DE3687536D1 - Nichtzerstoerendes auslesen eines latenten elektrostatischen bildes welches auf isolierendem material gebildet wurde. - Google Patents
Nichtzerstoerendes auslesen eines latenten elektrostatischen bildes welches auf isolierendem material gebildet wurde.Info
- Publication number
- DE3687536D1 DE3687536D1 DE8686301228T DE3687536T DE3687536D1 DE 3687536 D1 DE3687536 D1 DE 3687536D1 DE 8686301228 T DE8686301228 T DE 8686301228T DE 3687536 T DE3687536 T DE 3687536T DE 3687536 D1 DE3687536 D1 DE 3687536D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor material
- insulating material
- layer
- electrostatic image
- latent electrostatic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/28—Measuring radiation intensity with secondary-emission detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/24—Arrangements for measuring quantities of charge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/265—Contactless testing
- G01R31/2656—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/246—Measuring radiation intensity with semiconductor detectors utilizing latent read-out, e.g. charge stored and read-out later
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/054—Apparatus for electrographic processes using a charge pattern using X-rays, e.g. electroradiography
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/22—Apparatus for electrographic processes using a charge pattern involving the combination of more than one step according to groups G03G13/02 - G03G13/20
- G03G15/221—Machines other than electrographic copiers, e.g. electrophotographic cameras, electrostatic typewriters
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G5/00—Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G5/00—Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
- G03G5/02—Charge-receiving layers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/719,725 US4663526A (en) | 1984-12-26 | 1985-04-03 | Nondestructive readout of a latent electrostatic image formed on an insulating material |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3687536D1 true DE3687536D1 (de) | 1993-03-04 |
DE3687536T2 DE3687536T2 (de) | 1993-05-13 |
Family
ID=24891110
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686301228T Expired - Fee Related DE3687536T2 (de) | 1985-04-03 | 1986-02-20 | Nichtzerstoerendes auslesen eines latenten elektrostatischen bildes welches auf isolierendem material gebildet wurde. |
Country Status (9)
Country | Link |
---|---|
US (3) | US4663526A (de) |
EP (1) | EP0200300B1 (de) |
JP (1) | JPS61292069A (de) |
CN (1) | CN1007292B (de) |
AT (1) | ATE84880T1 (de) |
AU (1) | AU595180B2 (de) |
CA (1) | CA1251256A (de) |
DE (1) | DE3687536T2 (de) |
MX (1) | MX161936A (de) |
Families Citing this family (39)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4663526A (en) * | 1984-12-26 | 1987-05-05 | Emil Kamieniecki | Nondestructive readout of a latent electrostatic image formed on an insulating material |
US4833324A (en) * | 1985-04-03 | 1989-05-23 | Optical Diagnostic Systems, Inc. | Nondestructive readout of a latent electrostatic image formed on an insulating material |
CA1276320C (en) * | 1987-12-01 | 1990-11-13 | John Allan Rowlands | System for measuring the charge distribution on a photoreceptor surface |
US5091691A (en) * | 1988-03-21 | 1992-02-25 | Semitest, Inc. | Apparatus for making surface photovoltage measurements of a semiconductor |
US5172163A (en) * | 1989-05-10 | 1992-12-15 | Sanyo Electric Co., Ltd. | Photovoltaic photo-receptor and electrophotographing apparatus |
CZ283018B6 (cs) * | 1991-02-01 | 1997-12-17 | Merck Sharp And Dohme Limited | Deriváty imidazolu, triazolu a tetrazolu a farmaceutické přípravky na jejich bázi |
US5127038A (en) * | 1991-06-28 | 1992-06-30 | E. I. Du Pont De Nemours And Company | Method for capturing and displaying a latent radiographic image |
US5166524A (en) * | 1991-06-28 | 1992-11-24 | E. I. Du Pont De Nemours & Company | Element, device and associated method for capturing a latent radiographic image |
US5168160A (en) * | 1991-06-28 | 1992-12-01 | E. I. Du Pont De Nemours And Company | Method and apparatus for acquiring an electrical signal representing a radiographic image |
US5313066A (en) * | 1992-05-20 | 1994-05-17 | E. I. Du Pont De Nemours And Company | Electronic method and apparatus for acquiring an X-ray image |
US5331179A (en) * | 1993-04-07 | 1994-07-19 | E. I. Du Pont De Nemours And Company | Method and apparatus for acquiring an X-ray image using a thin film transistor array |
US5268569A (en) * | 1992-07-22 | 1993-12-07 | Minnesota Mining And Manufacturing Company | Imaging system having optimized electrode geometry and processing |
US5332893A (en) * | 1992-07-22 | 1994-07-26 | Minnesota Mining And Manufacturing Company | Imaging system and device having a simplified electrode design |
WO1994004963A1 (en) * | 1992-08-14 | 1994-03-03 | E.I. Du Pont De Nemours And Company | Element, device and associated method for capturing a latent radiographic image |
US5340975A (en) * | 1993-01-29 | 1994-08-23 | Minnesota Mining And Manufacturing Company | Method and apparatus for reducing the effects of laser noise and for improving modulation transfer function in scanning a photoconductive surface |
US5587453A (en) * | 1994-02-25 | 1996-12-24 | Mitsubishi Gas Chemical Company, Inc. | Process for purifying methacrylate |
EP0753232A1 (de) * | 1994-03-31 | 1997-01-15 | Imation Corp. | Bildaufnahmesystem mit variabler geometrie der elektrode und verarbeitung |
US5541402A (en) * | 1994-10-17 | 1996-07-30 | At&T Corp. | Imaging active pixel device having a non-destructive read-out gate |
US5661408A (en) * | 1995-03-01 | 1997-08-26 | Qc Solutions, Inc. | Real-time in-line testing of semiconductor wafers |
US5644223A (en) * | 1995-05-12 | 1997-07-01 | International Business Machines Corporation | Uniform density charge deposit source |
US5485091A (en) * | 1995-05-12 | 1996-01-16 | International Business Machines Corporation | Contactless electrical thin oxide measurements |
US5594247A (en) * | 1995-07-07 | 1997-01-14 | Keithley Instruments, Inc. | Apparatus and method for depositing charge on a semiconductor wafer |
US5767693A (en) * | 1996-09-04 | 1998-06-16 | Smithley Instruments, Inc. | Method and apparatus for measurement of mobile charges with a corona screen gun |
EP0898421A3 (de) * | 1997-08-19 | 2001-12-05 | Fuji Photo Film Co., Ltd. | Elektrostatisches Aufnahmeelement, Aufnahme- und Auslesevorrichtung für latente elektrostatische Bilder |
US6060709A (en) * | 1997-12-31 | 2000-05-09 | Verkuil; Roger L. | Apparatus and method for depositing uniform charge on a thin oxide semiconductor wafer |
IL126018A0 (en) | 1998-09-01 | 1999-05-09 | Edge Medical Devices Ltd | X-ray imaging system |
US6388455B1 (en) | 1999-01-13 | 2002-05-14 | Qc Solutions, Inc. | Method and apparatus for simulating a surface photo-voltage in a substrate |
EP1022586A1 (de) * | 1999-01-20 | 2000-07-26 | Edge Medical Devices Ltd. | Bilderzeugungssystem mittels Röntgenstrahlen |
US7663385B2 (en) * | 2002-12-13 | 2010-02-16 | Nanometrics Incorporated | Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor |
US6911350B2 (en) * | 2003-03-28 | 2005-06-28 | Qc Solutions, Inc. | Real-time in-line testing of semiconductor wafers |
JP2007524802A (ja) * | 2003-11-12 | 2007-08-30 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 電気的検証のためのイオン化試験 |
US7119569B2 (en) * | 2004-03-05 | 2006-10-10 | Qc Solutions, Inc. | Real-time in-line testing of semiconductor wafers |
US20060257126A1 (en) * | 2005-05-16 | 2006-11-16 | Wen-Long Chyn | Cooling/heating fan apparatus |
US8314627B2 (en) * | 2006-10-13 | 2012-11-20 | Ricoh Company, Limited | Latent-image measuring device and latent-image carrier |
US7518376B2 (en) * | 2007-02-16 | 2009-04-14 | Xerox Corporation | Electric field probe |
US9423359B2 (en) * | 2013-06-26 | 2016-08-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Wafer charging electromagnetic inspection tool and method of using |
CN103513119B (zh) * | 2013-10-18 | 2016-08-17 | 河北大学 | 静电分选机转辊表面电荷密度分布的测量方法及测量装置 |
CN110927472B (zh) * | 2019-11-04 | 2021-08-03 | 华中科技大学 | 一种不依赖测量的孤立导体电荷控制方法 |
CN116859201B (zh) * | 2023-09-05 | 2023-11-17 | 武汉莱恩输变电设备股份有限公司 | 一种高压输变电绝缘子表面电荷量测量检测装置及其方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3199086A (en) * | 1960-11-25 | 1965-08-03 | Rahn Corp | Devices exhibiting internal polarization and apparatus for and methods of utilizing the same |
DE1281573B (de) * | 1964-12-08 | 1968-10-31 | Kalle Ag | Messsonde zur Bestimmung der oertlichen Ladungsverteilung auf Oberflaechen von Festkoerpern |
NL6919560A (de) * | 1969-01-31 | 1970-08-04 | ||
US3746867A (en) * | 1971-04-19 | 1973-07-17 | Massachusetts Inst Technology | Radiation responsive signal storage device |
US3859527A (en) * | 1973-01-02 | 1975-01-07 | Eastman Kodak Co | Apparatus and method for producing images corresponding to patterns of high energy radiation |
US4176275A (en) * | 1977-08-22 | 1979-11-27 | Minnesota Mining And Manufacturing Company | Radiation imaging and readout system and method utilizing a multi-layered device having a photoconductive insulative layer |
US4296478A (en) * | 1979-10-12 | 1981-10-20 | Rca Corporation | Readout of electrostatically stored information |
US4319284A (en) * | 1979-10-12 | 1982-03-09 | Rca Corporation | Repetitive readout of electrostatically stored information |
DE2948660A1 (de) * | 1979-12-04 | 1981-06-11 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Influenzsondenanordnung und verfahren zu ihrer herstellung |
DE3135933A1 (de) * | 1980-09-26 | 1982-05-19 | Unisearch Ltd., Kensington, New South Wales | Solarzelle und verfahren zu ihrer herstellung |
JPS58199351A (ja) * | 1982-05-17 | 1983-11-19 | Konishiroku Photo Ind Co Ltd | 画像情報記録媒体及び記録読出し方法 |
US4541017A (en) * | 1982-08-02 | 1985-09-10 | Siemens Aktiengesellschaft | Apparatus for contact-free measurement of electrical charge images generated by electro-radiographic recording methods |
DE3235076A1 (de) * | 1982-09-22 | 1984-03-22 | Siemens AG, 1000 Berlin und 8000 München | Aufnahme- und auslesevorrichtung fuer roentgenstrahlen |
US4663526A (en) * | 1984-12-26 | 1987-05-05 | Emil Kamieniecki | Nondestructive readout of a latent electrostatic image formed on an insulating material |
US4833324A (en) * | 1985-04-03 | 1989-05-23 | Optical Diagnostic Systems, Inc. | Nondestructive readout of a latent electrostatic image formed on an insulating material |
-
1985
- 1985-04-03 US US06/719,725 patent/US4663526A/en not_active Expired - Fee Related
-
1986
- 1986-02-05 AU AU53218/86A patent/AU595180B2/en not_active Ceased
- 1986-02-20 DE DE8686301228T patent/DE3687536T2/de not_active Expired - Fee Related
- 1986-02-20 AT AT86301228T patent/ATE84880T1/de not_active IP Right Cessation
- 1986-02-20 EP EP86301228A patent/EP0200300B1/de not_active Expired - Lifetime
- 1986-03-27 CA CA000505461A patent/CA1251256A/en not_active Expired
- 1986-04-01 CN CN86102223A patent/CN1007292B/zh not_active Expired
- 1986-04-03 JP JP61077504A patent/JPS61292069A/ja active Pending
- 1986-04-03 MX MX2076A patent/MX161936A/es unknown
-
1987
- 1987-05-04 US US07/046,562 patent/US4873436A/en not_active Expired - Fee Related
- 1987-05-04 US US07/046,467 patent/US4847496A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
ATE84880T1 (de) | 1993-02-15 |
US4847496A (en) | 1989-07-11 |
EP0200300B1 (de) | 1993-01-20 |
US4873436A (en) | 1989-10-10 |
DE3687536T2 (de) | 1993-05-13 |
US4663526A (en) | 1987-05-05 |
CN86102223A (zh) | 1986-11-05 |
MX161936A (es) | 1991-03-08 |
CA1251256A (en) | 1989-03-14 |
JPS61292069A (ja) | 1986-12-22 |
AU595180B2 (en) | 1990-03-29 |
AU5321886A (en) | 1986-10-16 |
EP0200300A1 (de) | 1986-11-05 |
CN1007292B (zh) | 1990-03-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8339 | Ceased/non-payment of the annual fee |