CN202994334U - 用于感测工业过程的温度的温度变送器 - Google Patents
用于感测工业过程的温度的温度变送器 Download PDFInfo
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- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
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- G—PHYSICS
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- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/02—Means for indicating or recording specially adapted for thermometers
- G01K1/022—Means for indicating or recording specially adapted for thermometers for recording
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
Abstract
一种用于感测工业过程的温度的温度变送器,包括:温度传感器,提供与工业过程的温度有关的传感器输出;测量电路,与所述温度传感器耦合,基于所述传感器输出来测量工业过程的温度;输出电路,提供与所测量的温度有关的输出;存储器,存储与温度传感器经历的过度温度事件有关的温度信息;以及诊断电路,基于所存储的过度温度信息对所述温度传感器的条件进行诊断。
Description
技术领域
本实用新型涉及用于控制或者监测工业过程的工业过程控制或监测系统。更具体地,本实用新型涉及一种用于感测工业过程的温度的温度变送器。
背景技术
过程变量变送器用于测量过程控制或监测系统中的过程参数。温度变送器典型地包括:传感器;模数转换器,用于将来自传感器的输出转换为数字形式;微处理器,用于补偿数字化的输出;以及输出电路,用于发送补偿的输出。典型地,通过过程控制回路执行发送,例如4-20mA的电流回路。一个示例参数是可以通过测量RTD(电阻温度器件)的电阻来感测的温度,或者热电耦传感器的电压输出,RTD也称作PRT(铂电阻温度计)传感器。
随着过程变量变送器中的温度传感器的老化,其精度可能趋向于退化,尤其是如果所述传感器经历了高于或低于传感器标准温度范围的过度温度。这种退化可能导致完全失效,其中需要替换传感器或者变送器本身。另外,所述退化也可能导致温度读取时的错误。这可能是不引人注意的,并且导致在工业过程的监测或控制时的误差。
实用新型内容
本实用新型提供了一种用于感测工业过程的温度的温度变送器,包括:温度传感器,提供与工业过程的温度有关的传感器输出;测量电路,与所述温度传感器耦合,基于所述传感器输出来测量工业过程的温度;输出电路,提供与所测量的温度有关的输出;存储器,存储与温度传感器经历的过度温度事件有关的温度信息;以及诊断电路,基于所存储的过度温度信息对所述温度传感器的条件进行诊断。
附图说明
图1示出了包括配置用于感测过程流体温度的温度传感器在内的工业过程控制系统的简化图。
图2A是连接用于利用RTD传感器测量温度的温度变送器的框图。
图2B是连接用于利用热电耦传感器测量温度的温度变送器的框图。
图3是根据本实用新型的步骤的简化框图。
具体实施方式
如在背景技术中所讨论的,温度变送器的温度传感器随着时间老化并且退化。这可以导致温度测量时的误差以及传感器的最终失效。已经发现这种退化的一个来源是由于将温度传感器暴露到过度的温度,引起对于传感器的损坏。例如,可能将传感器暴露到超过用于构成所述传感器材料的限制的温度。过度的温度可以是过高的温度或过低的温度。
本实用新型监测过程变量变送器中的温度传感器经历的过度温度事件的次数。基于这种信息,可以执行诊断并进行与传感器退化概率有关的判定。过度温度的监测可以是传感器已经经历的过度温度事件的次数、过度温度事件的持续时间和/或过度温度事件期间的温度。可以将这种信息存储在过程变量变送器的存储器中,或者存储在与温度传感器本身相关联的存储器中。
图1是工业过程控制系统5的简化图。在图1中,过程管道7承载过程流体。过程变量变送器10配置用于与过程管道7耦合。变送器10包括温度传感器18,例如,所述温度传感器18可以包括热电耦或RTD传感器。变送器10配置用于向例如过程控制室6的另一个位置发送信息。所述发送可以是通过过程控制回路,例如双线过程控制回路11。所述过程控制回路可以是根据任意所需形式,例如包括4-20mA过程控制回路、承载数字通信的过程控制回路、无线过程控制回路等等。在图1所示的示例中,所述过程变量由控制室6处的电源6A供电。通过过程控制回路11接收供电。感测电阻器6B可以用于感测流过回路11的电流,从而监测由变送器10发送的温度相关信息。应该理解的是可以使用向传感器供电并且对所述传感器 信息进行传送的其他方法。
图2A是连接用于利用RTD传感器18测量温度的温度变送器10的框图。变送器10与过程控制回路11相连,所述过程控制回路向变送器10供电,并且在所述过程控制回路上发送和接收信息。变送器10包括具有端子1至4的端子模块14,用于与传感器耦合,所述传感器例如是RTD温度传感器(如图2A所示)或者热电耦温度传感器(如图2B所示)。传感器18可以在变送器10内部或外部。变送器10包括微处理器22,所述微处理器通过输入/输出(I/O)电路24与控制回路11相连。电路24也利用来自回路11的功率向变送器10供电。电流源50向传感器18施加电流IS。差分放大器26的正输入和负输入与传感器18相连,并且向高精度A/D转换器28提供输出。存储器30存储用于微处理器22的指令和信息,所述微处理器按照由时钟32确定的速度操作。
在操作时,变送器10测量传感器18的温度,并且通过控制回路11发送温度的表示。变送器10采用以下等式来计算传感器18的温度的电阻值:
其中:
电流源50经由端子1和4提供通过传感器18的电流IS。微处理器22测量端子2和3之间的RTD18两端的电压降(VRINPUT)。在例如这里的四线电阻测量中,很大程度上消除了与端子2和3的连接上的电压降,因为实质上所有电流都在端子1和4之间流过,并且对于测量精度几乎没有影响。利用在存储器30中存储的查找表或者合适的等式将RINPUT转换为温度单位。
图2B示出了连接用于利用传感器18的热电耦测量温度的变送器10,其在端子1和2上产生电压VTCINPUT。端子1和2与差分放大器26的输入耦合。变送器10通过确定热电耦电压VTCINPUT来测量热电耦传感器18的温度。将这种电压适当地补偿,并且基于例如在存储器30中存储的查找表、等式等将电压转换为温度表示。然后可以如上所述在控制回路11上发送温度信息。
除了图2A和2B所示的存储器30,也示出了可选的传感器存储器40。 可选的传感器存储器40可以与传感器18物理地相关联,并且通过端子模块14中的存储器连接器42与微处理器22相连。在另一个示例实施例中,存储器40包括用于与端子模块14的端子耦合的电路。在任一配置中,可以通过微处理器22读取在存储器40中存储的信息。类似地,微处理器22可以将信息写入到存储器40中。在其中存储器40通过端子模块连接器1-4与微处理器22通信的配置中,例如,存储器40可以包括对于调制到端子模块14的端子上的高频信号或数字信号做出响应的电路。响应于这种信号,存储器40可以存储来自微处理器22的信息,或者向微处理器22发送信息。
在操作期间,微处理器监测温度传感器18的温度。如果温度传感器18的温度超过阈值,可以将信息存储在存储器30和/或存储器40中。如这里所使用的,“过度温度事件”指的是传感器18经历了超过阈值的温度。这种阈值可以是绝对阈值,或者可以是基于温度和持续时间两者的阈值。例如,如果感测的温度超过阈值,可以将存储器30/40中的计数器递增。这种递增也可以与温度大于阈值的持续时间相关。在另一个示例实施例中,从额定值减去测量温度,并且将结果相对于时间积分。例如,可以向传感器18处于较高温度期间的持续时间赋予比传感器18处于较低温度期间的持续时间更大的权重。作为特定示例,可以温度传感器18发生临时超过500℃赋予比温度传感器18经历200℃温度10小时更大的权重。可以按照需要调节这种加权。例如,一些部件可能在高温下即刻失效,而一些部件当暴露到低于引起即刻失效的温度的升高温度下时可能只是简单地趋向于更加迅速地退化。
基于与过度温度事件相关联的在存储器30/40中存储的信息,微处理器22可以对传感器18的条件进行诊断。这种诊断可以是以下形式:提供与预期剩余寿命有关的输出、传感器18需要即刻替换的指示,用于对由于过度温度事件导致的在温度测量中引入的误差的补偿。过度温度信息也可以用于预测由于过度温度事件导致的温度测量中的误差。可以通过将经历过度温度事件的温度传感器特征化、并且将这种信息按照补偿信息的形式存储在存储器30或40中来确定这种信息。
在一些配置中,温度传感器18是可移除的。例如,可选存储器40可以是非易失性存储器,所述非易失性存储器能够在不需要分立电源的情况下保存信息。因为将过度温度事件信息保留在传感器18本身中,这种配置可能是需要的。如果将传感器18去除并且用于不同的变送器18,所述过度温度事件信息将可用于新的变送器。另外,如果传感器因为失效而通过用户返修,所述信息可以用于故障分析。在存储器30或40中存储的信息也可以包含与发生过度温度事件的时间有关的信息,例如时间和日期信息。在另一个示例配置中,也可以在制造或者试行期间或者基于用户输入将具体的阈值信息存储在存储器30或40中。可以通过本地接口或者通过过程控制回路11接收用户输入。存储器30或40也可以包含诸如其他过程变量之类的其他信息,例如传感器18经历的振动。
根据本实用新型提供了一种用于感测工业过程的温度的温度变送器,包括:温度传感器,提供与工业过程的温度有关的传感器输出;测量电路,与所述温度传感器耦合,基于所述传感器输出来测量工业过程的温度;输出电路,提供与所测量的温度有关的输出;存储器,存储与温度传感器经历的过度温度事件有关的温度信息;以及诊断电路,基于所存储的过度温度信息对所述温度传感器的条件进行诊断。
图3是示出了根据本实用新型一个实施例的步骤的简化框图60。例如,图3所示的步骤可以使用基于在存储器30中存储的指令而操作的微处理器22来实现。所述程序开始于块62,并且在块64获得温度测量。在块66,判定所述传感器是否经历过度温度事件。这可以通过将温度与阈值相比来进行,并且在过度温度事件时可以考虑时间因素。如果发生或者已经发生这种事件,在块68将过度温度事件信息存储在存储器30或40中。如果不存在过度温度事件,控制转到块70。在块70,从存储器30或40中检索过度温度事件。在块72,基于检索的过度温度事件信息来执行诊断。在其他配置中,在块72可以执行其他类型的步骤,包括基于检索的过度温度事件来补偿测量的温度值。此外,可以将从存储器30或40中检索的过度温度事件信息按照需要通过过程控制回路18发送至另一个位置。
尽管已经参考优选实施例描述了本实用新型,本领域普通技术人员 应该理解的是在不脱离本实用新型精神和范围的情况下可以进行形式和细节上的修改。温度变送器的各种部件中实现如这里所使用的“测量电路”和“诊断电路”。例如,这两个电路都可以在微处理器22中实现,并且可以包括其他电路。例如,测量电路也可以包括模数转换器、放大器、电流源等。在其他配置中,所述电路可以分散在分立的元件中,或者可以包括共享的元件。
Claims (11)
1.一种用于感测工业过程的温度的温度变送器,包括:
温度传感器,提供与工业过程的温度有关的传感器输出;
测量电路,与所述温度传感器耦合,基于所述传感器输出来测量工业过程的温度;
输出电路,提供与所测量的温度有关的输出;
存储器,存储与温度传感器经历的过度温度事件有关的温度信息;以及
诊断电路,基于所存储的过度温度信息对所述温度传感器的条件进行诊断。
2.根据权利要求1所述的用于感测工业过程的温度的温度变送器,其中所述存储器位于所述温度变送器中。
3.根据权利要求1所述的用于感测工业过程的温度的温度变送器,其中所述存储器与所述温度传感器耦合,并且所述温度传感器可从所述变送器移除。
4.根据权利要求1所述的用于感测工业过程的温度的温度变送器,其中所述过度温度信息包括与温度传感器已经经历的过度温度事件的次数有关的信息。
5.根据权利要求1所述的用于感测工业过程的温度的温度变送器,其中所述过度温度信息包括与温度传感器经历过度温度的持续时间有关的信息。
6.根据权利要求1所述的用于感测工业过程的温度的温度变送器,其中所述过度温度信息包括在过度温度事件期间所述温度传感器经历的温度。
7.根据权利要求1所述的用于感测工业过程的温度的温度变送器,其中由所述诊断电路诊断的条件涉及所述温度传感器的剩余寿命。
8.根据权利要求1所述的用于感测工业过程的温度的温度变送器,其中所诊断的所述温度传感器的条件涉及测量温度中的预期误差。
9.根据权利要求1所述的用于感测工业过程的温度的温度变送器,其中所述测量电路基于所诊断的条件来补偿所测量的温度。
10.根据权利要求1所述的用于感测工业过程的温度的温度变送器,其中所述温度传感器包括电阻温度设备RTD。
11.根据权利要求1所述的用于感测工业过程的温度的温度变送器,其中所述温度传感器包括热电耦。
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- 2012-09-11 CN CN 201220461788 patent/CN202994334U/zh not_active Expired - Fee Related
- 2012-09-11 CN CN201210335726.1A patent/CN103512679B/zh active Active
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2013
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- 2013-06-04 JP JP2015520215A patent/JP6058134B2/ja not_active Expired - Fee Related
- 2013-06-04 RU RU2014148280/28A patent/RU2594623C1/ru not_active IP Right Cessation
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103512679A (zh) * | 2012-06-29 | 2014-01-15 | 罗斯蒙德公司 | 利用传感器应力诊断的工业过程温度变送器 |
CN103512679B (zh) * | 2012-06-29 | 2016-02-24 | 罗斯蒙特公司 | 利用传感器应力诊断的工业过程温度变送器 |
CN106918408A (zh) * | 2017-03-02 | 2017-07-04 | 顺丰科技有限公司 | 一种无源测温装置及其使用方法 |
Also Published As
Publication number | Publication date |
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US20140003465A1 (en) | 2014-01-02 |
US9052240B2 (en) | 2015-06-09 |
WO2014003996A2 (en) | 2014-01-03 |
CN103512679A (zh) | 2014-01-15 |
EP2867634B1 (en) | 2016-04-13 |
JP2015522160A (ja) | 2015-08-03 |
EP2867634A2 (en) | 2015-05-06 |
CA2877701A1 (en) | 2014-01-03 |
CN103512679B (zh) | 2016-02-24 |
RU2594623C1 (ru) | 2016-08-20 |
WO2014003996A3 (en) | 2014-05-15 |
IN2014MN02410A (zh) | 2015-08-21 |
CA2877701C (en) | 2017-05-23 |
JP6058134B2 (ja) | 2017-01-11 |
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