CN104422876A - Testing fixture - Google Patents
Testing fixture Download PDFInfo
- Publication number
- CN104422876A CN104422876A CN201310411298.0A CN201310411298A CN104422876A CN 104422876 A CN104422876 A CN 104422876A CN 201310411298 A CN201310411298 A CN 201310411298A CN 104422876 A CN104422876 A CN 104422876A
- Authority
- CN
- China
- Prior art keywords
- card extender
- base
- transit point
- contacts
- electronic component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Abstract
The invention discloses a testing fixture which is used for testing a plurality of electrical contacts of an electronic element. The testing fixture comprises a base and an adapter plate. The base is provided with a plurality of testing contacts. A first side of the adapter plate is provided with a plurality of adapter contacts, a second side of the adapter plate is provided with a plurality of second adapter contacts, the first side is opposite to the second side, and the first adapter contacts are electrically connected with the second adapter contacts. When the adapter plate is arranged on the base and the second side faces the base, the second adapter contacts are electrically connected with the testing contacts. When the electronic element is arranged on the first side of the adapter plate, the first adapter contacts are electrically connected with the electrical contacts.
Description
Technical field
The present invention relates to a kind of measurement jig, especially relate to a kind of measurement jig of the electrical contact in order to testing electronic element.
Background technology
In response to electronic installation gradually towards compact trend development, circuit board also more does less, to avoid taking the too many inner space of electronic installation, makes the distribution ever greater concentration of the electrical contact on circuit board.For the outer pin (outer lead) on circuit board, the spacing between two adjacent outer pins is less than 300 microns, and the width of each outer pin is less than 150 microns, makes the test of outer pin quite not easily.The special Micro-probe tool of current employing is tested, and tool cost is significantly increased.In addition, must for different circuit boards special tool, overall production cost also will be made to increase.
Summary of the invention
An object of the present invention is to provide a kind of measurement jig, to solve the problem.
According to an embodiment, measurement jig of the present invention is in order to test multiple electrical contacts of an electronic component.Measurement jig comprises a base and a card extender.Base has multiple test contacts.One first side of card extender has multiple first transit point, and one second side of card extender has multiple second transit point, and wherein the first side is relative with the second side, and the first transit point is electrically connected with the second transit point.When card extender is arranged on base and the second side to base, the second transit point is electrically connected with test contacts.When on the first side that electronic component is arranged at card extender, the first transit point is electrically connected with electrical contact.
In sum, according to measurement jig of the present invention, tester can first make the second side of card extender be arranged on base to base by card extender, is then arranged on the first side of card extender by electronic component again.Now, namely the electrical contact of electronic component and the test contacts of base to be formed with the second transit point via the first transit point of relative two sides of card extender and be electrically connected, to test the electrical contact of electronic component.The present invention can design the first corresponding transit point for the spacing of the electrical contact of different electronic components and width design on card extender, to be formed with the test contacts of base via the second transit point again and be electrically connected, make card extender of the present invention be applicable to general electrical measurement board, effectively can promote the mobility of electrical measurement board.In addition, card extender cost of the present invention is low, also can avoid developing special Micro-probe tool and the expensive expense that produces.
Can be further understood by following detailed Description Of The Invention and appended accompanying drawing about the advantages and spirit of the present invention.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of measurement jig according to an embodiment of the invention;
Fig. 2 is that the card extender in Fig. 1 is in the schematic diagram at another visual angle;
Fig. 3 is that the card extender in Fig. 1 is arranged at the schematic diagram of on base and the second side to base;
Fig. 4 is the schematic diagram that electronic component is arranged on the first side of the card extender in Fig. 3.
Symbol description
1 measurement jig
3 electronic components
10 bases
12 card extenders
30 electrical contacts
32 second pilot holes
100 test contacts
102 reference columns
120 first transit points
122 second transit points
124 first pilot holes
S1 first side
S2 second side
Embodiment
Refer to Fig. 1 to Fig. 4, Fig. 1 is the schematic diagram of measurement jig 1 according to an embodiment of the invention, Fig. 2 is that card extender 12 in Fig. 1 is in the schematic diagram at another visual angle, Fig. 3 be the card extender 12 in Fig. 1 to be arranged on base 10 and the second side S2 towards the schematic diagram of base 10, Fig. 4 is the schematic diagram that electronic component 3 is arranged on the first side S1 of the card extender 12 in Fig. 3.Measurement jig 1 of the present invention is in order to multiple electrical contacts 30 of testing electronic element 3.In this embodiment, electronic component 3 can be a circuit board, but not as limit.
As shown in Figure 1, measurement jig 1 comprises base 10 and a card extender 12.In this embodiment, base 10 can be an electrical measurement board, but not as limit.Base 10 has multiple test contacts 100 and multiple reference column 102.In this embodiment, test contacts 100 can be probe, but not as limit.One first side S1 of card extender 12 has multiple first transit point 120, and one second side S2 of card extender 12 has multiple second transit point 122, and wherein the first side S1 is relative with the second side S2, and the first transit point 120 is electrically connected with the second transit point 122.In this embodiment, each first transit point 120 is electrically connected with corresponding second transit point 122 respectively, that is the first transit point 120 is identical with the quantity of the second transit point 122 and be electrically connected one to one.In actual applications, by wiring design, the first transit point 120 is electrically connected with the second transit point 122.Multiple first pilot hole 124 is formed on card extender 12, and multiple second pilot hole 32 is formed on electronic component 3.
When testing, tester can first make the second side S2 of card extender 12 be arranged on base 10 towards base 10 by card extender 12, each second transit point 122 is electrically connected respectively, as shown in Figure 3 with corresponding test contacts 100.In other words, the second transit point 122 and position one_to_one corresponding identical with the quantity of test contacts 100.When card extender 12 is arranged on base 10, each reference column 102 is each passed through corresponding first pilot hole 124.In other words, position by reference column 102 and the first pilot hole 124 pairs of test contacts 100 and the second transit point 122, to save the typesetting test duration, and then promote testing efficiency.
Then, electronic component 3 is arranged on the first side S1 of card extender 12 by tester again, each first transit point 120 is electrically connected, as shown in Figure 4 with corresponding electrical contact 30.In other words, the first transit point 120 and position one_to_one corresponding identical with the quantity of electrical contact 30.When electronic component 3 is arranged on card extender 12, each reference column 102 is each passed through corresponding second pilot hole 32.In other words, by reference column 102 and the second pilot hole 32, first transit point 120 and electrical contact 30 are positioned, to save the typesetting test duration, and then promote testing efficiency.
Sequentially card extender 12 to be arranged on base 10 and electronic component 3 is being arranged at after on card extender 12, namely the electrical contact 30 of electronic component 3 and the test contacts 100 of base 10 to be formed with the second transit point 122 via the first transit point 120 of relative two sides of card extender 12 and be electrically connected, to test the electrical contact 30 of electronic component 3.
In sum, according to measurement jig of the present invention, tester can first make the second side of card extender be arranged on base to base by card extender, is then arranged on the first side of card extender by electronic component again.Now, namely the electrical contact of electronic component and the test contacts of base to be formed with the second transit point via the first transit point of relative two sides of card extender and be electrically connected, to test the electrical contact of electronic component.The present invention can design the first corresponding transit point for the spacing of the electrical contact of different electronic components and width design on card extender, to be formed with the test contacts of base via the second transit point again and be electrically connected, make card extender of the present invention be applicable to general electrical measurement board, effectively can promote the mobility of electrical measurement board.In addition, card extender cost of the present invention is low, also can avoid developing special Micro-probe tool and the expensive expense that produces.Moreover the present invention positions base, card extender and electronic component by reference column and pilot hole, to save the typesetting test duration, and then promote testing efficiency.
The foregoing is only preferred embodiment of the present invention, all equalizations done according to the claims in the present invention change and modify, and all should belong to covering scope of the present invention.
Claims (6)
1. a measurement jig, in order to test multiple electrical contacts of an electronic component, this measurement jig comprises:
Base, has multiple test contacts; And
Card extender, first side of this card extender has multiple first transit point, second side of this card extender has multiple second transit point, this first side is relative with this second side, the plurality of first transit point is electrically connected with the plurality of second transit point, when this card extender is arranged on this base and this second side to this base, the plurality of second transit point is electrically connected with the plurality of test contacts;
Wherein, when on this first side that this electronic component is arranged at this card extender, the plurality of first transit point is electrically connected with the plurality of electrical contact.
2. measurement jig as claimed in claim 1, wherein this base separately has multiple reference column, and multiple first pilot hole is formed on this card extender, and when this card extender is arranged on this base, the plurality of reference column is through the plurality of first pilot hole.
3. measurement jig as claimed in claim 2, wherein multiple second pilot hole is formed on this electronic component, and when on this first side that this circuit board is arranged at this card extender, the plurality of reference column is through the plurality of second pilot hole.
4. measurement jig as claimed in claim 1, wherein this electronic component is a circuit board.
5. measurement jig as claimed in claim 1, wherein the plurality of test contacts is probe.
6. measurement jig as claimed in claim 1, wherein this base is an electrical measurement board.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310411298.0A CN104422876A (en) | 2013-09-11 | 2013-09-11 | Testing fixture |
| TW102137520A TW201510543A (en) | 2013-09-11 | 2013-10-17 | Test tool |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310411298.0A CN104422876A (en) | 2013-09-11 | 2013-09-11 | Testing fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104422876A true CN104422876A (en) | 2015-03-18 |
Family
ID=52972450
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310411298.0A Pending CN104422876A (en) | 2013-09-11 | 2013-09-11 | Testing fixture |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN104422876A (en) |
| TW (1) | TW201510543A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109085391A (en) * | 2018-09-19 | 2018-12-25 | 四川爱联科技有限公司 | Testing for electrical equipment device and electronic equipment |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6338629B1 (en) * | 1999-03-15 | 2002-01-15 | Aprion Digital Ltd. | Electrical connecting device |
| TW201017186A (en) * | 2008-10-17 | 2010-05-01 | Hon Hai Prec Ind Co Ltd | Circuit board and circuit board test device |
| TW201329468A (en) * | 2012-01-03 | 2013-07-16 | Rato High Tech Corp | Structural improvement of circuit board testing jig |
-
2013
- 2013-09-11 CN CN201310411298.0A patent/CN104422876A/en active Pending
- 2013-10-17 TW TW102137520A patent/TW201510543A/en unknown
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6338629B1 (en) * | 1999-03-15 | 2002-01-15 | Aprion Digital Ltd. | Electrical connecting device |
| TW201017186A (en) * | 2008-10-17 | 2010-05-01 | Hon Hai Prec Ind Co Ltd | Circuit board and circuit board test device |
| TW201329468A (en) * | 2012-01-03 | 2013-07-16 | Rato High Tech Corp | Structural improvement of circuit board testing jig |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109085391A (en) * | 2018-09-19 | 2018-12-25 | 四川爱联科技有限公司 | Testing for electrical equipment device and electronic equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201510543A (en) | 2015-03-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20150318 |