DE3683053D1 - Verfahren zur kontaktfreien pruefung von platinen fuer integrierte schaltungen unter atmosphaerischen bedingungen. - Google Patents

Verfahren zur kontaktfreien pruefung von platinen fuer integrierte schaltungen unter atmosphaerischen bedingungen.

Info

Publication number
DE3683053D1
DE3683053D1 DE8686114712T DE3683053T DE3683053D1 DE 3683053 D1 DE3683053 D1 DE 3683053D1 DE 8686114712 T DE8686114712 T DE 8686114712T DE 3683053 T DE3683053 T DE 3683053T DE 3683053 D1 DE3683053 D1 DE 3683053D1
Authority
DE
Germany
Prior art keywords
pad
pads
tunnelling
boards
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686114712T
Other languages
English (en)
Inventor
Johannes Georg Beha
Armin Blacha
Rolf Clauberg
Hugo K Seitz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE3683053D1 publication Critical patent/DE3683053D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
DE8686114712T 1986-10-23 1986-10-23 Verfahren zur kontaktfreien pruefung von platinen fuer integrierte schaltungen unter atmosphaerischen bedingungen. Expired - Fee Related DE3683053D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP86114712A EP0264482B1 (de) 1986-10-23 1986-10-23 Verfahren zur kontaktfreien Prüfung von Platinen für integrierte Schaltungen unter atmosphärischen Bedingungen

Publications (1)

Publication Number Publication Date
DE3683053D1 true DE3683053D1 (de) 1992-01-30

Family

ID=8195525

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686114712T Expired - Fee Related DE3683053D1 (de) 1986-10-23 1986-10-23 Verfahren zur kontaktfreien pruefung von platinen fuer integrierte schaltungen unter atmosphaerischen bedingungen.

Country Status (4)

Country Link
US (2) US4868492A (de)
EP (1) EP0264482B1 (de)
JP (1) JPH0614085B2 (de)
DE (1) DE3683053D1 (de)

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US5272434A (en) * 1987-06-20 1993-12-21 Schlumberger Technologies, Inc. Method and apparatus for electro-optically testing circuits
EP0402499A1 (de) * 1989-06-13 1990-12-19 Siemens Aktiengesellschaft Verfahren zur Prüfung einer Leiterplatte mit einer Teilchensonde
US4970461A (en) * 1989-06-26 1990-11-13 Lepage Andrew J Method and apparatus for non-contact opens/shorts testing of electrical circuits
EP0405672A1 (de) * 1989-06-30 1991-01-02 Koninklijke Philips Electronics N.V. Verfahren zur Messung einer Spannungsverteilung auf ein Leitermuster
EP0429739B1 (de) * 1989-11-28 1993-10-27 International Business Machines Corporation Verfahren zur Inspektion von Durchkontakt-Stiften in integrierten Schaltungspackungen mittels Photoemission
US5270655A (en) * 1989-12-22 1993-12-14 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit having light emitting devices
US5157334A (en) * 1990-01-22 1992-10-20 Atlantic Richfield Company Image intensifier monitoring of power line insulator leakage
US5124635A (en) * 1990-02-15 1992-06-23 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5039938A (en) * 1990-06-21 1991-08-13 Hughes Aircraft Company Phosphor glow testing of hybrid substrates
US5208531A (en) * 1990-08-13 1993-05-04 Texas Instruments Incorporated Apparatus and method for testing integrated circuits
US5157327A (en) * 1990-09-19 1992-10-20 Photon Dynamics, Inc. Method and apparatus for electro-optically measuring a voltage signal
JPH04158238A (ja) * 1990-10-22 1992-06-01 Ezel Inc 液晶パネルの検査方法
US5285150A (en) * 1990-11-26 1994-02-08 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array
US5216359A (en) * 1991-01-18 1993-06-01 University Of North Carolina Electro-optical method and apparatus for testing integrated circuits
US5150043A (en) * 1991-02-11 1992-09-22 The United States Of America As Represented By The Secretary Of The Navy Apparatus and method for non-contact surface voltage probing by scanning photoelectron emission
US5170127A (en) * 1991-02-19 1992-12-08 Photon Dynamics, Inc. Capacitance imaging system using electro-optics
US5175504A (en) * 1991-06-17 1992-12-29 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5465052A (en) * 1991-09-10 1995-11-07 Photon Dynamics, Inc. Method of testing liquid crystal display substrates
US5459409A (en) * 1991-09-10 1995-10-17 Photon Dynamics, Inc. Testing device for liquid crystal display base plate
US5444385A (en) * 1991-09-10 1995-08-22 Photon Dynamics, Inc. Testing apparatus for liquid crystal display substrates
US5504438A (en) * 1991-09-10 1996-04-02 Photon Dynamics, Inc. Testing method for imaging defects in a liquid crystal display substrate
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates
US5451863A (en) * 1992-10-30 1995-09-19 International Business Machines Corporation Fiber optic probe with a magneto-optic film on an end surface for detecting a current in an integrated circuit
US5301012A (en) * 1992-10-30 1994-04-05 International Business Machines Corporation Optical technique for rapid inspection of via underetch and contamination
US5459404A (en) * 1994-03-28 1995-10-17 Ulsi Technology, Inc. Apparatus and method for detecting floating nodes
JP3787185B2 (ja) * 1995-04-28 2006-06-21 アヴェンティス・リサーチ・ウント・テクノロジーズ・ゲーエムベーハー・ウント・コー・カーゲー 配線基板の配線の欠陥を検出する装置
US5587664A (en) * 1995-07-12 1996-12-24 Exsight Ltd. Laser-induced metallic plasma for non-contact inspection
US5959459A (en) * 1996-12-10 1999-09-28 International Business Machines Corporation Defect monitor and method for automated contactless inline wafer inspection
US6118285A (en) * 1998-01-28 2000-09-12 Probot, Inc Non-contact plasma probe for testing electrical continuity of printed wire boards
US6512385B1 (en) * 1999-07-26 2003-01-28 Paul Pfaff Method for testing a device under test including the interference of two beams
US6528818B1 (en) * 1999-12-14 2003-03-04 Kla-Tencor Test structures and methods for inspection of semiconductor integrated circuits
US7655482B2 (en) * 2000-04-18 2010-02-02 Kla-Tencor Chemical mechanical polishing test structures and methods for inspecting the same
US7733499B2 (en) 2001-12-06 2010-06-08 Attofemto, Inc. Method for optically testing semiconductor devices
US8462350B2 (en) 2001-12-06 2013-06-11 Attofemto, Inc. Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture
US7400411B2 (en) * 2001-12-06 2008-07-15 Attofemto, Inc. Method for optically testing semiconductor devices
US9952161B2 (en) 2001-12-06 2018-04-24 Attofemto, Inc. Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials
US7206078B2 (en) * 2002-05-03 2007-04-17 Attofemto, Inc. Non-destructive testing system using a laser beam
KR100436776B1 (ko) * 2002-01-16 2004-06-23 한국전자통신연구원 전압 분포 감지 센서
US6894518B1 (en) * 2002-03-29 2005-05-17 Advanced Micro Devices, Inc. Circuit analysis and manufacture using electric field-induced effects
JP5013754B2 (ja) * 2005-06-13 2012-08-29 キヤノン株式会社 電磁波検出装置、放射線検出装置、放射線検出システム及びレーザ加工方法
KR101610821B1 (ko) * 2008-05-21 2016-04-20 포톤 다이나믹스, 인코포레이티드 전면 조명을 이용한 디스플레이 패널상의 결함 검출의 향상

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Publication number Priority date Publication date Assignee Title
US3436651A (en) * 1966-12-23 1969-04-01 Texas Instruments Inc Electronic method and apparatus utilizing photoemissive means for testing circuit board continuity
DE2207546A1 (de) * 1972-02-18 1973-08-23 Ibm Deutschland Verfahren zum pruefen des elektrischen durchganges
JPS4823385A (de) * 1971-07-28 1973-03-26
DD100564A1 (de) * 1972-03-01 1973-09-20
DE2824308A1 (de) * 1978-06-02 1979-12-13 Siemens Ag Verfahren zum einpraegen einer spannung mit einem elektronenstrahl
US4415851A (en) * 1981-05-26 1983-11-15 International Business Machines Corporation System for contactless testing of multi-layer ceramics
US4417203A (en) * 1981-05-26 1983-11-22 International Business Machines Corporation System for contactless electrical property testing of multi-layer ceramics
US4507605A (en) * 1982-05-17 1985-03-26 Testamatic, Incorporated Method and apparatus for electrical and optical inspection and testing of unpopulated printed circuit boards and other like items
IL68568A0 (en) * 1983-05-04 1983-09-30 Optrotech Ltd Apparatus and method for automatic inspection of printed circuitboards
WO1984004819A1 (en) * 1983-05-25 1984-12-06 Battelle Memorial Institute Method for inspecting and testing an electric device of the printed or integrated circuit type
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
JPS60206147A (ja) * 1984-03-30 1985-10-17 Toshiba Corp 集積回路の動作試験方法
US4644264A (en) * 1985-03-29 1987-02-17 International Business Machines Corporation Photon assisted tunneling testing of passivated integrated circuits
US4703260A (en) * 1985-09-23 1987-10-27 International Business Machines Corporation Full chip integrated circuit tester
US4733174A (en) * 1986-03-10 1988-03-22 Textronix, Inc. Circuit testing method and apparatus
US4910458A (en) * 1987-03-24 1990-03-20 Princeton Applied Research Corp. Electro-optic sampling system with dedicated electro-optic crystal and removable sample carrier
JPH0830720B2 (ja) * 1987-06-30 1996-03-27 浜松ホトニクス株式会社 電圧検出装置

Also Published As

Publication number Publication date
EP0264482B1 (de) 1991-12-18
JPH0614085B2 (ja) 1994-02-23
EP0264482A1 (de) 1988-04-27
US4868492A (en) 1989-09-19
JPS63115072A (ja) 1988-05-19
US4999577A (en) 1991-03-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee