DE3377083D1 - Interferometric contact-free method for testing workpieces using ultrasonic wave vibrations - Google Patents

Interferometric contact-free method for testing workpieces using ultrasonic wave vibrations

Info

Publication number
DE3377083D1
DE3377083D1 DE8383300080T DE3377083T DE3377083D1 DE 3377083 D1 DE3377083 D1 DE 3377083D1 DE 8383300080 T DE8383300080 T DE 8383300080T DE 3377083 T DE3377083 T DE 3377083T DE 3377083 D1 DE3377083 D1 DE 3377083D1
Authority
DE
Germany
Prior art keywords
interferometric
contact
ultrasonic wave
free method
wave vibrations
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383300080T
Other languages
English (en)
Inventor
Tohru C O Nippon Steel C Iuchi
Fumio C O Nippon Steel Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Application granted granted Critical
Publication of DE3377083D1 publication Critical patent/DE3377083D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0421—Longitudinal waves
DE8383300080T 1982-01-12 1983-01-07 Interferometric contact-free method for testing workpieces using ultrasonic wave vibrations Expired DE3377083D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57002995A JPS58131557A (ja) 1982-01-12 1982-01-12 超音波の非接触測定法

Publications (1)

Publication Number Publication Date
DE3377083D1 true DE3377083D1 (en) 1988-07-21

Family

ID=11544954

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383300080T Expired DE3377083D1 (en) 1982-01-12 1983-01-07 Interferometric contact-free method for testing workpieces using ultrasonic wave vibrations

Country Status (4)

Country Link
US (1) US4619529A (de)
EP (1) EP0083979B1 (de)
JP (1) JPS58131557A (de)
DE (1) DE3377083D1 (de)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2574537B1 (fr) * 1984-12-06 1989-08-04 France Etat Procede et dispositif de mesure de l'epaisseur de films minces utilisant des ondes acoustiques de surface
JPH0634007B2 (ja) * 1985-03-29 1994-05-02 ロツクウエル インタ−ナシヨナル コ−ポレ−シヨン 欠陥及び音響的不連続検知用の無接触超音波変換
US4928527A (en) * 1988-04-29 1990-05-29 At&T Bell Laboratories Method and device for nondestructive evaluation
US5778016A (en) 1994-04-01 1998-07-07 Imra America, Inc. Scanning temporal ultrafast delay methods and apparatuses therefor
US5489984A (en) * 1994-04-01 1996-02-06 Imra America, Inc. Differential ranging measurement system and method utilizing ultrashort pulses
US5585913A (en) * 1994-04-01 1996-12-17 Imra America Inc. Ultrashort pulsewidth laser ranging system employing a time gate producing an autocorrelation and method therefore
US5638396A (en) * 1994-09-19 1997-06-10 Textron Systems Corporation Laser ultrasonics-based material analysis system and method
US5546187A (en) * 1995-03-15 1996-08-13 Hughes Aircraft Company Self-referencing laser-based ultrasonic wave receiver
USH1937H1 (en) * 1996-02-29 2001-02-06 The United States Of America As Represented By The United States Department Of Energy Laser barometer
US6552803B1 (en) * 1998-02-24 2003-04-22 Kla-Tencor Corporation Detection of film thickness through induced acoustic pulse-echos
US6715354B2 (en) * 1998-02-24 2004-04-06 Massachusetts Institute Of Technology Flaw detection system using acoustic doppler effect
US6108087A (en) * 1998-02-24 2000-08-22 Kla-Tencor Corporation Non-contact system for measuring film thickness
AU3154999A (en) * 1998-03-26 1999-10-18 British Nuclear Fuels Plc Improvements in and relating to inspection
US6633384B1 (en) 1998-06-30 2003-10-14 Lockheed Martin Corporation Method and apparatus for ultrasonic laser testing
US6657733B1 (en) * 1998-06-30 2003-12-02 Lockheed Martin Corporation Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
WO2000020841A1 (en) * 1998-10-05 2000-04-13 Kla-Tencor Corporation Interferometric system for measurement disturbance of a sample
US6628408B1 (en) 1999-04-15 2003-09-30 Kimberly-Clark Worldwide, Inc. Amplitude measurement for an ultrasonic horn
GB2356931B (en) * 1999-12-03 2003-05-28 Aea Technology Plc Optical ultrasonic measurement
US6728515B1 (en) 2000-02-16 2004-04-27 Massachusetts Institute Of Technology Tuned wave phased array
US6325172B1 (en) 2000-05-25 2001-12-04 Pvt-Wrl, Llc Geophone including laser interferometer
US6782337B2 (en) 2000-09-20 2004-08-24 Kla-Tencor Technologies Corp. Methods and systems for determining a critical dimension an a presence of defects on a specimen
US7106425B1 (en) 2000-09-20 2006-09-12 Kla-Tencor Technologies Corp. Methods and systems for determining a presence of defects and a thin film characteristic of a specimen
US6812045B1 (en) 2000-09-20 2004-11-02 Kla-Tencor, Inc. Methods and systems for determining a characteristic of a specimen prior to, during, or subsequent to ion implantation
US6694284B1 (en) 2000-09-20 2004-02-17 Kla-Tencor Technologies Corp. Methods and systems for determining at least four properties of a specimen
US6919957B2 (en) 2000-09-20 2005-07-19 Kla-Tencor Technologies Corp. Methods and systems for determining a critical dimension, a presence of defects, and a thin film characteristic of a specimen
US7349090B2 (en) 2000-09-20 2008-03-25 Kla-Tencor Technologies Corp. Methods and systems for determining a property of a specimen prior to, during, or subsequent to lithography
EP1319244A1 (de) 2000-09-20 2003-06-18 Kla-Tencor Inc. Methode und system zur halbleiterherstellung
US7130029B2 (en) 2000-09-20 2006-10-31 Kla-Tencor Technologies Corp. Methods and systems for determining an adhesion characteristic and a thickness of a specimen
US6673637B2 (en) 2000-09-20 2004-01-06 Kla-Tencor Technologies Methods and systems for determining a presence of macro defects and overlay of a specimen
US6891627B1 (en) 2000-09-20 2005-05-10 Kla-Tencor Technologies Corp. Methods and systems for determining a critical dimension and overlay of a specimen
US20040102764A1 (en) * 2000-11-13 2004-05-27 Peter Balling Laser ablation
US6833554B2 (en) * 2000-11-21 2004-12-21 Massachusetts Institute Of Technology Laser-induced defect detection system and method
WO2002099412A1 (en) * 2001-06-04 2002-12-12 Aea Technology Plc Optical ultrasonic measurement
JP5847476B2 (ja) * 2011-07-28 2016-01-20 公益財団法人レーザー技術総合研究所 欠陥検査装置
JP6896493B2 (ja) * 2017-04-17 2021-06-30 株式会社東芝 超音波受信装置、欠陥検査装置、超音波受信方法、欠陥検査方法、および構造体の製造方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3796495A (en) * 1972-05-30 1974-03-12 Zenith Radio Corp Apparatus and methods for scanning phase profilometry
US3854325A (en) * 1973-07-13 1974-12-17 Us Air Force Method and means for determining fatigue damage and surface stress
DE2457253C2 (de) * 1974-12-04 1982-09-02 Krautkrämer, GmbH, 5000 Köln Optisches interferometrisches Verfahren und Vorrichtung zur berührungslosen Messung der durch Ultraschallwellen verursachten Oberflächenauslenkung eines Prüflings
DE2709725A1 (de) * 1977-03-05 1978-09-07 Krautkraemer Gmbh Verfahren zur thermischen anregung von ultraschallwellen in lichtabsorbierenden oberflaechen von pruefstuecken
DE2709686C2 (de) * 1977-03-05 1982-09-09 Krautkrämer, GmbH, 5000 Köln Optisches interferometrisches Verfahren zur berührungslosen Messung der durch Ultraschallwellen verursachten Oberflächenauslenkung eines Prüflings
US4147435A (en) * 1977-06-30 1979-04-03 International Business Machines Corporation Interferometric process and apparatus for the measurement of the etch rate of opaque surfaces
US4172382A (en) * 1978-10-03 1979-10-30 The Johns Hopkins University Applied Physics Laboratory Laser interferometry detection method/apparatus for buried structure
JPS5664655A (en) * 1979-10-31 1981-06-01 Nippon Steel Corp Measurement method of isometric ratio of cast-iron piece
DE3016879C2 (de) * 1980-05-02 1982-12-30 Krautkrämer, GmbH, 5000 Köln Verfahren und Vorrichtung zur zerstörungsfreien Ultraschall-Werkstoffprüfung

Also Published As

Publication number Publication date
JPS58131557A (ja) 1983-08-05
EP0083979A3 (en) 1984-07-11
EP0083979A2 (de) 1983-07-20
EP0083979B1 (de) 1988-06-15
US4619529A (en) 1986-10-28

Similar Documents

Publication Publication Date Title
DE3377083D1 (en) Interferometric contact-free method for testing workpieces using ultrasonic wave vibrations
DE3064477D1 (en) Method and apparatus for focusing elastic waves
JPS5755138A (en) Method and apparatus for carrying out ultrasonic inspection
GB2136995B (en) Method and apparatus for locating the boundary of an object
JPS54107401A (en) Vibrating method for s wave detecting layer
KR860005331A (ko) 표면 음파 장치 및 그 형성 방법
GB2019566B (en) Reference part especially for nondestructive testing by ultrasonic vibrations and a method for the fabrication of said part
JPS5772786A (en) Method and apparatus for ultrasonic bonding
DE3463183D1 (en) Method and apparatus for the detection of composition changes within a fluid using ultransonic means
EP0160922A3 (en) Method for the ultrasonic non-destructive testing of objects and components, and apparatus for using the same
GB2140559B (en) Ultrasonic inspecting apparatus
EP0186014A3 (en) Apparatus for adjustably mounting ultrasonic testing devices
IL75491A0 (en) Apparatus for examining objects by ultrasonic echography
DE3368996D1 (en) Method and apparatus for ultrasonic echography
GB2120790B (en) Electromagnetic acoustic wave test apparatus
EP0396761A4 (en) Ultrasonic wave inspecting apparatus
GB2036923B (en) Method of and apparatus for acoustic damping of punching machines and the like
GB2114300B (en) Ultrasonic testing of non uniform thickness workpieces
DE3371568D1 (en) Ultrasonic apparatus for localising an object
IL73801A (en) Device for the examination of objects by means of ultrasound echography
GB8718811D0 (en) Ultrasonic non-destructive testing apparatus
DE3277083D1 (en) Ultrasonic testing apparatus
GB8412437D0 (en) Apparatus for ultrasonic testing
GB8312095D0 (en) Apparatus for non-destructive ultrasonic testing of materials
DE3371692D1 (en) Apparatus for ultrasonic investigation

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee