DE3587858D1 - IC-Testvorrichtung. - Google Patents

IC-Testvorrichtung.

Info

Publication number
DE3587858D1
DE3587858D1 DE3587858T DE3587858T DE3587858D1 DE 3587858 D1 DE3587858 D1 DE 3587858D1 DE 3587858 T DE3587858 T DE 3587858T DE 3587858 T DE3587858 T DE 3587858T DE 3587858 D1 DE3587858 D1 DE 3587858D1
Authority
DE
Germany
Prior art keywords
test device
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE3587858T
Other languages
English (en)
Inventor
Hiroshi Sato
Yoshihito Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP9884884U external-priority patent/JPS6113996U/ja
Priority claimed from JP9884784U external-priority patent/JPS6115203U/ja
Priority claimed from JP9884384U external-priority patent/JPS6115218U/ja
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of DE3587858D1 publication Critical patent/DE3587858D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/344Sorting according to other particular properties according to electric or electromagnetic properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers
DE3587858T 1984-06-29 1985-06-27 IC-Testvorrichtung. Expired - Lifetime DE3587858D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP9884884U JPS6113996U (ja) 1984-06-29 1984-06-29 Ic用マガジン収納装置
JP9884784U JPS6115203U (ja) 1984-06-29 1984-06-29 Ic用マガジン収納装置
JP9884384U JPS6115218U (ja) 1984-06-29 1984-06-29 Ic用マガジン搬送装置

Publications (1)

Publication Number Publication Date
DE3587858D1 true DE3587858D1 (de) 1994-07-21

Family

ID=27308779

Family Applications (2)

Application Number Title Priority Date Filing Date
DE3587858T Expired - Lifetime DE3587858D1 (de) 1984-06-29 1985-06-27 IC-Testvorrichtung.
DE8585107996T Expired - Fee Related DE3584319D1 (de) 1984-06-29 1985-06-27 Ic-testeinrichtung.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE8585107996T Expired - Fee Related DE3584319D1 (de) 1984-06-29 1985-06-27 Ic-testeinrichtung.

Country Status (3)

Country Link
US (2) US4715501A (de)
EP (2) EP0166448B1 (de)
DE (2) DE3587858D1 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3539965A1 (de) * 1985-11-11 1987-05-14 Ueberreiter Ekkehard Vorrichtung zum pruefen und sortieren von elektronischen bauelementen
JPH0833433B2 (ja) * 1987-11-30 1996-03-29 東京エレクトロン株式会社 プローブ装置
US4941795A (en) * 1988-11-21 1990-07-17 At&T Bell Laboratories Component insertion machine apparatus
US4950120A (en) * 1989-02-27 1990-08-21 Burndy Corporation Apparatus and method for feeding card edge connectors and connector magazines
DE4023772A1 (de) * 1989-08-31 1991-03-14 Gold Star Electronics Vorrichtung zum beschicken und entladen von huelsen fuer ein ic-pruefgeraet
US5116185A (en) * 1990-05-01 1992-05-26 Lsi Logic Corp. Vibratory tube-to-tube transfer system
JP2921937B2 (ja) * 1990-07-18 1999-07-19 東京エレクトロン株式会社 Ic検査装置
JP3006064B2 (ja) * 1990-10-01 2000-02-07 株式会社アドバンテスト Ic試験装置
JPH069027A (ja) * 1991-06-13 1994-01-18 Tenryu Technic:Kk スティックフィーダ
US5307011A (en) * 1991-12-04 1994-04-26 Advantest Corporation Loader and unloader for test handler
US5313156A (en) * 1991-12-04 1994-05-17 Advantest Corporation Apparatus for automatic handling
US5319353A (en) * 1992-10-14 1994-06-07 Advantest Corporation Alarm display system for automatic test handler
TW287235B (de) * 1994-06-30 1996-10-01 Zenshin Test Co
US6070731A (en) * 1994-09-22 2000-06-06 Advantest Corporation IC receiving tray storage device and mounting apparatus for the same
US5538141A (en) * 1994-09-27 1996-07-23 Intel Corporation Test flow assurance using memory imprinting
JPH08306765A (ja) * 1995-04-28 1996-11-22 Advantest Corp ハンドラ装置用トレイ装着台
US6024526A (en) * 1995-10-20 2000-02-15 Aesop, Inc. Integrated prober, handler and tester for semiconductor components
DE19581894C2 (de) * 1995-11-06 1999-12-23 Advantest Corp Vorrichtung zum Ändern der Ausrichtung von ICs
JP3063602B2 (ja) * 1995-12-22 2000-07-12 日立電子エンジニアリング株式会社 Icデバイスの移載装置
CA2202788A1 (en) * 1997-04-15 1998-10-15 Sylvain Rodier Automatic input and output tube handlers for use with an electronic component processing machine
JP3591679B2 (ja) * 1997-04-17 2004-11-24 株式会社アドバンテスト Ic用トレイ取出装置及びic用トレイ収納装置
US5831856A (en) * 1997-07-21 1998-11-03 Behavior Tech Computer Corp. DRAM testing apparatus
US6135291A (en) 1998-01-16 2000-10-24 Micron Electronics, Inc. Vertical magazine method for integrated circuit device dispensing, receiving, storing, testing or binning
US6112940A (en) * 1998-01-16 2000-09-05 Micron Electronics, Inc. Vertical magazine apparatus for integrated circuit device dispensing, receiving or storing
US5931630A (en) * 1998-01-26 1999-08-03 Harmony Technology Corp. Material feeding apparatus for use in a surface mounting system
US6039526A (en) * 1998-05-11 2000-03-21 Vanguard International Semiconductor Corporation Automatic plug pulling machine for IC tubes
US6607071B1 (en) * 1998-10-19 2003-08-19 Mirae Corporation Sealed test chamber for module IC handler
US6476628B1 (en) * 1999-06-28 2002-11-05 Teradyne, Inc. Semiconductor parallel tester
US6310486B1 (en) * 1999-10-01 2001-10-30 Teradyne, Inc. Integrated test cell
AU3084500A (en) * 1999-10-13 2001-04-23 Vladimir Nikolaevich Davydov Semiconductor device processing and sorting apparatus and method of handling
US6719518B2 (en) * 2001-10-15 2004-04-13 Anadigics, Inc. Portable tube holder apparatus
TW544076U (en) * 2002-02-08 2003-07-21 Chi Yhei Tech Internat Co Ltd IC supplying machine
TWI271832B (en) * 2005-10-07 2007-01-21 King Yuan Electronics Co Ltd Feeding apparatus
WO2011058644A1 (ja) * 2009-11-13 2011-05-19 株式会社データンク フラッシュメモリ自動供給装置
US20110253592A1 (en) * 2009-11-13 2011-10-20 Hiromitsu Sato Magazine for flash memory
US8981807B2 (en) 2010-07-27 2015-03-17 Intest Corporation Positioner system and method of positioning
RU2680161C1 (ru) * 2018-04-27 2019-02-18 Публичное акционерное общество "Радиофизика" Способ тестирования гис свч

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE213338C (de) *
US1292635A (en) * 1918-10-02 1919-01-28 George D Parker Tray-stacker.
US1652698A (en) * 1926-12-13 1927-12-13 William F Boettger Stacking device
US3308977A (en) * 1965-10-04 1967-03-14 Ibm Automatic tray handler
US3587852A (en) * 1969-05-19 1971-06-28 Honeywell Inc Control apparatus
US3758122A (en) * 1969-11-05 1973-09-11 Victor Company Of Japan Automatic cassette changing and playing apparatus
US3844423A (en) * 1972-12-08 1974-10-29 Hartman Metal Fab Inc Pallet accumulator
US4170290A (en) * 1977-02-28 1979-10-09 Motorola, Inc. Lift and feed mechanism for high speed integrated circuit handler
US4124132A (en) * 1977-05-18 1978-11-07 Sola Basic Industries, Inc. Magazine apparatus for semiconductor processing device
US4234418A (en) * 1978-06-23 1980-11-18 Contrel Corporation Dip-handling apparatus
JPS5722570A (en) * 1980-07-02 1982-02-05 Fujitsu Ltd Automatic handling tool for parts
US4423815A (en) * 1981-08-10 1984-01-03 Contrel Corporation Component sorting apparatus
JPS5834800U (ja) * 1981-08-31 1983-03-07 株式会社日立国際電気 マガジン等の供給装置
US4500246A (en) * 1983-03-01 1985-02-19 Universal Instruments Corporation Indexed feed of electronic component supply tubes
US4618305A (en) * 1983-11-23 1986-10-21 Daymarc Corporation Automatic feed apparatus and process for integrated circuits stored in tubes
JPS61246676A (ja) * 1985-04-24 1986-11-01 Nec Corp Icのハンドリング装置
JPS61246675A (ja) * 1985-04-25 1986-11-01 Toshiba Seiki Kk 電子部品の測定装置
US4647269A (en) * 1985-07-01 1987-03-03 Micro Component Technology, Inc. Automatic integrated circuit transportation tube elevating and tilting device

Also Published As

Publication number Publication date
US4760924A (en) 1988-08-02
EP0382264B1 (de) 1994-06-15
DE3584319D1 (de) 1991-11-14
EP0166448A2 (de) 1986-01-02
EP0382264A2 (de) 1990-08-16
US4715501A (en) 1987-12-29
EP0166448B1 (de) 1991-10-09
EP0166448A3 (en) 1987-06-10
EP0382264A3 (de) 1991-04-10

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Legal Events

Date Code Title Description
8332 No legal effect for de