CN1150617C - 半导体基板和层叠的半导体封装及其制作方法 - Google Patents

半导体基板和层叠的半导体封装及其制作方法 Download PDF

Info

Publication number
CN1150617C
CN1150617C CNB981007147A CN98100714A CN1150617C CN 1150617 C CN1150617 C CN 1150617C CN B981007147 A CNB981007147 A CN B981007147A CN 98100714 A CN98100714 A CN 98100714A CN 1150617 C CN1150617 C CN 1150617C
Authority
CN
China
Prior art keywords
lead
main body
hole
base main
cavity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB981007147A
Other languages
English (en)
Other versions
CN1211821A (zh
Inventor
金朝汉
金振圣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
LG Semicon Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LG Semicon Co Ltd filed Critical LG Semicon Co Ltd
Publication of CN1211821A publication Critical patent/CN1211821A/zh
Application granted granted Critical
Publication of CN1150617C publication Critical patent/CN1150617C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals
    • H01L23/04Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
    • H01L23/053Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body
    • H01L23/055Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body the leads having a passage through the base
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/50Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/16Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
    • H01L23/18Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
    • H01L23/24Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device solid or gel at the normal operating temperature of the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/10Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
    • H01L25/105Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L27/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2225/00Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
    • H01L2225/03All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
    • H01L2225/10All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers
    • H01L2225/1005All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
    • H01L2225/1011All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement
    • H01L2225/1047Details of electrical connections between containers
    • H01L2225/1058Bump or bump-like electrical connections, e.g. balls, pillars, posts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/15165Monolayer substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/162Disposition
    • H01L2924/1627Disposition stacked type assemblies, e.g. stacked multi-cavities
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Abstract

半导体基板和层叠的半导体封装及其制作方法,可以在有限的面积内实现高集成度的半导体组件。半导体基板包括:非导电的基板主体,其内部有多根已构图的导线;在基板主体的中心上部形成的腔体;垂直通过基板主体边缘部分的多个通孔。

Description

半导体基板和层叠的半导体封装及其制作方法
技术领域
本发明涉及半导体基板和层叠的半导体封装及其制作方法,尤其涉及改进的球栅阵列(BGA)半导体封装。
背景技术
图1是常规BGA半导体封装的示意图。如图所示,11是基板的主体。在基板主体11内分布多根已构图的导线(图未示出)。具有诸多芯片焊盘(图未示出)的半导体芯片13用粘合剂15粘接在基板主体11的上面。通过多根金属线17实现芯片焊盘与导电布线的连接。为了半导体芯片13和金属线17,形成模制部分18,以便用环氧树脂模制化合物模制基板主体的预定部分。此外,贴在基板11底表面上的数个焊球用于与基板11内形成的导电布线连接。然而,常规封装因其结构特点的限制,不可能将半导体芯片堆叠起来,因而不可能在有限的面积内实现具有高集成度的存储组件。
发明内容
本发明的目的是提供半导体基板和层叠的半导体封装及其制作方法,克服常规工艺中遇到的上述问题。
本发明的另一目的提供改进的半导体基板和层叠的半导体封装及其制作方法,以便在有限的面积内实现高集成度的半导体组件。
为了达到上述目的,提供一种半导体基板,包括:非导电的基板主体,其内部有多根已构图的导线;在基板主体的中心上部形成的腔体;垂直通过基板主体边缘的多个通孔;及填入每个通孔的导电金属棒,以及形成于基板主体上下表面上的导电外部端子,用于与每根金属棒的两端电连接。
为了达到上述目的,提供一种层叠的半导体封装,包括:非导电的基板主体,其内部有多根已构图的导线;基板主体的中心上部形成的腔体;垂直通过基板主体的边缘部分的多个通孔;安装在腔体的下表面的半导体芯片;用于连接半导体芯片与导电布线的多根导线;填充各个通孔的多根导电金属棒;贴在基板主体的上下表面的多个导电外部端子,用于与金属棒连接;填装于腔体中的模制化合物,用于模制半导体芯片和各导线。
为了达到上述目的,提供一种层叠的半导体封装的制作方法,包括如下步骤:制备其内部有多根已构图的导线的非导电的基板主体;形成具有在基板主体的中心上部形成的阶梯部分的腔体;形成垂直通过基板主体边缘的多个通孔;将半导体芯片安装在腔体的下表面;用第二导线(35)将半导体芯片和第一导线(22)电连接;在腔体内填充模制化合物,并模制半导体芯片和第二导线(35);将导电金属材料填入每个通孔;将导电外部端子安装到基板主体上下表面上,用于与导电金属材料电连接;以及每根第一导线(22)的一端露在阶梯部分的上表面,而每根第一导线(22)的另一端则延伸到每个通孔。
为了达到上述目的,提供一种层叠的半导体封装的制作方法,包括,制备非导电的基板主体,其内部形成有多根已构图的导线;形成具有在基板主体的中心上部形成的阶梯部分的腔体;在腔体附近形成垂直通过基板主体的多个通孔;把半导体芯片安装在腔体的下表面上;用第二导线(35)电连接半导体芯片与第一导线(22);通过在腔体中填充模制化合物模制半导体芯片与第二导线(35);准备层叠的半导体封装;对准形成于层叠的半导体封装中的通孔;把层叠的半导体封装叠在一起;将导电金属材料分别填入这样对准了的通孔;将最上层层叠的半导体封装的上表面和最下层层叠的半导体封装下表面的外部端子固定在一起,用于与导电金属材料电连接;以及每根第一导线(22)的一端露在阶梯部分的上表面,而每根第一导线(22)的另一端则延伸到每个通孔。
本发明的其他优点、目标和特点在下文的进一步描述将得更清楚。
附图说明
从以下的详细说明和各图可以更充分地理解本发明,各附图只是为了说明,所以本发明并不限于此,其中:
图1为常规球栅阵列半导体封装的剖面图;
图2是根据本发明的半导体基板的剖面图;
图3是根据本发明的层叠的半导体封装的剖面图;
图4A至4D是根据本发明的层叠的半导体封装制作方法的剖面图;
图5A至5C辊根据本发明的堆叠半导体封装组件制作方法的剖面图。
具体实施方式
下面将说明半导体基板、用其制造的层叠的半导体封装、半导体组件及其制造方法。
图2是根据本发明的半导体基板的剖面图。如图所示,提供非导电的基板主体21,其内部装有多根构图的导线22。基板主体21上表面中心部分形成具有阶梯23的腔体24。在腔体24的两侧形成有多个通孔25垂直通过基板主体21。每根导线22的一端在阶梯部分的上表面露出,另一端延伸至相应的通孔25。
另外,导电金属棒26例如焊料棒被分别填入通孔25,基板主体21上下表面贴有外部端子27,用于与每根金属棒26的两端电连接。在此,金属棒26和外部端子27还可以按本发明另一实施例制作。
图3是根据本发明的层叠的半导体封装的剖面图。如图所示,运用图2的半导体封装封装半导体芯片。在图3的实施例中,与图2实施例相同的部件有相同的参考标记。
如图3所示,半导体芯片33用粘合剂31粘接在腔体24的下表面。多根导线35用于电连接半导体芯片33和导线22,模制化合物37填充腔体24,以此封装半导体芯片33和导线35。
现在根据图4A至4D来说明根据本发明的层叠的半导体封装制作方法。
首先,如图4A所示,非导电的基板主体21具有多根已构图的导线22,基板主体22的中心上部形成具有阶梯部分23的腔体24,在腔体24附近形成多个通孔25,垂直通过基板主体21,以便每根导线22的一端在阶梯部分的上表面露出,其另一端暴露于通孔25内。
如图4B所示,引线键合过程如下,半导体的芯片33用粘合剂31粘接在腔体24的底部,用导线33连接半导体芯片33和导线22。
其次,如图4C所示,模制过程如下,模制化合物填充腔体24,由此模制半导体芯片33和导线35。
此外,如图4D所示,可以进行金属材料填充过程,将导电金属材料26例如焊料棒填入到每个通孔25,导电的外部端子27例如焊料球粘在基板主体21的上下表面上,由此电连接每条导电金属材料26的两端。金属材料填入工序分成几步,先是将焊料棒填入通孔25,而后将其回流和硬化。
图5A到图5C是根据本发明的层叠的的半导体封装组件制作方法的剖面图。
如图5A所示,将层叠的的半导体封装100,110和120堆叠在一起,如图4所示。堆叠时,应将层叠的的半导体封装100,110和120精确对准,同时对准形成于层叠的的半导体封装100,110和120上的通孔25。
如图5B所示,在金属材料填入步骤,将导电金属材料26填入到这样对准的通孔25。在此,金属材料填入过程分成几步,先是将焊料棒分别填入对准的通孔25,后再回流和硬化。
如图5C所示,导电外部端子27分别贴在最上层层叠的半导体封装120的上表面和最下层层叠的半导体封装100下表面上,由此电连接每个导电金属材料27的两端,从而制备根据本发明的层叠的的半导体封装组件。
如上所述,根据本发明,采用半导体基板封装半导体芯片可以制成层叠的半导体封装。此外,按照本发明,采用层叠的半导体封装有可以在有限的面积内作成高集成度的半导体封装组件。而且,采用层叠的的半导体封装中形成的通孔可以精确对准并堆叠每个半导体封装,通过填入通孔的导电金属材料(焊料棒)可电连接每个封装内的半导体芯片。
虽然为了说明披露了本发明的优选实施例,但在不背离本发明所附权利要求的范围和精神的情况下,本领域的普通技术人员可以作出各种修改,增加和替代。

Claims (5)

1.一种层叠的半导体封装的制作方法,包括如下步骤:
制备其内部有多根已构图的导线的非导电的基板主体;
形成具有在基板主体的中心上部形成的阶梯部分的腔体;
形成垂直通过基板主体边缘的多个通孔;
将半导体芯片安装在腔体的下表面;
用第二导线(35)将半导体芯片和第一导线(22)电连接;
在腔体内填充模制化合物,并模制半导体芯片和第二导线(35);
将导电金属材料填入每个通孔;和
将导电外部端子安装到基板主体上下表面上,用于与导电金属材料电连接,
其中,每根第一导线(22)的一端露在阶梯部分的上表面,而每根第一导线(22)的另一端则延伸到每个通孔。
2.如权利要求1的层叠的半导体封装的制作方法,其特征在于,所说外部端子是焊料制成的。
3.如权利要求1的层叠的半导体封装的制作方法,其中,所说的将导电金属材料填入每个通孔包括步骤:
将焊料棒填入通孔;和
对焊料棒进行回流和硬化。
4.一种层叠的半导体封装组件的制作方法,包括如下步骤:
制备其内部有多根已构图的导线的非导电的基板主体;
形成具有在基板主体的中心上部形成的阶梯的腔体;
在腔体附近形成多个通孔垂直通过基板主体;
将半导体芯片安装在腔体的下表面;
用第二导线(35)将半导体芯片和第一导线(22)电连接,并且在腔体填充模制化合物,以模制半导体芯片和第二导线(35);
堆叠上述半导体封装;
对准上述堆叠的半导体封装的通孔;
将导电金属材料分别填入对准的通孔;和
将导电外部端子贴在最上层半导体封装的上表面和最下层半导体封装的下表面,用于与导电金属材料电连接,
其中,每根第一导线(22)的一端露在阶梯部分的上表面,而每根第一导线(22)的另一端则延伸到每个通孔。
5.如权利要求4的层叠的半导体封装组件的制作方法,其特征在于,所说的将金属材料分别填入对准的通孔的步骤包括将焊料棒分别填入对准的通孔,然后回流和硬化焊料棒。
CNB981007147A 1997-09-12 1998-03-06 半导体基板和层叠的半导体封装及其制作方法 Expired - Fee Related CN1150617C (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR1019970047075A KR100280398B1 (ko) 1997-09-12 1997-09-12 적층형 반도체 패키지 모듈의 제조 방법
KR47075/97 1997-09-12
KR47075/1997 1997-09-12

Publications (2)

Publication Number Publication Date
CN1211821A CN1211821A (zh) 1999-03-24
CN1150617C true CN1150617C (zh) 2004-05-19

Family

ID=19521226

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB981007147A Expired - Fee Related CN1150617C (zh) 1997-09-12 1998-03-06 半导体基板和层叠的半导体封装及其制作方法

Country Status (6)

Country Link
US (1) US6137163A (zh)
JP (1) JP2967344B2 (zh)
KR (1) KR100280398B1 (zh)
CN (1) CN1150617C (zh)
DE (1) DE19802347B4 (zh)
HK (1) HK1018983A1 (zh)

Families Citing this family (57)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6297548B1 (en) * 1998-06-30 2001-10-02 Micron Technology, Inc. Stackable ceramic FBGA for high thermal applications
US6313522B1 (en) * 1998-08-28 2001-11-06 Micron Technology, Inc. Semiconductor structure having stacked semiconductor devices
KR100302593B1 (ko) 1998-10-24 2001-09-22 김영환 반도체패키지및그제조방법
JP3538045B2 (ja) * 1998-12-09 2004-06-14 三菱電機株式会社 Rf回路モジュール
KR20010068781A (ko) * 2000-01-10 2001-07-23 윤종용 반도체 칩 패키지
JP4251421B2 (ja) * 2000-01-13 2009-04-08 新光電気工業株式会社 半導体装置の製造方法
US6780672B2 (en) * 2000-01-31 2004-08-24 Lockheed Martin Corporation Micro eletro-mechanical component and system architecture
DE10007414B4 (de) 2000-02-18 2006-07-06 eupec Europäische Gesellschaft für Leistungshalbleiter mbH & Co. KG Verfahren zur Durchkontaktierung eines Substrats für Leistungshalbleitermodule durch Lot und mit dem Verfahren hergestelltes Substrat
US6586836B1 (en) * 2000-03-01 2003-07-01 Intel Corporation Process for forming microelectronic packages and intermediate structures formed therewith
JP3722209B2 (ja) * 2000-09-05 2005-11-30 セイコーエプソン株式会社 半導体装置
JP2002305286A (ja) * 2001-02-01 2002-10-18 Mitsubishi Electric Corp 半導体モジュールおよび電子部品
US6734538B1 (en) 2001-04-12 2004-05-11 Bae Systems Information & Electronic Systems Integration, Inc. Article comprising a multi-layer electronic package and method therefor
JP3999945B2 (ja) * 2001-05-18 2007-10-31 株式会社東芝 半導体装置の製造方法
US6765287B1 (en) 2001-07-27 2004-07-20 Charles W. C. Lin Three-dimensional stacked semiconductor package
US6451626B1 (en) 2001-07-27 2002-09-17 Charles W.C. Lin Three-dimensional stacked semiconductor package
US20030042615A1 (en) 2001-08-30 2003-03-06 Tongbi Jiang Stacked microelectronic devices and methods of fabricating same
KR100435813B1 (ko) * 2001-12-06 2004-06-12 삼성전자주식회사 금속 바를 이용하는 멀티 칩 패키지와 그 제조 방법
US6971160B1 (en) 2002-01-03 2005-12-06 The United States Of America As Represented By The Secretary Of The Air Force Hybrid electrical circuit method with mated substrate carrier method
US6646336B1 (en) 2002-06-28 2003-11-11 Koninkl Philips Electronics Nv Wearable silicon chip
KR100608349B1 (ko) * 2002-09-11 2006-08-09 주식회사 하이닉스반도체 요철 형상의 스택기판을 사용한 bga 스택 패키지 및 그제조방법
KR20040026530A (ko) * 2002-09-25 2004-03-31 삼성전자주식회사 반도체 패키지 및 그를 이용한 적층 패키지
EP1601017A4 (en) 2003-02-26 2009-04-29 Ibiden Co Ltd MULTILAYER PRINTED PCB
US7309923B2 (en) * 2003-06-16 2007-12-18 Sandisk Corporation Integrated circuit package having stacked integrated circuits and method therefor
US6984881B2 (en) 2003-06-16 2006-01-10 Sandisk Corporation Stackable integrated circuit package and method therefor
US7993983B1 (en) 2003-11-17 2011-08-09 Bridge Semiconductor Corporation Method of making a semiconductor chip assembly with chip and encapsulant grinding
US7227249B1 (en) 2003-12-24 2007-06-05 Bridge Semiconductor Corporation Three-dimensional stacked semiconductor package with chips on opposite sides of lead
US7613010B2 (en) * 2004-02-02 2009-11-03 Panasonic Corporation Stereoscopic electronic circuit device, and relay board and relay frame used therein
US7083425B2 (en) 2004-08-27 2006-08-01 Micron Technology, Inc. Slanted vias for electrical circuits on circuit boards and other substrates
US20060267173A1 (en) * 2005-05-26 2006-11-30 Sandisk Corporation Integrated circuit package having stacked integrated circuits and method therefor
US7795134B2 (en) 2005-06-28 2010-09-14 Micron Technology, Inc. Conductive interconnect structures and formation methods using supercritical fluids
KR100721353B1 (ko) * 2005-07-08 2007-05-25 삼성전자주식회사 칩 삽입형 매개기판의 구조와 제조 방법, 이를 이용한 이종칩의 웨이퍼 레벨 적층 구조 및 패키지 구조
US20070045120A1 (en) * 2005-09-01 2007-03-01 Micron Technology, Inc. Methods and apparatus for filling features in microfeature workpieces
US7863187B2 (en) 2005-09-01 2011-01-04 Micron Technology, Inc. Microfeature workpieces and methods for forming interconnects in microfeature workpieces
US7262134B2 (en) 2005-09-01 2007-08-28 Micron Technology, Inc. Microfeature workpieces and methods for forming interconnects in microfeature workpieces
US7888185B2 (en) * 2006-08-17 2011-02-15 Micron Technology, Inc. Semiconductor device assemblies and systems including at least one conductive pathway extending around a side of at least one semiconductor device
US7902643B2 (en) * 2006-08-31 2011-03-08 Micron Technology, Inc. Microfeature workpieces having interconnects and conductive backplanes, and associated systems and methods
US7811863B1 (en) 2006-10-26 2010-10-12 Bridge Semiconductor Corporation Method of making a semiconductor chip assembly with metal pillar and encapsulant grinding and heat sink attachment
SG149710A1 (en) * 2007-07-12 2009-02-27 Micron Technology Inc Interconnects for packaged semiconductor devices and methods for manufacturing such devices
US7781877B2 (en) 2007-08-07 2010-08-24 Micron Technology, Inc. Packaged integrated circuit devices with through-body conductive vias, and methods of making same
KR100881400B1 (ko) * 2007-09-10 2009-02-02 주식회사 하이닉스반도체 반도체 패키지 및 이의 제조 방법
US20090140408A1 (en) * 2007-11-30 2009-06-04 Taewoo Lee Integrated circuit package-on-package system with stacking via interconnect
US7884015B2 (en) 2007-12-06 2011-02-08 Micron Technology, Inc. Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods
SG142321A1 (en) 2008-04-24 2009-11-26 Micron Technology Inc Pre-encapsulated cavity interposer
US8310835B2 (en) * 2009-07-14 2012-11-13 Apple Inc. Systems and methods for providing vias through a modular component
US7923304B2 (en) * 2009-09-10 2011-04-12 Stats Chippac Ltd. Integrated circuit packaging system with conductive pillars and method of manufacture thereof
US8350381B2 (en) * 2010-04-01 2013-01-08 Infineon Technologies Ag Device and method for manufacturing a device
US8847376B2 (en) * 2010-07-23 2014-09-30 Tessera, Inc. Microelectronic elements with post-assembly planarization
CN102738120B (zh) * 2012-07-09 2016-01-20 日月光半导体制造股份有限公司 半导体封装件及其制造方法
CN103632988B (zh) * 2012-08-28 2016-10-19 宏启胜精密电子(秦皇岛)有限公司 层叠封装结构及其制作方法
US8860202B2 (en) * 2012-08-29 2014-10-14 Macronix International Co., Ltd. Chip stack structure and manufacturing method thereof
CN103413795B (zh) * 2013-08-28 2016-12-28 天津大学 半导体器件的封装结构和半导体器件的封装工艺流程
CN103904057B (zh) * 2014-04-02 2016-06-01 华进半导体封装先导技术研发中心有限公司 PoP封装结构及制造工艺
TWM499394U (zh) * 2014-12-19 2015-04-21 Bothhand Entpr Inc 電子裝置之封裝盒
TWI700798B (zh) * 2018-07-12 2020-08-01 南韓商三星電子股份有限公司 半導體封裝
CN109326580A (zh) * 2018-11-20 2019-02-12 中国科学院苏州纳米技术与纳米仿生研究所南昌研究院 一种多芯片封装互联结构及多芯片封装互联方法
CN111739871A (zh) * 2020-05-15 2020-10-02 甬矽电子(宁波)股份有限公司 双面芯片封装结构和双面芯片封装工艺
US11388811B1 (en) 2021-05-21 2022-07-12 Amulaire Thermal Technology, Inc. Heat-dissipating substrate structure with built-in conductive circuits

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61101067A (ja) * 1984-10-24 1986-05-19 Nec Corp メモリモジユ−ル
JPH0430561A (ja) * 1990-05-28 1992-02-03 Hitachi Ltd 半導体集積回路装置およびその実装構造
US5241456A (en) * 1990-07-02 1993-08-31 General Electric Company Compact high density interconnect structure
US5043794A (en) * 1990-09-24 1991-08-27 At&T Bell Laboratories Integrated circuit package and compact assemblies thereof
US5241454A (en) * 1992-01-22 1993-08-31 International Business Machines Corporation Mutlilayered flexible circuit package
DE4303734C2 (de) * 1993-02-03 1996-07-18 Deutsches Elektronen Synchr Chipträger
US5355283A (en) * 1993-04-14 1994-10-11 Amkor Electronics, Inc. Ball grid array with via interconnection
JPH07226456A (ja) * 1993-04-23 1995-08-22 Nippon Micron Kk Icパッケージ及びその製造方法
US5455385A (en) * 1993-06-28 1995-10-03 Harris Corporation Multilayer LTCC tub architecture for hermetically sealing semiconductor die, external electrical access for which is provided by way of sidewall recesses
JPH07231049A (ja) * 1994-02-17 1995-08-29 Fujitsu Ltd セラミックス多層基板の製造方法及びセラミックス多層基板
US5380681A (en) * 1994-03-21 1995-01-10 United Microelectronics Corporation Three-dimensional multichip package and methods of fabricating
US5579207A (en) * 1994-10-20 1996-11-26 Hughes Electronics Three-dimensional integrated circuit stacking
JPH08186192A (ja) * 1994-12-27 1996-07-16 Matsushita Electric Works Ltd 多層プリント配線板の製造方法
JPH08186196A (ja) * 1994-12-27 1996-07-16 Casio Comput Co Ltd 半導体装置の実装構造
US5835061A (en) * 1995-06-06 1998-11-10 Wayport, Inc. Method and apparatus for geographic-based communications service
US5861666A (en) * 1995-08-30 1999-01-19 Tessera, Inc. Stacked chip assembly
US5838060A (en) * 1995-12-12 1998-11-17 Comer; Alan E. Stacked assemblies of semiconductor packages containing programmable interconnect
US5798564A (en) * 1995-12-21 1998-08-25 Texas Instruments Incorporated Multiple chip module apparatus having dual sided substrate

Also Published As

Publication number Publication date
JPH1197583A (ja) 1999-04-09
KR100280398B1 (ko) 2001-02-01
DE19802347B4 (de) 2005-10-06
CN1211821A (zh) 1999-03-24
HK1018983A1 (en) 2000-01-14
KR19990025444A (ko) 1999-04-06
US6137163A (en) 2000-10-24
DE19802347A1 (de) 1999-04-08
JP2967344B2 (ja) 1999-10-25

Similar Documents

Publication Publication Date Title
CN1150617C (zh) 半导体基板和层叠的半导体封装及其制作方法
CN1064780C (zh) 底部引线半导体芯片堆式封装
US9418872B2 (en) Packaged microelectronic components
CN1215557C (zh) 半导体器件
US8203203B1 (en) Stacked redistribution layer (RDL) die assembly package
CN1065662C (zh) 半导体芯片封装及其制造方法
CN1065660C (zh) 半导体封装基片及其制造方法以及半导体封装
US7564137B2 (en) Stackable integrated circuit structures and systems devices and methods related thereto
EP0571749A1 (en) Stacking semiconductor multi-chip module and method for making the same
CN1445845A (zh) 芯片比例封装及其制造方法
CN102117798A (zh) 堆叠封装
CN101060087A (zh) 电极及其制造方法,以及具有该电极的半导体器件
CN1314708A (zh) 半导体装置
US6753599B2 (en) Semiconductor package and mounting structure on substrate thereof and stack structure thereof
CN1652316A (zh) 制造多层封装件的方法
US20070262435A1 (en) Three-dimensional packaging scheme for package types utilizing a sacrificial metal base
US7781299B2 (en) Leadframe semiconductor package stand and method for making the same
CN1433071A (zh) 芯片封装及其制造方法
KR100713898B1 (ko) 적층 패키지
CN1187035A (zh) 半导体芯片封装及其制造方法
EP4235772A1 (en) Semiconductor package with overlapping leads and die pad
KR100891538B1 (ko) 칩 스택 패키지
CN220753419U (zh) 集成电路封装件
CN216773255U (zh) 半导体封装结构
CN116072618A (zh) 具有互相交叉模具布置的半导体封装

Legal Events

Date Code Title Description
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C06 Publication
PB01 Publication
C14 Grant of patent or utility model
GR01 Patent grant
REG Reference to a national code

Ref country code: HK

Ref legal event code: GR

Ref document number: 1018983

Country of ref document: HK

C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20040519

Termination date: 20130306