DE3171811D1 - Apparatus for the dynamic in-circuit testing of electronic digital circuit elements - Google Patents

Apparatus for the dynamic in-circuit testing of electronic digital circuit elements

Info

Publication number
DE3171811D1
DE3171811D1 DE8181303755T DE3171811T DE3171811D1 DE 3171811 D1 DE3171811 D1 DE 3171811D1 DE 8181303755 T DE8181303755 T DE 8181303755T DE 3171811 T DE3171811 T DE 3171811T DE 3171811 D1 DE3171811 D1 DE 3171811D1
Authority
DE
Germany
Prior art keywords
devices
signals
library
test
dynamic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8181303755T
Other languages
English (en)
Inventor
Milan Slamka
Mamdouh H Rassem
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thalamus Electronics Inc
Original Assignee
Thalamus Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thalamus Electronics Inc filed Critical Thalamus Electronics Inc
Application granted granted Critical
Publication of DE3171811D1 publication Critical patent/DE3171811D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers
DE8181303755T 1980-08-18 1981-08-18 Apparatus for the dynamic in-circuit testing of electronic digital circuit elements Expired DE3171811D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA000358461A CA1163721A (en) 1980-08-18 1980-08-18 Apparatus for the dynamic in-circuit testing of electronic digital circuit elements

Publications (1)

Publication Number Publication Date
DE3171811D1 true DE3171811D1 (en) 1985-09-19

Family

ID=4117670

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8181303755T Expired DE3171811D1 (en) 1980-08-18 1981-08-18 Apparatus for the dynamic in-circuit testing of electronic digital circuit elements

Country Status (6)

Country Link
US (1) US4484329A (de)
EP (1) EP0046404B1 (de)
JP (1) JPS5760269A (de)
AT (1) ATE14939T1 (de)
CA (1) CA1163721A (de)
DE (1) DE3171811D1 (de)

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US4642784A (en) * 1984-04-26 1987-02-10 Texas Instruments Incorporated Integrated circuit manufacture
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JPS60253885A (ja) * 1984-05-30 1985-12-14 Advantest Corp 回路試験装置
US4641250A (en) * 1984-06-11 1987-02-03 The United States Of America As Represented By The Secretary Of The Air Force Inspection workstation data entry method
US4773028A (en) * 1984-10-01 1988-09-20 Tektronix, Inc. Method and apparatus for improved monitoring and detection of improper device operation
US4691316A (en) * 1985-02-14 1987-09-01 Support Technologies, Inc. ROM emulator for diagnostic tester
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US4916641A (en) * 1987-01-16 1990-04-10 Acl Technologies, Inc. Servovalve analyzer system
US4760329A (en) * 1987-04-23 1988-07-26 Grumman Aerospace Corporation Programmable tester with bubble memory
US4862067A (en) * 1987-06-24 1989-08-29 Schlumberger Technologies, Inc. Method and apparatus for in-circuit testing of electronic devices
US5426767A (en) * 1987-08-03 1995-06-20 Compaq Computer Corporation Method for distinguishing between a 286-type central processing unit and a 386-type central processing unit
US6304987B1 (en) 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
SE461939B (sv) * 1988-09-12 1990-04-09 Kjell Moum Instrument foer kontroll av ic-kretsar
US5220280A (en) * 1989-05-11 1993-06-15 Vlsi Technology, Inc. Method and an apparatus for testing the assembly of a plurality of electrical components on a substrate
JP3005250B2 (ja) 1989-06-30 2000-01-31 テキサス インスツルメンツ インコーポレイテツド バスモニター集積回路
US5103169A (en) * 1989-11-15 1992-04-07 Texas Instruments Incorporated Relayless interconnections in high performance signal paths
US5049814A (en) * 1989-12-27 1991-09-17 Lsi Logic Corporation Testing of integrated circuits using clock bursts
US5166604A (en) * 1990-11-13 1992-11-24 Altera Corporation Methods and apparatus for facilitating scan testing of asynchronous logic circuitry
US5255208A (en) * 1991-08-08 1993-10-19 Aeg Westinghouse Transportation Systems, Inc. On-line processor based diagnostic system
US5323108A (en) * 1992-01-23 1994-06-21 Hewlett-Packard Company Method for generating functional tests for printed circuit boards based on pattern matching of models
JP3181736B2 (ja) * 1992-12-25 2001-07-03 三菱電機株式会社 Ｉｃ機能試験装置及び試験方法
US5333112A (en) * 1993-03-25 1994-07-26 Aai/Acl Technologies, Inc. Automatic flow grind system and method
JPH0764817A (ja) * 1993-08-30 1995-03-10 Mitsubishi Electric Corp 故障検出システム
US5590136A (en) * 1995-01-25 1996-12-31 Hewlett-Packard Co Method for creating an in-circuit test for an electronic device
US5539753A (en) * 1995-08-10 1996-07-23 International Business Machines Corporation Method and apparatus for output deselecting of data during test
US6157210A (en) 1997-10-16 2000-12-05 Altera Corporation Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits
US6408413B1 (en) 1998-02-18 2002-06-18 Texas Instruments Incorporated Hierarchical access of test access ports in embedded core integrated circuits
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US7058862B2 (en) 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
TW580578B (en) * 2000-10-03 2004-03-21 Concord Idea Corp System and method for testing integrated circuit devices
US20030141887A1 (en) * 2001-03-13 2003-07-31 Stephane Briere Integrated circuit testing device with improved reliability
TW555982B (en) * 2002-01-03 2003-10-01 Winbond Electronics Corp EDC box compatible with various tester and EDC system
US7539912B2 (en) 2005-12-15 2009-05-26 King Tiger Technology, Inc. Method and apparatus for testing a fully buffered memory module
JP4843451B2 (ja) * 2006-10-19 2011-12-21 富士通株式会社 データ生成方法、結線チェックシステム、およびデータ生成プログラム
US7620861B2 (en) * 2007-05-31 2009-11-17 Kingtiger Technology (Canada) Inc. Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels
US7757144B2 (en) * 2007-11-01 2010-07-13 Kingtiger Technology (Canada) Inc. System and method for testing integrated circuit modules comprising a plurality of integrated circuit devices
US7848899B2 (en) * 2008-06-09 2010-12-07 Kingtiger Technology (Canada) Inc. Systems and methods for testing integrated circuit devices
US8356215B2 (en) * 2010-01-19 2013-01-15 Kingtiger Technology (Canada) Inc. Testing apparatus and method for analyzing a memory module operating within an application system
US8918686B2 (en) 2010-08-18 2014-12-23 Kingtiger Technology (Canada) Inc. Determining data valid windows in a system and method for testing an integrated circuit device
US9003256B2 (en) 2011-09-06 2015-04-07 Kingtiger Technology (Canada) Inc. System and method for testing integrated circuits by determining the solid timing window
JP5200198B1 (ja) * 2011-10-03 2013-05-15 パナソニック株式会社 動作確認支援装置および動作確認支援方法
US8724408B2 (en) 2011-11-29 2014-05-13 Kingtiger Technology (Canada) Inc. Systems and methods for testing and assembling memory modules
US9117552B2 (en) 2012-08-28 2015-08-25 Kingtiger Technology(Canada), Inc. Systems and methods for testing memory
US8732630B1 (en) * 2013-03-15 2014-05-20 Cadence Design Systems, Inc. Methods, systems, and articles of manufacture for implementing analog behavioral modeling and IP integration using systemverilog hardware description language
US9501592B1 (en) 2013-03-15 2016-11-22 Cadence Design Systems, Inc. Methods, systems, and articles of manufacture for implementing analog behavioral modeling and IP integration using systemverilog hardware description language
US8949753B1 (en) 2013-03-15 2015-02-03 Cadence Design Systems, Inc. Methods, systems, and articles of manufacture for implementing analog behavioral modeling and IP integration using systemverilog hardware description language

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US3614608A (en) * 1969-05-19 1971-10-19 Ibm Random number statistical logic test system
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US4001818A (en) * 1975-10-22 1977-01-04 Storage Technology Corporation Digital circuit failure detector
US4039813A (en) * 1976-04-07 1977-08-02 Sperry Rand Corporation Apparatus and method for diagnosing digital data devices
US4099119A (en) * 1977-02-03 1978-07-04 Honeywell Inc. Probe apparatus for in place testing of electrical circuit boards
US4125763A (en) * 1977-07-15 1978-11-14 Fluke Trendar Corporation Automatic tester for microprocessor board
US4270178A (en) * 1977-07-19 1981-05-26 Beckman Instruments, Inc. Measuring system incorporating self-testing probe circuit and method for checking signal levels at test points within the system
US4122995A (en) * 1977-08-02 1978-10-31 Burroughs Corporation Asynchronous digital circuit testing system
US4168527A (en) * 1978-02-17 1979-09-18 Winkler Dean A Analog and digital circuit tester
US4230986A (en) * 1978-12-18 1980-10-28 Ncr Corporation Apparatus for facilitating the servicing of printed circuit boards
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit
JPS5585264A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit
US4271515A (en) * 1979-03-23 1981-06-02 John Fluke Mfg. Co., Inc. Universal analog and digital tester
US4290015A (en) * 1979-10-18 1981-09-15 Fairchild Camera & Instrument Corp. Electrical validator for a printed circuit board test fixture and a method of validation thereof

Also Published As

Publication number Publication date
EP0046404B1 (de) 1985-08-14
JPS5760269A (en) 1982-04-12
CA1163721A (en) 1984-03-13
US4484329A (en) 1984-11-20
EP0046404A1 (de) 1982-02-24
ATE14939T1 (de) 1985-08-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee