DE3888301D1 - Digitalschaltungsprüfgerät. - Google Patents

Digitalschaltungsprüfgerät.

Info

Publication number
DE3888301D1
DE3888301D1 DE88119504T DE3888301T DE3888301D1 DE 3888301 D1 DE3888301 D1 DE 3888301D1 DE 88119504 T DE88119504 T DE 88119504T DE 3888301 T DE3888301 T DE 3888301T DE 3888301 D1 DE3888301 D1 DE 3888301D1
Authority
DE
Germany
Prior art keywords
signal
expected value
logical
test channel
comparators
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE88119504T
Other languages
English (en)
Other versions
DE3888301T2 (de
Inventor
Kazuhiko Sato
Junji Nishiura
Keiichi Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of DE3888301D1 publication Critical patent/DE3888301D1/de
Publication of DE3888301T2 publication Critical patent/DE3888301T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
DE3888301T 1987-11-24 1988-11-23 Digitalschaltungsprüfgerät. Expired - Lifetime DE3888301T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62296995A JP2604606B2 (ja) 1987-11-24 1987-11-24 回路試験装置

Publications (2)

Publication Number Publication Date
DE3888301D1 true DE3888301D1 (de) 1994-04-14
DE3888301T2 DE3888301T2 (de) 1994-07-28

Family

ID=17840890

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3888301T Expired - Lifetime DE3888301T2 (de) 1987-11-24 1988-11-23 Digitalschaltungsprüfgerät.

Country Status (4)

Country Link
US (1) US4862071A (de)
EP (1) EP0318814B1 (de)
JP (1) JP2604606B2 (de)
DE (1) DE3888301T2 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5107501A (en) * 1990-04-02 1992-04-21 At&T Bell Laboratories Built-in self-test technique for content-addressable memories
JP2803311B2 (ja) * 1990-04-09 1998-09-24 住友化学工業株式会社 熱可塑性エラストマー組成物
JP2608168B2 (ja) * 1990-08-31 1997-05-07 三菱電機株式会社 半導体試験装置
JP2760157B2 (ja) * 1991-01-23 1998-05-28 日本電気株式会社 Ｌｓｉテスト方法
JPH04118678U (ja) * 1991-04-03 1992-10-23 株式会社アドバンテスト Ｉｃ試験装置の論理比較装置
US5471153A (en) * 1991-04-26 1995-11-28 Vlsi Technologies, Inc. Methods and circuits for testing open collectors and open drains
DE4128301A1 (de) * 1991-08-27 1993-03-11 Kirk Gustav Elektrische beleuchtung
US5579251A (en) * 1992-03-31 1996-11-26 Advantest Corporation IC tester
US5486753A (en) * 1993-07-30 1996-01-23 Genrad, Inc. Simultaneous capacitive open-circuit testing
JPH0764817A (ja) * 1993-08-30 1995-03-10 Mitsubishi Electric Corp 故障検出システム
CA2159036C (en) * 1994-12-29 1999-01-26 Miron Abramovici Method for identifying untestable & redundant faults in sequential logic circuits
JP2953975B2 (ja) * 1995-02-09 1999-09-27 日本電気アイシーマイコンシステム株式会社 テストパタン生成装置およびテストパタン生成方法
SE504455C2 (sv) 1995-07-10 1997-02-17 Borealis Polymers Oy Kabelmantlingskomposition, dess användning samt sätt för dess framställning
US5969538A (en) 1996-10-31 1999-10-19 Texas Instruments Incorporated Semiconductor wafer with interconnect between dies for testing and a process of testing
US5732047A (en) * 1995-12-12 1998-03-24 Advantest Corporation Timing comparator circuit for use in device testing apparatus
JPH11101850A (ja) * 1997-09-26 1999-04-13 Ando Electric Co Ltd Ｉｃ試験装置
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US6329833B1 (en) * 1999-02-24 2001-12-11 Xilinx, Inc. System and method for automatically measuring input voltage levels for integrated circuits
US6693436B1 (en) * 1999-12-23 2004-02-17 Intel Corporation Method and apparatus for testing an integrated circuit having an output-to-output relative signal
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
DE60103361T2 (de) * 2001-03-16 2005-06-09 Agilent Technologies Inc., A Delaware Corp., Palo Alto Bitfehlerratenmessung
JP4839638B2 (ja) * 2005-03-07 2011-12-21 横河電機株式会社 テスタシミュレーション装置及びテストシミュレーション方法
US9401222B1 (en) * 2015-11-23 2016-07-26 International Business Machines Corporation Determining categories for memory fail conditions
US11695283B2 (en) * 2018-05-11 2023-07-04 Texas Instruments Incorporated Shoot-through current limiting circuit

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3541441A (en) * 1969-02-17 1970-11-17 Ibm Test system for evaluating amplitude and response characteristics of logic circuits
GB1278694A (en) * 1969-07-04 1972-06-21 Sperry Rand Corp Improvements in or relating to apparatus for testing electronic circuits
US4414665A (en) * 1979-11-21 1983-11-08 Nippon Telegraph & Telephone Public Corp. Semiconductor memory device test apparatus
US4510603A (en) * 1981-05-26 1985-04-09 Burroughs Corporation Testing system for reliable access times in ROM semiconductor memories
JPS58773A (ja) * 1981-06-25 1983-01-05 Nec Corp 集積回路検査装置
JPS59152598A (ja) * 1983-02-21 1984-08-31 Hitachi Ltd 試験結果の取込み装置
JPS61284676A (ja) * 1985-06-12 1986-12-15 Hitachi Ltd 論理値比較判定回路
DE3685078D1 (de) * 1985-09-09 1992-06-04 Hitachi Ltd Speicherpruefgeraet.

Also Published As

Publication number Publication date
US4862071A (en) 1989-08-29
EP0318814A3 (en) 1990-10-31
DE3888301T2 (de) 1994-07-28
JPH01138477A (ja) 1989-05-31
EP0318814A2 (de) 1989-06-07
JP2604606B2 (ja) 1997-04-30
EP0318814B1 (de) 1994-03-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Free format text: HOFFMANN, E., DIPL.-ING., PAT.-ANW., 82166 GRAEFELFING