DE3229448A1 - Vacuum adaptor - Google Patents

Vacuum adaptor

Info

Publication number
DE3229448A1
DE3229448A1 DE19823229448 DE3229448A DE3229448A1 DE 3229448 A1 DE3229448 A1 DE 3229448A1 DE 19823229448 DE19823229448 DE 19823229448 DE 3229448 A DE3229448 A DE 3229448A DE 3229448 A1 DE3229448 A1 DE 3229448A1
Authority
DE
Germany
Prior art keywords
plates
vacuum
test
holes
space
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19823229448
Other languages
German (de)
Other versions
DE3229448C2 (en
Inventor
Busso Dipl.-Ing. 8904 Friedberg Prillwitz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE19823229448 priority Critical patent/DE3229448A1/en
Publication of DE3229448A1 publication Critical patent/DE3229448A1/en
Application granted granted Critical
Publication of DE3229448C2 publication Critical patent/DE3229448C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Abstract

The invention relates to a vacuum adaptor for testing flat modules. Because of the large number of devices under test, an adaptor is required which can be constructed with little expenditure. For this purpose, the invention provides two plates (1, 2), consisting of insulating material, at a predetermined distance, which are connected to one another in such a manner that a hollow space is produced which is used as vacuum space. Both plates (1, 2) are provided with previously drilled holes, contact spring pins (3) being inserted, in accordance with the test configuration of the device under test (7), in some of the drilled holes. The space between the upper plate (1) and the device under test is filled up by a foam rubber mat (4) which contact is cut out at the points at which the pins are located. <IMAGE>

Description

VakuumadapterVacuum adapter

Die Erfindung betrifft einen Vakuumadapter zur Prüfung von Flachbaugruppen.The invention relates to a vacuum adapter for testing printed circuit boards.

Es ist bekannt, Vakuumadapter aus mehreren zueinander beweglichen Platten, die über Führungselemente und Federn miteinander verbunden sind, aufzubauen, wie dies beispielsweise in dem Prospekt Vakuumadapter VA 200 der Firma PTB Meßtechnik GmbH gezeigt ist.It is known that vacuum adapters made up of several mutually movable Assemble panels that are connected to one another via guide elements and springs, As shown, for example, in the brochure VA 200 vacuum adapter from PTB Messtechnik GmbH is shown.

Die Beweglichkeit der Platten zueinander erfordert jedoch einen relativ hohen Konstruktionsaufwand, der vor allen dann ins Gewicht fällt, wenn wegen der Vielzahl der zu prüfenden Flachbaugruppen eine große Anzahl unterschiedlicher auf den jeweiligen Prüffall ausgerichteten Adapter erforderlich ist.However, the mobility of the plates to one another requires a relative high construction effort, which is of particular importance when because of the Large number of flat modules to be tested on a large number of different adapter aligned with the respective test case is required.

Aufgabe der vorliegenden Erfindung ist es daher, einen einfach aufgebauten Prüfadapter zu schaffen.The object of the present invention is therefore to provide a simply constructed To create test adapters.

Zur Lösung dieser Aufgabe wird gemäß der Erfindung der Vakuumadapter derart ausgebildet, daß zwei aus Isoliermaterial bestehende Platten in einem vorgegebenen Abstand miteinander so verbunden sind, anlaß ein Hohlraum zur Ausbildung eines Vakuums entsteht, daß beide Platten mit Bohrungen versehen sind, wobei in einem Teil der Bohrungen entsprechend der Prüfpunktkonfiguration des Prüflings Kontaktferderstifte eingesetzt sind, daß der Raum zwischen der oberen Platte und dem Prüfling durch eine Schwammgummimatte ausgefüllt ist, die an den Stellen, an denen sich Kontaktfederstifte befinden, ausgeschnitten ist.To solve this problem, the vacuum adapter according to the invention designed such that two plates made of insulating material in a predetermined Distance are connected to each other so as to cause a cavity to form a vacuum arises that both plates are provided with holes, in a part of the Bores according to the test point configuration of the test object contact ground pins are inserted that the space between the top plate and the test specimen through a sponge rubber mat is filled in at the points where there are contact spring pins is cut out.

Durch diese Maßnahmen erhält man einen Vakuumadapter, bei dem auch Flachbaugruppen mit extremen Unebenheiten und Korrekturdrähten einwandfrei kontaktiert werden. Der Adapter ist einfach im Aufbau, da er keine Federelemente und Fhrungselemente benötigt.By these measures you get a vacuum adapter, with which also Flat modules with extreme unevenness and corrective wires made perfect contact will. The adapter is simple in construction since it does not have any spring elements or guide elements needed.

Eine weitere Vereinfachung des Aufbaus erhält man dadurch, daß die obere Platte voll im Raster mit Bohrungen versehen und mit einer Folie abgedeckt ist, die an den jeweils benötigten Stellen für Kontaktfederstifte und Luftlöcher durchstochen ist. Dadurch wird ein für alle Anwendungsfälle in seinem Grundaufbau gleicher Adapter geschaffen, der lediglich für den einzelnen Einsatzfall an unterschiedlichen Stellen mit Kontaktstiften bestückt wird.A further simplification of the structure is obtained in that the Drill holes in the top plate fully in the grid and cover it with a film at the required locations for contact spring pins and air holes is pierced. This creates a basic structure for all applications created the same adapter, which is only for the individual application on different Places with contact pins is fitted.

Anhand des AusfUhrungsbelsciels nach der Figur wird die Erfindung näher erläutert.The invention is based on the embodiment according to the figure explained in more detail.

Zwei in einem bestimmten Abstand miteinander verschraubte Platten 1,2 aus Isoliermaterial, die an den zur Prüfung benötigten Punkten gebohrt und mit Kontaktfederstiften 3 bestuckt sind, dienen als KontakttrAger und Luftführungseinheit. Dabei entsteht zwischen den beiden Platten ein Hohlraum 8,der als-Vakuumraumbenützt wird. Der Raum.Two plates screwed together at a certain distance 1.2 made of insulating material, which is drilled at the points required for testing and with Contact spring pins 3 are fitted, serve as a contact carrier and air guide unit. This creates a cavity 8 between the two plates, which is used as a vacuum space will. The space.

zwischen der oberen Platte und dem Prüfling wird durch eine Schwammgummimatte 4 ausgefüllt, die zum einen die Abdichtung zum Prüfling 7 hin vornimmt und zum anderen eine gleichmäßig verteilte Auflagefläche bzw. Gegenkraft zur Vermeidung von Leiterplattendurchbiegungen erzeugt. Die Freiräume 5 für die Kontaktfederstifte werden grob ausgeschnitten oder gelocht, die Führung des Prüflings Z erfolgt über zwei Zentrierstifte 6.between the top plate and the test piece is made by a sponge rubber mat 4 filled in, which on the one hand makes the seal to the test item 7 and on the other hand an evenly distributed contact surface or counterforce to avoid bending of the circuit board generated. The free spaces 5 for the contact spring pins are roughly cut out or perforated, the test specimen Z is guided by two centering pins 6.

Es ist auch möglich, die Platten voll im Raster zu bohren, mit Folie abzukleben und nur an den verwendeten Prüfpunkten durchzustechen. In jedem Fall müssen zur Weitergabe des Vakuums an den Prüfling neben den mit Prüfstiften 3 bestückten eine gewisse Anzahl Bohrungen frei bleiben.It is also possible to drill the panels fully in the grid, with foil masking off and piercing only at the test points used. In any case need to pass on the vacuum to the test object in addition to those equipped with test pins 3 a certain number of holes remain free.

Claims (2)

Patentansprüche (» Vakuumadapter zur Prüfung von Flachbaugruppen, d a d u r ch g e k e n n z e i c h n e t, daß zwei aus Isoliermaterial bestehende Platten (1,2) in einem vorgegebenen Abstand miteinander so verbunden sind, daß ein Hohlraum zur Ausbildung eines Vakuums entsteht, daß beide Platten (1) mit Bohrungen versehen ist, wobei in einem Teil der Bohrungen entsprechend der Prüfpunktkonfiguration des Prüflings (7) Konaktfederstifte (3) eingesetzt sind, daß der Raum zwischen der oberen Platte (1) und dem Prüfling (7) durch eine Schwammgummimatte(4) ausgefüllt ist, die an den Stellen, an denen sich Kontaktfederstifte (3) befinden, ausgeschnitten ist. Patent claims (»vacuum adapter for testing flat assemblies, d u r ch e k e nn n n e i c h n e t that two are made of insulating material Plates (1,2) are connected to each other at a predetermined distance so that a Cavity for the formation of a vacuum arises that both plates (1) with holes is provided, in part of the holes according to the test point configuration of the test piece (7) spring pins (3) are used that the space between the top plate (1) and the test item (7) filled with a sponge rubber mat (4) is cut out at the points where the contact spring pins (3) are located is. 2. Vakuumadapter nach Anspruch 1, d a d u r c h g e k e n n-Z ei c h n e t, daß beide Platten (1,2) voll im Raster mit Bohrungen'versehen und mit einer Folie abgedeckt ist, die an den jeweils benötigten Stellen für Kontaktfederstifte (3) und Luftlöcher durchstochen ist. 2. Vacuum adapter according to claim 1, d a d u r c h g e k e n n-Z ei c h n e t that both plates (1, 2) are provided with holes and with a film is covered, which is at the required points for contact spring pins (3) and air holes pierced.
DE19823229448 1982-08-06 1982-08-06 Vacuum adaptor Granted DE3229448A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19823229448 DE3229448A1 (en) 1982-08-06 1982-08-06 Vacuum adaptor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19823229448 DE3229448A1 (en) 1982-08-06 1982-08-06 Vacuum adaptor

Publications (2)

Publication Number Publication Date
DE3229448A1 true DE3229448A1 (en) 1984-02-09
DE3229448C2 DE3229448C2 (en) 1987-04-23

Family

ID=6170325

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19823229448 Granted DE3229448A1 (en) 1982-08-06 1982-08-06 Vacuum adaptor

Country Status (1)

Country Link
DE (1) DE3229448A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5021733A (en) * 1989-11-02 1991-06-04 Mitsubishi Denki Kabushiki Kaisha Burn-in apparatus
DE19654404A1 (en) * 1996-12-24 1998-06-25 Hewlett Packard Co Adaptation device for the electrical test of printed circuit boards

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2921007A1 (en) * 1979-05-23 1980-11-27 Siemens Ag Printed circuit board tester - has raster probe array with probe mask easily hand-punched using needle
FR2490350A1 (en) * 1980-09-12 1982-03-19 Thomson Csf Vacuum type connector for PCB and test appts. - uses sheet glued onto frame forming cover placed around circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2921007A1 (en) * 1979-05-23 1980-11-27 Siemens Ag Printed circuit board tester - has raster probe array with probe mask easily hand-punched using needle
FR2490350A1 (en) * 1980-09-12 1982-03-19 Thomson Csf Vacuum type connector for PCB and test appts. - uses sheet glued onto frame forming cover placed around circuit

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Firmenprospekt: "Vakuumadapter VA 200", PTR Meß- technik GmbH *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5021733A (en) * 1989-11-02 1991-06-04 Mitsubishi Denki Kabushiki Kaisha Burn-in apparatus
DE19654404A1 (en) * 1996-12-24 1998-06-25 Hewlett Packard Co Adaptation device for the electrical test of printed circuit boards
US6147505A (en) * 1996-12-24 2000-11-14 Hewlett-Packard Company Adapter arrangement for electrically testing printed circuit boards

Also Published As

Publication number Publication date
DE3229448C2 (en) 1987-04-23

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee