DE3473921D1 - Measuring device for the "contactless" measurement of large thicknesses, for metal materials above the curie temperature - Google Patents

Measuring device for the "contactless" measurement of large thicknesses, for metal materials above the curie temperature

Info

Publication number
DE3473921D1
DE3473921D1 DE8484200819T DE3473921T DE3473921D1 DE 3473921 D1 DE3473921 D1 DE 3473921D1 DE 8484200819 T DE8484200819 T DE 8484200819T DE 3473921 T DE3473921 T DE 3473921T DE 3473921 D1 DE3473921 D1 DE 3473921D1
Authority
DE
Germany
Prior art keywords
contactless
measurement
measuring device
metal materials
curie temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484200819T
Other languages
English (en)
Inventor
Eugenio Caruso
Antonio Gray
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CISE Centro Informazioni Studi e Esperienze SpA
Original Assignee
Dalmine SpA
CISE Centro Informazioni Studi e Esperienze SpA
Innocenti Santeustacchio SpA
Innse Innocenti Santeustacchio SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dalmine SpA, CISE Centro Informazioni Studi e Esperienze SpA, Innocenti Santeustacchio SpA, Innse Innocenti Santeustacchio SpA filed Critical Dalmine SpA
Application granted granted Critical
Publication of DE3473921D1 publication Critical patent/DE3473921D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
DE8484200819T 1983-06-15 1984-06-08 Measuring device for the "contactless" measurement of large thicknesses, for metal materials above the curie temperature Expired DE3473921D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT21637/83A IT1194275B (it) 1983-06-15 1983-06-15 Misuratore di spessori elevati "senza contatto" per materiali metallici ad di sopra della temperatura di curie

Publications (1)

Publication Number Publication Date
DE3473921D1 true DE3473921D1 (en) 1988-10-13

Family

ID=11184678

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484200819T Expired DE3473921D1 (en) 1983-06-15 1984-06-08 Measuring device for the "contactless" measurement of large thicknesses, for metal materials above the curie temperature

Country Status (7)

Country Link
US (1) US4771238A (de)
EP (1) EP0129282B1 (de)
JP (1) JPS6013203A (de)
AT (1) ATE37088T1 (de)
CA (1) CA1268816A (de)
DE (1) DE3473921D1 (de)
IT (1) IT1194275B (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2572175A1 (fr) * 1984-10-24 1986-04-25 Stein Heurtey Procede et dispositif pour mesurer l'epaisseur de couches metalliques minces deposees sur un support conducteur
SE451886B (sv) * 1986-10-10 1987-11-02 Sten Linder Sett och anordning for beroringsfri metning av storheter hos eller i anslutning till elektriskt ledande material
US4843320A (en) * 1987-12-17 1989-06-27 Atlantic Richfield Company Transient electromagnetic method for detecting corrosion on conductive containers
US4843319A (en) * 1987-12-17 1989-06-27 Atlantic Richfield Company Transient electromagnetic method for detecting corrosion on conductive containers having variations in jacket thickness
CA1265916A (en) * 1988-09-30 1990-02-20 Jobst Ulrich Gellert Method of manufacture of an electrical terminal on an injection molding nozzle
US5036236A (en) * 1990-05-07 1991-07-30 Hughes Aircraft Company Air gap matching proximity sensor for magnetic bearings
EP0496934B1 (de) * 1991-01-30 1994-10-12 VDO Luftfahrtgeräte Werk GmbH Verfahren zum Betreiben eines induktiven Abstandssensors
US5283519A (en) * 1991-01-30 1994-02-01 Vdo Luftfahrtgerate Werk Gmbh Operation of inductive distance sensor by scaling output signal by vectorially obtained factor
US5420507A (en) * 1992-09-28 1995-05-30 Edward L. Laskowski Method and apparatus for sensing a target characteristic by measuring both impedance and resonant frequency of a tank circuit
DE4327712C2 (de) * 1993-08-18 1997-07-10 Micro Epsilon Messtechnik Sensoranordnung und Verfahren zum Erfassen von Eigenschaften der Oberflächenschicht eines metallischen Targets
US5701073A (en) * 1996-02-28 1997-12-23 Tektronix, Inc. Direct current measuring apparatus and method employing flux diversion
JP2002533659A (ja) * 1998-12-18 2002-10-08 マイクロ−エプシロン・メステヒニク・ゲーエムベーハー・ウント・コンパニー・カー・ゲー 渦電流センサの作動方法及び渦電流センサ
US7112960B2 (en) * 2003-07-31 2006-09-26 Applied Materials, Inc. Eddy current system for in-situ profile measurement
CN100443853C (zh) * 2004-04-21 2008-12-17 爱德森（厦门）电子有限公司 在线探测热钢板居里点温度层距表面深度的方法及装置
WO2007019066A2 (en) * 2005-08-04 2007-02-15 Mau-Chung Frank Chang Phase coherent differential structures
DE102008028711B4 (de) * 2007-10-15 2009-07-09 V&M Deutschland Gmbh Verfahren und Vorrichtung zur Messung der Exzentrizität eines warmgefertigten, nahtlosen Rohres bei der Herstellung
US8284560B2 (en) * 2008-11-14 2012-10-09 Applied Materials, Inc. Eddy current sensor with enhanced edge resolution
FR2972795B1 (fr) * 2011-03-15 2013-10-11 Crouzet Automatismes Capteur inductif de proximite et procede de montage dudit capteur
ITUB20153041A1 (it) * 2015-08-10 2017-02-10 Danieli Automation Spa Dispositivo per la misura a caldo, durante la laminazione, di una dimensione di profili metallici
GB201518809D0 (en) * 2015-10-23 2015-12-09 The Technology Partnership Plc Temperature sensor
WO2018080764A1 (en) 2016-10-28 2018-05-03 Applied Materials, Inc. Core configuration with alternating posts for in-situ electromagnetic induction monitoring system
JP6610746B1 (ja) * 2018-10-24 2019-11-27 Tdk株式会社 磁気センサ
JP7291558B2 (ja) * 2019-07-03 2023-06-15 株式会社荏原製作所 渦電流センサ

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1261346A (en) * 1968-03-13 1972-01-26 Atomic Energy Authority Uk Improvements in or relating to the detection of magnetic discontinuities
FR2163899A5 (de) * 1971-12-06 1973-07-27 Siderurgie Fse Inst Rech
US3764897A (en) * 1971-12-28 1973-10-09 Singer Co Electromagnetic thickness gauging using a transmitting coil shaped to provide a constant field over a range of measuring distances
US3848182A (en) * 1973-08-15 1974-11-12 Magnetic Analysis Corp Apparatus for limiting phase-angle response range, particularly in eddy current testing apparatus
JPS5753604A (en) * 1980-09-18 1982-03-30 Yokogawa Hokushin Electric Corp Thickness gauge
US4461995A (en) * 1981-10-29 1984-07-24 Republic Steel Corporation Cooling method and apparatus for eddy current flaw detection
US4578999A (en) * 1982-02-10 1986-04-01 Mannesmann A.G. Instrument for testing materials
AT382458B (de) * 1982-02-11 1987-02-25 Voest Alpine Ag Verfahren zur oberflaechenpruefung von ueber dem curie-punkt heissem stahlgut sowie einrichtung zur durchfuehrung des verfahrens

Also Published As

Publication number Publication date
EP0129282B1 (de) 1988-09-07
ATE37088T1 (de) 1988-09-15
CA1268816A (en) 1990-05-08
IT8321637A0 (it) 1983-06-15
IT8321637A1 (it) 1984-12-15
US4771238A (en) 1988-09-13
JPS6013203A (ja) 1985-01-23
IT1194275B (it) 1988-09-14
EP0129282A1 (de) 1984-12-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: CISE - CENTRO INFORMAZIONI STUDI ESPERIENZE S.P.A.

8328 Change in the person/name/address of the agent

Free format text: SPALTHOFF, A., DIPL.-ING. LELGEMANN, K., DIPL.-ING., PAT.-ANWAELTE, 4300 ESSEN

8339 Ceased/non-payment of the annual fee