DE50204916D1 - Optisches Abbildungssystem mit Polarisationsmitteln - Google Patents

Optisches Abbildungssystem mit Polarisationsmitteln

Info

Publication number
DE50204916D1
DE50204916D1 DE50204916T DE50204916T DE50204916D1 DE 50204916 D1 DE50204916 D1 DE 50204916D1 DE 50204916 T DE50204916 T DE 50204916T DE 50204916 T DE50204916 T DE 50204916T DE 50204916 D1 DE50204916 D1 DE 50204916D1
Authority
DE
Germany
Prior art keywords
imaging system
optical imaging
polarizing means
polarizing
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE50204916T
Other languages
English (en)
Inventor
Dr Gerhard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss SMT GmbH
Original Assignee
Carl Zeiss SMT GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss SMT GmbH filed Critical Carl Zeiss SMT GmbH
Priority to DE50204916T priority Critical patent/DE50204916D1/de
Application granted granted Critical
Publication of DE50204916D1 publication Critical patent/DE50204916D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
    • G03F7/70566—Polarisation control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00—Optical objectives specially designed for the purposes specified below
    • G02B13/14—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation
    • G02B13/143—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation for use with ultraviolet radiation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/286—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising for controlling or changing the state of polarisation, e.g. transforming one polarisation state into another
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B27/00—Photographic printing apparatus
    • G03B27/72—Controlling or varying light intensity, spectral composition, or exposure time in photographic printing apparatus
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70241—Optical aspects of refractive lens systems, i.e. comprising only refractive elements
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
    • G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
    • G03F7/70966—Birefringence
DE50204916T 2001-05-15 2002-04-19 Optisches Abbildungssystem mit Polarisationsmitteln Expired - Fee Related DE50204916D1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE50204916T DE50204916D1 (de) 2001-05-15 2002-04-19 Optisches Abbildungssystem mit Polarisationsmitteln

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10124566A DE10124566A1 (de) 2001-05-15 2001-05-15 Optisches Abbildungssystem mit Polarisationsmitteln und Quarzkristallplatte hierfür
DE50204916T DE50204916D1 (de) 2001-05-15 2002-04-19 Optisches Abbildungssystem mit Polarisationsmitteln

Publications (1)

Publication Number Publication Date
DE50204916D1 true DE50204916D1 (de) 2005-12-22

Family

ID=7685481

Family Applications (2)

Application Number Title Priority Date Filing Date
DE10124566A Withdrawn DE10124566A1 (de) 2001-05-15 2001-05-15 Optisches Abbildungssystem mit Polarisationsmitteln und Quarzkristallplatte hierfür
DE50204916T Expired - Fee Related DE50204916D1 (de) 2001-05-15 2002-04-19 Optisches Abbildungssystem mit Polarisationsmitteln

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE10124566A Withdrawn DE10124566A1 (de) 2001-05-15 2001-05-15 Optisches Abbildungssystem mit Polarisationsmitteln und Quarzkristallplatte hierfür

Country Status (6)

Country Link
US (5) US6774984B2 (de)
EP (1) EP1258780B1 (de)
JP (1) JP2003059821A (de)
KR (1) KR20020087353A (de)
DE (2) DE10124566A1 (de)
TW (1) TWI243966B (de)

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US6417168B1 (en) 1998-03-04 2002-07-09 The Trustees Of The University Of Pennsylvania Compositions and methods of treating tumors
DE10124566A1 (de) * 2001-05-15 2002-11-21 Zeiss Carl Optisches Abbildungssystem mit Polarisationsmitteln und Quarzkristallplatte hierfür
DE10302765A1 (de) * 2003-01-24 2004-07-29 Carl Zeiss Smt Ag Optische Anordnung mit Linse aus einachsig doppelbrechendem Material
KR101484435B1 (ko) 2003-04-09 2015-01-19 가부시키가이샤 니콘 노광 방법 및 장치, 그리고 디바이스 제조 방법
TWI569308B (zh) 2003-10-28 2017-02-01 尼康股份有限公司 照明光學裝置、曝光裝置、曝光方法以及元件製造 方法
TWI612338B (zh) 2003-11-20 2018-01-21 尼康股份有限公司 光學照明裝置、曝光裝置、曝光方法、以及元件製造方法
EP1716457B9 (de) 2004-01-16 2012-04-04 Carl Zeiss SMT GmbH Projektionssystem mit einem polarisationsmodulierenden optischen Element mit variabler Dicke
US8270077B2 (en) 2004-01-16 2012-09-18 Carl Zeiss Smt Gmbh Polarization-modulating optical element
US20070019179A1 (en) * 2004-01-16 2007-01-25 Damian Fiolka Polarization-modulating optical element
TWI395068B (zh) 2004-01-27 2013-05-01 尼康股份有限公司 光學系統、曝光裝置以及曝光方法
JP4752702B2 (ja) * 2004-02-06 2011-08-17 株式会社ニコン 照明光学装置、露光装置、およびデバイス製造方法
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WO2005091077A2 (de) * 2004-02-20 2005-09-29 Carl Zeiss Smt Ag Projektionsobjektiv einer mikrolithographischen projektionsbelichtungsanlage
US7304719B2 (en) * 2004-03-31 2007-12-04 Asml Holding N.V. Patterned grid element polarizer
EP1586946A3 (de) * 2004-04-14 2007-01-17 Carl Zeiss SMT AG Optisches System eines Projektions-Mikrolithographie Apparats
US7324280B2 (en) 2004-05-25 2008-01-29 Asml Holding N.V. Apparatus for providing a pattern of polarization
DE102005030543A1 (de) * 2004-07-08 2006-02-02 Carl Zeiss Smt Ag Polarisatoreinrichtung zur Erzeugung einer definierten Ortsverteilung von Polarisationszuständen
DE102004037346B4 (de) * 2004-08-02 2006-11-23 Infineon Technologies Ag Lithographie-Anordnung und Verfahren zum Herstellen einer Lithographie-Anordnung
US7271874B2 (en) * 2004-11-02 2007-09-18 Asml Holding N.V. Method and apparatus for variable polarization control in a lithography system
US7324185B2 (en) 2005-03-04 2008-01-29 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8248577B2 (en) 2005-05-03 2012-08-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
KR101544336B1 (ko) 2005-05-12 2015-08-12 가부시키가이샤 니콘 투영 광학계, 노광 장치 및 노광 방법
JP2007258575A (ja) * 2006-03-24 2007-10-04 Canon Inc 照明装置、当該照明装置を有する露光装置及びデバイス製造方法
JP4827181B2 (ja) * 2006-08-29 2011-11-30 オリンパス株式会社 撮像装置
DE102007027985A1 (de) * 2006-12-21 2008-06-26 Carl Zeiss Smt Ag Optisches System, insbesondere Beleuchtungseinrichtung oder Projektionsobjektiv einer mikrolithographischen Projektionsbelichtungsanlage
DE102007031691A1 (de) 2007-07-06 2009-01-08 Carl Zeiss Smt Ag Verfahren zum Betreiben einer Mikrolithographischen Projektionsbelichtunganlagen
US7817250B2 (en) * 2007-07-18 2010-10-19 Carl Zeiss Smt Ag Microlithographic projection exposure apparatus
JP5267029B2 (ja) 2007-10-12 2013-08-21 株式会社ニコン 照明光学装置、露光装置及びデバイスの製造方法
US8379187B2 (en) 2007-10-24 2013-02-19 Nikon Corporation Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method
US9116346B2 (en) 2007-11-06 2015-08-25 Nikon Corporation Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method
DE102008043321A1 (de) 2008-01-17 2009-07-23 Carl Zeiss Smt Ag Optisches System einer mikrolithographischen Projektionsbelichtungsanlage
US8284506B2 (en) 2008-10-21 2012-10-09 Gentex Corporation Apparatus and method for making and assembling a multi-lens optical device
JP6080349B2 (ja) * 2010-11-26 2017-02-15 キヤノン株式会社 光学部材および撮像装置
DE102011079548A1 (de) 2011-07-21 2012-07-19 Carl Zeiss Smt Gmbh Mikrolithographische Projektionsbelichtungsanlage sowie mikrolithographisches Belichtungsverfahren
DE102012200368A1 (de) 2012-01-12 2013-07-18 Carl Zeiss Smt Gmbh Polarisationsbeeinflussende optische Anordnung, insbesondere in einer mikrolithographischen Projektionsbelichtungsanlage
DE102012212864A1 (de) 2012-07-23 2013-08-22 Carl Zeiss Smt Gmbh Optisches System, insbesondere einer mikrolithographischen Projektionsbelichtungsanlage
TWI758891B (zh) * 2020-09-30 2022-03-21 國立成功大學 濃度感測系統與方法

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Also Published As

Publication number Publication date
US20080186469A1 (en) 2008-08-07
US7961298B2 (en) 2011-06-14
JP2003059821A (ja) 2003-02-28
KR20020087353A (ko) 2002-11-22
DE10124566A1 (de) 2002-11-21
US20070139636A1 (en) 2007-06-21
US7199864B2 (en) 2007-04-03
EP1258780A3 (de) 2004-02-04
US20040240073A1 (en) 2004-12-02
EP1258780B1 (de) 2005-11-16
US6774984B2 (en) 2004-08-10
US20060119826A1 (en) 2006-06-08
EP1258780A2 (de) 2002-11-20
US20020186462A1 (en) 2002-12-12
TWI243966B (en) 2005-11-21

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Legal Events

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee