CN1947001B - 通过确保在一个时刻只有一个源在发射辐射而对包括多个源的反向散射检查入口中的串扰的消除 - Google Patents
通过确保在一个时刻只有一个源在发射辐射而对包括多个源的反向散射检查入口中的串扰的消除 Download PDFInfo
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Abstract
一种采用多个穿透性辐射源检查物体的系统和方法。将源对被检查物体的辐照在时间上排序,使得被检测的散射辐射的源是明确的。因此,即使在波束大致共面的紧凑几何结构中,也可获得被检查物体的多个视图,并可提高图像质量。
Description
技术领域
本发明涉及用于采用穿透性辐射检查物体的系统和方法,并且更特别地,本发明涉及采用多个辐射源的检查系统。
背景技术
合乎需要的是,在被检查的物体移动经过一个或多个使用穿透性辐射来对物体的内容进行成像的系统时,确定已被藏匿在例如移动车辆中、或人身上、或任何被检查的物体中的诸如违禁品、武器或爆炸物的物体的存在。应该能够在被检查的物体在运动中时,或者可选地,在检查系统相对于被检查的人或物体处于运动中时,做出确定。实际上,因为检查速度以及因而导致的每小时的通过量是非常重要的,所以合乎需要的是,例如车辆被驱动而不需要司机或乘客下车。在做出检测的情况下,可视图像应该能用于核实。
对通过检测和分析从被辐照的物体、容器、或车辆散射的穿透性辐射而产生的图像的使用,是例如于2002年10月1日公开的授予Chalmers等(“Chalmers专利”)的美国专利第6,459,764号的主题。Chalmers专利公开了通过从移动车辆上方或下方以及从侧面、采用x射线照射车辆的对移动车辆的反向散射检查。
对都位于入口处的用于拍摄(screening)人员的x射线源和x射线检测器的使用,是例如于2000年7月25日公开的授予Smith的美国专利第6,094,072号的主题。
X射线从物体向四面八方散射,因此,散射可由相对于照射辐射的入射方向与散射材料成任何角度布置的x射线检测器检测。因此,通常使用“飞点(flying spot)”辐照系统,由此在任意给定时刻采用穿透性辐射照射被检查物体上的单个点,使得至少相对于横穿过穿透性辐射的波束方向的平面,可明确地确定散射的轨迹。
为了获得被检查物体的多个视图,可在单个检查隧道中采用多个反向散射成像系统。这可能会导致各成像系统之间的干扰或串扰,从而引起图像退化。这是由于各飞点成像器缺乏从每个成像器的源辨别散射辐射的来源的能力。迄今,已经通过将成像器分开一些距离放置以最小化串扰,来解决该问题。该方法导致整个系统的尺寸增加。在空间受限制的应用中,这经常是不合需要的。
发明内容
在本发明的一个实施例中,提供了一种用于依靠相对于物体、检查系统或两者的局部参照系的运动而检查具有相对于检查系统在特定方向上运动的特征的物体的检查系统。该检查系统具有第一源,该第一源用于提供以大致横穿过物体运动方向的第一波束方向引导的、具有特定横截面的穿透性辐射的第一波束。它还具有用于提供第二波束方向的穿透性辐射的第二波束的第二源,并且可具有附加波束的附加源。穿透性辐射的波束在时间上是散置的(temporally interspersed)。另外,系统具有多个散射检测器,用于检测由被检查物体内的任何散射材料从第一波束和其它波束中的至少一个中散射的辐射,并用于生成散射辐射信号。系统还可具有一个或多个透射检测器,用于检测透射穿过物体的穿透性辐射。最后,系统具有控制器,用于至少基于散射辐射信号来生成散射材料的图像,或者用于以别的方式表征散射材料。
根据本发明的替代实施例,穿透性辐射的第一源可以是x射线源,也可以是其它穿透性辐射源。第一波束方向和任何其它波束的方向可以大致共面。多个源可包括波束扫描机构,诸如旋转调制盘或电磁扫描器,并且一个或多个波束可以是笔形波束。
根据本发明的另一实施例,第一波束的穿透性辐射的发射的特征在于具有第一时间周期,并且第二波束的穿透性辐射的发射的特征在于具有第二时间周期,第一和第二时间周期偏差固定的相位关系。每个源的时间周期的特征在于具有工作循环,相邻源的发射的特征在于具有关于相邻源的相位关系,其中相位关系可等于2π乘工作循环。
根据本发明的另一实施例,检查系统还可包括用于显示布置在被检查物体内的材料的散射图像的显示器。
附图说明
通过参照参考附图而做出的以下详细描述,将更容易理解本发明的上述特征,其中:
图1表示根据本发明的实施例使用多个反向散射成像系统的x射线检查系统的横截面示意图;并且
图2表示图1的x射线检查系统实施例的侧视图。
具体实施方式
根据本发明的实施例,在配置为多视图反向散射检查系统的多个飞点反向散射成像系统之间最小化波束串扰,同时对单个成像系统之间的距离没有限制。换句话说,在由用于每个视图的单个反向散射成像系统组成的多视图系统中,可将单个成像系统靠拢放置到物理上可行的紧密程度,同时有利地减小或消除串扰。
通过采用x射线从移动车辆的上方或下方照射车辆的对移动车辆的反向散射检查的方法和优势,被描述在2001年6月19日公开的美国专利第6,249,567号中,在此引用其全部内容作为参考。根据本发明的优选实施例,在检查过程期间,不需要横穿车辆的穿透性辐射,就能够揭示由于隐藏的材料靠近车辆的侧壁而出现的反向散射增强区域。
图1表示一般标记为附图标记10的检查系统的元件的横截面示意图。可能是有生命的或无生命的检查目标18,以进入页面或从页面出来的方向移动或被移动,从而横穿入口12。入口12支撑多个穿透性辐射的源13、15和17。源13、15和17典型地是本领域中已知的具有波束形成和控制机构的x射线管。例如,源13以具有特定形状的横截面的波束23来发射穿透性辐射。对于散射成像应用,通常采用狭窄的笔形波束。穿透性辐射的波束23可以是例如诸如多色x射线波束的x射线波束。尽管穿透性辐射的源13优选地例如是x射线管,但是其它穿透性辐射的源,诸如直线加速器(线性加速器),也在本发明的范围内,并且实际上穿透性辐射不限于x射线辐射,并且可以包括伽马射线辐射。
沿大致垂直的轴为扫描波束23设置扫描机构,使得在工作循环的部分期间,以诸如24的一系列方向引导波束23。在图1的描绘中,要被检查的物体18以大致水平方向移动经过波束23,进入页面。在本发明的替代实施例中,检查系统的源和/或其它部分可相对于物体18移动,物体18可自身移动或静止。
源13可包括扫描机构,诸如本领域的技术人员已知的飞点旋转调制盘。可选地,可采用电磁扫描器,诸如2002年7月23日公开的标题为“Method and Apparatus for Generating Sequential Beams ofPenetrating Radiation”的美国专利第6,421,420号中所描述的那些,在此引用其全部内容作为参考。
源15和17的波束以它们各自扫描的典型极限位置来显示,并标为25、26、27和28。如上讨论的被检查物体18可以指,例如可自动通过波束23-28或可由机械化传送装置传送或由牵引器等牵引的车辆、容器或人。在本发明的替代实施例中,例如配置为入口的检查系统可以在诸如车辆的物体上移动或被移动,其中物体本身可以是移动的或静止的。
本说明中的波束23-28将被称为x射线波束,且不限于此。根据本发明的优选实施例,使用旋转调制盘来产生可在大致平行于页面的平面中扫描的笔形波束23-28。笔形波束23的横截面在每个尺寸上具有可比较的程度,并且通常大致是圆,尽管它可以是很多形状。笔形波束23-28的尺寸通常定义采用该系统可获得的散射图像分辨率。可在特定应用中有利地采用其它形状的波束横截面。
由散射检测器31代表的检测器布置,被布置在与扫描过程期间物体18的运动方向平行的平面中。由康普顿散射从波束24中散射到基本相反方向的x射线30,由布置在源13和物体18之间的一个或多个反向散射检测器3 1检测。可辅助地使用附加的检测器布置32、33、34、35和36,来检测来自波束24的康普顿散射的x射线,并且类似地,如下面将描述的那样,来对依次入射在被检查物体18上的其它波束中的每一个进行检测。
另外,可使用相对于发射源布置在被检查物体18的远端的透射检测器,采用在透射的x射线中获得的物体图像,来增加散射图像,例如,被指定为35和36的检测器元件检测透射穿过被检查物体的源13的放射。在本发明的另一实施例中,将单个分离的检测器布置在一对散射检测器35和一对散射检测器36之间,并将其用于检测透射穿过物体16的穿透性辐射。
在本发明的范围内,可采用本领域内已知的x射线检测技术,用于检测器布置31-36。检测器可以是固态、液态或气态的闪烁材料,其由诸如光电倍增器或固态检测器的光敏检测器进行查看。液态闪烁器可以掺杂锡或其它元素或高原子序数的元素。来自散射检测器31-36的各输出信号被传输到处理器40,并被处理以获得被检查物体18内部的特征42的图像。因为入射x射线光子由物体18内的散射源散射到四面八方,所以使用具有大面积的检测器以最大化散射光子的收集。根据本发明的某些实施例,还可采用处理器40(在此另外称为“控制器”)来得到散射物体的其它特性,诸如本领域内已知的其质量、质量密度、有效原子序数等。
为了允许来自多个方向的被检查物体的视图,使用多个源13-17辐照被检查物体。然而,因为由每个源发射的光子被散射到四面八方,所以必须注意以便消除串扰,即,辐照源的错误鉴别。根据本发明的实施例,通过确保在一个时刻只有一个成像器在发射辐射,来有利地减少或消除串扰。首先,将从成像系统发射的波束的工作循环设置成小于或等于成像系统的数量或多视图系统中的视图的数量的倒数。例如,如果期望的视图数量是6,则将每个成像系统设置成1/6的工作循环,或更小。
接下来,将每对相邻源之间的相位关系设置成2π乘工作循环。这导致从成像器顺序地发射辐射,从而消除从多于一个成像器同时发射的可能性。例如,具有6个源的多视图检查系统会要求它们以相同频率运行,它们的工作循环是1/6,并且它们的相位关系是2π/6,或者60度。
在通过诸如旋转环(rotating hoop)和调制盘的机械装置实现飞点系统的情况下,可通过同步由相位偏移偏置的机械斩波器元件的运动,来满足上述标准。因此,例如,在旋转准直器以定义出现的x射线波束23的路径的情况下,可采用本领域中已知的闭环运动控制器系统来驱动准直器的旋转。通过将扇形孔径(fan aperture)(波束的总扫描角度,即,单个源的极限波束23和24之间的角度)设置成等于2π乘工作循环来控制工作循环。在可电子控制所发射的辐射的系统中,可完全通过电子或软件控制,来设置任何期望的辐照顺序或扫描范围,并且不限于此。
由于减小或消除串扰的时间排序,所以可将源放置成比其它可能性更接近的程度。特别地,可将源13-17布置在单个平面中,这有利地允许实际上同时开/关控制x射线,而不管物体经过成像器的速度如何。
所描述的系统可有利地提供从每个连续的源13-17的透视得到的图像。图1表示示例性的三视图系统,波束23、25等各自扫描共面的轨道。
来自每个成像器的波束顺序扫描,使得在一个时刻仅仅只有一个成像器在发射辐射。因此,源(或‘成像器’)13首先扫描其波束。由射线44代表的从物体散射的辐射,由所有检测器接收。来自每个检测器的信号由获取系统作为分离信道来获取。为三个成像器中的每个重复该处理,从而在物体经过时生成物体的“切片(slice)”。
现参照图2,其示出了图1的布置的侧视图,同时元件被指定了相应的附图标记。图中示出了缝50,当物体18被扫描同时该物体在横向16移动时,源13的波束通过该缝穿过检测器31的部分52和54。
可选择性地使用来自检测器的信号,以重建物体的图像。因为由检测器33和34检测的来自源13的散射光子44与来自源17的散射光子一样有用,所以这些相同的检测器可在所有源之间共享,并导致有效使用检测硬件,从而提高散射收集。
此外,本发明的实施例可通过消除串扰,并且通过允许用于每个视图的单个成像器更加靠近地放置,而有利地允许在更小的操作占地面积中实施多视图飞点x射线散射成像。这些成像器(其中“成像器”指的是源、至少一个检测器、和相关的电子和信号处理)的靠近放置还可允许在成像器之间共享散射检测器,从而允许有效使用检测器硬件,更好地进行散射收集,以提高图像质量。
在期望扫描物体的选择区域的应用中,成像器的共面放置允许x射线的同时开/关控制,而不管物体经过成像器的速度如何。这大大地简化了多视图检查系统中对来自每个成像器的x射线发射的控制的设计,从而不需要如同在不共面发射的系统中通常实施的那样,执行x射线发射的单独排序。
除了对隐藏外壳的内容成像,根据这一点已经描述了本发明的实施例,在本发明的范围内可获得被检查物体的其它特征。例如,可应用本领域中已知的反向散射技术,以用于得到质量、质量密度、质量分布、平均原子序数、或者包含目标威胁材料的可能性。
根据本发明的某些实施例,采用最大能量在160keV和300keV之间的范围中的x射线。以该能量,x射线穿透进车辆,并且可检测车辆内部的有机体。因为低剂量的x射线辐射因而是可能的,所以可使用本发明扫描汽车。对于扫描的车辆可能包含人员的应用,优选的是,低于300keV的端点能量。然而,本发明的范围不限于所采用的穿透性光子的范围。
所描述的本发明的实施例意在仅仅是示例性的,并且对于本领域技术人员而言,许多变更和改变将是显而易见的。所有这些变更和改变都应包含在如所附权利要求定义的本发明的范围内。
Claims (15)
1.一种检查系统,用于检查具有相对于所述检查系统在一个方向上运动的特征的物体,所述系统包括:
a.第一源,用于提供具有特定横截面的穿透性辐射的第一波束;
b.第一波束扫描机构,用于扫描大致横穿过所述物体的运动方向的第一波束方向上的第一波束;
c.第二源,用于提供具有特定横截面的穿透性辐射的第二波束;
d.第二波束扫描机构,用于扫描与所述第一波束方向大致共面且大致垂直的第二波束方向上的第二波束,所述第二波束在时间上与所述穿透性辐射的第一波束散置;
e.多个散射检测器,每个散射检测器被放置成检测由被检查物体内的任何散射材料从所述第一波束和所述第二波束中散射的辐射,并用于生成散射辐射信号;和
f.控制器,用于至少基于所述散射辐射信号来生成所述散射材料的图像。
2.如权利要求1所述的检查系统,其中,所述检查系统相对于局部参照系被固定。
3.如权利要求1所述的检查系统,其中,所述检查系统在检查过程期间相对于局部参照系处于运动中。
4.如权利要求1所述的检查系统,其中,所述穿透性辐射的第一源是x射线源。
5.如权利要求1所述的检查系统,其中,所述第一和第二波束扫描机构是旋转调制盘。
6.如权利要求1所述的检查系统,其中,所述第一和第二波束扫描机构包括电磁扫描器。
7.如权利要求1所述的检查系统,其中,所述穿透性辐射的第一波束是笔形波束。
8.如权利要求1所述的检查系统,其中,所述第一波束的穿透性辐射的发射的特征在于具有第一时间周期,并且所述第二波束的穿透性辐射的发射的特征在于具有第二时间周期,所述第一和所述第二时间周期偏差固定的相位关系。
9.如权利要求8所述的检查系统,其中,每个源的时间周期的特征在于具有工作循环。
10.如权利要求9所述的检查系统,其中,每个源的时间周期的特征在于,关于相邻源的相位关系等于2π乘所述工作循环。
11.如权利要求1所述的检查系统,还包括用于显示布置在所述物体内的材料的散射图像的显示器。
12.如权利要求1所述的检查系统,还包括至少一个透射检测器,用于检测透射穿过所述被检查物体的所述第一波束和所述第二波束中的至少一个,并用于生成透射辐射信号。
13.一种用于检查物体的方法,所述方法包括:
a.采用形成第一波束的穿透性辐射来照射所述物体,所述第一波束在大致横穿过所述物体的运动方向的第一波束方向上被扫描;
b.采用形成第二波束的穿透性辐射来照射物体,所述第二波束在大致横穿过所述物体的运动方向的第二波束方向上被扫描,所述第二波束方向与所述第一波束方向大致共面,所述第二波束方向处于相对于所述第一波束方向是固定的且大致垂直的方向,所述第二波束方向相对于所述第一波束方向在时间上散置;
c.检测从所述第一波束和所述第二波束中由所述物体和至少一个检测器散射的辐射,以生成散射辐射信号,所述检测器用于检测来自第一波束和第二波束的散射;以及
d.基于所述散射辐射信号来表征所述物体。
14.如权利要求13所述的方法,还包括:
e.显示所述散射辐射信号的散射图像。
15.如权利要求13所述的方法,其中,所述表征布置在车辆内的材料的步骤包括,将在采用第一光谱成分照射期间获得的散射辐射信号与在采用第二光谱成分照射期间获得的散射辐射信号组合。
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Families Citing this family (105)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8503605B2 (en) | 2002-07-23 | 2013-08-06 | Rapiscan Systems, Inc. | Four sided imaging system and method for detection of contraband |
US7963695B2 (en) | 2002-07-23 | 2011-06-21 | Rapiscan Systems, Inc. | Rotatable boom cargo scanning system |
US8275091B2 (en) | 2002-07-23 | 2012-09-25 | Rapiscan Systems, Inc. | Compact mobile cargo scanning system |
US9958569B2 (en) | 2002-07-23 | 2018-05-01 | Rapiscan Systems, Inc. | Mobile imaging system and method for detection of contraband |
GB0525593D0 (en) * | 2005-12-16 | 2006-01-25 | Cxr Ltd | X-ray tomography inspection systems |
US8451974B2 (en) | 2003-04-25 | 2013-05-28 | Rapiscan Systems, Inc. | X-ray tomographic inspection system for the identification of specific target items |
US7949101B2 (en) | 2005-12-16 | 2011-05-24 | Rapiscan Systems, Inc. | X-ray scanners and X-ray sources therefor |
US8223919B2 (en) | 2003-04-25 | 2012-07-17 | Rapiscan Systems, Inc. | X-ray tomographic inspection systems for the identification of specific target items |
US9113839B2 (en) | 2003-04-25 | 2015-08-25 | Rapiscon Systems, Inc. | X-ray inspection system and method |
US8243876B2 (en) | 2003-04-25 | 2012-08-14 | Rapiscan Systems, Inc. | X-ray scanners |
US8837669B2 (en) | 2003-04-25 | 2014-09-16 | Rapiscan Systems, Inc. | X-ray scanning system |
US6928141B2 (en) | 2003-06-20 | 2005-08-09 | Rapiscan, Inc. | Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers |
US7809109B2 (en) * | 2004-04-09 | 2010-10-05 | American Science And Engineering, Inc. | Multiple image collection and synthesis for personnel screening |
US7471764B2 (en) | 2005-04-15 | 2008-12-30 | Rapiscan Security Products, Inc. | X-ray imaging system having improved weather resistance |
WO2007006042A2 (en) * | 2005-07-05 | 2007-01-11 | L-3 Communications Security And Detection Systems, Inc. | Methods and apparatus for e-beam scanning |
US7526064B2 (en) | 2006-05-05 | 2009-04-28 | Rapiscan Security Products, Inc. | Multiple pass cargo inspection system |
RU2448342C2 (ru) * | 2006-08-11 | 2012-04-20 | Эмерикэн Сайэнс Энд Энджиниэринг, Инк. | Система контроля объекта (варианты) |
US7492861B2 (en) | 2006-10-13 | 2009-02-17 | Tsinghua University | Apparatus and method for quick imaging and inspecting moving target |
US8638904B2 (en) | 2010-03-14 | 2014-01-28 | Rapiscan Systems, Inc. | Personnel screening system |
US8995619B2 (en) | 2010-03-14 | 2015-03-31 | Rapiscan Systems, Inc. | Personnel screening system |
US7796733B2 (en) * | 2007-02-01 | 2010-09-14 | Rapiscan Systems, Inc. | Personnel security screening system with enhanced privacy |
US8576982B2 (en) | 2008-02-01 | 2013-11-05 | Rapiscan Systems, Inc. | Personnel screening system |
US20080253522A1 (en) * | 2007-04-11 | 2008-10-16 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware | Tool associated with compton scattered X-ray visualization, imaging, or information provider |
US8837677B2 (en) * | 2007-04-11 | 2014-09-16 | The Invention Science Fund I Llc | Method and system for compton scattered X-ray depth visualization, imaging, or information provider |
US20080253526A1 (en) * | 2007-04-11 | 2008-10-16 | Searete Llc, A Limited Liability Corporation Of The State Of Delaware | Geometric compton scattered x-ray visualizing, imaging, or information providing |
US8041006B2 (en) * | 2007-04-11 | 2011-10-18 | The Invention Science Fund I Llc | Aspects of compton scattered X-ray visualization, imaging, or information providing |
US7742567B2 (en) * | 2007-04-11 | 2010-06-22 | Searete Llc | Compton scattered X-ray visualization, imaging, or information provider with time of flight computation |
US20080253525A1 (en) * | 2007-04-11 | 2008-10-16 | Boyden Edward S | Compton scattered x-ray visualizing, imaging, or information providing of at least some dissimilar matter |
US7711089B2 (en) * | 2007-04-11 | 2010-05-04 | The Invention Science Fund I, Llc | Scintillator aspects of compton scattered X-ray visualization, imaging, or information providing |
CN103064125B (zh) * | 2007-06-21 | 2016-01-20 | 瑞皮斯坎系统股份有限公司 | 用于提高受指引的人员筛查的系统和方法 |
RU2010131017A (ru) * | 2007-12-25 | 2012-02-10 | Рапискан Системз, Инк. (Us) | Усовершенствованная система безопасности для досмотра людей |
GB0803641D0 (en) | 2008-02-28 | 2008-04-02 | Rapiscan Security Products Inc | Scanning systems |
GB0809109D0 (en) | 2008-05-20 | 2008-06-25 | Rapiscan Security Products Inc | Scanner systems |
GB0809110D0 (en) | 2008-05-20 | 2008-06-25 | Rapiscan Security Products Inc | Gantry scanner systems |
GB0809107D0 (en) * | 2008-05-20 | 2008-06-25 | Rapiscan Security Products Inc | Scannign systems |
GB0810638D0 (en) | 2008-06-11 | 2008-07-16 | Rapiscan Security Products Inc | Photomultiplier and detection systems |
US8963094B2 (en) | 2008-06-11 | 2015-02-24 | Rapiscan Systems, Inc. | Composite gamma-neutron detection system |
US8130904B2 (en) | 2009-01-29 | 2012-03-06 | The Invention Science Fund I, Llc | Diagnostic delivery service |
US8041008B2 (en) | 2009-01-29 | 2011-10-18 | The Invention Science Fund I, Llc | Diagnostic delivery service |
US9310323B2 (en) | 2009-05-16 | 2016-04-12 | Rapiscan Systems, Inc. | Systems and methods for high-Z threat alarm resolution |
US8275092B1 (en) | 2009-06-15 | 2012-09-25 | American Science And Engineering, Inc. | Three-dimensional mapping based on scattered penetrating radiation |
CN102484935B (zh) | 2009-07-13 | 2015-02-04 | 拉皮斯坎系统股份有限公司 | 四侧成像系统及用于检测违禁品的方法 |
WO2011011583A1 (en) * | 2009-07-24 | 2011-01-27 | Nucsafe, Inc. | Spatial sequenced backscatter portal |
US8824632B2 (en) | 2009-07-29 | 2014-09-02 | American Science And Engineering, Inc. | Backscatter X-ray inspection van with top-down imaging |
PL2459991T3 (pl) * | 2009-07-29 | 2020-01-31 | American Science & Engineering, Inc. | Przyczepa do odgórnej kontroli rentgenowskiej |
US20110142201A1 (en) * | 2009-12-15 | 2011-06-16 | General Electric Company | Multi-view imaging system and method |
CA2793225A1 (en) | 2010-03-14 | 2011-09-22 | Rapiscan Systems, Inc. | Multiple screen detection systems |
US9036782B2 (en) * | 2010-08-06 | 2015-05-19 | Telesecurity Sciences, Inc. | Dual energy backscatter X-ray shoe scanning device |
US8848871B2 (en) * | 2010-11-04 | 2014-09-30 | Ut-Battelle, Llc | X-ray backscatter imaging of nuclear materials |
US8908831B2 (en) | 2011-02-08 | 2014-12-09 | Rapiscan Systems, Inc. | Covert surveillance using multi-modality sensing |
PL2673660T3 (pl) | 2011-02-08 | 2018-01-31 | Rapiscan Systems Inc | Tajny nadzór z użyciem wykrywania multimodalnego |
RU2550319C2 (ru) * | 2011-02-08 | 2015-05-10 | Американ Сайенс Энд Инжиниринг, Инк. | Анализ энергий при обратном рассеянии для классификации материалов на основании позиционной некоммутативности |
JP5423705B2 (ja) * | 2011-02-28 | 2014-02-19 | 横河電機株式会社 | 放射線検査装置 |
US9218933B2 (en) | 2011-06-09 | 2015-12-22 | Rapidscan Systems, Inc. | Low-dose radiographic imaging system |
US8761338B2 (en) | 2011-06-20 | 2014-06-24 | The Boeing Company | Integrated backscatter X-ray system |
US9151721B2 (en) | 2011-06-20 | 2015-10-06 | The Boeing Company | Integrated backscatter X-ray system |
CN102393399B (zh) * | 2011-08-24 | 2015-10-28 | 屈俊健 | X射线飞点的形成装置和方法 |
WO2013036735A1 (en) | 2011-09-07 | 2013-03-14 | Rapiscan Systems, Inc. | X-ray inspection system that integrates manifest data with imaging/detection processing |
US8855268B1 (en) * | 2011-11-01 | 2014-10-07 | The Boeing Company | System for inspecting objects underwater |
CN104170051B (zh) * | 2012-02-03 | 2017-05-31 | 拉皮斯坎系统股份有限公司 | 组合散射和透射的多视图成像系统 |
CN104204854B (zh) | 2012-02-14 | 2017-05-10 | 美国科技工程公司 | 使用波长偏移光纤耦合闪烁检测器进行x射线检查 |
US10670740B2 (en) | 2012-02-14 | 2020-06-02 | American Science And Engineering, Inc. | Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors |
CN103308535B (zh) * | 2012-03-09 | 2016-04-13 | 同方威视技术股份有限公司 | 用于射线扫描成像的设备和方法 |
US9123450B2 (en) | 2012-04-30 | 2015-09-01 | The Boeing Company | Single beam backscatter x-ray system |
US8879688B2 (en) * | 2012-05-22 | 2014-11-04 | The Boeing Company | Reconfigurable detector system |
CN103901494B (zh) * | 2012-12-27 | 2017-08-29 | 同方威视技术股份有限公司 | 人体背散射安检系统及其方法 |
KR102167245B1 (ko) | 2013-01-31 | 2020-10-19 | 라피스캔 시스템스, 인코포레이티드 | 이동식 보안검사시스템 |
US9778391B2 (en) * | 2013-03-15 | 2017-10-03 | Varex Imaging Corporation | Systems and methods for multi-view imaging and tomography |
CA2919159A1 (en) | 2013-07-23 | 2015-01-29 | Rapiscan Systems, Inc. | Methods for improving processing speed for object inspection |
CN104340627B (zh) * | 2013-07-23 | 2017-03-01 | 同方威视技术股份有限公司 | 车辆拖动装置、车辆双模式通过系统和检查系统 |
US9519853B2 (en) | 2013-11-01 | 2016-12-13 | James P Tolle | Wearable, non-visible identification device for friendly force identification and intruder detection |
US9557427B2 (en) | 2014-01-08 | 2017-01-31 | Rapiscan Systems, Inc. | Thin gap chamber neutron detectors |
RO130582B1 (ro) * | 2014-01-23 | 2021-12-30 | Mb Telecom Ltd. S.R.L. | Sistem şi metodă pentru inspecţia completă şi neintruzivă a aeronavelor |
WO2015134802A1 (en) | 2014-03-07 | 2015-09-11 | Rapiscan Systems, Inc. | Ultra wide band detectors |
US11280898B2 (en) | 2014-03-07 | 2022-03-22 | Rapiscan Systems, Inc. | Radar-based baggage and parcel inspection systems |
US9867271B2 (en) | 2014-05-16 | 2018-01-09 | American Science And Engineering, Inc. | Source for intra-pulse multi-energy X-ray cargo inspection |
US11266006B2 (en) | 2014-05-16 | 2022-03-01 | American Science And Engineering, Inc. | Method and system for timing the injections of electron beams in a multi-energy x-ray cargo inspection system |
WO2016003547A1 (en) | 2014-06-30 | 2016-01-07 | American Science And Engineering, Inc. | Rapidly relocatable modular cargo container scanner |
CN104101910A (zh) * | 2014-07-04 | 2014-10-15 | 清华大学 | 基于分布式辐射源的x射线背散射通道式车辆安检系统和方法 |
CN104062688A (zh) * | 2014-07-04 | 2014-09-24 | 同方威视技术股份有限公司 | 基于分布式辐射源的x射线背散射通道式车辆安检系统和方法 |
US9594033B2 (en) * | 2014-07-22 | 2017-03-14 | The Boeing Company | Visible X-ray indication and detection system for X-ray backscatter applications |
KR20170109533A (ko) | 2014-11-25 | 2017-09-29 | 라피스캔 시스템스, 인코포레이티드 | 지능형 보안관리시스템 |
GB2554566B (en) | 2015-03-20 | 2021-06-02 | Rapiscan Systems Inc | Hand-held portable backscatter inspection system |
WO2017015549A1 (en) * | 2015-07-22 | 2017-01-26 | UHV Technologies, Inc. | X-ray imaging and chemical analysis of plant roots |
US9989483B2 (en) * | 2015-08-17 | 2018-06-05 | The Boeing Company | Systems and methods for performing backscatter three dimensional imaging from one side of a structure |
GB2558464C (en) | 2015-09-08 | 2021-10-27 | American Science & Eng Inc | Backscatter imaging for precision agriculture |
US11536672B2 (en) | 2015-09-08 | 2022-12-27 | American Science And Engineering, Inc. | Systems and methods for using backscatter imaging in precision agriculture |
GB2559500B (en) | 2015-09-10 | 2022-02-23 | American Science & Eng Inc | Backscatter characterization using interlinearly adaptive electromagnetic x-ray scanning |
US10345479B2 (en) | 2015-09-16 | 2019-07-09 | Rapiscan Systems, Inc. | Portable X-ray scanner |
EP3420563A4 (en) | 2016-02-22 | 2020-03-11 | Rapiscan Systems, Inc. | SYSTEMS AND METHODS FOR THREAT DETECTION AND SMUGGLING IN CARGO |
CN107280700B (zh) * | 2016-03-31 | 2023-06-20 | 通用电气公司 | Ct成像设备及方法、用于ct成像设备的x射线收发组件 |
CN109791811A (zh) | 2016-09-30 | 2019-05-21 | 美国科学及工程股份有限公司 | 用于2d扫描光束成像的x射线源 |
CN106526688A (zh) * | 2016-12-28 | 2017-03-22 | 同方威视技术股份有限公司 | 背散射检查车 |
US10600609B2 (en) | 2017-01-31 | 2020-03-24 | Rapiscan Systems, Inc. | High-power X-ray sources and methods of operation |
CN106841256B (zh) * | 2017-02-17 | 2023-11-21 | 清华大学 | 多视角背散射检查系统和多视角背散射检查方法 |
CN108227027B (zh) * | 2017-12-29 | 2020-12-01 | 同方威视技术股份有限公司 | 车载背散射检查系统 |
CN108008458B (zh) * | 2017-12-29 | 2020-09-08 | 同方威视技术股份有限公司 | 车载背散射检查系统 |
WO2019245636A1 (en) | 2018-06-20 | 2019-12-26 | American Science And Engineering, Inc. | Wavelength-shifting sheet-coupled scintillation detectors |
CN109521480A (zh) * | 2019-01-04 | 2019-03-26 | 同方威视科技(北京)有限公司 | 辐射检查设备和辐射检查方法 |
US11212902B2 (en) | 2020-02-25 | 2021-12-28 | Rapiscan Systems, Inc. | Multiplexed drive systems and methods for a multi-emitter X-ray source |
US11193898B1 (en) | 2020-06-01 | 2021-12-07 | American Science And Engineering, Inc. | Systems and methods for controlling image contrast in an X-ray system |
US11175245B1 (en) | 2020-06-15 | 2021-11-16 | American Science And Engineering, Inc. | Scatter X-ray imaging with adaptive scanning beam intensity |
US11340361B1 (en) | 2020-11-23 | 2022-05-24 | American Science And Engineering, Inc. | Wireless transmission detector panel for an X-ray scanner |
EP4298433A1 (en) | 2021-02-23 | 2024-01-03 | Rapiscan Systems, Inc. | Systems and methods for eliminating cross-talk in scanning systems having multiple x-ray sources |
WO2024030046A1 (en) * | 2022-08-01 | 2024-02-08 | Obshhestvo S Ogranichennoj Otvetstvennost`Yu "Indikom" (Ooo "Indikom") | Method for determining the spatial profile of inspected objects |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6094472A (en) * | 1998-04-14 | 2000-07-25 | Rapiscan Security Products, Inc. | X-ray backscatter imaging system including moving body tracking assembly |
US6151381A (en) * | 1998-01-28 | 2000-11-21 | American Science And Engineering, Inc. | Gated transmission and scatter detection for x-ray imaging |
CN1328639A (zh) * | 1998-09-17 | 2001-12-26 | 程序控制公司 | X-射线荧光元素分析器 |
US6459761B1 (en) * | 2000-02-10 | 2002-10-01 | American Science And Engineering, Inc. | Spectrally shaped x-ray inspection system |
Family Cites Families (56)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DK131955C (da) | 1973-10-09 | 1976-02-23 | I Leunbach | Fremgangsmade og anleg til bestemmelse af elektrontetheden i et delvolumen af et legeme |
US4064440A (en) | 1976-06-22 | 1977-12-20 | Roder Frederick L | X-ray or gamma-ray examination device for moving objects |
DE2939146A1 (de) | 1979-09-27 | 1981-04-16 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Verfahren zur untersuchung eines koerpers mit durchdringender strahlung |
US4525854A (en) | 1983-03-22 | 1985-06-25 | Troxler Electronic Laboratories, Inc. | Radiation scatter apparatus and method |
US4799247A (en) * | 1986-06-20 | 1989-01-17 | American Science And Engineering, Inc. | X-ray imaging particularly adapted for low Z materials |
US4809312A (en) | 1986-07-22 | 1989-02-28 | American Science And Engineering, Inc. | Method and apparatus for producing tomographic images |
GB8623196D0 (en) | 1986-09-26 | 1986-10-29 | Robinson M | Visual screening system |
DE8717508U1 (zh) | 1987-10-19 | 1989-01-05 | Heimann Gmbh, 6200 Wiesbaden, De | |
US4825454A (en) | 1987-12-28 | 1989-04-25 | American Science And Engineering, Inc. | Tomographic imaging with concentric conical collimator |
US4864142A (en) | 1988-01-11 | 1989-09-05 | Penetron, Inc. | Method and apparatus for the noninvasive interrogation of objects |
US5022062A (en) * | 1989-09-13 | 1991-06-04 | American Science And Engineering, Inc. | Automatic threat detection based on illumination by penetrating radiant energy using histogram processing |
US5179581A (en) | 1989-09-13 | 1993-01-12 | American Science And Engineering, Inc. | Automatic threat detection based on illumination by penetrating radiant energy |
US5181234B1 (en) * | 1990-08-06 | 2000-01-04 | Rapiscan Security Products Inc | X-ray backscatter detection system |
US5247561A (en) | 1991-01-02 | 1993-09-21 | Kotowski Andreas F | Luggage inspection device |
JPH04344491A (ja) * | 1991-05-21 | 1992-12-01 | Toshiba Corp | 放射線透視検査装置 |
JPH05133909A (ja) * | 1991-11-15 | 1993-05-28 | Toshiba Corp | 散乱放射線検査装置 |
GB9200828D0 (en) * | 1992-01-15 | 1992-03-11 | Image Research Ltd | Improvements in and relating to material identification using x-rays |
DE4215343A1 (de) | 1992-05-09 | 1993-11-11 | Philips Patentverwaltung | Filterverfahren für ein Röntgensystem und Anordnung zur Durchführung eines solchen Filterverfahrens |
JPH05323039A (ja) * | 1992-05-21 | 1993-12-07 | Toshiba Corp | 放射線検査装置 |
JPH06138252A (ja) * | 1992-10-28 | 1994-05-20 | Toshiba Corp | X線検査装置 |
US5430787A (en) | 1992-12-03 | 1995-07-04 | The United States Of America As Represented By The Secretary Of Commerce | Compton scattering tomography |
US5600303A (en) | 1993-01-15 | 1997-02-04 | Technology International Incorporated | Detection of concealed explosives and contraband |
DE4311174C2 (de) | 1993-04-05 | 1996-02-15 | Heimann Systems Gmbh & Co | Röntgenprüfanlage für Container und Lastkraftwagen |
DE19532965C2 (de) | 1995-09-07 | 1998-07-16 | Heimann Systems Gmbh & Co | Röntgenprüfanlage für großvolumige Güter |
US6018562A (en) * | 1995-11-13 | 2000-01-25 | The United States Of America As Represented By The Secretary Of The Army | Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography |
US5764683B1 (en) | 1996-02-12 | 2000-11-21 | American Science & Eng Inc | Mobile x-ray inspection system for large objects |
US5696806A (en) * | 1996-03-11 | 1997-12-09 | Grodzins; Lee | Tomographic method of x-ray imaging |
US5638420A (en) * | 1996-07-03 | 1997-06-10 | Advanced Research And Applications Corporation | Straddle inspection system |
EP0910807B1 (en) | 1996-07-12 | 2003-03-19 | American Science & Engineering, Inc. | Side scatter tomography system |
WO1998003889A1 (en) | 1996-07-22 | 1998-01-29 | American Science And Engineering, Inc. | System for rapid x-ray inspection of enclosures |
US5763886A (en) | 1996-08-07 | 1998-06-09 | Northrop Grumman Corporation | Two-dimensional imaging backscatter probe |
US5974111A (en) | 1996-09-24 | 1999-10-26 | Vivid Technologies, Inc. | Identifying explosives or other contraband by employing transmitted or scattered X-rays |
WO1998020366A1 (en) | 1996-11-08 | 1998-05-14 | American Science And Engineering, Inc. | Coded aperture x-ray imaging system |
US5912460A (en) | 1997-03-06 | 1999-06-15 | Schlumberger Technology Corporation | Method for determining formation density and formation photo-electric factor with a multi-detector-gamma-ray tool |
WO1999013323A2 (en) * | 1997-09-09 | 1999-03-18 | American Science And Engineering, Inc. | A tomographic inspection system |
JPH11164829A (ja) * | 1997-12-03 | 1999-06-22 | Toshiba Corp | 架台移動ヘリカルスキャンct装置 |
US6236709B1 (en) | 1998-05-04 | 2001-05-22 | Ensco, Inc. | Continuous high speed tomographic imaging system and method |
US6442233B1 (en) * | 1998-06-18 | 2002-08-27 | American Science And Engineering, Inc. | Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection |
RU2158917C2 (ru) * | 1998-08-24 | 2000-11-10 | АОЗТ "Технологии металлургии" | Рудоконтролирующее устройство |
ATE290223T1 (de) * | 1998-11-30 | 2005-03-15 | American Science & Eng Inc | Röntgenstrahluntersuchungssystem mit kegel- und bleistiftstrahlen aus einer gemeinsamen quelle |
US6421420B1 (en) * | 1998-12-01 | 2002-07-16 | American Science & Engineering, Inc. | Method and apparatus for generating sequential beams of penetrating radiation |
US6249567B1 (en) | 1998-12-01 | 2001-06-19 | American Science & Engineering, Inc. | X-ray back scatter imaging system for undercarriage inspection |
US6459764B1 (en) | 1999-01-27 | 2002-10-01 | American Science And Engineering, Inc. | Drive-through vehicle inspection system |
US6546072B1 (en) * | 1999-07-30 | 2003-04-08 | American Science And Engineering, Inc. | Transmission enhanced scatter imaging |
US6567496B1 (en) * | 1999-10-14 | 2003-05-20 | Sychev Boris S | Cargo inspection apparatus and process |
CA2348150C (en) * | 2000-05-25 | 2007-03-13 | Esam M.A. Hussein | Non-rotating x-ray system for three-dimensional, three-parameter imaging |
RU2193185C2 (ru) * | 2000-10-02 | 2002-11-20 | Общество с ограниченной ответственностью Научно-производственная фирма "ТАПЕКО" | Способ обнаружения алмазов на конвейере, в потоке или образце алмазоносной породы |
US6473487B1 (en) * | 2000-12-27 | 2002-10-29 | Rapiscan Security Products, Inc. | Method and apparatus for physical characteristics discrimination of objects using a limited view three dimensional reconstruction |
RU2225018C2 (ru) * | 2002-04-22 | 2004-02-27 | Российский научный центр "Курчатовский институт" | Способ обнаружения предметов в верхних слоях грунта, в частности противопехотных мин |
US6879657B2 (en) * | 2002-05-10 | 2005-04-12 | Ge Medical Systems Global Technology, Llc | Computed tomography system with integrated scatter detectors |
US7162005B2 (en) | 2002-07-19 | 2007-01-09 | Varian Medical Systems Technologies, Inc. | Radiation sources and compact radiation scanning systems |
US7103137B2 (en) * | 2002-07-24 | 2006-09-05 | Varian Medical Systems Technology, Inc. | Radiation scanning of objects for contraband |
JP2004108912A (ja) * | 2002-09-18 | 2004-04-08 | Hitachi Ltd | 中性子を用いた検知装置および検知方法 |
JP4314008B2 (ja) * | 2002-10-01 | 2009-08-12 | 株式会社東芝 | X線ctスキャナ |
US7333587B2 (en) | 2004-02-27 | 2008-02-19 | General Electric Company | Method and system for imaging using multiple offset X-ray emission points |
US20070009088A1 (en) | 2005-07-06 | 2007-01-11 | Edic Peter M | System and method for imaging using distributed X-ray sources |
-
2005
- 2005-04-01 EP EP05743513A patent/EP1733213B1/en active Active
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-
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- 2008-07-10 US US12/171,020 patent/US7593506B2/en active Active
-
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- 2010-02-25 JP JP2010040967A patent/JP2010133977A/ja not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6151381A (en) * | 1998-01-28 | 2000-11-21 | American Science And Engineering, Inc. | Gated transmission and scatter detection for x-ray imaging |
US6094472A (en) * | 1998-04-14 | 2000-07-25 | Rapiscan Security Products, Inc. | X-ray backscatter imaging system including moving body tracking assembly |
CN1328639A (zh) * | 1998-09-17 | 2001-12-26 | 程序控制公司 | X-射线荧光元素分析器 |
US6459761B1 (en) * | 2000-02-10 | 2002-10-01 | American Science And Engineering, Inc. | Spectrally shaped x-ray inspection system |
Also Published As
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HK1104181A1 (en) | 2008-01-04 |
JP2010133977A (ja) | 2010-06-17 |
PT1733213E (pt) | 2010-05-27 |
KR101000182B1 (ko) | 2010-12-10 |
PL1733213T3 (pl) | 2010-07-30 |
DE602005019552D1 (de) | 2010-04-08 |
WO2005098400A3 (en) | 2005-11-24 |
RU2444723C2 (ru) | 2012-03-10 |
NO20064614L (no) | 2007-01-09 |
RU2006133625A (ru) | 2008-03-27 |
US20080310591A1 (en) | 2008-12-18 |
JP2007532876A (ja) | 2007-11-15 |
WO2005098400A2 (en) | 2005-10-20 |
IL178284A (en) | 2010-12-30 |
EP1733213A2 (en) | 2006-12-20 |
DK1733213T3 (da) | 2010-05-03 |
IL178284A0 (en) | 2006-12-31 |
ATE458994T1 (de) | 2010-03-15 |
ES2338899T3 (es) | 2010-05-13 |
US20080152081A1 (en) | 2008-06-26 |
JP4689663B2 (ja) | 2011-05-25 |
KR20060132990A (ko) | 2006-12-22 |
US7593506B2 (en) | 2009-09-22 |
EP1733213B1 (en) | 2010-02-24 |
US7400701B1 (en) | 2008-07-15 |
CN1947001A (zh) | 2007-04-11 |
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