CN1183377C - 带有电阻基传感器的自动温度校正变送器 - Google Patents

带有电阻基传感器的自动温度校正变送器 Download PDF

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CN1183377C
CN1183377C CNB998123196A CN99812319A CN1183377C CN 1183377 C CN1183377 C CN 1183377C CN B998123196 A CNB998123196 A CN B998123196A CN 99812319 A CN99812319 A CN 99812319A CN 1183377 C CN1183377 C CN 1183377C
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伊夫伦·埃吕莱克
乔格施·沃里奥尔
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Abstract

本发明涉及一种用于过程控制系统中应用的变送器和一种对过程控制系统变速器中的电阻基温度传感器诊断的方法，其中包括一用于对过程变量进行检测并产生传感器输出的电阻基传感器(10)，一模/数转换电路(50)与传感器输出耦合，用于产生一数字传感器输出，和变送器输出校准电路(52)用于产生一作为自热信号输出函数的自动校正输出，或在另一实施例中变送器(40)输出一作为自热信号系数函数的传感器(10)的剩余寿命推定值。

Description

过程控制系统中的变速器和对其电阻基温度传感器诊断的方法
技术领域
本发明涉及一种用于过程控制系统中应用的变送器和一种对过程控制系统变速器中的电阻基温度传感器诊断的方法。具体地说，本发明涉及对过程控制变送器的校准，所述过程控制变送器包括一个电阻基温度传感器。
背景技术
过程控制变送器用于对工业过程的过程变量进行监视。例如一个变送器对温度进行监视并将该信息发回控制室。另外有些变送器可以直接实施过程控制。为对过程变量进行监视，变送器必须包括一个传感器，例如一个电阻式温度计，该电阻式温度计是一个电阻基温度传感器。
由于电阻式温度计传感器陈旧或处于恶劣的环境条件下，其精确度将会降低。可以通过定期进行再校准对此降低进行补偿。通常，这将需要操作人员进入现场并在变送器实地实施校正过程。这对于操作人员来说既不方便，而且也耗费时间。另外在出现极限误差之前很难确定传感器的条件。
另外随着使用年限的增长必须定期对传感器加以更换。但很难精确地确定必须进行更换的时间。因此通常是在传感器出现故障之前或在出现意想不到的故障的情况下，对传感器进行更换。
发明内容
本发明提出一种用于过程控制系统中应用的变送器和一种对过程控制系统变速器中的电阻基温度传感器诊断的方法。
根据本发明，实现上述目的的技术方案如下：
一种在过程控制系统中应用的变送器，包含：
一个对过程变量进行检测并产生传感器输出的电阻式温度传感器；
与传感器电气耦合并产生一个与传感器自热系数相关的自热信号的自热电路，所述传感器自热系数与作为传感器校准常数的α和/或在温度为0时的电阻R0之间密切相关；
与传感器输出和传感器监视电路电气耦合的模/数转换电路，用于产生数字传感器输出和数字自热信号；
与过程控制环路电气耦合的用于发送与传感器温度相关的信号的输出电路；和
与产生数字自热信号的自热电路电气耦合的用于产生与作为数字自热信号函数的传感器诊断相关的诊断输出的诊断电路。
一种在一过程控制变送器中对电阻基温度传感器进行诊断的方法，包含：
对传感器的电阻进行检测和数字化，以便产生一数字传感器输出；
求出作为在对电阻式温度传感器的功率输入给定的情况下的传感器电阻的变化的传感器的自热系数，所述传感器自热系数与作为传感器的校准常数α和/或在温度为0时的电阻R0之间密切相关，所述自热系数与电阻式温度计传感器的诊断相关；
产生一作为自热系数的函数的诊断输出。
过程控制系统中的变送器包括一对过程变量进行检测并产生一传感器输出的电阻基传感器。与传感器耦合的自热电路产生一与传感器相关的的自热信号。与传感器输出端耦合的模/数转换电路产生一数字的传感器输出，并且变送器输出诊断校正电路产生一作为自热信号输出函数的自动校正输出或在另一个实施例中，变送器输出一个作为自热系数的函数的剩余寿命推定值。另外还披露了一种用于本发明的计算自热系数的新方法。
附图说明
下面将对照附图对本发明做进一步的说明。图中示出：
图1示出具有本发明变送器的过程控制系统；
图2为本发明的变送器的方框图；和
图3为本发明的电阻基温度传感器的自动温度校准流程图。
具体实施方式
图1为过程控制系统2的示意图，该系统包括安装在现场的温度变送器40和阀门控制器12，所述温度变送器和阀门控制器分别通过两线过程控制环路6和14与控制室4电耦合。安装在支管上并通过支管与管道连接的变送器40对过程管道8中的过程流体的温度进行监视。而且本发明还适用于电阻基的压力测量或电阻基的pH值的测量等任何电阻基的过程变量的测量。变送器40通过对环路6上的电流的控制经环路6将温度信息发送给控制室4。例如对环路6上的电流可以控制在4至20mA并进行相宜的校准，对温度进行表示。另外或在替代方案中，变送器40可以通过环路6采用哈特(HART)或诸如Fieldbus(场总线)等全数字协议向控制室4发送与温度有关的数字信息。变送器40包括实现与温度传感器工作有关的高级诊断的电路，对此还将进一步详述。
本发明的一个方面包括对密切相关进行的识别，在一些情况下是自热(SH)系数与传感器的α和/或R0的线性关系。已知，传感器的α和/或R0与传感器的校准并因此与传感器的寿命相关。因此，一旦测出自热系数，即可推定出传感器的寿命。另外，可以实时对衰变量度的函数(即预选定的自热系数值与自热系数的真正的现时值之间的差)的传感器的输出进行校正。以此可实现对变送器输出的自动校正。
本发明的另一方面包括一种对电阻式温度计传感器的自热(SH)系数进行确定的新方法。通常已有技术是通过对所加电流导致的电阻式温度计的温度变化的监视实施对自热系数的测量。但是在一个变送器中由于功率的限制和必须单独对温度进行测量，因而实施这种测量是不可能的。本发明中的自热系数系指在对电阻式温度计传感器的功率输入的变化给定的情况下的传感器电阻的变化。由于本方法不需要对电阻式温度计进行校准，  所以优选适用于温度变送器。另外，不需要将电阻式温度计由工艺流程上拆卸下来，因而可以实时进行数据采集，没有任何麻烦并且也不必为中断过程付出代价。在一个变送器中可以通过加入两个不同的输入电流，例如5mA和15mA，计算出自热系数。对在电阻式温度计上产生的电压进行测量并利用公式R＝V/I在两个不同电流的情况下计算出传感器的电阻。在两个不同电流的情况下确定出作为P＝I·V的加在电阻式温度计上的功率。根据式1计算出自热系数：
自热系数(SHI)＝(R1-R2)/(P1-P2)               (式1)
可以在过程控制系统中的几个位置中的任何一个位置实施本发明。具体地说，以软件和微处理机实现的本发明如图1所示可以位于中央控制器上或甚至在诸如阀门、电机或开关等执行件12上。另外现代的诸如Fieldbus、Profibus等数字协议都可以使实现本发明的软件在过程控制系统中的通联，而且还可以用于在一变送器中检测出的并接着发送给软件的过程变量。
图2为本发明的与电阻式温度计温度传感器10连接的温度变送器的方框简图。变送器40包括一端子板44、电流源45、乘法器46、微分放大器48、高精度模/数转换器50、微处理机52、时钟电路54、存储器56和输入-输出电路58。
端子板44包括用于例如与电阻式温度计温度传感器连接的端子1至4。传感器10可以是变送器40内设的或外置的。传感器10包括电阻式温度计传感器件61，该件具有电阻R1，该电阻随环境温度的变化而变化。引线16包括四根件引线62、64、66和68。引线62接在传感器件61与端子4之间，引线64接在传感器件61与端子3之间，引线66接在传感器件61与端子2之间，并且引线68接在传感器件61与端子1之间。
电流源45与端子板44连接并馈送流经端子4、传感器件61、端子1、基准电阻RREF、拉曳电阻R2和接地端子72的测量电流。
乘法器46被分成两部分，即一有效乘法器，该乘法器具有一个与微分放大器48的非反向输入端连接的输出端；和一基准乘法器，该基准乘法器具有一与微分放大器48的反向输入端连接的输出端。微处理机52对乘法器46进行控制，对相应的模拟信号组进行倍增，包括来自端子1至3的信号加到微分放大器48的非反向和反向输入端。微分放大器48具有一个与模/数转换器50连接的输出端。在一个实施例中，模/数转换器50的精确度为17比特并且转换速率为14个取样/秒。模/数转换器50将微分放大器48输出端上的电压转换成数字值并将该值馈送给微处理机52用于分析或经输入/输出电路58在过程控制环路6上的通联。
在一优选实施例中，输入/输出电路58包括用于以已知的方式根据选定的协议在环路6上进行模拟或双向数字通信的一哈特(HART)通信段、一FIELDBUS通信段和一4-20mA模拟环路段。但也可以应用其它的协议，例如应用四线配置，其中接收来自单独一个源的功率。环路6也可以通过输入/输出电路58向变送器40的不同器件馈送功率。优选对变送器40完全由两线环路6供电。
存储器56用于对微处理机52的指令和信息进行存储，所述微处理机以由时钟电路60确定的速度进行运算。时钟电路60包括一实时时钟和一精密的高速时钟，所述时钟用于对模/数转换器50的运算排序。微处理机52实施数项任务，包括对乘法器46和模/数转换器50的控制、对环路6上的通信进行控制、温度补偿、存储变送器配置参数和实施传感器诊断。
微处理机52应用下述公式计算电阻式温度计传感器件61的温度：
R1＝VR1/VRREF(RREFNOM)             (式2)
式中：
R1＝电阻式温度计传感器件61的电阻；
VR1＝电阻式温度计传感器件61上的压降；
VRREF＝电阻RREF上的压降；和
RREFNOM＝以欧姆为单位的和/或存储在存储器56内的基准电阻RREF的标称电阻。
微处理机52与乘法器46配合对位于端子2和3之间的电阻式温度计传感器件61上的压降VR1和基准电阻RREF上的压降(VRREF)进行测量。在如图2所示的四线电阻测量时，由于基本所有的电流Is在端子1和4之间流动，因而在很大程度上忽略对与端子2和3连接上的压降，并且该压降对测量精度不会造成太大的影响。微处理机52利用存储在存储器30中的检索表或适用的公式将测出的电阻R1转换成温度单位。例如这样的一个公式是如下的卡伦德-范·迪森(Callender-Van Dusen)公式：
R(t)＝R0{1+α(t-δ(t/100)(t/100-1)-β(t/100-1)(t/100)3)}  (式3)
式中：
R(t)＝在温度t时的电阻(单位：欧姆)
R0＝在温度0时的电阻(单位：欧姆)
t＝温度℃
α、δ、β＝校准常数
β＝0，当t＞0℃时。
但必须针对具体的电阻式温度计温度传感器对存储的检索表或公式2都要进行校准。另外该校准很容易在作为α的传感器漂移时间上变化。对电阻式温度计的校准需要一个精确的温度计基准，以便获得一定数量的正确的温度值，从而精确地确定出常数α和δ。在罗斯蒙特公司1985年2月出版的程序参考表手册简报1042中对公式3和变送器校准进行了讨论并且公式3和变送器校准作为参考资料被包含在本申请中。
当微处理机52激励开关器138将电流源140与传感器61连接时，对自热系数进行计算。用来自源140流过传感器61的电流ISH计算出公式的P1和R1。微处理机52根据来自源45的电流IS确定出P2和R2。应用公式1计算出自热系数。如果变送器40完全由环路6供电，则电流ISH和IS被限制在环路6的电流I上，小于任何运行变送器40中的电路需要的电流。
微处理机52应用自热系数实施与变送器40工作有关的诊断。下面将对用于实现变送器40中的诊断电路的几个实施例加以说明。这些诊断包括对传感器完好状况的确定、对剩余寿命推定的实施，该推定可能是传感器即将失效的征兆、或对温度测量实施的自动校正。
本发明的另一个方面包括应用自热系数校正温度测量，以减少由于α和/或R0的漂移引起的误差。随着电阻式温度计传感器的老化，传感器的常数α和/或R0(在公式3中给出)将发生变化，导致温度测量的不精确性。经发现，在自热系数和由于α和/或R0的漂移造成的温度测量的误差之间存在一基本线性的关系。应用下述公式可对温度进行校正：
T校正＝T测量·K(Δ自热系数(SHI))    (式4)
式中：
T测量是测出的温度；
K是比例常数，该比例是自热系数变化的函数；和
T校正是自动校正温度。
可以用实验的方法确定出K与自热系数间的关系。可以通过公式或根据一优选实施例用存储在存储器56中的作为自热系数的函数的检索表对K进行确定。同样可根据α和R0对自热系数，或自热系数的变化进行校正，或改变这些常数。另外。在本发明的范围内可以根据公式3中的其它限定对自热系数或Δ自热系数进行校正。
图3为说明涉及对作为自热系数的函数的温度输出的自动校正的本发明的框图150。框图150对运算做了说明，该运算通常由图2中所示的微处理机52实施。在方框152中例如由存储器56中获得自热系数(SHI1)的在先值。该值可以是在制造时存储在存储器中、在变送器使用期间或甚至在变送器40工作时的预定时刻预先由微处理机52产生或确定和存储的。在方框154中，由微处理机52确定自热系数(SHI2)的现时值。当变化率m大于或等于最大容许变化率(mMAX)时，判决方框158产生一个报警输出。通常在方框156中对表示SHI1和SHI2的差进行评估。一实施该减功能的优选方法是计算两个自热系数值的时间上的斜率。但可以实施其它的评估差量的方法，例如简单地将SHI2与门限值进行比较，而不必采用方框156。例如可以通过环路6发送出输出，表明传感器品质已下降到即将失效并且必须更换的程度。也可以实施其它的诸如在申请日为1996年11月7日的基础专利申请US 08/744,980中所述的诊断。mMAX值存储在存储器56中并且也可以是根据为具体过程所需精度的用户专用配置。方框158中的报警功能是选用功能，但对本发明是优选的。
如果不存在报警条件，检测到达判决方框160，在该方框中测出的自热系数(SHI2)与存储的自热系数(SHI1)进行比较。如果它们大致相同，则检测到达方框162并确定出温度。反之，如果在两个值之间存在差时，则在方框164中由微处理机52为公式4中Δ自热系数计算出新的值。另外也可以应用其它较为复杂的曲线拟合方法结合传感器校准对自热系数进行校正。这时检测到达方框162并且公式4中的Δ自热系数的新的值存储在存储器中，取代在先值。
对在图3中所示的各种功能可以用控制室中的过程控制设备、用一台位于现场以外的计算机或与这些位置结合在一起远程实施。通常可以在过程控制系统中的任何一个位置实现本发明。具体地说，作为用软件和微处理机实现的本发明可以设置在中央控制器或甚至在诸如图1所示的阀门、电动机或开关器等最终执行部件上。另外诸如Fieldbus、Profibus等最新数字协议可使实现本发明的软件实现在过程控制系统中部件间的联通，并且也可以适用于在变送器中检测出的并接着发送给软件的过程变量。
另外，图4中示出本发明的诊断电路的另一实施方式。
本发明中的诊断电路的一个实施例应用经验模型或作为自热系数的函数的多项曲线拟合。例如应用作为自热系数的函数的多项式计算出剩余寿命推定值。可以通过两线环路向变送器40发送常数和/或公式。也可以利用多层神经网络实现另外的诊断电路。而且可以应用几个训练算法提出一个用于不同目的的神经网络模型，一个实施例包括已知的反向传播网络(BPN)，用于提出神经网络模块，所述模块将对一组输入和输出的非线性的关系进行采集。
诊断电路52的另一个实施例应用一组如果-否则规则，以便实现对传感器电阻式温度计61的温度状况的计算。对自热系数进行监视并将其实时值与上边界和下边界进行比较。通过对多个电阻式温度计传感器的试验根据经验设置上边界和下边界。根据比较做出判决。
在本发明的另一个方面中，采用传感器61的寿命预期值对自热系数的变化率进行校正。自热系数的变化率被提供给在微处理机52中实现的诊断电路，该诊断电路产生一个表示预期寿命的输出，其中也包括当预期的剩余传感器寿命低于最小值时的报警。
尽管上面结合优选实施例对本发明做了说明，但本领域的专业人员应认识到，对本发明的在形式和细节上的改动都不会偏离本发明的构思和范围。

Claims (30)

1.一种在过程控制系统中应用的变送器，包含：
一个对过程变量进行检测并产生传感器输出的电阻式温度传感器；
与传感器电气耦合并产生一个与传感器自热系数相关的自热信号的自热电路，所述传感器自热系数与作为传感器校准常数的α和/或在温度为0时的电阻R0之间密切相关；
与传感器输出和传感器监视电路电气耦合的模/数转换电路，用于产生数字传感器输出和数字自热信号；
与过程控制环路电气耦合的用于发送与传感器温度相关的信号的输出电路；和
与产生数字自热信号的自热电路电气耦合的用于产生与作为数字自热信号函数的传感器校准相关的诊断输出的诊断电路。
2.按照权利要求1所述的变送器，其特征在于，该变送器包括一存储器，该存储器用于存储与自热信号相关的一组预期的结果。
3.按照权利要求1所述的变送器，其中诊断电路包含一神经网络。
4.按照权利要求1所述的变送器，其中诊断电路包含模糊逻辑。
5.按照权利要求1所述的变送器，其中诊断电路产生一剩余寿命推定值输出。
6.按照权利要求5所述的变送器，其中诊断电路对作为数字自热信号的变化率的函数的剩余寿命的推定值进行确定，所述数字自热信号的变化率系(SHI2-SH1)/时间，其中SH2是自热系数的现时值和SH1是自热系数的存储值。
7.按照权利要求1所述的变送器，其中自热电路包括一电流源和电压测量电路。
8.按照权利要求1所述的变送器，其中自热电路对作为对提供给传感器的功率的变化的响应的传感器电阻的变化的函数的自热系数进行确定。
9.按照权利要求8所述的变送器，其中计算出在两个不同电流情况下的作为(R1-R2)/(P1-P2)的自热系数。
10.按照权利要求1所述的变送器，其中输出电路对根据诊断输出的传感器温度信号进行校准。
11.按照权利要求1所述的变送器，其中诊断输出表示传感器寿命预期值。
12.按照权利要求1所述的变送器，其特征在于，
所述自热电路是一个与传感器电气耦合的并用于产生与传感器的电阻上的压降相关的输出的电压测量电路；和
所述诊断电路是一个用于产生作为注入电流和在传感器的电阻上的压降的函数的自热系数输出的诊断电路。
13.按照权利要求12所述的变送器，其中诊断电路提供一个作为自热系数的函数的寿命预期值输出。
14.按照权利要求12所述的变送器，其特征在于，该变送器包括温度测量电路，该温度测量电路用于产生作为传感器电阻和自热系数函数的传感器温度相关的输出。
15.按照权利要求12所述的变送器，其中确定作为根据加在传感器上的功率的变化的传感器电阻的函数的自热系数。
16.按照权利要求13所述的变送器，其中计算出在两个不同的电流的情况下作为(R1-R2)/(P1-P2)的自热系数。
17.按照权利要求1所述的变送器，其特征在于，还包含：
一个用于计算作为数字传感器输出和数字自热信号的函数的温度传感器的测量温度的测量电路。
18.按照权利要求17所述的变送器，其中温度传感器的常数R0作为自热信号变化的函数变化。
19.按照权利要求17所述的变送器，其中温度传感器的校准常数α作为自热信号变化的函数变化。
20.按照权利要求17所述的变送器，其中测量温度是作为自热系数的传感器信号的函数乘以常数K的积。
21.按照权利要求20所述的变送器，其中测量温度与常数K线性相关，其中常数K是自热系数的函数。
22.按照权利要求20所述的变送器，其特征在于，温度变送器包括一个存储在存储器内的检索表，检索表用于提供作为自热信号函数的常数K。
23.按照权利要求17所述的变送器，其特征在于，该变送器还包括：
一与传感器电气耦合的用于将电流注入传感器的电流源。
24.一种在一过程控制变送器中对电阻基温度传感器进行诊断的方法，包含：
对传感器的电阻进行检测和数字化，以便产生一数字传感器输出；
求出作为在对电阻式温度传感器的功率输入给定的情况下的传感器电阻的变化的传感器的自热系数，所述传感器自热系数与作为传感器校准常数的α和/或在温度为0时的电阻R0之间密切相关，所述自热系数又与电阻式温度计传感器的诊断相关；
产生一作为自热系数的函数的诊断输出。
25.按照权利要求24所述的方法，其中求出自热系数的过程还包括对根据加在传感器上的功率的变化的传感器电阻变化进行的测量。
26.按照权利要求25所述的方法，其中计算出在两个不同的电流的情况下作为(R1-R2)/(P1-P2)的自热系数。
27.按照权利要求24所述的方法，其特征在于，该方法包括根据自热系数的变化率对传感器剩余寿命的推定。
28.按照权利要求24所述的方法，其中求自热系数的过程包括对传感器顺序注入至少两个不同的电流并测量在传感器的电阻上产生的压降。
29.按照权利要求24所述的方法，其特征在于，该方法包括对作为诊断输出的传感器寿命预期值的确定。
30 按照权利要求24所述的方法，其特征在于，该方法包括对作为传感器输出和自热系数的函数的传感器温度的确定。
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AU1444400A (en) 2000-05-08
US6519546B1 (en) 2003-02-11
US6594603B1 (en) 2003-07-15
CA2346095A1 (en) 2000-04-27
WO2000023776A1 (en) 2000-04-27

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