DE3369204D1 - Method and apparatus for use in developing resist film - Google Patents

Method and apparatus for use in developing resist film

Info

Publication number
DE3369204D1
DE3369204D1 DE8383306538T DE3369204T DE3369204D1 DE 3369204 D1 DE3369204 D1 DE 3369204D1 DE 8383306538 T DE8383306538 T DE 8383306538T DE 3369204 T DE3369204 T DE 3369204T DE 3369204 D1 DE3369204 D1 DE 3369204D1
Authority
DE
Germany
Prior art keywords
resist film
developing resist
developing
film
resist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383306538T
Other languages
English (en)
Inventor
Yuji Fukuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP19025282A external-priority patent/JPS5978343A/ja
Priority claimed from JP19025082A external-priority patent/JPS5978342A/ja
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE3369204D1 publication Critical patent/DE3369204D1/de
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/3021Imagewise removal using liquid means from a wafer supported on a rotating chuck
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00Cleaning and liquid contact with solids
    • Y10S134/902Semiconductor wafer
DE8383306538T 1982-10-28 1983-10-27 Method and apparatus for use in developing resist film Expired DE3369204D1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP19025282A JPS5978343A (ja) 1982-10-28 1982-10-28 レジスト膜の現像方法
JP19025082A JPS5978342A (ja) 1982-10-28 1982-10-28 レジスト膜の現像方法

Publications (1)

Publication Number Publication Date
DE3369204D1 true DE3369204D1 (en) 1987-02-19

Family

ID=26505966

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383306538T Expired DE3369204D1 (en) 1982-10-28 1983-10-27 Method and apparatus for use in developing resist film

Country Status (3)

Country Link
US (1) US4564280A (de)
EP (1) EP0110558B1 (de)
DE (1) DE3369204D1 (de)

Families Citing this family (103)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4838289A (en) * 1982-08-03 1989-06-13 Texas Instruments Incorporated Apparatus and method for edge cleaning
JPS61279858A (ja) * 1985-06-05 1986-12-10 Mitsubishi Electric Corp ネガレジスト現像装置
US4745422A (en) * 1985-11-18 1988-05-17 Kabushiki Kaisha Toshiba Automatic developing apparatus
US4886012A (en) * 1987-06-30 1989-12-12 Mitsubishi Denki Kabushiki Kaisha Spin coating apparatus
US5143552A (en) * 1988-03-09 1992-09-01 Tokyo Electron Limited Coating equipment
US4799993A (en) * 1988-05-10 1989-01-24 E. I. Du Pont De Nemours And Company Rotary developer and method for its use
US5002008A (en) * 1988-05-27 1991-03-26 Tokyo Electron Limited Coating apparatus and method for applying a liquid to a semiconductor wafer, including selecting a nozzle in a stand-by state
JP2846891B2 (ja) * 1988-06-03 1999-01-13 東京エレクトロン株式会社 処理装置
US5395446A (en) * 1988-11-21 1995-03-07 Kabushiki Kaisha Toshiba Semiconductor treatment apparatus
JPH03136232A (ja) * 1989-08-31 1991-06-11 Dainippon Screen Mfg Co Ltd 基板の表面処理装置
JPH062260Y2 (ja) * 1989-09-13 1994-01-19 東京応化工業株式会社 スプレー装置
NL9000323A (nl) * 1990-02-12 1991-09-02 Philips & Du Pont Optical Werkwijze voor het vanuit een metalliseringsvloeistof stroomloos neerslaan van een metaallaag op een vlak voorwerp.
US5196285A (en) * 1990-05-18 1993-03-23 Xinix, Inc. Method for control of photoresist develop processes
JP3167317B2 (ja) * 1990-10-18 2001-05-21 株式会社東芝 基板処理装置及び同方法
US5488964A (en) * 1991-05-08 1996-02-06 Tokyo Electron Limited Washing apparatus, and washing method
JP2547296B2 (ja) * 1992-03-18 1996-10-23 公利 間藤 ディスクの表面被膜形成方法および装置
DE69428391T2 (de) * 1993-03-25 2002-07-04 Tokyo Electron Ltd Verfahren und Vorrichtung zur Beschichtung eines Filmes
KR100248565B1 (ko) * 1993-03-30 2000-05-01 다카시마 히로시 레지스트 처리방법 및 레지스트 처리장치
JP3276449B2 (ja) * 1993-05-13 2002-04-22 富士通株式会社 回転塗布方法
US5395803A (en) * 1993-09-08 1995-03-07 At&T Corp. Method of spiral resist deposition
JP3415670B2 (ja) * 1994-03-03 2003-06-09 三菱電機株式会社 ウエハ洗浄装置
US5935331A (en) * 1994-09-09 1999-08-10 Matsushita Electric Industrial Co., Ltd. Apparatus and method for forming films
KR100212089B1 (ko) * 1994-09-09 1999-08-02 모리시타 요이찌 박막형성방법 및 그 장치
JP3122868B2 (ja) * 1994-09-29 2001-01-09 東京エレクトロン株式会社 塗布装置
US5625433A (en) * 1994-09-29 1997-04-29 Tokyo Electron Limited Apparatus and method for developing resist coated on a substrate
JP2874155B2 (ja) * 1994-11-02 1999-03-24 株式会社フロンテック レジスト現像装置
JP3337870B2 (ja) * 1995-05-11 2002-10-28 大日本スクリーン製造株式会社 回転式基板洗浄装置
JPH08316190A (ja) * 1995-05-18 1996-11-29 Dainippon Screen Mfg Co Ltd 基板処理装置
US5902399A (en) * 1995-07-27 1999-05-11 Micron Technology, Inc. Method and apparatus for improved coating of a semiconductor wafer
JP3227642B2 (ja) * 1995-10-13 2001-11-12 東京エレクトロン株式会社 塗布装置
US5897982A (en) * 1996-03-05 1999-04-27 Kabushiki Kaisha Toshiba Resist develop process having a post develop dispense step
US5821035A (en) * 1996-03-06 1998-10-13 Sony Corporation Resist developing apparatus and resist developing method
JP3280883B2 (ja) * 1996-05-08 2002-05-13 東京エレクトロン株式会社 現像処理方法及び現像処理装置
DE19629705A1 (de) * 1996-07-24 1998-01-29 Joachim Dr Scheerer Verfahren und Vorrichtung zur Reinigung von scheibenförmigen Gegenständen, insbesondere Wafern, mit Ultraschall und Wasser als Spülmedium
JP3254574B2 (ja) * 1996-08-30 2002-02-12 東京エレクトロン株式会社 塗布膜形成方法及びその装置
US6039059A (en) 1996-09-30 2000-03-21 Verteq, Inc. Wafer cleaning system
US5988896A (en) * 1996-10-26 1999-11-23 Applied Science Fiction, Inc. Method and apparatus for electronic film development
US6069714A (en) 1996-12-05 2000-05-30 Applied Science Fiction, Inc. Method and apparatus for reducing noise in electronic film development
US5779816A (en) * 1997-01-30 1998-07-14 Trinh; Tieu T. Nozzle and system for use in wafer cleaning procedures
US6017688A (en) 1997-01-30 2000-01-25 Applied Science Fiction, Inc. System and method for latent film recovery in electronic film development
DE19718983B4 (de) * 1997-05-05 2004-09-30 Infineon Technologies Ag Vorrichtungen, Verwendung und Verfahren zum Aufbringen einer Substanz auf eine Oberfläche eines Halbleiterwafers
US6260562B1 (en) * 1997-10-20 2001-07-17 Dainippon Screen Mfg. Co., Ltd. Substrate cleaning apparatus and method
ATE224622T1 (de) 1998-02-23 2002-10-15 Applied Science Fiction Inc Progressive flächenabtastung in der elektronischen filmentwicklung
US6062240A (en) * 1998-03-06 2000-05-16 Tokyo Electron Limited Treatment device
KR100537040B1 (ko) * 1998-08-19 2005-12-16 동경 엘렉트론 주식회사 현상장치
US6689215B2 (en) 1998-09-17 2004-02-10 Asml Holdings, N.V. Method and apparatus for mitigating cross-contamination between liquid dispensing jets in close proximity to a surface
US6248171B1 (en) * 1998-09-17 2001-06-19 Silicon Valley Group, Inc. Yield and line width performance for liquid polymers and other materials
US6594041B1 (en) 1998-11-20 2003-07-15 Applied Science Fiction, Inc. Log time processing and stitching system
US6680031B2 (en) * 1998-12-22 2004-01-20 Genencor International, Inc. Spray gun with a plurality of single nozzles for a fluid bed processing system and method thereof
US6781620B1 (en) 1999-03-16 2004-08-24 Eastman Kodak Company Mixed-element stitching and noise reduction system
US6159662A (en) * 1999-05-17 2000-12-12 Taiwan Semiconductor Manufacturing Company Photoresist development method with reduced cycle time and improved performance
TW495389B (en) 1999-06-29 2002-07-21 Applied Science Fiction Inc Slot coater device for applying developer to film for electronic film development
AU6914900A (en) 1999-08-17 2001-03-13 Applied Science Fiction, Inc. Method and system for using calibration patches in electronic film processing
US6602382B1 (en) * 1999-10-26 2003-08-05 Tokyo Electron Limited Solution processing apparatus
US6248175B1 (en) 1999-10-29 2001-06-19 Advanced Micro Devices, Inc. Nozzle arm movement for resist development
US6270579B1 (en) * 1999-10-29 2001-08-07 Advanced Micro Devices, Inc. Nozzle arm movement for resist development
US6915021B2 (en) * 1999-12-17 2005-07-05 Eastman Kodak Company Method and system for selective enhancement of image data
US6447178B2 (en) 1999-12-30 2002-09-10 Applied Science Fiction, Inc. System, method, and apparatus for providing multiple extrusion widths
US6505977B2 (en) 1999-12-30 2003-01-14 Applied Science Fiction, Inc. System and method for digital color dye film processing
US6813392B2 (en) 1999-12-30 2004-11-02 Eastman Kodak Company Method and apparatus for aligning multiple scans of the same area of a medium using mathematical correlation
US6788335B2 (en) 1999-12-30 2004-09-07 Eastman Kodak Company Pulsed illumination signal modulation control & adjustment method and system
US6965692B1 (en) 1999-12-30 2005-11-15 Eastman Kodak Company Method and apparatus for improving the quality of reconstructed information
US6554504B2 (en) 1999-12-30 2003-04-29 Applied Science Fiction, Inc. Distributed digital film processing system and method
US6461061B2 (en) 1999-12-30 2002-10-08 Applied Science Fiction, Inc. System and method for digital film development using visible light
US6864973B2 (en) * 1999-12-30 2005-03-08 Eastman Kodak Company Method and apparatus to pre-scan and pre-treat film for improved digital film processing handling
AU2463501A (en) * 1999-12-30 2001-07-24 Applied Science Fiction, Inc. Methods and apparatus for transporting and positioning film in a digital film processing system
US20010030685A1 (en) * 1999-12-30 2001-10-18 Darbin Stephen P. Method and apparatus for digital film processing using a scanning station having a single sensor
US6707557B2 (en) 1999-12-30 2004-03-16 Eastman Kodak Company Method and system for estimating sensor dark current drift and sensor/illumination non-uniformities
AU2743701A (en) 1999-12-30 2001-07-16 Applied Science Fiction, Inc. System and method for digital film development using visible light
AU2733601A (en) * 1999-12-31 2001-07-16 Applied Science Fiction, Inc. Digital film processing method
US6475711B1 (en) 1999-12-31 2002-11-05 Applied Science Fiction, Inc. Photographic element and digital film processing method using same
US7020344B2 (en) 2000-02-03 2006-03-28 Eastman Kodak Company Match blur system and method
US6786655B2 (en) 2000-02-03 2004-09-07 Eastman Kodak Company Method and system for self-service film processing
AU2001239745A1 (en) 2000-02-03 2001-08-14 Applied Science Fiction Method, system, and software for signal processing using pyramidal decomposition
US6619863B2 (en) 2000-02-03 2003-09-16 Eastman Kodak Company Method and system for capturing film images
EP1252549A2 (de) * 2000-02-03 2002-10-30 Applied Science Fiction Filmentwicklungsmittelkassette und verfahren zum entwickeln und digitalisieren von filmen
US6990251B2 (en) 2000-02-03 2006-01-24 Eastman Kodak Company Method, system, and software for signal processing using sheep and shepherd artifacts
US20010040701A1 (en) * 2000-02-03 2001-11-15 Edgar Albert D. Photographic film having time resolved sensitivity distinction
US20060182337A1 (en) * 2000-06-28 2006-08-17 Ford Benjamin C Method and apparatus for improving the quality of reconstructed information
US6746826B1 (en) 2000-07-25 2004-06-08 Asml Holding N.V. Method for an improved developing process in wafer photolithography
US20020118402A1 (en) * 2000-09-19 2002-08-29 Shaw Timothy C. Film bridge for digital film scanning system
US7016080B2 (en) * 2000-09-21 2006-03-21 Eastman Kodak Company Method and system for improving scanned image detail
US20020146171A1 (en) * 2000-10-01 2002-10-10 Applied Science Fiction, Inc. Method, apparatus and system for black segment detection
US6888997B2 (en) * 2000-12-05 2005-05-03 Eastman Kodak Company Waveguide device and optical transfer system for directing light to an image plane
US6691719B2 (en) * 2001-01-12 2004-02-17 Applied Materials Inc. Adjustable nozzle for wafer bevel cleaning
EP1360551A2 (de) 2001-02-09 2003-11-12 Applied Science Fiction, Inc. Verfahren und verarbeitungslösungen zur digitalen filmverarbeitung
US6551750B2 (en) * 2001-03-16 2003-04-22 Numerical Technologies, Inc. Self-aligned fabrication technique for tri-tone attenuated phase-shifting masks
TWI221316B (en) * 2001-04-24 2004-09-21 Kobe Steel Ltd Process for drying an object having microstructure and the object obtained by the same
US6517641B2 (en) * 2001-05-16 2003-02-11 Infineon Technologies Richmond, Lp Apparatus and process for collecting trace metals from wafers
JP3754322B2 (ja) * 2001-05-24 2006-03-08 東京エレクトロン株式会社 塗布膜形成方法及びその装置
US6805501B2 (en) * 2001-07-16 2004-10-19 Eastman Kodak Company System and method for digital film development using visible light
US7263240B2 (en) * 2002-01-14 2007-08-28 Eastman Kodak Company Method, system, and software for improving signal quality using pyramidal decomposition
US6770424B2 (en) * 2002-12-16 2004-08-03 Asml Holding N.V. Wafer track apparatus and methods for dispensing fluids with rotatable dispense arms
KR100906916B1 (ko) * 2004-01-29 2009-07-08 유겐카이샤 나스 기켄 기판 검사 장치, 기판 검사 방법, 및 회수 치구
KR20060119707A (ko) * 2004-02-13 2006-11-24 소니 가부시끼 가이샤 화상 처리 장치와 화상 처리 방법 및 프로그램
JP2006019575A (ja) * 2004-07-02 2006-01-19 Sharp Corp フォトレジストの現像方法及び現像装置
TWI352628B (en) * 2006-07-21 2011-11-21 Akrion Technologies Inc Nozzle for use in the megasonic cleaning of substr
JP5449662B2 (ja) 2007-10-18 2014-03-19 株式会社Sokudo 現像装置
US8950414B2 (en) * 2009-07-31 2015-02-10 Tokyo Electron Limited Liquid processing apparatus, liquid processing method, and storage medium
JP5634341B2 (ja) * 2011-06-29 2014-12-03 東京エレクトロン株式会社 めっき処理装置、めっき処理方法および記憶媒体
CN103094148B (zh) * 2011-10-27 2015-06-17 沈阳芯源微电子设备有限公司 一种双喷嘴清洗装置
US11526076B2 (en) 2020-11-18 2022-12-13 Canon Kabushiki Kaisha Nanofabrication system with dispensing system for rotational dispensing
JP2023137995A (ja) * 2022-03-18 2023-09-29 株式会社Screenホールディングス 基板処理装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE451209C (de) * 1927-02-28 1927-10-22 Hoh & Hahne Schleudervorrichtung zum gleichmaessigen Verteilen und Auftrocknen der lichtempfindlichen Schicht auf Platten
US2386591A (en) * 1944-03-22 1945-10-09 James T Campbell Plate whirler
US2376591A (en) * 1944-06-05 1945-05-22 Ernest V Hammond Animal trap
DE1267979B (de) * 1964-12-07 1968-05-09 Chemotenex Geraetebau G M B H Bespruehvorrichtung
US3769992A (en) * 1971-12-06 1973-11-06 Fluoroware Inc Spray processing machine
JPS5349955A (en) * 1976-10-18 1978-05-06 Fuji Photo Film Co Ltd Spin coating method
US4153203A (en) * 1977-03-02 1979-05-08 Tetsuya Tada Trigger type sprayer
JPS54102123A (en) * 1978-01-27 1979-08-11 Matsushita Electric Ind Co Ltd Developing method
JPS5546985A (en) * 1978-09-29 1980-04-02 Citizen Watch Co Ltd Printing mechanism for printer
JPS5654435A (en) * 1979-10-11 1981-05-14 Matsushita Electric Ind Co Ltd Photosensitive resin coating method
JPS5732446A (en) * 1980-08-04 1982-02-22 Mitsubishi Electric Corp Resist developing device
JPH0246366B2 (de) * 1980-08-11 1990-10-15 Discovision Ass
JPS57135066A (en) * 1981-02-14 1982-08-20 Tatsumo Kk Rotary applying machine
JPS57166032A (en) * 1981-04-03 1982-10-13 Toshiba Corp Spray type developing device for positive resist
JPS57192955A (en) * 1981-05-25 1982-11-27 Toppan Printing Co Ltd Developing method
JPS5817444A (ja) * 1981-07-24 1983-02-01 Hitachi Ltd フオトレジスト現像装置

Also Published As

Publication number Publication date
US4564280A (en) 1986-01-14
EP0110558B1 (de) 1987-01-14
EP0110558A2 (de) 1984-06-13
EP0110558A3 (en) 1984-07-11

Similar Documents

Publication Publication Date Title
DE3369204D1 (en) Method and apparatus for use in developing resist film
DE3374441D1 (en) Method and apparatus for exposing photosensitive material
GB2114160B (en) Film depositing apparatus and method
DE3380744D1 (en) Immunoassay apparatus and method
HK48390A (en) Developer and developing method
JPS55153971A (en) Method and device for removing excessive developing solution
EP0177625A3 (en) Method and apparatus for making improved laminating film and improved film
JPS572068A (en) Developing method and device
GB2012624B (en) Method and apparatus for conveying developing agent
DE3374035D1 (en) Toner containment method and apparatus
GB2112952B (en) Image formation in photopolymerizable light-sensitive material; and automatic apparatus for developing such material
JPS572065A (en) Developing method and device
DE3375224D1 (en) Daylight film loading method and apparatus
DE3370382D1 (en) Electrophotographic method and apparatus
DE3479818D1 (en) Method and apparatus for forming thin film
ZA838068B (en) Apparatus and method for sorting photographic film boxes
DE3174648D1 (en) Electrographic method and apparatus
IL72275A0 (en) Apparatus and method for toning photocopies
DE3168598D1 (en) Electrostatographic developing apparatus and method
GB2124409B (en) Method and device for automatically developing photosensitive material
EP0136672A3 (en) Method and apparatus for x-ray exposure
EP0767930A4 (de) Verfahren und vorrichtung zur verwendung bei der optimierung photographischer filmverarbeitungsprozesse
GB2141530B (en) Method and apparatus for drying film
DE3371945D1 (en) Device for developing and printing photographs simultaneously
EP0091684A3 (en) Method and apparatus for endless counting

Legal Events

Date Code Title Description
8364 No opposition during term of opposition