improve splicing accuracy.

Description

Automatically the radium-shine projection arrangement and the method thereof of continued access
Technical field
The present invention relates to a kind of projection arrangement and method thereof, relate in particular to a kind of radium-shine projection arrangement and method thereof of continued access automatically.
Background technology
The method of traditional extension projection image is with being connected about the projector more than two groups or up and down.The mode that is connected adjustment is hard-edge, simply overlap or mode such as edge fusion is got specific figure earlier and finely tuned precision or the interlock degree that the projecting direction of projector is connected with calibration with the mode of manual work again.
Because the precision that needs artificial visual inspection to be connected when calibration is connected, and just can be variant through the part that is connected after the difference of long-time operation, environmental vibration or temperature, needing manual synchronizing again, time-consuming effort again uses very inconvenient.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of radium-shine projection arrangement and method thereof of continued access automatically, to solve the problem that prior art exists.
For reaching above-mentioned purpose, technical scheme provided by the invention is:
A kind of radium-shine projection arrangement of continued access automatically; It is characterized in that having the two-dimentional radium-shine projecting subassembly of plural groups; Be connected through the projection control system that extends, said each organize two-dimentional radium-shine projecting subassembly and all have a radium-shine light source, can launch the radium-shine light of a projection; One light source detector can receive and detect the radium-shine light of an incident; One eyeglass, the radium-shine light of said projection can be throwed according to its orientation in movable adjustment orientation, or receives and guide said incident radium-shine light; And a drive system, be connected to said eyeglass, to drive the said eyeglass of adjustment orientation.
The radium-shine projecting subassembly of described two dimension has a polar biased spectroscope in addition, and corresponding said eyeglass setting is in order to be directed to said light source detector with the radium-shine light of incident.
The radium-shine projecting subassembly of described two dimension has a control system in addition; Be connected to said radium-shine light source, said light source detector, said drive system; The said radium-shine light source of control system may command of one group two-dimentional radium-shine projecting subassembly is launched the radium-shine light of said projection in the radium-shine projecting subassembly of therefore said plural groups two dimension; And control the said eyeglass of said drive systems and throw on said radium-shine light to one image frame, as a radium-shine light emitters; The said eyeglass of the said drive systems of control system may command of the two-dimentional radium-shine projecting subassembly of another group in the radium-shine projecting subassembly of said plural groups two dimension; Reflect and be incident to said another at said image frame and organize the radium-shine light of incident in the two-dimentional radium-shine projecting subassembly to detect the radium-shine light of said projection, with as radium-shine light source detector.
The radium-shine projecting subassembly of described two dimension is the radium-shine projecting subassembly of two-dimentional MEMS microcomputer.
A kind of radium-shine projecting method of continued access automatically; It is characterized in that implementing through a kind of radium-shine projection arrangement of continued access automatically; Said radium-shine projection arrangement has the two-dimentional radium-shine projecting subassembly of plural groups; Be connected through the projection control system that extends, said each organize two-dimentional radium-shine projecting subassembly and have a radium-shine light source, can launch the radium-shine light of a projection; One light source detector can receive and detect the radium-shine light of an incident; One eyeglass, the radium-shine light of said projection can be throwed according to its orientation in movable adjustment orientation, or receives and guide said incident radium-shine light; And a drive system, be connected to said eyeglass, to drive the said eyeglass of adjustment orientation, the radium-shine projecting method of described automatic connection has following steps:
(1) two groups of radium-shine projecting subassemblies of two dimension in the radium-shine projecting subassembly of said plural groups two dimension are projected said projection laser light line respectively and form a total image, each total image has a frame;
(2) confirms that the two-dimensional laser projection assembly full image's borders overlap each other to form a heavy Xing region;
(3) see through said extension projection control system and send the swing instruction; Make in said two groups of radium-shine projecting subassemblies of two dimension one group the said radium-shine light source of two-dimentional radium-shine projecting subassembly launch the radium-shine light of said projection; And control the said eyeglass of said drive systems and scan and throw on said radium-shine light to one image frame; As a radium-shine light emitters; And the said eyeglass of said drive systems of the two-dimentional radium-shine projecting subassembly of another group in said two groups of radium-shine projecting subassemblies of two dimension is scanned; Reflect and be incident to said another at said image frame and organize the radium-shine light of incident in the two-dimentional radium-shine projecting subassembly to detect the radium-shine light of said projection, with as radium-shine light source detector;
(4) confirm that said two groups of radium-shine projecting subassemblies of two dimension are to point to same point in said overlapping zone; And
(5) through said extension projection control system said another organized two-dimentional radium-shine projecting subassembly and change into another radium-shine light emitters.
In the step (3), said radium-shine light emitters and radium-shine light source detector are that same surface level is placed, and both swing instructions are identical in vertical direction, opposite in the horizontal direction.
In the step (3), said radium-shine light emitters and radium-shine light source detector are last held, and both swing instructions are opposite in vertical direction, identical in the horizontal direction.
Radium-shine light emitters described in the step (3) is to carry out different hunting periods with the scanning of radium-shine light source detector.
Said method in step (5) afterwards, the laser light picture that the image frame that said another radium-shine light emitters is projected throw with said radium-shine light emitters continues.
Said method is in step (3), and the scanning of said eyeglass is the scanning of sweep trace formula.
Said method is in step (3), and the scanning of said eyeglass is the scanning of Lissajous-like pattern form.
The present invention has reduced the adjustment time of continuing of manual work and the accuracy that raising continues, and has improved work efficiency greatly.
Description of drawings
Fig. 1 is the radium-shine projecting subassembly inner structure of the present invention's two dimension MEMS microcomputer synoptic diagram.
Fig. 2 scans the synoptic diagram of mirror with the scanning of sweep trace formula for the present invention's two dimension MEMS microcomputer.
Fig. 3 scans mirror is educated formula scanning with Li Sha synoptic diagram for the present invention's two dimension MEMS microcomputer.
Fig. 4 throws the embodiment that the image edge merges for the present invention's tradition extends.
Fig. 5 seeks synchronous synoptic diagram for the radium-shine projector of the present invention's two groups of two dimensions MEMS microcomputer in the zone that overlaps.
Fig. 6 is the single line of the present invention synoptic diagram that continues.
Fig. 7 is the picture frame of the present invention synoptic diagram that continues.
Among the figure:
The radium-shine projecting subassembly of 100 two-dimentional MEMS microcomputers
101 two-dimentional MEMS microcomputer eyeglasses
102 radium-shine light sources
103 light source detectors
104 drive systems
105 polar biased spectroscopes
106 control system
200 total images
201 total images
202 extend throws control system
The radium-shine light emitters of the 203 radium-shine projections of two-dimentional MEMS microcomputer
The radium-shine light source detector of 204 two-dimentional MEMS microcomputer projections
205 overlapping zones
Embodiment
The present invention provides a kind of radium-shine projection arrangement of continued access automatically; Below will combine accompanying drawing that one of the present invention example is done further explanation; Wherein be to describe for coming example with radium-shine projection arrangement with two groups of radium-shine projecting subassemblies of two dimension; The radium-shine projecting subassembly of described two dimension is to launch radium-shine light, and can detect or receive radium-shine light, so these two groups of radium-shine projecting subassemblies can be according to control as radium-shine light emitters or radium-shine light source detector.The radium-shine projecting subassembly of described two dimension can be the radium-shine projector of two-dimentional MEMS microcomputer, or other similar devices.
Next penetrate at the projecting subassembly person is that example is explained the radium-shine projection arrangement of automatic connection of the present invention to have two groups of two dimensions.For ease of explanation, the radium-shine projection arrangement of automatic connection hereinafter of the present invention also can simply be called " projection arrangement " sometimes.Like Fig. 5, Fig. 6 or shown in Figure 7, according to the present invention, the radium-shine projection arrangement of an automatic connection comprises two groups two-dimentional radium-shine projecting subassembly, is denoted as 203 and 204 respectively, and the two connects mutually through one group of projection control system 202 that extends.The radium-shine projecting subassembly of said two dimension is preferably the radium-shine projector of two-dimentional MEMS microcomputer.
The structure that cooperates two-dimentional radium-shine projecting subassembly (being the two-dimentional radium- shine projecting subassembly 203 or 204 among Fig. 5, Fig. 6, Fig. 7) used in the explanation shown in Figure 1 projection arrangement of the present invention now.In Fig. 1; Said two-dimentional radium-shine projecting subassembly is to indicate with label 100; Its polar biased spectroscope 105 that is provided with by eyeglass (for example two-dimentional MEMS microcomputer eyeglass) 101, radium-shine light source 102, light source detector 103, drive system 104, corresponding to eyeglass 101, form with 106 of control system; Wherein radium-shine light source 102, light source detector 103, drive system 104 are connected on the control system 106, and control start by control system 106.Two dimension MEMS microcomputer eyeglass 101 is its angle orientations of movable adjustment, and drive system 104 is connected to two-dimentional MEMS microcomputer eyeglass 101, to drive 101 deflections of two-dimentional MEMS microcomputer eyeglass and to move to the desired position and angle.In the emission of radium-shine light, radium-shine light source 102 is exported the radium-shine light of desire projection via control system 106 CSs.Can penetrate polar biased spectroscope 105 directives two dimension MEMS microcomputer eyeglass 101 after the radium-shine light output of projection.Throw away again after the direct reflection via two-dimentional MEMS microcomputer eyeglass 101.
On the other hand; In the reception of radium-shine light; When the radium-shine light of incident is injected; The first control-driven systems 104 of control system 106 drive two-dimentional MEMS microcomputer eyeglass 101 to corresponding angle, and correct goes into polar biased spectroscope 105 with the laser light line reflection, polar biased spectroscope 105 again with incident laser light line reflection to light source detector 103.The radium-shine light of injecting light source detector 103 converts electronic signal into through light source detector 103 and notifies control system 106 radium-shine light to import afterwards.Control system 106 can referenced drive system 104 driving parameters learn the swaying direction of the two-dimentional MEMS microcomputer eyeglass 101 of this moment.
The scanning pattern of two dimension MEMS microcomputer eyeglass has sweep trace formula scanning (like Fig. 2) and Lissajous-like pattern form scanning (like Fig. 3) two kinds.These two kinds can both form frame at the picture frame edge.When utilizing extension projection image technology; Be with two groups of radium-shine projectors see through respectively Fig. 2 the scanning of sweep trace formula or Fig. 3 the scanning of Lissajous-like pattern form or other scan mode and projection goes out two group images that will overlap, and the part that sees through frame overlaps and carries out continuing of image.Utilize among the present invention and two groups of two dimension MEMS microcomputer radium-shine projecting subassemblies are set in the projection arrangement to project respectively two group images that will overlap.Certain framework of the present invention also can expand to has three groups or the radium-shine projecting subassembly of more two-dimentional MEMS microcomputers of group, projects three groups or more image of organizing respectively more.Therefore, according to of the present invention one preferable example, the embodiment of the projection image that extends is as shown in Figure 4, implements with two groups of two dimension radium-shine projecting subassemblies 203 of MEMS microcomputer and 204.
As shown in Figure 4; Image in embodiment of the present invention continues technical; Two groups of two dimension radium-shine projecting subassemblies 203 of MEMS microcomputer and 204 in the present invention's the projection arrangement are respectively as radium-shine light emitters 203 of the radium-shine projection of two-dimentional MEMS microcomputer and the radium-shine light source detector 204 of two-dimentional MEMS microcomputer projection; And as aforementioned, the structure of the two all with Fig. 1 in the radium-shine projecting subassembly of two-dimentional MEMS microcomputer 100 identical.At first let two groups of radium-shine projecting subassemblies of two dimension MEMS microcomputer all project total image (Full Image) 200,201 separately.Then again with the mode of manual work adjustment, move described two groups of two dimension radium-shine projecting subassemblies 203 of MEMS microcomputer and 204 or wherein at least one, the edge that two total images, 200,201 desires are engaged overlaps mutually and forms the zone 205 that overlaps.
As shown in Figure 5; Two groups of radium-shine projecting subassemblies of two dimension MEMS microcomputer in the projection arrangement of the present invention are when the enforcement image continues; With one group as the radium-shine light emitters 203 of two-dimentional MEMS microcomputer projection, another is organized as the radium-shine light source detector 204 of two-dimentional MEMS microcomputer projection.Two groups of radium-shine projecting subassemblies of two dimension MEMS microcomputer connect mutually by an extension projection control system 202.According to the present invention; When the enforcement image continues; The projection control system 202 that extends can be sent the instruction of swing to radium-shine light emitters 203 and radium-shine light source detector 204, and the control system 104 that sees through radium-shine light emitters 203 and radium-shine light source detector 204 drives eyeglasses 101 and scans swing.According to embodiments of the invention, the swing instruction that the projection control system that extends is sent is opposite on the direction that continues.That is, about radium-shine light emitters 203 and radium-shine light source detector 204 done, put when continuing, swing up and down direction and be in the same way (the same or with down), but the direction that swings is reverse (the first from left is right).Relative, if put up and down when continuing when radium-shine light emitters 203 and radium-shine light source detector 204, then swinging up and down direction is reverse (one on the other), and the direction that swings is in the same way (with a left side or the right side together).Yet two groups of reverse scanning times hunting period must be consistent; Time hunting period in the same way necessary one fast one is slow, so could in finite time, let two groups of radium-shine projectors of two dimension MEMS microcomputer point to same point mutually.This moment, radium-shine light source detector 204 just can detect the radium-shine light that radium-shine light emitters 203 is penetrated.Time hunting period synchronization at this moment in the same way can be in a complete scan picture frame (Frame) in the hope of radium-shine light source detector 204, and each bar sweep trace all can receive the laser light from radium-shine light emitters 203 in the zone 205 that overlaps.Projection control system 202 is confirmed in a complete scan picture frame (Frame) when extending; Two groups of two dimension MEMS microcomputer radium-shine projectors be scanned up at every turn overlap all can point to same point mutually at regional 205 o'clock after; Just can give an order to radium-shine light source detector 204; Make it transfer the laser light emission to, with the laser light pattern of the radium-shine light emitters 203 that continues.Like Fig. 6, shown in Figure 7.
Fig. 6 is that single line continued access, Fig. 7 are the picture frame continued access, and the application that single line continues can be used as the radium-shine light automatic connection of radium-shine level meter; The application that picture frame continues can be used as the automatic connection of image projection.
When radium-shine light causes bad connection because of environmental change, just can assign the instruction of the detecting that continues again to the projection control system 202 that extends.When the just continued access again of latter two laser light line projection of accomplishing calibration procedure again.

Claims (9)

1. radium-shine projection arrangement of continued access automatically; It is characterized in that having the two-dimentional radium-shine projecting subassembly of plural groups; Be connected through the projection control system that extends, said each organize two-dimentional radium-shine projecting subassembly and all have a radium-shine light source, can launch the radium-shine light of a projection; One light source detector can receive and detect the radium-shine light of an incident; One eyeglass, the radium-shine light of said projection can be throwed according to its orientation in movable adjustment orientation, or receives and guide said incident radium-shine light; And a drive system, be connected to said eyeglass, to drive the said eyeglass of adjustment orientation.
2. the radium-shine projection arrangement of continued access automatically according to claim 1 is characterized in that the radium-shine projecting subassembly of described two dimension has a polar biased spectroscope in addition, and corresponding said eyeglass setting is in order to be directed to said light source detector with the radium-shine light of incident.
3. the radium-shine projection arrangement of continued access automatically according to claim 1; It is characterized in that the radium-shine projecting subassembly of described two dimension has a control system in addition; Be connected to said radium-shine light source, said light source detector, said drive system; The said radium-shine light source of control system may command of one group two-dimentional radium-shine projecting subassembly is launched the radium-shine light of said projection in the radium-shine projecting subassembly of therefore said plural groups two dimension; And control the said eyeglass of said drive systems and throw on said radium-shine light to one image frame, as a radium-shine light emitters; The said eyeglass of the said drive systems of control system may command of the two-dimentional radium-shine projecting subassembly of another group in the radium-shine projecting subassembly of said plural groups two dimension; Reflect and be incident to said another at said image frame and organize the radium-shine light of incident in the two-dimentional radium-shine projecting subassembly to detect the radium-shine light of said projection, with as radium-shine light source detector.
4. the radium-shine projection arrangement of continued access automatically according to claim 1 is characterized in that the radium-shine projecting subassembly of described two dimension is the radium-shine projecting subassembly of two-dimentional MEMS microcomputer.
5. radium-shine projecting method of continued access automatically; It is characterized in that implementing through a kind of radium-shine projection arrangement of continued access automatically; Said radium-shine projection arrangement has the two-dimentional radium-shine projecting subassembly of plural groups; Be connected through the projection control system that extends, said each organize two-dimentional radium-shine projecting subassembly and have a radium-shine light source, can launch the radium-shine light of a projection; One light source detector can receive and detect the radium-shine light of an incident; One eyeglass is movable adjustment orientation, can throw the radium-shine light of said projection according to its orientation, or receives and guide said incident radium-shine light; And a drive system, be connected to said eyeglass, to drive the said eyeglass of adjustment orientation, the radium-shine projecting method of described automatic connection has following steps:
(1) said two groups of radium-shine projecting subassemblies of two dimension organizing again in the two-dimentional radium-shine projecting subassembly are projected said projection laser light line respectively and form a total image, each total image has a frame;
(2) confirms that the two-dimensional laser projection assembly group full image's borders overlap each other to form a heavy Xing region;
(3) see through said extension projection control system and send the swing instruction; Make in said two groups of radium-shine projecting subassemblies of two dimension one group the said radium-shine light source of two-dimentional radium-shine projecting subassembly launch the radium-shine light of said projection; And control the said eyeglass of said drive systems and scan and throw on said radium-shine light to one image frame; As a radium-shine light emitters; And the said eyeglass of said drive systems of the two-dimentional radium-shine projecting subassembly of another group in said two groups of radium-shine projecting subassemblies of two dimension is scanned; Reflect and be incident to said another at said image frame and organize the radium-shine light of incident in the two-dimentional radium-shine projecting subassembly to detect the radium-shine light of said projection, with as radium-shine light source detector;
(4) confirm that said two groups of radium-shine projecting subassemblies of two dimension are to point to same point in said overlapping zone; And
(5) through said extension projection control system said another organized two-dimentional radium-shine projecting subassembly and change into another radium-shine light emitters.
6. the radium-shine projecting method of continued access automatically according to claim 5; It is characterized in that in step (3); Said radium-shine light emitters and radium-shine light source detector are that same surface level is placed, and both swing instructions are identical in vertical direction, opposite in the horizontal direction.
7. radium-shine projecting method according to claim 5 is characterized in that in step (3) said radium-shine light emitters and radium-shine light source detector are last held, and both swing instructions are opposite in vertical direction, identical in the horizontal direction.
8. radium-shine projecting method according to claim 5 is characterized in that in step (3), and said radium-shine light emitters is to carry out different hunting periods with the scanning of radium-shine light source detector.
9. radium-shine projecting method according to claim 5 is characterized in that in step (5) afterwards, the laser light picture that the image frame that said another radium-shine light emitters is projected throw with said radium-shine light emitters continues.
CN2011101612891A 2011-06-10 2011-06-10 Laser projection device capable of achieving splicing automatically and method thereof Pending CN102819176A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI635463B (en) * 2017-03-28 2018-09-11 良瑞科技股份有限公司 Method for detecting appearance of articles with continuous image capturing function

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1573412A (en) * 2003-06-02 2005-02-02 精工爱普生株式会社 Scanning device, laser projector, and optical device
US20090161193A1 (en) * 2007-12-19 2009-06-25 Yoshihiro Maeda Projection display system for modulating light beams from plural laser light sources
CN201662677U (en) * 2010-03-06 2010-12-01 富港电子(东莞)有限公司 Projector

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1573412A (en) * 2003-06-02 2005-02-02 精工爱普生株式会社 Scanning device, laser projector, and optical device
US20090161193A1 (en) * 2007-12-19 2009-06-25 Yoshihiro Maeda Projection display system for modulating light beams from plural laser light sources
CN201662677U (en) * 2010-03-06 2010-12-01 富港电子(东莞)有限公司 Projector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI635463B (en) * 2017-03-28 2018-09-11 良瑞科技股份有限公司 Method for detecting appearance of articles with continuous image capturing function

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Application publication date: 20121212