DE3787587T2 - Formerkennungsverfahren. - Google Patents
Formerkennungsverfahren.Info
- Publication number
- DE3787587T2 DE3787587T2 DE87110311T DE3787587T DE3787587T2 DE 3787587 T2 DE3787587 T2 DE 3787587T2 DE 87110311 T DE87110311 T DE 87110311T DE 3787587 T DE3787587 T DE 3787587T DE 3787587 T2 DE3787587 T2 DE 3787587T2
- Authority
- DE
- Germany
- Prior art keywords
- recognition process
- shape recognition
- shape
- recognition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T1/00—General purpose image data processing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/46—Descriptors for shape, contour or point-related descriptors, e.g. scale invariant feature transform [SIFT] or bags of words [BoW]; Salient regional features
- G06V10/469—Contour-based spatial representations, e.g. vector-coding
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/46—Descriptors for shape, contour or point-related descriptors, e.g. scale invariant feature transform [SIFT] or bags of words [BoW]; Salient regional features
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61168347A JPH065545B2 (ja) | 1986-07-17 | 1986-07-17 | 図形認識装置 |
JP61170038A JP2506673B2 (ja) | 1986-07-18 | 1986-07-18 | 電子部品のリ−ド認識装置 |
JP61237352A JPS6391779A (ja) | 1986-10-06 | 1986-10-06 | 部品認識装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3787587D1 DE3787587D1 (de) | 1993-11-04 |
DE3787587T2 true DE3787587T2 (de) | 1994-01-27 |
Family
ID=27322984
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE87110311T Expired - Fee Related DE3787587T2 (de) | 1986-07-17 | 1987-07-16 | Formerkennungsverfahren. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4845764A (de) |
EP (1) | EP0253397B1 (de) |
KR (1) | KR920004956B1 (de) |
DE (1) | DE3787587T2 (de) |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5189707A (en) * | 1985-10-11 | 1993-02-23 | Hitachi, Ltd. | Method of loading surface mounted device and an apparatus therefor |
JPH01249181A (ja) * | 1988-03-31 | 1989-10-04 | Tdk Corp | チップ部品自動外観選別機における部品仕分け方法 |
ES2007960A6 (es) * | 1988-07-12 | 1989-07-01 | Ona Electro Erosion | Sistema de generacion en dos dimensiones de la geometria de un modelo por medio de vision artificial. |
GB2230886A (en) * | 1989-04-29 | 1990-10-31 | Marconi Gec Ltd | Recognition of shapes |
JP2552728B2 (ja) * | 1989-05-31 | 1996-11-13 | 富士通株式会社 | 赤外線監視システム |
JPH083405B2 (ja) * | 1989-06-30 | 1996-01-17 | 松下電器産業株式会社 | リード位置認識装置 |
ATE152824T1 (de) * | 1990-02-23 | 1997-05-15 | Amada Co Ltd | Verfahren und gerät zur messung des winkels eines werkstücks |
US5137362A (en) * | 1990-03-26 | 1992-08-11 | Motorola, Inc. | Automatic package inspection method |
US5471407A (en) * | 1992-03-31 | 1995-11-28 | Matsushita Electric Industrial Co., Ltd. | Method of detecting longitudinal direction of inspection object and identifying configuration of the same |
JP2851022B2 (ja) * | 1992-06-09 | 1999-01-27 | 株式会社鷹山 | Icの傾き検査方法 |
FR2698192B1 (fr) * | 1992-11-16 | 1995-09-08 | Ona Electro Erosion | Système de génération en deux dimensions de la géométrie d'un modèle par vision artificielle. |
US5638462A (en) * | 1993-12-24 | 1997-06-10 | Nec Corporation | Method and apparatus for recognizing graphic forms on the basis of elevation angle data associated with sequence of points constituting the graphic form |
DE4443728C1 (de) * | 1994-12-08 | 1996-04-04 | Kronseder Maschf Krones | Verfahren zur Bestimmung der Form eines Körpers |
US5807042A (en) * | 1995-06-07 | 1998-09-15 | Almblad; Robert | Method and apparatus for automatically making keys |
US6065911A (en) * | 1994-12-22 | 2000-05-23 | Almblad; Robert | Method and apparatus for automatically making keys |
JPH08240536A (ja) * | 1995-01-03 | 1996-09-17 | Texas Instr Inc <Ti> | 集積回路のリードのバリを検査する方法および装置 |
US6188784B1 (en) | 1996-07-12 | 2001-02-13 | American Tech Manufacturing, Inc. | Split optics arrangement for vision inspection/sorter module |
US6330354B1 (en) * | 1997-05-01 | 2001-12-11 | International Business Machines Corporation | Method of analyzing visual inspection image data to find defects on a device |
KR100457064B1 (ko) * | 1997-11-13 | 2005-05-27 | 주식회사 대우일렉트로닉스 | 윤곽선정보검출방법 |
US6526165B1 (en) * | 1998-11-30 | 2003-02-25 | Cognex Corporation | Methods and apparatuses for refining a geometric description of an object having a plurality of extensions |
US6453062B1 (en) * | 1999-04-28 | 2002-09-17 | Sulzer Carbomedics Inc. | Final assembly visual inspection system for packaged heart valves |
US6898333B1 (en) | 1999-08-06 | 2005-05-24 | Cognex Corporation | Methods and apparatus for determining the orientation of an object in an image |
US6813377B1 (en) * | 1999-08-06 | 2004-11-02 | Cognex Corporation | Methods and apparatuses for generating a model of an object from an image of the object |
JP3877501B2 (ja) * | 2000-07-07 | 2007-02-07 | 松下電器産業株式会社 | 部品認識データ作成方法及び作成装置並びに電子部品実装装置及び記録媒体 |
US6836553B2 (en) * | 2000-07-25 | 2004-12-28 | The Hillman Group, Inc. | Key identification system |
US6839449B1 (en) | 2000-07-25 | 2005-01-04 | The Hillman Group, Inc. | Key identification system |
US6754387B1 (en) * | 2000-09-21 | 2004-06-22 | International Business Machines Corporation | Systems, method and program product for pattern information processing |
US6985631B2 (en) * | 2002-02-20 | 2006-01-10 | Hewlett-Packard Development Company, L.P. | Systems and methods for automatically detecting a corner in a digitally captured image |
JP4189654B2 (ja) * | 2003-04-18 | 2008-12-03 | セイコーエプソン株式会社 | 画像処理装置 |
WO2007087389A2 (en) | 2006-01-23 | 2007-08-02 | Hy-Ko Products Company | Key duplication machine |
US9101990B2 (en) | 2006-01-23 | 2015-08-11 | Hy-Ko Products | Key duplication machine |
US8634655B2 (en) | 2009-05-01 | 2014-01-21 | Hy-Ko Products Company | Key blank identification system with bitting analysis |
WO2010127352A2 (en) | 2009-05-01 | 2010-11-04 | Hy-Ko Products | Key blank identification system with groove scanning |
DE102011054452A1 (de) * | 2011-10-13 | 2013-04-18 | How To Organize (H2O) Gmbh | Vorrichtung und Verfahren zum Zusammenstellen von Instrumentensets |
US9818041B2 (en) | 2015-08-03 | 2017-11-14 | Hy-Ko Products Company | High security key scanning system |
US11265292B1 (en) * | 2019-01-28 | 2022-03-01 | Amazon Technologies, Inc. | Graph based management of virtualized infrastructures |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4183013A (en) * | 1976-11-29 | 1980-01-08 | Coulter Electronics, Inc. | System for extracting shape features from an image |
EP0040682B1 (de) * | 1980-05-27 | 1987-03-25 | Texas Instruments Incorporated | Didaktische Anordnung, wie z.B. Puppe mit simulierter Sicht und Stimme |
GB2108306B (en) * | 1981-10-16 | 1985-05-15 | Tokyo Shibaura Electric Co | Pattern recognition apparatus and method |
DE3381833D1 (de) * | 1982-03-31 | 1990-10-04 | Gen Electric | Verfahren und geraet zur sehbildverarbeitung und zur eckpunktsortierung in einem sehbild-verarbeitungssystem. |
US4493105A (en) * | 1982-03-31 | 1985-01-08 | General Electric Company | Method and apparatus for visual image processing |
US4490848A (en) * | 1982-03-31 | 1984-12-25 | General Electric Company | Method and apparatus for sorting corner points in a visual image processing system |
US4747153A (en) * | 1984-03-08 | 1988-05-24 | Japan As Represented By Director General Of Agency Of Industrial Science And Technology | Device and method for pattern recognition |
JPS6140684A (ja) * | 1984-07-31 | 1986-02-26 | Omron Tateisi Electronics Co | 輪郭追跡装置 |
-
1987
- 1987-07-16 EP EP87110311A patent/EP0253397B1/de not_active Expired - Lifetime
- 1987-07-16 DE DE87110311T patent/DE3787587T2/de not_active Expired - Fee Related
- 1987-07-16 US US07/074,186 patent/US4845764A/en not_active Expired - Lifetime
- 1987-07-18 KR KR1019870007792A patent/KR920004956B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR920004956B1 (ko) | 1992-06-22 |
EP0253397B1 (de) | 1993-09-29 |
US4845764A (en) | 1989-07-04 |
DE3787587D1 (de) | 1993-11-04 |
EP0253397A3 (en) | 1990-05-30 |
EP0253397A2 (de) | 1988-01-20 |
KR880002095A (ko) | 1988-04-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: GROSSE, BOCKHORNI, SCHUMACHER, 81476 MUENCHEN |
|
8339 | Ceased/non-payment of the annual fee |