DE3267983D1 - Apparatus for measuring noise factor and available gain - Google Patents
Apparatus for measuring noise factor and available gainInfo
- Publication number
- DE3267983D1 DE3267983D1 DE8282103230T DE3267983T DE3267983D1 DE 3267983 D1 DE3267983 D1 DE 3267983D1 DE 8282103230 T DE8282103230 T DE 8282103230T DE 3267983 T DE3267983 T DE 3267983T DE 3267983 D1 DE3267983 D1 DE 3267983D1
- Authority
- DE
- Germany
- Prior art keywords
- noise factor
- measuring noise
- available gain
- gain
- available
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6300181A JPS57178168A (en) | 1981-04-25 | 1981-04-25 | Noise and gain evaluating system |
JP13348481A JPS5834371A (ja) | 1981-08-26 | 1981-08-26 | 雑音指数・利得自動測定装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3267983D1 true DE3267983D1 (en) | 1986-01-30 |
Family
ID=26404079
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8282103230T Expired DE3267983D1 (en) | 1981-04-25 | 1982-04-16 | Apparatus for measuring noise factor and available gain |
Country Status (3)
Country | Link |
---|---|
US (1) | US4491783A (de) |
EP (1) | EP0064198B1 (de) |
DE (1) | DE3267983D1 (de) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3267983D1 (en) * | 1981-04-25 | 1986-01-30 | Toshiba Kk | Apparatus for measuring noise factor and available gain |
US4763062A (en) * | 1986-10-06 | 1988-08-09 | Chrysler Motors Corporation | Conductive EMI test system, a decoupling network therefor |
US4998071A (en) * | 1988-10-25 | 1991-03-05 | Cascade Microtech, Inc. | Noise parameter test method and apparatus |
US4864218A (en) * | 1988-11-09 | 1989-09-05 | Cascade Microtech, Inc. | Method of compensating for frequency errors in noise power meters |
US4905308A (en) * | 1989-04-05 | 1990-02-27 | Cascade Microtech, Inc. | Noise parameter determination method |
US5477150A (en) * | 1990-10-24 | 1995-12-19 | Hendry Mechanical Works | Electric arc and radio frequency spectrum detection |
EP0507782B1 (de) * | 1990-10-24 | 1996-01-17 | Hendry Mechanical Works | Spektrumerfassung von lichtbögen und radiofrequenzen |
US5416422A (en) * | 1994-05-20 | 1995-05-16 | Hewlett-Packard Company | Apparatus and method for determining single sideband noise figure from double sideband measurements |
US6232789B1 (en) * | 1997-05-28 | 2001-05-15 | Cascade Microtech, Inc. | Probe holder for low current measurements |
US6114858A (en) * | 1998-10-28 | 2000-09-05 | Credence Systems Corporation | System for measuring noise figure of a radio frequency device |
SE0000309D0 (sv) * | 2000-01-31 | 2000-01-31 | Ericsson Telefon Ab L M | Calibrating method and apparatus in a telecommunication system |
US6704352B1 (en) * | 2000-05-04 | 2004-03-09 | Samsung Electronics Co., Ltd. | High accuracy receiver forward and reflected path test injection circuit |
US6636722B1 (en) * | 2000-09-12 | 2003-10-21 | Tektronix, Inc. | Broadband receiver amplitude/phase normalization using a broadband temperature compensated noise source and a pseudo random sequence generator |
US6693439B1 (en) | 2000-09-28 | 2004-02-17 | Cadence Design Systems, Inc. | Apparatus and methods for measuring noise in a device |
DE20114544U1 (de) | 2000-12-04 | 2002-02-21 | Cascade Microtech Inc | Wafersonde |
AU2003233659A1 (en) * | 2002-05-23 | 2003-12-12 | Cascade Microtech, Inc. | Probe for testing a device under test |
US7057404B2 (en) * | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
KR100960496B1 (ko) * | 2003-10-31 | 2010-06-01 | 엘지디스플레이 주식회사 | 액정표시소자의 러빙방법 |
US20050137814A1 (en) * | 2003-12-19 | 2005-06-23 | Joseph Kelly | Method of measuring noise figure using arbitrary waveforms |
WO2005065258A2 (en) * | 2003-12-24 | 2005-07-21 | Cascade Microtech, Inc. | Active wafer probe |
JP2008512680A (ja) * | 2004-09-13 | 2008-04-24 | カスケード マイクロテック インコーポレイテッド | 両面プロービング構造体 |
US7449899B2 (en) * | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
US7609077B2 (en) * | 2006-06-09 | 2009-10-27 | Cascade Microtech, Inc. | Differential signal probe with integral balun |
US7443186B2 (en) * | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
US7403028B2 (en) * | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
US7764072B2 (en) * | 2006-06-12 | 2010-07-27 | Cascade Microtech, Inc. | Differential signal probing system |
US7723999B2 (en) * | 2006-06-12 | 2010-05-25 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
US7876114B2 (en) * | 2007-08-08 | 2011-01-25 | Cascade Microtech, Inc. | Differential waveguide probe |
JP5528999B2 (ja) * | 2010-12-15 | 2014-06-25 | 株式会社アドバンテスト | 試験装置 |
JP5528998B2 (ja) * | 2010-12-15 | 2014-06-25 | 株式会社アドバンテスト | 試験装置 |
US9366710B1 (en) * | 2014-04-03 | 2016-06-14 | Christos Tsironis | Noise parameter extraction method |
CN112255470B (zh) * | 2020-09-30 | 2023-09-15 | 中国电子科技集团公司第十六研究所 | 一种噪声源超噪比测试系统及其测试方法 |
US11639953B2 (en) | 2021-02-10 | 2023-05-02 | Rohde & Schwarz Gmbh & Co. Kg | Method and system for sideband corrected noise-power measurement |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3464006A (en) * | 1967-06-01 | 1969-08-26 | Cutler Hammer Inc | R-f attenuation measurement apparatus of the i-f series substitution type,with noise injection for compensation of error due to mixer noise |
US3774113A (en) * | 1970-07-29 | 1973-11-20 | Int Microwave Corp | Apparatus and systems for testing and monitoring receiver equipment, including system capability for continuous in-service performance monitoring |
NL7105272A (de) * | 1971-04-20 | 1972-10-24 | ||
US3835378A (en) * | 1973-12-17 | 1974-09-10 | Cutler Hammer Inc | System for automatic gain measurement |
DE3032426A1 (de) * | 1980-08-28 | 1982-04-01 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Verfahren und anordnung zur radiometrischen messung der rauschtemperatur von ein-toren im hochfrequenz- und mikrowellenbereich |
DE3267983D1 (en) * | 1981-04-25 | 1986-01-30 | Toshiba Kk | Apparatus for measuring noise factor and available gain |
-
1982
- 1982-04-16 DE DE8282103230T patent/DE3267983D1/de not_active Expired
- 1982-04-16 EP EP82103230A patent/EP0064198B1/de not_active Expired
- 1982-04-22 US US06/370,916 patent/US4491783A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0064198A1 (de) | 1982-11-10 |
US4491783A (en) | 1985-01-01 |
EP0064198B1 (de) | 1985-12-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8320 | Willingness to grant licences declared (paragraph 23) | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |