CN103727883A - 利用按键间隙测量键盘相对高度的方法及其装置 - Google Patents

利用按键间隙测量键盘相对高度的方法及其装置 Download PDF

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CN103727883A
CN103727883A CN201410003261.9A CN201410003261A CN103727883A CN 103727883 A CN103727883 A CN 103727883A CN 201410003261 A CN201410003261 A CN 201410003261A CN 103727883 A CN103727883 A CN 103727883A
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CN103727883B (zh
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刘勇
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Suzhou Jujia Electronic Technology Co., LTD.
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GFOCUS TECHNOLOGIES Co Ltd
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2600145A (en) * 2020-10-23 2022-04-27 Secr Defence A device and method for measuring impact patterns

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0122082A2 (fr) * 1983-04-08 1984-10-17 Tektronix, Inc. Dispositif et procédé pour modifier des images affichées en couleurs
JPS6041872A (ja) * 1983-08-17 1985-03-05 Canon Inc モニタ装置
JPS62291628A (ja) * 1986-06-11 1987-12-18 Fuji Photo Film Co Ltd 主要画像指示装置
CN101424518A (zh) * 2007-10-31 2009-05-06 比亚迪股份有限公司 一种按键间距的检测方法及系统
CN102156579A (zh) * 2011-03-31 2011-08-17 华为终端有限公司 一种触摸显示屏坐标的校准方法、装置及终端设备
CN103391480A (zh) * 2013-07-15 2013-11-13 Tcl集团股份有限公司 一种向电视机输入字符的方法及系统

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0122082A2 (fr) * 1983-04-08 1984-10-17 Tektronix, Inc. Dispositif et procédé pour modifier des images affichées en couleurs
JPS6041872A (ja) * 1983-08-17 1985-03-05 Canon Inc モニタ装置
JPS62291628A (ja) * 1986-06-11 1987-12-18 Fuji Photo Film Co Ltd 主要画像指示装置
CN101424518A (zh) * 2007-10-31 2009-05-06 比亚迪股份有限公司 一种按键间距的检测方法及系统
CN102156579A (zh) * 2011-03-31 2011-08-17 华为终端有限公司 一种触摸显示屏坐标的校准方法、装置及终端设备
CN103391480A (zh) * 2013-07-15 2013-11-13 Tcl集团股份有限公司 一种向电视机输入字符的方法及系统

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
徐珂 等: "基于机器视觉的手机键盘质量检测系统", 《计算机系统应用》, no. 4, 31 December 2009 (2009-12-31), pages 7 - 10 *
曹健 等: "HexSight在键盘表面检测中的应用", 《PLC&FA》, 31 January 2005 (2005-01-31), pages 127 - 130 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2600145A (en) * 2020-10-23 2022-04-27 Secr Defence A device and method for measuring impact patterns

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Effective date of registration: 20170831

Address after: Suzhou City, Jiangsu Province, Suzhou Industrial Park 215123 Xinghu Street No. 218 BioBAY A4-520

Patentee after: Suzhou Jujia Electronic Technology Co., LTD.

Address before: 215500 building T2, Southeast campus of Changshu Institute Of Technology, Jiangsu, Suzhou

Patentee before: GFocus Technologies Co., Ltd.