CN104931799A - On-chip antenna electrical property test system and method - Google Patents
On-chip antenna electrical property test system and method Download PDFInfo
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- CN104931799A CN104931799A CN201510224228.3A CN201510224228A CN104931799A CN 104931799 A CN104931799 A CN 104931799A CN 201510224228 A CN201510224228 A CN 201510224228A CN 104931799 A CN104931799 A CN 104931799A
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Abstract
The invention provides an on-chip antenna electrical property test system. A millimeter wave test system comprises a vector network analyzer, a millimeter wave controller, a triplexer, a millimeter wave receiving module, and an S parameter test module, and realizes signal generation and receiving measurement. A millimeter wave probe is in connection with the output port of the S parameter test module through a waveguide tube; a probe bench system and a microscope system are in mutual cooperation to realize reliable contact between a probe contact and an on-chip antenna feeding point; a three-shaft rotary table system comprises a lower orientation rotary table, a first L-shaped cantilever, a second L-shaped cantilever, a pitching rotary table, an upper orientation rotary table and a rotary table controller; the millimeter wave receiving module is installed above the three-shaft rotary table system; the input port of the millimeter wave receiving module is provided with a horn receiving antenna which aligns the on-chip antenna at the centre of sphere; a master control computer controls a whole system. The on-chip antenna electrical property test system can accurately measure the standing-wave ratio, directional diagram characteristics and gains of an on-chip antenna.
Description
Technical field
The present invention relates to microwave testing field, particularly a kind of electric performance test system at chip antenna, also relate to a kind of electric performance test method at chip antenna.
Background technology
Along with the develop rapidly of electronic information technology, the communication technology and integrated circuit technique, current wireless communication system particularly high speed short-distance wireless communication system develops towards higher frequency range one after another.Along with the raising of frequency, wavelength is shorter and shorter, and the volume size of corresponding device just can be less, and therefore SOC (system on a chip) obtains fast development and application.
Traditional antenna measuring technology for measurand be all kinds of antennas adopting the standard interface forms such as coaxial, waveguide, and this kind of measuring technology be not suitable for the various test at chip antenna not having independent power feeding interface.Effective means is provided for solution is various at chip antenna electric performance test: have employed probe feed in chip antenna measuring technology, to utilize microscope and simple and easy probe station to assist to carry out at the clamping of chip antenna and probe with the precise contact of antenna contacts, effectively can solve the various feed problem at chip antenna; Coordinate custom-designed 3 axle turntables, the test of E face, H face main polarization and Cross polarization pattern and radiate pattern can be realized; Coordinate compensation for calibrating errors and the standard antenna comparison of feeder loss, the gain test at chip antenna can be realized.
All kinds of at chip antenna for widespread use in SOC (system on a chip), its electrical performance characteristics has important impact to whole system, therefore needs to test all kinds of Performance Characteristics at chip antenna.
Traditional antenna measuring technology for measurand be all kinds of antennas adopting the standard interface forms such as coaxial, waveguide, the method for testings such as usual employing standard far field, near field, Figure 1 shows that the technical scheme block diagram of standard remote field testing method, introduce in detail below:
For far field test, dual-mode antenna should be in far-field region each other, and the distance of two antennas need meet R>=2D
2/ λ, wherein D is the full-size of antenna aperture, and λ is the operation wavelength of antenna.As shown in Figure 1, emitting antenna is fixed on to be launched on support, and the frequency microwave signal that signal source produces delivers to emitting antenna by radio-frequency cable, and emitting antenna is aimed at antenna to be measured and signal amplitude is shot out; Antenna to be measured is fixed on turntable by support, antenna to be measured receives the signal of emitting antenna radiation and delivers to receiver reception process by cable, obtain the amplitude information of antenna, main control computer is controlled testing apparatus by bus, and obtains test data; Under main control computer controls, turntable drives antenna to be measured to rotate, then is tested by testing apparatus, can obtain the amplitude information that antenna to be measured receives in different angles, orientation; After data acquisition, main control computer directly can obtain the pattern characteristics of antenna to be measured by process of drawing.For gain test, the method for testing of this standard far field antenna measuring technology is: first system selects by turntable the greatest irradiation direction finding antenna to be measured, emitting antenna is aimed in the greatest irradiation direction of antenna to be measured, and writes down the range value now measured; Antenna to be measured replaced by recycling standard gain antenna, selects by turntable the greatest irradiation direction finding standard gain antenna, and the measured value that record is corresponding; By contrasting the range value of twice measurement, then by the yield value of contrast standard antenna, the yield value of antenna to be measured can be obtained, gain test method that standard antenna compares that Here it is.
For standard far field antenna method of testing, be characterized in simple, directly, accuracy is also higher.
Near field antenna test is one indirectly antenna performance characteristics method of testing, its principle utilizes near-field measurement probe (usually distance 3 ~ 5 λ) in certain one side nearer apart from antenna to be measured to receive amplitude, the phase data in tested aerial radiation near field, recycling FFT conversion realizes the conversion of near field width phase data to far field data, obtains the far-field pattern of antenna to be measured.As shown in Figure 2, antenna to be measured is fixed on support, and test macro is connected with antenna to be measured by standard interface, near field probes is around antenna movement to be measured, according to the difference near field probes movement locus face, planar near-field can be divided into test, cylinder near-field test and sphere near-field test.
The above-mentioned standard remote field testing method of the many employings of antenna measurement and near-field test method.This two class testings method for be all kinds of antennas adopting the standard feeding interface such as coaxial, waveguide, do not consider the various singularity in chip antenna test.For at chip antenna, volume size is very little on the one hand, and therefore traditional antenna fixed form cannot meet the requirement of clamping, needs to take auxiliary clamping means; Also independently joint can for not connecting for antenna on the other hand, and conventional test methodologies cannot carry out feed, therefore cannot obtain the detecting information of antenna to be measured; The rotation mode of traditional antenna test macro, gain test mode are also not suitable for the test at chip antenna in addition.
Summary of the invention
The invention discloses a kind of electric performance test system and method at chip antenna, by one based on the method for testing at chip antenna of probe feed with " L " type cantilever turntable, solve the problems such as the various clamping at chip antenna, feed, test and calibration, the accurate test at chip antenna standing-wave ratio (SWR), the main polarization and unit for electrical property parameters such as Cross polarization pattern, radiate pattern and gain can be realized.
Technical scheme of the present invention is achieved in that
In an electric performance test system for chip antenna, millimeter wave test macro comprises: vector network analyzer 2, millimeter wave controller 3, triplexer 4, millimeter wave receiver module 5, S parameter test module 6, realizes the generation of signal and receives measurement;
Millimeter wave probe 10 is connected to output port 6 by waveguide 9;
Probe station system 7, microscopic system 8 cooperatively interact, and realize probe contact and the reliable contacts between the feeding point of chip antenna 19;
3 axle turret systems comprise: lower azimuth rotating platform 13, first L-type cantilever 14, second L-type cantilever 15, pitching rotary 16, upper position turntable 17 and turntable controller 12; At the axle center place of 3 rotary parts of 3 axle turret systems, rotary joint 11 is installed; The upper position of 3 axle turret systems has installed millimeter wave receiver module 5, and the input port place of millimeter wave receiver module 5 installs and receives electromagnetic horn 18, receive electromagnetic horn 18 aim at centre of sphere place at chip antenna;
Main control computer 1 pair of whole system controls;
Fixing on the wafer-supporting platform being placed on probe station system at chip antenna, remain on chip antenna and be in the sphere center position that turret systems rotates; Utilize the micro-amplification of microscopic system, in the feed contact contact of the chip antenna that coexisted the contact of millimeter wave probe; The millimeter-wave signal that millimeter wave test macro produces is fed at chip antenna via after millimeter wave probe by the output port of S parameter test module, and through radiateing at chip antenna; Millimeter wave receiver module is fixed on upper position and rotates together with turret systems, receives width phase signals, obtain the pattern characteristics at chip antenna to be measured in each position of sphere.
Alternatively, described triplexer uses in pairs, in millimeter wave receiver module, be also integrated with triplexer; Triplexer comprises DC, IF and LO tri-wave filter of road different frequency range, the merging realizing DC, IF and local oscillation signal be separated.
Alternatively, DC and the LO signal that described millimeter wave controller is sent delivers to millimeter wave receiver module after triplexer, for millimeter wave receiver module provides direct current supply and local oscillation signal, the intermediate-freuqncy signal that millimeter wave receiver module produces is sent by the triplexer in receiver module, extracts intermediate-freuqncy signal at millimeter wave controller end by the IF filter paths in triplexer.
Based on the above-mentioned electric performance test system at chip antenna, present invention also offers a kind of gain test method, comprise the following steps:
Step (1), waveguide insert loss;
Step (2), the level measurement of standard gain aerial radiation;
Step (3), millimeter wave probe insert loss;
Step (4), to be measured in chip antenna radiation level measurement;
Step (5), path wear-out error calculates;
Step (6), to be measuredly calculates in chip antenna gain.
Alternatively, the step of described waveguide insert loss specifically comprises:
First, connect transition waveguide at the output port of S parameter test module, its latter linked standard gain antenna greatest irradiation direction is aimed at and is received electromagnetic horn, and transition waveguide output port connects waveguide short sheet;
Then, the system of setting is sweep check, and test parameter is S11;
Next, observe time-domain curve by vector network analyzer display screen, find the reflected signal that short-circuit piece is corresponding, door is added to this signal time domain, the impact of other reflected signal of filtering;
Record frequency domain data now, obtain the range value of one group of reflected signal, these data are the basis that system carries out revising when different frequency is tested, and extract the range value L that frequency F is corresponding
1(dB).
Alternatively, the step of described standard gain aerial radiation level measurement specifically comprises:
First, remove the short-circuit piece on transition waveguide, change standard gain antenna, the yield value G of standard gain antenna
standard(dB) known;
Then, the system of setting is point-frequency test, and frequency values is F, and test parameter is S21;
Next, the pitch axis of fine setting turret systems, find the maximal value of standard gain aerial radiation signal, and to record this value is P
r1(dB);
Measurement standard gain antenna, with the distance received between electromagnetic horn, is designated as R1 (m).
Alternatively, the step of described millimeter wave probe insert loss specifically comprises:
Remove the transition waveguide that S parameter test module output port connects, connect millimeter wave probe, sheet mo(u)ld top half short-circuit piece is fixed on below probe, probe is connected with short-circuit piece contact;
The system of setting is sweep check, and test parameter is S11;
Observe time-domain curve by vector network analyzer display screen, find the reflected signal that short-circuit piece is corresponding, door is added to this signal time domain, the impact of other reflected signal of filtering;
Record frequency domain data now, obtain the range value of one group of reflected signal, these data are the basis that system carries out revising when different frequency is tested, and extract the range value L that frequency F is corresponding
2(dB).
Alternatively, the described step in chip antenna radiation level measurement to be measured specifically comprises:
Sheet mo(u)ld top half short-circuit piece is removed, changes to be measured at chip antenna;
The system of setting is point-frequency test, and frequency values is F, and test parameter is S21;
The pitch axis of fine setting turret systems, find the maximal value of standard gain aerial radiation signal, and to record this value is P
r2(dB);
Measure in the same distance received between electromagnetic horn of chip antenna, be designated as R2 (m).
Alternatively, the step that described path wear-out error calculates specifically comprises:
The measuring distance corresponding by described step (2) and step (4), calculating corresponding distance error is:
Alternatively, the described step calculated in chip antenna gain to be measured specifically comprises:
According to the parameter that described 5 steps obtain, calculating the gain at chip antenna to be measured is:
The invention has the beneficial effects as follows:
(1) measurement of microwave/millimeter wave at the main polarization of chip antenna and Cross polarization pattern and radiate pattern can be carried out with receiving antenna around the form that antenna to be measured rotates;
(2) by the impact of the various error of Measurement and calibration, the Measurement accuracy of gain is achieved;
(3) utilize the method for a cable transmission 3 road signal simultaneously, it also avoid cable winding in rotary course, improve phase stability.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is standard far field antenna test macro schematic diagram;
Fig. 2 a is planar near-field test macro schematic diagram;
Fig. 2 b is cylinder near field test system schematic diagram;
Fig. 2 c is sphere near field test system schematic diagram;
Fig. 3 is the theory diagram of the electric performance test system at chip antenna of the present invention;
Fig. 4 a is waveguide Insertion Loss and standard antenna radiation level measuring principle figure;
Fig. 4 b is probe Insertion Loss and on-chip antenna radiation level measuring principle figure;
Fig. 5 is of the present invention at chip antenna gain test method flow diagram.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
Shown in Fig. 3, the present invention is in the electric performance test system of chip antenna, millimeter wave test macro comprises: vector network analyzer 2, millimeter wave controller 3, triplexer 4, millimeter wave receiver module 5, S parameter test module 6, realizes the generation of signal and receives measurement; In Fig. 3, millimeter wave probe 10 is connected to output port 6 by waveguide 9; Probe station system 7, microscopic system 8 cooperatively interact, and realize probe contact and the reliable contacts between the feeding point of chip antenna 19; 3 axle turret systems of the present invention comprise: lower azimuth rotating platform 13, L-type cantilever 14, L-type cantilever 15, pitching rotary 16, upper position turntable 17 and turntable controller 12; At the axle center place of 3 rotary parts of 3 axle turret systems, rotary joint 11 has been installed, the object of these 3 rotary joints be make the triplexer in millimeter wave test macro and the radio-frequency cable that connects between millimeter wave receiver module by the impact that turntable rotates, ensure the stability of wherein signal transmission amplitude and phase place; The upper position of 3 axle turret systems has installed millimeter wave receiver module 5, and the input port place of millimeter wave receiver module 5 installs and receives electromagnetic horn 18, guarantee electromagnetic horn aim at centre of sphere place at chip antenna; Whole system utilizes main control computer 1 to control, and realizes autorun.
Introduce triplexer in system of the present invention, object is between millimeter wave controller and millimeter wave receiver module, realize a cable transmission 3 road signal.Triplexer is paired use, in millimeter wave receiver module, be integrated with triplexer too; Contain DC, IF and LO tri-wave filter of road different frequency range in triplexer, the merging that can realize DC, IF and local oscillation signal be separated.As shown in Figure 3, DC and the LO signal that millimeter wave controller is sent by triplexer delivers to millimeter wave receiver module after triplexer, for receiver module provides direct current supply and local oscillation signal, the intermediate-freuqncy signal that millimeter wave receiver module produces is sent by the triplexer in receiver module equally, extracts intermediate-freuqncy signal receive process further for system at millimeter wave controller end by the IF filter paths in triplexer.
Principle of work of the present invention is: first, as Fig. 3 connects system, due to various very small in chip antenna size, therefore need by be placed on probe station system at chip antenna wafer-supporting platform on and fixing, remain on chip antenna and be in the sphere center position that turret systems rotates; Then, utilize the micro-amplification of microscopic system, the feed contact of the chip antenna that coexisted the contact of millimeter wave probe contacts accurately and reliably, in order to not affect the test of antenna performance characteristics, microscope can rotate backward around stationary shaft below, leaves the primary radiation region of antenna; Next, the millimeter-wave signal that millimeter wave test macro produces is fed at chip antenna via after millimeter wave probe by the output port of S parameter test module, and through radiateing at chip antenna; Millimeter wave receiver module is fixed on upper position and rotates together with turret systems, receives width phase signals, can obtain the pattern characteristics at chip antenna to be measured in each position of sphere.
The lower azimuth rotating platform of 3 axle turret systems and upper position turntable can realize 360 degree of rotations of surface level, and lower azimuth rotating platform can realize the angle rotating range of 270 degree due to the restriction of probe station system, pitching rotary can realize 360 degree of rotations in vertical plane, by the interaction of 3 axles, can take R as radius, the sphere being centered around chip antenna scans, polarization characteristic consistent (or polarization characteristic intersects, different depending on the difference of test parameter) can be ensured simultaneously.
Carry out gain test based on above-mentioned test macro, as shown in Figure 4, as shown in Figure 5, implementation step is as follows for concrete test process for its test philosophy:
Step (1), waveguide insert loss.
As shown in Fig. 4 (a), first in systems in which the output port of S parameter test module connects transition waveguide, the shape of this transition waveguide is different with the difference of the radiation direction at chip antenna to be measured, but should ensure that its latter linked standard gain antenna greatest irradiation direction is aimed at and receive electromagnetic horn, the waveguide short sheet shown in transition waveguide output port connection layout 4 (a); The system of setting is sweep check, and test parameter is S11; Observe time-domain curve by vector network analyzer display screen, find the reflected signal that short-circuit piece is corresponding, door is added to this signal time domain, the impact of other reflected signal of filtering; Record frequency domain data now, obtain the range value of one group of reflected signal, these data are the basis that system carries out revising when different frequency is tested, and extract the range value L that frequency F is corresponding
1(dB).
Step (2), the level measurement of standard gain aerial radiation.
Remove the short-circuit piece on transition waveguide, change the standard gain antenna shown in Fig. 4 (a), the yield value G of this antenna
standard(dB) known; The system of setting is point-frequency test, and frequency values is F, and test parameter is S21; The pitch axis of fine setting turret systems, find the maximal value of standard gain aerial radiation signal, and to record this value is P
r1(dB); Measurement standard gain antenna, with the distance received between electromagnetic horn, is designated as R1 (m).
Step (3), millimeter wave probe insert loss.
As shown in Fig. 4 (b), remove the transition waveguide that S parameter test module output port connects, connect millimeter wave probe, sheet mo(u)ld top half short-circuit piece is fixed on below probe, probe is reliably connected with short-circuit piece contact; The system of setting is sweep check, and test parameter is S11; Observe time-domain curve by vector network analyzer display screen, find the reflected signal that short-circuit piece is corresponding, door is added to this signal time domain, the impact of other reflected signal of filtering; Record frequency domain data now, obtain the range value of one group of reflected signal, these data are the basis that system carries out revising when different frequency is tested, and extract the range value L that frequency F is corresponding
2(dB).
Step (4), to be measured in chip antenna radiation level measurement.
As shown in Fig. 4 (b), sheet mo(u)ld top half short-circuit piece is removed, changes to be measured at chip antenna; The system of setting is point-frequency test, and frequency values is F, and test parameter is S21; The pitch axis of fine setting turret systems, find the maximal value of standard gain aerial radiation signal, and to record this value is P
r2(dB); Measure in the same distance received between electromagnetic horn of chip antenna, be designated as R2 (m).
Step (5), path wear-out error calculates.
The measuring distance corresponding by above-mentioned steps (2) and step (4), can calculate corresponding distance error is
Step (6), to be measuredly calculates in chip antenna gain.
According to the parameter that above-mentioned 5 steps obtain, can calculate the gain at chip antenna to be measured is
Test macro of the present invention and method are suitable for all kinds of test at chip antenna of each frequency range of millimeter wave, and for microwave frequency band, test macro of the present invention and method are applicable equally.
The present invention can carry out the measurement of microwave/millimeter wave at the main polarization of chip antenna and Cross polarization pattern and radiate pattern with receiving antenna around the form that antenna to be measured rotates; By the impact of the various error of Measurement and calibration, achieve the Measurement accuracy of gain; Utilize the method for a cable transmission 3 road signal to it also avoid cable winding in rotary course simultaneously, improve phase stability.
The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention, within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (10)
1., in an electric performance test system for chip antenna, it is characterized in that:
Millimeter wave test macro comprises: vector network analyzer (2), millimeter wave controller (3), triplexer (4), millimeter wave receiver module (5), S parameter test module (6), realizes the generation of signal and receives measurement;
Millimeter wave probe (10) is connected to S parameter test module (6) output port by waveguide (9);
Probe station system (7), microscopic system (8) cooperatively interact, and realize probe contact and the reliable contacts between the feeding point of chip antenna (19);
3 axle turret systems comprise: lower azimuth rotating platform (13), the first L-type cantilever (14), the second L-type cantilever (15), pitching rotary (16), upper position turntable (17) and turntable controller (12); At the axle center place of 3 rotary parts of 3 axle turret systems, rotary joint (11) is installed; The upper position of 3 axle turret systems has installed millimeter wave receiver module (5), the input port place of millimeter wave receiver module (5) installs and receives electromagnetic horn (18), receive electromagnetic horn (18) aim at centre of sphere place at chip antenna;
Main control computer (1) controls whole system;
Fixing on the wafer-supporting platform being placed on probe station system at chip antenna, remain on chip antenna and be in the sphere center position that turret systems rotates; Utilize the micro-amplification of microscopic system, in the feed contact contact of the chip antenna that coexisted the contact of millimeter wave probe; The millimeter-wave signal that millimeter wave test macro produces is fed at chip antenna via after millimeter wave probe by the output port of S parameter test module, and through radiateing at chip antenna; Millimeter wave receiver module is fixed on upper position and rotates together with turret systems, receives width phase signals, obtain the pattern characteristics at chip antenna to be measured in each position of sphere.
2., as claimed in claim 1 in the electric performance test system of chip antenna, it is characterized in that, described triplexer uses in pairs, in millimeter wave receiver module, be also integrated with triplexer; Triplexer comprises DC, IF and LO tri-wave filter of road different frequency range, the merging realizing DC, IF and local oscillation signal be separated.
3. as claimed in claim 2 in the electric performance test system of chip antenna, it is characterized in that, DC and the LO signal that described millimeter wave controller is sent delivers to millimeter wave receiver module after triplexer, for millimeter wave receiver module provides direct current supply and local oscillation signal, the intermediate-freuqncy signal that millimeter wave receiver module produces is sent by the triplexer in receiver module, extracts intermediate-freuqncy signal at millimeter wave controller end by the IF filter paths in triplexer.
4., based on the gain test method of the electric performance test system at chip antenna described in any one of claims 1 to 3, it is characterized in that, comprise the following steps:
Step (1), waveguide insert loss;
Step (2), the level measurement of standard gain aerial radiation;
Step (3), millimeter wave probe insert loss;
Step (4), to be measured in chip antenna radiation level measurement;
Step (5), path wear-out error calculates;
Step (6), to be measuredly calculates in chip antenna gain.
5. method of testing as claimed in claim 4, is characterized in that,
The step of described waveguide insert loss specifically comprises:
First, connect transition waveguide at the output port of S parameter test module, its latter linked standard gain antenna greatest irradiation direction is aimed at and is received electromagnetic horn, and transition waveguide output port connects waveguide short sheet;
Then, the system of setting is sweep check, and test parameter is S11;
Next, observe time-domain curve by vector network analyzer display screen, find the reflected signal that short-circuit piece is corresponding, door is added to this signal time domain, the impact of other reflected signal of filtering;
Record frequency domain data now, obtain the range value of one group of reflected signal, these data are the basis that system carries out revising when different frequency is tested, and extract the range value L that frequency F is corresponding
1(dB).
6. method of testing as claimed in claim 4, is characterized in that,
The step of described standard gain aerial radiation level measurement specifically comprises:
First, remove the short-circuit piece on transition waveguide, change standard gain antenna, the yield value G of standard gain antenna
standard(dB) known;
Then, the system of setting is point-frequency test, and frequency values is F, and test parameter is S21;
Next, the pitch axis of fine setting turret systems, find the maximal value of standard gain aerial radiation signal, and to record this value is P
r1(dB);
Measurement standard gain antenna, with the distance received between electromagnetic horn, is designated as R1 (m).
7. method of testing as claimed in claim 4, it is characterized in that, the step of described millimeter wave probe insert loss specifically comprises:
Remove the transition waveguide that S parameter test module output port connects, connect millimeter wave probe, sheet mo(u)ld top half short-circuit piece is fixed on below probe, probe is connected with short-circuit piece contact;
The system of setting is sweep check, and test parameter is S11;
Observe time-domain curve by vector network analyzer display screen, find the reflected signal that short-circuit piece is corresponding, door is added to this signal time domain, the impact of other reflected signal of filtering;
Record frequency domain data now, obtain the range value of one group of reflected signal, these data are the basis that system carries out revising when different frequency is tested, and extract the range value L that frequency F is corresponding
2(dB).
8. method of testing as claimed in claim 4, it is characterized in that, the described step in chip antenna radiation level measurement to be measured specifically comprises:
Sheet mo(u)ld top half short-circuit piece is removed, changes to be measured at chip antenna;
The system of setting is point-frequency test, and frequency values is F, and test parameter is S21;
The pitch axis of fine setting turret systems, find the maximal value of standard gain aerial radiation signal, and to record this value is P
r2(dB);
Measure in the same distance received between electromagnetic horn of chip antenna, be designated as R2 (m).
9. method of testing as claimed in claim 4, is characterized in that, the step that described path wear-out error calculates specifically comprises:
The measuring distance corresponding by described step (2) and step (4), calculating corresponding distance loss error is:
10. method of testing as claimed in claim 4, is characterized in that, the described step calculated in chip antenna gain to be measured specifically comprises:
According to the parameter that described 5 steps obtain, calculating the gain at chip antenna to be measured is:
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