DE3309881A1 - DEVICE FOR FUNCTIONAL CONTROL OF TEST SYSTEMS AND DEVICES - Google Patents

Description

The invention relates to a device for the functional control of test systems and devices for non-destructive testing Materials testing using ultrasound, eddy current or leakage flux methods.

Such systems or devices are usually checked today using test bodies based on the visible functions such as fluorescent screen signals or Discriminator output lamps.

Checks of the concealed functions are only possible with great expenditure of time and measuring equipment require a high level of training on the part of the inspection staff. A periodic inspection of the test systems or devices is therefore not feasible to the required extent.

The object of the invention is comprehensive functional checks that can be easily adapted to each test system or to each Test device objective and reproducible with a significant reduction in effort time and personnel qualifications perform.

The problem is solved by a device with the characterizing features of the claim.

An exemplary embodiment of the invention is described in detail with reference to FIG.

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The central unit (1) contains a freely programmable computer with program and data memory which controls all the steps necessary for a system or device check.
5

In the unit 2a, all necessary digital signals are generated that are necessary to establish readiness for testing the test system 4 are necessary.

Unit 3a processes the digital or analog reaction signals coming from the test system.

The test device is synchronized with the test system or the test device within the unit 3b 4th

The central unit 1 is now program-controlled synchronously with the test system or the test device 4 in the Unit 2b generates a test signal that is possible for the respective test method. These test signals can e.g. for an ultrasonic testing system can be varied in terms of amplitude, frequency and temporal position the sync pulse, the length of time and the frequency of its occurrence.

The reaction signals of the test system or the test device 4 are evaluated by the central unit 1. The result is made available to the operator of the test facility on a writing device Logging device 5 communicated.

Evaluation criteria are partly determined by the test facility itself. For the data of the analog amplifier In an ultrasonic testing system, for example, the frequency spectrum of an ultrasonic testing head 6 is necessary. For this purpose, the high-frequency signal from the ultrasonic test head 6 is sent to the Terminal 7 removed, digitized and the frequency spectrum determined. This becomes an evaluation criterion the minimum requirement for the bandwidth of the analog amplifiers of an ultrasonic testing system is derived.

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Claims (1)

Mannesmann AG
Mannesmannufer 2
4000 Düsseldorf 1 Equipment for the functional control of test systems and devices Claim; Device for the functional control of test systems and devices for non-destructive material testing by means of Ultrasonic, eddy current or leakage flux method, characterized in that the device consists of a programmable Central unit (1) and units (2) for generating test signals, on the one hand the production the readiness for use of the test system (4) serve and on the other hand simulate the signals that are sent by the probes or test heads (6) are fed to the test system (4) - 2 - TELEX: TELEGRAM: PHONE: BANK ACCOUNT CHECK ACCOUNT 1-85644 INVENTION FAX BERLINERBANKAG P MEISSNER BLN-W inven d BERLIN 030/891 60 37 BERLIN 31 4047 37-103 and those (3) for receiving the reaction signals from the test system (4), for which the units (2, _{3) can be connected to the test system (4) and wherein all units (2 f} 3) are directly connected to the central unit (1.) and the central unit (l) communicates with the units (2, 3) and vice versa via a BUS system (e.g. IEEE 488) and the reaction signals after an evaluation and evaluation in the central unit (l) are connected to a writing and drawing device ( 5). are fed.