CN105222990A - Light-emitting component measurement jig - Google Patents
Light-emitting component measurement jig Download PDFInfo
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- CN105222990A CN105222990A CN201510659095.2A CN201510659095A CN105222990A CN 105222990 A CN105222990 A CN 105222990A CN 201510659095 A CN201510659095 A CN 201510659095A CN 105222990 A CN105222990 A CN 105222990A
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- 238000005259 measurement Methods 0.000 title claims abstract description 57
- 238000012360 testing method Methods 0.000 claims abstract description 288
- 239000000523 sample Substances 0.000 claims abstract description 127
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims abstract description 43
- 210000002421 cell wall Anatomy 0.000 claims description 6
- 238000003860 storage Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 abstract description 5
- 238000000429 assembly Methods 0.000 abstract description 3
- 230000000712 assembly Effects 0.000 abstract description 3
- 238000002474 experimental method Methods 0.000 abstract description 3
- 230000003287 optical effect Effects 0.000 description 7
- 238000011056 performance test Methods 0.000 description 7
- 238000003825 pressing Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 229910000831 Steel Inorganic materials 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000000084 colloidal system Substances 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 229920006351 engineering plastic Polymers 0.000 description 1
- 229920006335 epoxy glue Polymers 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000000741 silica gel Substances 0.000 description 1
- 229910002027 silica gel Inorganic materials 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Abstract
The present invention relates to a kind of light-emitting component measurement jig, it comprises pedestal, test suite and limit assembly.This light-emitting component measurement jig realizes the contact of light-emitting component to be measured and test probe by limit assembly, can ensure to contact preferably when testing, quickly light-emitting component to be measured can be taken off from measurement jig again after having tested, do not damage light-emitting component to be measured, light-emitting component to be measured is reusable, do not affect other experiments, thus test process can be made efficient, easy.This light-emitting component measurement jig also can be different according to the pad form of light-emitting component to be measured, the test suite that flexible is corresponding, and can according to testing efficiency the preferential or preferential different situations of test accuracy rate, freely reequip different limit assemblies, different test needs can be met.
Description
Technical field
The present invention relates to light-emitting component field tests, especially relate to a kind of light-emitting component measurement jig.
Background technology
Along with the chip of the light-emitting components such as LED and the development of encapsulation technology, the point between light-emitting component is apart from more and more less, and the picture element density in unit area is increasing.Because the point of high density LED display is apart from less, be also beneficial to manufacture for ensureing that properties of product are stable, high density LED display is normally used is surface welded LED lamp simultaneously.Often need to utilize the test that optic test tool carries out in optical parametric when surface welded LED lamp is before attachment, as tested light intensity, predominant wavelength, the curve of light distribution, colour temperature, chromaticity coordinates etc., to confirm whether the LED of respective batch meets the request for utilization manufacturing LED display.
Surface mount LED is divided into bottom land formula LED and side bonding pads formula LED, and its pad lays respectively at bottom and the side of LED.When the optical parametric of test surfaces mounted type LED, be reduce test error, need measurement jig to reduce blocking light as much as possible at LED exiting surface.Way conventional in the industry first makes the PCB test board corresponding with a LED pad, again LED is welded on corresponding test board and carries out circuit connection, but the high temperature in welding process often makes a LED surperficial packing colloid, as epoxy glue or silica gel produce sex change, and then coloured effect is to the corresponding optic test result of LED.In addition, surface welded LED pad size is general less, once be welded to after test pcb board gets on, LED is more difficult disassembles test for other from test pcb board.In addition, when testing, also needing to test pcb board accordingly just can test for testing certain surface mount LED custom-made, comparing and waste time and energy.
Summary of the invention
Based on this, be necessary the light-emitting component measurement jig that a kind of convenient operation is provided.
A kind of light-emitting component measurement jig, is characterized in that, comprising:
Pedestal, is provided with mounting groove;
Test suite, comprise test base, test probe and PCB test board, described test base offers the test trough for placing light-emitting component to be measured, described test probe is arranged in described test base and contact pads with described light-emitting component to be measured in described test trough can be stretched in one end, the other end is electrically connected with described PCB test board, and described test base is located in described mounting groove; And
Limit assembly, be actively installed on described pedestal or described test base, when described limit assembly is in test station, described limit assembly and described light-emitting component to be measured abut against by spacing for described light-emitting component to be measured in described test trough, and the pad of described light-emitting component to be measured contacts with described test probe.
Wherein in an embodiment, described limit assembly comprises cover plate and Elastic buckle; One end and the described pedestal of described cover plate are hinged, and the other end is provided with described Elastic buckle; Described pedestal is provided with the draw-in groove matched with described Elastic buckle;
When after described cover plate and described pedestal clamping, described limit assembly is in described test station, and the madial wall of described cover plate and the top of described light-emitting component to be measured abut against spacing for described light-emitting component to be measured in described test trough.
Wherein in an embodiment, described pedestal and described test base are provided with the probe mounting hole matched at the bottom land of described test trough, described test probe is located in described probe mounting hole.
Wherein in an embodiment, described pedestal and described test base are provided with the floating spring mounting groove matched, and are provided with floating spring in described floating spring mounting groove;
When described floating spring is in initial station, described in described floating spring jack-up, test base makes the upper surface of described test base protrude the notch of described mounting groove, and makes the end of described test probe be buried in described probe mounting hole;
When described limit assembly is in described test station, described cover plate can press down described test base, and compresses described floating spring, and the end of described test probe stretches in described test trough for abutting against with the bottom land of described light-emitting component to be measured.
Wherein in an embodiment, described limit assembly comprises clamping snap arm, clamping screw and back-moving spring; Described clamping snap arm is L-shaped; Described test base is provided with the snap arm mounting groove of the L-type be communicated with described test trough, and described clamping snap arm is located in described snap arm mounting groove and one end can be stretched in described test trough; Described test base is provided with back-moving spring mounting groove above described snap arm mounting groove, and described back-moving spring to be located in described back-moving spring mounting groove and to abut against with the madial wall of described clamping snap arm; Described test base is provided with at the outside cell wall of described snap arm mounting groove the threaded hole running through cell wall outside this, and described clamping screw to be arranged in described threaded hole and can to abut against with the lateral wall of described clamping snap arm;
After screwing described clamping screw, described limit assembly is in described test station, and the sidewall of described clamping snap arm and described light-emitting component to be measured abuts against spacing for described light-emitting component to be measured in described test trough.
Wherein in an embodiment, described pedestal and described test base are provided with the probe mounting hole matched at the bottom land of described test trough, described test probe is located in described probe mounting hole and one end and stretches in described test trough for abutting against with the bottom land of described light-emitting component to be measured.
Wherein in an embodiment, described test base is outwards provided with probe mounting hole at the sidewall of described test trough, and described test probe is located in described probe mounting hole and one end and stretches in described test trough for abutting against with the side bonding pads of described light-emitting component to be measured.
Wherein in an embodiment, described pedestal offers storage tank at the bottom land of described mounting groove, described test base offers the opening running through this bottom land at the bottom land of described test trough, ejector spring is provided with in described storage tank, the top of described ejector spring is provided with brace table, and described brace table is positioned at described test trough.
Wherein in an embodiment, described test probe is elastic telescopic probe, comprises sleeve pipe, is inserted in two probes of described sleeve pipe and probe springs in described sleeve pipe between described two probes.
Wherein in an embodiment, be cusp-shaped, zigzag, hemispherical or 1/4th spherical for the end of the probe abutted against with the pad of described light-emitting component to be measured in described two probes, the end of another probe is cusp-shaped, zigzag or flush end shape.
Above-mentioned light-emitting component measurement jig has following beneficial effect:
1. light-emitting component measurement jig realizes the contact of light-emitting component to be measured and test probe by limit assembly, can ensure to contact preferably when testing, quickly light-emitting component to be measured can be taken off from measurement jig again after having tested, do not damage light-emitting component to be measured, light-emitting component to be measured is reusable, do not affect other experiments, thus test process can be made efficient, easy.
2. this light-emitting component measurement jig also can be different according to the pad form of light-emitting component to be measured, the test suite that flexible is corresponding, if to ensure when testing test probe can with the pad electrical contact of light-emitting component to be measured.
3. this light-emitting component measurement jig also can according to testing efficiency the preferential or preferential different situations of test accuracy rate, freely reequip different limit assemblies, different test needs can be met.
4. by the design of concealed test probe, when non-test state, test probe is buried in the probe mounting hole of test base, thus can available protecting test probe, prevents faulty operation to the damage of test probe, the serviceable life of extended testing system probe.
5. this light-emitting component measurement jig is not limited to grip for LED, can also test for the light-emitting component of other similar LED contour structures.
Accompanying drawing explanation
Fig. 1 is the structural representation that the light-emitting component measurement jig of embodiment 1 is in initial station;
Fig. 2 is the structural representation that in Fig. 1, light-emitting component measurement jig is in test station;
Fig. 3 is the schematic diagram of light-emitting component measurement jig Elastic buckle open mode in Fig. 1;
Fig. 4 is a kind of structural representation of test probe in Fig. 1;
Fig. 5 is another structural representation of test probe in Fig. 1;
Fig. 6 is the structural representation that the light-emitting component measurement jig of embodiment 2 is in initial station;
Fig. 7 is the structural representation that in Fig. 6, light-emitting component measurement jig is in test station;
Fig. 8 is the structural representation that the light-emitting component measurement jig of embodiment 3 is in initial station;
Fig. 9 is the structural representation that in Fig. 8, light-emitting component measurement jig is in test station;
Figure 10 is a kind of structural representation of test probe in Fig. 8;
Figure 11 is the another kind of structural representation of test probe in Fig. 8;
Figure 12 is the structural representation that the light-emitting component measurement jig of embodiment 4 is in initial station.
Embodiment
For the ease of understanding the present invention, below with reference to relevant drawings, the present invention is described more fully.Preferred embodiment of the present invention is given in accompanying drawing.But the present invention can realize in many different forms, is not limited to embodiment described herein.On the contrary, provide the object of these embodiments be make the understanding of disclosure of the present invention more comprehensively thorough.
It should be noted that, when element is called as " being fixed on " another element, directly can there is element placed in the middle in it on another element or also.When an element is considered to " connection " another element, it can be directly connected to another element or may there is centering elements simultaneously.
Unless otherwise defined, all technology used herein and scientific terminology are identical with belonging to the implication that those skilled in the art of the present invention understand usually.The object of term used in the description of the invention herein just in order to describe specific embodiment, is not intended to be restriction the present invention.Term as used herein " and/or " comprise arbitrary and all combinations of one or more relevant Listed Items.
Embodiment 1
Incorporated by reference to Fig. 1, Fig. 2 and Fig. 3, the light-emitting component measurement jig 100 of embodiment 1 comprises pedestal 110, test suite 120 and limit assembly 130.The light-emitting component measurement jig 100 of the present embodiment is mainly used in the performance test of the light-emitting component to be measured 800 with bottom land, as carried out optical performance test to the surface welded LED of bottom land.
The upper surface of pedestal 110 offers mounting groove 112, and lower surface is provided with PCB connection bit 114.
Test suite 120 comprises test base 122, test probe 124 and PCB test board 126.
Test base 122 is located in mounting groove 112.The upper surface of test base 122 offers the test trough 1222 for placing light-emitting component 800 to be measured.Pedestal 110 and test base 122 are provided with the probe mounting hole 1224 matched at the bottom land of test trough 1222.The lower surface of test base 122 and the bottom land of mounting groove 112 offer the floating spring mounting groove 1226 matched.Floating spring 128 is provided with in floating spring mounting groove 1226.Test base 122 is supported by floating spring 128.
Test probe 124 is located in probe mounting hole 1224.When floating spring 128 is in initial station; test base 122 is propped up by floating spring 128 and the notch of upper surface protrusion mounting groove 112; now; the upper end of test probe 124 is buried in probe mounting hole 1224; can available protecting test probe 124; prevent maloperation from damaging test probe 124, can serviceable life of effective extended testing system probe 124.When floating spring 128 is in the compressive state of test station, the upper end of test probe 124 can stretch in test trough 1222, abuts against for the bottom land with light-emitting component 800 to be measured.
Please refer to the drawing 4 and Fig. 5, in the present embodiment, test probe 124 is elastic telescopic probe.Test probe 124 comprises sleeve pipe 1242, is inserted in two probes 1244 of sleeve pipe 1242 and the probe springs in sleeve pipe 1242 between two probes 1,244 1246.Test probe 124 is designed to elastic telescopic probe, the damage reduced in test process continually upper end probe 1244 can be ensured, contact well with the bottom land of light-emitting component 800 to be measured to make test probe 124.Further, be cusp-shaped or zigzag for the end of the probe 1244 abutted against with the pad of light-emitting component 800 to be measured in two probes 1244, what the end of another probe 1244 was corresponding is cusp-shaped or zigzag.Cusp-shaped or jagged probe 1244 can ensure the excellent electric contact with light-emitting component 800 to be measured and PCB test board 126, and contact reliability is high, prevents open circuit, are conducive to the accuracy improving test result.
Test probe 124 has good electric conductivity, the material such as copper or steel can be adopted to make, for needing the test occasion of light-emitting component 800 to be measured being carried out to dismounting frequently, test probe 124 can also adopt the good material of wolfram steel uniform wearability to make, can ensure electric short circuit not to occur, and ensure processibility.In addition, for preventing causing damage to test probe 124, pedestal 110 and test base 122 adopt the engineering plastics such as PI (polyimide) to make.
The quantity of test probe 124 and distribution can carry out corresponding making according to the number of pads of light-emitting component 800 to be measured and distribution, and the quantity of test trough 1222 is also not limited to one, as multiple test trough 1222 can be arranged, correspondingly, many group test probes 124 are set, can test multiple light-emitting component 800 to be measured, to improve testing efficiency simultaneously.
PCB test board 126 is located in the PCB connection bit 114 of pedestal 110, and contacts with the bottom of test probe 124.PCB test board 126 can be one or more groups.PCB test board 126, for being electrically connected with the control circuit etc. of external testing apparatus, can controlling light-emitting component 800 to be measured and send various light beam to meet the needs of all kinds of optic test.
Limit assembly 130 is actively installed on pedestal 110.When limit assembly 130 is in test station, limit assembly 130 and light-emitting component 800 to be measured abut against with by spacing for light-emitting component 800 to be measured in test trough 1222, the pad of light-emitting component 800 to be measured contacts with test probe 124.
In the present embodiment, limit assembly 130 comprises cover plate 132 and Elastic buckle 134.One end and the pedestal 110 of cover plate 132 are hinged, and the other end arranges this Elastic buckle 134.Please refer to the drawing 3, Elastic buckle 134 comprises Access Division 1342 and press section 1344.Elastic buckle 134 is hinged with cover plate 132, and is provided with buckle spring 1346 between press section 1344 and cover plate 132.Pedestal 110 is provided with the draw-in groove 116 matched with the Access Division 1342 of Elastic buckle 134.When the press section 1344 of downward pressing Elastic buckle 134, buckle spring 1346 compresses and Access Division 1342 can tilt, thus can remove the clamping with cover plate 132; When after cancellation pressing, press section 1344 can reset via buckle spring 1346, and makes Access Division 1342 reply initial position.
Cover plate 132 can be transparent cover plate that is whole or local (position of corresponding test trough 1222), carry out all or local making as glass or the contour transparent material of acrylic can be adopted, as long as ensure that light that light-emitting component 800 to be measured sends is as far as possible through not changing during cover plate 132 and also can not being stopped, to ensure the accuracy of the optical performance test to light-emitting component 800 to be measured.
When after cover plate 132 with pedestal 110 clamping, limit assembly 130 is in test station, the madial wall of cover plate 132 and the top of light-emitting component to be measured 800 abut against, by spacing for light-emitting component 800 to be measured in test trough 122, and cover plate 132 abuts against with the upper surface of test base 122, test base 122 can be pressed down and test probe 124 be stretched in test trough 1222 abut against with the bottom land of light-emitting component 800 to be measured.
The light-emitting component measurement jig 100 of the present embodiment is when the initial station that cover plate 132 is opened; test base 122 is propped up by floating spring 128 elasticity; and the upper surface of test base 122 exposes the notch of mounting groove 112; now, test probe 124 is in the guard mode be hidden in probe mounting hole 1224.
Before testing, the light-emitting component to be measured 800 with bottom land is put into test trough 1222; Rotation cover 132 and with pedestal 110 clamping, now, cover plate 132 is almost parallel with the upper surface of pedestal 110, limit assembly 130 is in test station, the lower surface of cover plate 132 and the upper surface of test base 122 and light-emitting component to be measured 800 abut against, pressing down test base 122 makes test probe 124 stretch in test trough 1222, and presses down light-emitting component 800 to be measured and ensure itself and test probe 124 electrical contact.PCB test board 126 is connected with test probe 124 and external control circuit, thus finally realizes the complete electrical connection of light-emitting component 800 to be measured.After external control circuit energising, can control to treat survey light-emitting component 800 and test.
After test terminates, the press section 1344 of pressing Elastic buckle 134, open the clamped condition with pedestal 110, cover plate 132 is rotated to initial station, remove pressing down test base 122 and light-emitting component to be measured 800, test base 122 gets back to initial position under the elastic-restoring force effect of floating spring 128, and be separated with light-emitting component 800 to be measured by test probe 124, test probe 124 is hidden in probe mounting hole 1224.
Embodiment 2
Incorporated by reference to Fig. 6 and Fig. 7, light-emitting component measurement jig 200 comprises pedestal 210, test suite 220 and limit assembly 230.The light-emitting component measurement jig 200 of embodiment 2 is also mainly used in the optical performance test of the light-emitting component to be measured 800 with bottom land, and structure is substantially identical with the light-emitting component measurement jig of embodiment 1.As different from Example 1, the limit assembly 230 of embodiment 2 light-emitting component measurement jig 200 is different from the limit assembly 130 of embodiment 1, the structure of corresponding pedestal 210 and the set-up mode of test probe 224 also different, specific as follows:
The limit assembly 230 of embodiment 2 comprises clamping snap arm 232, clamping screw 234 and back-moving spring 236.
Clamping snap arm 232 has the first abutment arms 2322 and the second abutment arms 2324.First abutment arms 2322 is vertically connected with the second abutment arms 2324, forms L shape structure.Test base 222 is provided with the snap arm mounting groove 2226 of the L-type be communicated with test trough 2222.Clamping snap arm 232 is located in snap arm mounting groove 2226 and one end of the second abutment arms 2324 and can stretches in test trough 2222 for abutting against with the sidewall of light-emitting component 800 to be measured.
Test base 222 cell wall outside 2226 of snap arm mounting groove is provided with the threaded hole 2228 running through cell wall outside this.Clamping screw 234 to be arranged in threaded hole 2228 and can to abut against with the lateral wall (i.e. the lateral wall of the first abutment arms 2322) of clamping snap arm 232.
Test base 222 is provided with back-moving spring mounting groove (not indicating in figure) above snap arm mounting groove 2226.Back-moving spring 236 to be located in back-moving spring mounting groove and to abut against with the madial wall (i.e. the madial wall of the first abutment arms 2322) of clamping snap arm 232.
After screwing clamping screw 234, clamping snap arm 232 can be promoted from side direction and move to the direction of test trough 2222, compression reseting spring 236, and the second abutment arms 2324 stretches in test trough 2222, to reach test station; After unscrewing clamping screw 234, clamping snap arm 232 can be moved to the direction away from test trough 2222, to be returned to initial station under the elastic-restoring force effect of back-moving spring 236.
The test probe 224 of embodiment 2, under initial station state, directly stretches in test trough 2222.When testing, put into light-emitting component 800 to be measured, and press down light-emitting component 800 to be measured is contacted with test probe 224 well, test probe 224 is also compressed, light-emitting component 800 major part to be measured is positioned at test trough 2222, screw clamping screw 234 by instruments such as screwdrivers again, promote clamping snap arm 232 and can overcome test probe 234 ejecting force upwards by the friction force of the vertical direction produced the side direction clamping of light-emitting component 800 to be measured, and then light-emitting component 800 to be measured can be clamped test.
The limit assembly 230 of embodiment 2 is not owing to having cover plate, and the emergent ray of light-emitting component 800 to be measured can not be subject to any stop ground outgoing, thus optic test accuracy rate is better.The limit assembly of embodiment 2 is without the need to arranging Elastic buckle, corresponding, and pedestal 210 can offer draw-in groove.And between the pedestal 210 of embodiment 2 and test base 222, floating spring is not set, accordingly, without the need to arranging floating spring mounting groove on pedestal 210 and/or test base 222.
Embodiment 3
Incorporated by reference to Fig. 8 and Fig. 9, the light-emitting component measurement jig 300 of embodiment 3 comprises pedestal 310, test suite 320 and limit assembly 330.The light-emitting component measurement jig 300 of embodiment 3 is mainly used in the performance test of the light-emitting component to be measured 900 with side direction pad, as the optical performance test of the LED to side direction pad.The structure of the light-emitting component measurement jig 300 of embodiment 3 is substantially identical with the light-emitting component measurement jig of embodiment 1.With the light-emitting component measurement jig 100 of embodiment 1 unlike, the pedestal 310 of the light-emitting component measurement jig of embodiment 3 and the structure of test suite 320 different from the pedestal 110 of embodiment 1 and the structure of test suite 120.
Test base 322 is outwards provided with probe mounting hole (not indicating in figure) at the sidewall of test trough 3222.Probe mounting hole is not limited to one.Test probe 324 is located in this probe mounting hole, and one end stretches in test trough 3222 for abutting against with the side bonding pads of light-emitting component 900 to be measured.Accordingly, the test base 322 of embodiment 3 and pedestal 310 also offer wire perforation (not indicating in figure).Wire 328 is provided with in wire perforation.Wire 328 one end is electrically connected with test probe 324, and the other end is electrically connected with PCB test board 326.
Further, the pedestal 310 of embodiment 3 offers storage tank (not indicating in figure) at the bottom land of mounting groove.Test base 322 offers the opening (not indicating in figure) running through this bottom land at the bottom land of test trough 3222.Be provided with ejector spring 342 in storage tank, the top of ejector spring 342 is provided with the brace table 344 for carrying light-emitting component 900 to be measured.Brace table 344 is positioned at test trough 3222.Light-emitting component 900 to be measured can be placed on this brace table 344.
This light-emitting component measurement jig 300 is when testing, the light-emitting component to be measured 900 with side bonding pads is placed in test trough 3222, cover cover plate 332, and make cover plate 332 and pedestal 310 clamping, cover plate 332 presses down light-emitting component 900 to test station to be measured, and drive light-emitting component 900 to be measured to press down brace table 344, ejector spring 342 is compressed, light-emitting component 900 to be measured is limited in test trough 3222, and with stretch to test probe 324 electrical contact of test trough 3222.
After test terminates, open cover plate 332, light-emitting component 900 to be measured can be ejected test trough 3222 under the elastic-restoring force effect of ejector spring 342.
Incorporated by reference to Figure 10 and Figure 11, the test probe 324 of embodiment 3 is also elastic telescopic probe, with embodiment 1 or embodiment 2 unlike, test probe 324 is the shape of hemispherical head or 1/4th bulbs for the end of the probe 3244 abutted against with the side bonding pads of light-emitting component 900 to be measured, light-emitting component 900 to be measured is pressed down to facilitate, the end of another probe 3244 can be flush end shape, is electrically connected with wire 328 to facilitate.
Embodiment 4
Please refer to the drawing 12, the light-emitting component measurement jig 400 of embodiment 4 comprises pedestal 410, test suite 420 and limit assembly 430.The light-emitting component measurement jig 400 of embodiment 4 is also mainly used in the optical performance test of the light-emitting component to be measured 900 with side direction pad.Embodiment 4 also adopts the mode of the spacing light-emitting component 900 to be measured of side clamp type by spacing for light-emitting component 900 to be measured in test trough 4222, and the structure of the test probe 324 of the structure of the test probe 424 of embodiment 4, brace table 444 and ejector spring 442 and set-up mode and embodiment 3, brace table 344 and ejector spring 342 and set-up mode identical.
The light-emitting component measurement jig of above-described embodiment 1-4 has following beneficial effect:
1. light-emitting component measurement jig realizes the contact of light-emitting component to be measured and test probe by limit assembly, can ensure to contact preferably when testing, quickly light-emitting component to be measured can be taken off from measurement jig again after having tested, do not damage light-emitting component to be measured, light-emitting component to be measured is reusable, do not affect other experiments, thus test process can be made efficient, easy.
2. this light-emitting component measurement jig also can be different according to the pad form of light-emitting component to be measured, the test suite that flexible is corresponding, if to ensure when testing test probe can with the pad electrical contact of light-emitting component to be measured.
3. this light-emitting component measurement jig also can according to testing efficiency the preferential or preferential different situations of test accuracy rate, freely reequip different limit assemblies, different test needs can be met.
4. by the design of concealed test probe, when non-test state, test probe is buried in the probe mounting hole of test base, thus can available protecting test probe, prevents faulty operation to the damage of test probe, the serviceable life of extended testing system probe.
5. this light-emitting component measurement jig is not limited to grip for LED, can also test for the light-emitting component of other similar LED contour structures.
Can understand, in other embodiments, the structure of this light-emitting component measurement jig can also do some distortion, particularly limit assembly, as long as limit assembly can reply initial station by spacing for light-emitting component to be measured after a test when testing in test trough; In addition, described in above the connected mode of test probe and PCB test board is also not limited to, be electrically connected as long as one end of test probe can be formed with PCB test board.
Each technical characteristic of the above embodiment can combine arbitrarily, for making description succinct, the all possible combination of each technical characteristic in above-described embodiment is not all described, but, as long as the combination of these technical characteristics does not exist contradiction, be all considered to be the scope that this instructions is recorded.
The above embodiment only have expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but can not therefore be construed as limiting the scope of the patent.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (10)
1. a light-emitting component measurement jig, is characterized in that, comprising:
Pedestal, is provided with mounting groove;
Test suite, comprise test base, test probe and PCB test board, described test base offers the test trough for placing light-emitting component to be measured, described test probe is arranged in described test base and contact pads with described light-emitting component to be measured in described test trough can be stretched in one end, the other end is electrically connected with described PCB test board, and described test base is located in described mounting groove; And
Limit assembly, be actively installed on described pedestal or described test base, when described limit assembly is in test station, described limit assembly and described light-emitting component to be measured abut against and by spacing for described light-emitting component to be measured in described test trough, the pad of described light-emitting component to be measured contacts with described test probe.
2. light-emitting component measurement jig as claimed in claim 1, it is characterized in that, described limit assembly comprises cover plate and Elastic buckle; One end and the described pedestal of described cover plate are hinged, and the other end is provided with described Elastic buckle; Described pedestal is provided with the draw-in groove matched with described Elastic buckle;
When after described cover plate and described pedestal clamping, described limit assembly is in described test station, and the madial wall of described cover plate and the top of described light-emitting component to be measured abut against spacing for described light-emitting component to be measured in described test trough.
3. light-emitting component measurement jig as claimed in claim 2, it is characterized in that, described pedestal and described test base are provided with the probe mounting hole matched at the bottom land of described test trough, described test probe is located in described probe mounting hole.
4. light-emitting component measurement jig as claimed in claim 3, it is characterized in that, described pedestal and described test base are provided with the floating spring mounting groove matched, and are provided with floating spring in described floating spring mounting groove;
When described floating spring is in initial station, described in described floating spring jack-up, test base makes the upper surface of described test base protrude the notch of described mounting groove, and makes the end of described test probe be buried in described probe mounting hole;
When described limit assembly is in described test station, described cover plate can press down described test base, and compresses described floating spring, and the end of described test probe stretches in described test trough for abutting against with the bottom land of described light-emitting component to be measured.
5. light-emitting component measurement jig as claimed in claim 1, is characterized in that, described limit assembly comprises clamping snap arm, clamping screw and back-moving spring; Described clamping snap arm is L-shaped; Described test base is provided with the snap arm mounting groove of the L-type be communicated with described test trough, and described clamping snap arm is located in described snap arm mounting groove and one end can be stretched in described test trough; Described test base is provided with back-moving spring mounting groove above described snap arm mounting groove, and described back-moving spring to be located in described back-moving spring mounting groove and to abut against with the madial wall of described clamping snap arm; Described test base is provided with at the outside cell wall of described snap arm mounting groove the threaded hole running through cell wall outside this, and described clamping screw to be arranged in described threaded hole and can to abut against with the lateral wall of described clamping snap arm;
After screwing described clamping screw, described limit assembly is in described test station, and the sidewall of described clamping snap arm and described light-emitting component to be measured abuts against spacing for described light-emitting component to be measured in described test trough.
6. light-emitting component measurement jig as claimed in claim 5, it is characterized in that, described pedestal and described test base are provided with the probe mounting hole matched at the bottom land of described test trough, described test probe is located in described probe mounting hole and one end and stretches in described test trough for abutting against with the bottom land of described light-emitting component to be measured.
7. the light-emitting component measurement jig as described in claim 2 or 5, it is characterized in that, described test base is outwards provided with probe mounting hole at the sidewall of described test trough, and described test probe is located in described probe mounting hole and one end and stretches in described test trough for abutting against with the side bonding pads of described light-emitting component to be measured.
8. light-emitting component measurement jig as claimed in claim 7, it is characterized in that, described pedestal offers storage tank at the bottom land of described mounting groove, described test base offers the opening running through this bottom land at the bottom land of described test trough, ejector spring is provided with in described storage tank, the top of described ejector spring is provided with brace table, and described brace table is positioned at described test trough.
9. light-emitting component measurement jig as claimed in claim 1, it is characterized in that, described test probe is elastic telescopic probe, comprises sleeve pipe, is inserted in two probes of described sleeve pipe and probe springs in described sleeve pipe between described two probes.
10. light-emitting component measurement jig as claimed in claim 9, it is characterized in that, be cusp-shaped, zigzag, hemispherical or 1/4th spherical for the end of the probe abutted against with the pad of described light-emitting component to be measured in described two probes, the end of another probe is cusp-shaped, zigzag or flush end shape.
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| CN201510659095.2A CN105222990B (en) | 2015-10-13 | 2015-10-13 | Light-emitting component measurement jig |
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| CN201510659095.2A CN105222990B (en) | 2015-10-13 | 2015-10-13 | Light-emitting component measurement jig |
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| CN105222990B CN105222990B (en) | 2018-07-31 |
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| CN106124965A (en) * | 2016-07-22 | 2016-11-16 | 中国船舶重工集团公司第七二四研究所 | A kind of radio frequency PCB testing device based on rf probe and rotary joint pedestal |
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Application publication date: 20160106 Assignee: Guangzhou Kaide Finance Leasing Co.,Ltd. Assignor: GUANGZHOU WONDFO BIOTECH Co.,Ltd. Contract record no.: 2019990000218 Denomination of invention: Test fixture of light-emitting element Granted publication date: 20180731 License type: Exclusive License Record date: 20190709 |
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Denomination of invention: Test fixture of light-emitting element Effective date of registration: 20190807 Granted publication date: 20180731 Pledgee: Guangzhou Kaide Finance Leasing Co.,Ltd. Pledgor: GUANGZHOU WONDFO BIOTECH Co.,Ltd. Registration number: Y2019990000035 |
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Assignee: Guangzhou Kaide Finance Leasing Co.,Ltd. Assignor: GUANGZHOU WONDFO BIOTECH Co.,Ltd. Contract record no.: 2019990000218 Date of cancellation: 20220922 |
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Date of cancellation: 20220922 Granted publication date: 20180731 Pledgee: Guangzhou Kaide Finance Leasing Co.,Ltd. Pledgor: GUANGZHOU WONDFO BIOTECH Co.,Ltd. Registration number: Y2019990000035 |