DE3587621T2 - Logikanalysator. - Google Patents

Logikanalysator.

Info

Publication number
DE3587621T2
DE3587621T2 DE85106407T DE3587621T DE3587621T2 DE 3587621 T2 DE3587621 T2 DE 3587621T2 DE 85106407 T DE85106407 T DE 85106407T DE 3587621 T DE3587621 T DE 3587621T DE 3587621 T2 DE3587621 T2 DE 3587621T2
Authority
DE
Germany
Prior art keywords
logic analyzer
analyzer
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE85106407T
Other languages
English (en)
Other versions
DE3587621D1 (de
Inventor
Takayuki Nakajima
Tetsuo Aoki
Katsumi Kobayashi
Noboru Akiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP59108921A external-priority patent/JPS60252280A/ja
Priority claimed from JP59110380A external-priority patent/JPS60253885A/ja
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE3587621D1 publication Critical patent/DE3587621D1/de
Application granted granted Critical
Publication of DE3587621T2 publication Critical patent/DE3587621T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
DE85106407T 1984-05-28 1985-05-24 Logikanalysator. Expired - Fee Related DE3587621T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP59108921A JPS60252280A (ja) 1984-05-28 1984-05-28 ロジツクアナライザ
JP59110380A JPS60253885A (ja) 1984-05-30 1984-05-30 回路試験装置

Publications (2)

Publication Number Publication Date
DE3587621D1 DE3587621D1 (de) 1993-11-18
DE3587621T2 true DE3587621T2 (de) 1994-03-24

Family

ID=26448746

Family Applications (1)

Application Number Title Priority Date Filing Date
DE85106407T Expired - Fee Related DE3587621T2 (de) 1984-05-28 1985-05-24 Logikanalysator.

Country Status (3)

Country Link
US (1) US4696004A (de)
EP (1) EP0163273B1 (de)
DE (1) DE3587621T2 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10047612B4 (de) * 2000-01-31 2006-05-04 Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto Logikanalysator mit durch ein Signalformexemplar definierter Trigger-Spezifikation

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61133873A (ja) * 1984-12-03 1986-06-21 Mitsubishi Electric Corp 半導体試験装置
US4821269A (en) * 1986-10-23 1989-04-11 The Grass Valley Group, Inc. Diagnostic system for a digital signal processor
US4799220A (en) * 1987-02-19 1989-01-17 Grumman Aerospace Corporation Dynamic system for testing an equipment
EP0595229B1 (de) * 1992-10-28 1999-03-17 Anton Rüegg Vorrichtung zum Aufwickeln einer kontinuierlich zugeführten Materialbahn auf eine Anzahl von Wickelkernen
JP3240709B2 (ja) * 1992-10-30 2001-12-25 株式会社アドバンテスト メモリ試験装置
US5737520A (en) * 1996-09-03 1998-04-07 Hewlett-Packard Co. Method and apparatus for correlating logic analyzer state capture data with associated application data structures
US6160561A (en) * 1996-09-12 2000-12-12 Micron Electronics, Inc. Method for displaying data on a video display
JPH10232890A (ja) * 1996-10-28 1998-09-02 Altera Corp プログラマブル論理回路のための組み込み式論理アナライザー
US5828985A (en) * 1996-11-20 1998-10-27 Advantest Corp. Semiconductor test system
US6148420A (en) * 1997-10-17 2000-11-14 Agilent Technologies Method and apparatus for analyzing serial data
US6286114B1 (en) * 1997-10-27 2001-09-04 Altera Corporation Enhanced embedded logic analyzer
US6678803B2 (en) * 1999-11-03 2004-01-13 Micron Technology, Inc. Method and device to use memory access request tags
US6754862B1 (en) 2000-03-09 2004-06-22 Altera Corporation Gaining access to internal nodes in a PLD
US7036046B2 (en) * 2002-11-14 2006-04-25 Altera Corporation PLD debugging hub
US7076751B1 (en) 2003-01-24 2006-07-11 Altera Corporation Chip debugging using incremental recompilation
US7539900B1 (en) 2003-07-29 2009-05-26 Altera Corporation Embedded microprocessor for integrated circuit testing and debugging
US7206967B1 (en) 2004-02-09 2007-04-17 Altera Corporation Chip debugging using incremental recompilation and register insertion
US7406548B2 (en) * 2004-03-26 2008-07-29 Hewlett-Packard Development Company, L.P. Systems and methods for responding to a data transfer
TWI492048B (zh) * 2012-03-30 2015-07-11 Zeroplus Technology Co Ltd Data display method
CN103377019B (zh) * 2012-04-19 2016-05-11 孕龙科技股份有限公司 数据显示方法
US9600385B2 (en) * 2014-02-25 2017-03-21 Arrow Devices Pvt Ltd Analyzing behavior of a device under test

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1163721A (en) * 1980-08-18 1984-03-13 Milan Slamka Apparatus for the dynamic in-circuit testing of electronic digital circuit elements
US4425643A (en) * 1981-06-08 1984-01-10 Tektronix, Inc. Multi-speed logic analyzer
GB2114306B (en) * 1981-12-28 1985-07-31 Sony Tektronix Corp Logic analyser
JPS58134554A (ja) * 1982-02-03 1983-08-10 Nec Corp 伝送路監視装置
JPS58158566A (ja) * 1982-03-17 1983-09-20 Hitachi Ltd 検査装置
US4574354A (en) * 1982-11-19 1986-03-04 Tektronix, Inc. Method and apparatus for time-aligning data
DE3379354D1 (en) * 1983-05-25 1989-04-13 Ibm Deutschland Test and diagnostic device for a digital computer
US4601033A (en) * 1984-01-16 1986-07-15 Siemens Corporate Research & Suppport, Inc. Circuit testing apparatus employing signature analysis

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10047612B4 (de) * 2000-01-31 2006-05-04 Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto Logikanalysator mit durch ein Signalformexemplar definierter Trigger-Spezifikation

Also Published As

Publication number Publication date
DE3587621D1 (de) 1993-11-18
EP0163273B1 (de) 1993-10-13
EP0163273A3 (en) 1988-08-03
EP0163273A2 (de) 1985-12-04
US4696004A (en) 1987-09-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee