DE60019219D1 - Verfahren zur kalibrierung eines scan-systems - Google Patents

Verfahren zur kalibrierung eines scan-systems

Info

Publication number
DE60019219D1
DE60019219D1 DE60019219T DE60019219T DE60019219D1 DE 60019219 D1 DE60019219 D1 DE 60019219D1 DE 60019219 T DE60019219 T DE 60019219T DE 60019219 T DE60019219 T DE 60019219T DE 60019219 D1 DE60019219 D1 DE 60019219D1
Authority
DE
Germany
Prior art keywords
calibrating
scan system
scan
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60019219T
Other languages
English (en)
Other versions
DE60019219T2 (de
Inventor
Roberts Mcmurtry
Tennant Sutherland
Allan Wright
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renishaw PLC filed Critical Renishaw PLC
Application granted granted Critical
Publication of DE60019219D1 publication Critical patent/DE60019219D1/de
Publication of DE60019219T2 publication Critical patent/DE60019219T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
DE60019219T 1999-04-08 2000-04-07 Verfahren zur kalibrierung eines scan-systems Expired - Lifetime DE60019219T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB9907868.5A GB9907868D0 (en) 1999-04-08 1999-04-08 Method of calibrating a scanning system
GB9907868 1999-04-08
PCT/GB2000/001315 WO2000062015A1 (en) 1999-04-08 2000-04-07 Method of calibrating a scanning system

Publications (2)

Publication Number Publication Date
DE60019219D1 true DE60019219D1 (de) 2005-05-12
DE60019219T2 DE60019219T2 (de) 2005-09-22

Family

ID=10851041

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60019219T Expired - Lifetime DE60019219T2 (de) 1999-04-08 2000-04-07 Verfahren zur kalibrierung eines scan-systems

Country Status (6)

Country Link
US (2) US6434846B1 (de)
EP (1) EP1086356B1 (de)
JP (1) JP5042409B2 (de)
DE (1) DE60019219T2 (de)
GB (1) GB9907868D0 (de)
WO (1) WO2000062015A1 (de)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9907868D0 (en) * 1999-04-08 1999-06-02 Renishaw Plc Method of calibrating a scanning system
US6810597B2 (en) * 1999-04-08 2004-11-02 Renishaw Plc Use of surface measuring probes
JP4660779B2 (ja) * 2000-08-18 2011-03-30 学校法人 中央大学 移動装置の位置誤差評価方法およびその評価結果に基づく移動精度向上方法
GB0106245D0 (en) * 2001-03-14 2001-05-02 Renishaw Plc Calibration of an analogue probe
GB0126232D0 (en) * 2001-11-01 2002-01-02 Renishaw Plc Calibration of an analogue probe
DE10207228A1 (de) * 2002-02-21 2003-09-04 Bosch Gmbh Robert Verfahren zur Kalibrierung eines Sensors und Schaltungsanordnung zum Betreiben eines Sensors
GB0205332D0 (en) * 2002-03-06 2002-04-17 Renishaw Plc Dynamic artefact comparison
GB0215478D0 (en) * 2002-07-04 2002-08-14 Renishaw Plc Method of scanning a calibrating system
US6895682B2 (en) * 2002-11-08 2005-05-24 North Carolina State University Polar coordinate-based profilometer and methods
GB0228371D0 (en) * 2002-12-05 2003-01-08 Leland E C E Workpiece inspection method
US6721675B1 (en) * 2003-01-31 2004-04-13 The Boeing Company Machine capability verification and diagnostics (CAP/DIA) system, method and computer program product
DE10327867A1 (de) * 2003-05-28 2004-12-16 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zur Kalibrierung eines Tasters
EP1627203B1 (de) * 2003-05-28 2014-11-26 Carl Zeiss Industrielle Messtechnik GmbH Verfahren zur kalibrierung eines tasters
GB0322115D0 (en) * 2003-09-22 2003-10-22 Renishaw Plc Method of error compensation
US6948254B2 (en) * 2003-10-27 2005-09-27 Micronic Laser Systems Ab Method for calibration of a metrology stage
US7543393B2 (en) 2003-12-16 2009-06-09 Renishaw Plc Method of calibrating a scanning system
GB0329098D0 (en) 2003-12-16 2004-01-21 Renishaw Plc Method of calibrating a scanning system
GB0417536D0 (en) * 2004-08-06 2004-09-08 Renishaw Plc The use of surface measurement probes
DE102006019382A1 (de) * 2006-04-24 2007-10-25 Carl Zeiss Industrielle Messtechnik Gmbh Scanning einer Oberfläche mit einem Koordinatenmessgerät
GB0608235D0 (en) * 2006-04-26 2006-06-07 Renishaw Plc Differential calibration
GB0611109D0 (en) * 2006-06-06 2006-07-19 Renishaw Plc A method for measuring workpieces
US7735234B2 (en) * 2006-08-31 2010-06-15 Faro Technologies, Inc. Smart probe
GB0703423D0 (en) * 2007-02-22 2007-04-04 Renishaw Plc Calibration method and apparatus
GB0707720D0 (en) * 2007-04-23 2007-05-30 Renishaw Plc Apparatus and method for controlling or programming a measurement routine
GB0707921D0 (en) 2007-04-24 2007-05-30 Renishaw Plc Apparatus and method for surface measurement
GB0716218D0 (en) 2007-08-20 2007-09-26 Renishaw Plc Measurement path generation
US7712224B2 (en) * 2007-10-03 2010-05-11 Hexagon Metrology Ab Validating the error map of CMM using calibrated probe
JP4653824B2 (ja) * 2008-07-29 2011-03-16 ファナック株式会社 機上計測装置にて計測対象物の形状を計測する工作機械システム
DE102008049751A1 (de) * 2008-10-01 2010-04-08 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zum Vermessen eines Werkstücks, Kalibrierverfahren sowie Koordinatenmessgerät
US9689655B2 (en) 2008-10-29 2017-06-27 Renishaw Plc Measurement method
GB0901040D0 (en) * 2009-01-22 2009-03-11 Renishaw Plc Optical measuring method and system
GB201003599D0 (en) * 2010-03-04 2010-04-21 Renishaw Plc Measurement method and apparatus
EP2492635B1 (de) * 2011-02-22 2013-05-29 Siemens Aktiengesellschaft Kalibrierverfahren für einen kugelförmigen Messtaster
GB201113715D0 (en) 2011-08-09 2011-09-21 Renishaw Plc Method and apparatus for inspecting workpieces
CN103175489A (zh) * 2011-12-21 2013-06-26 鸿富锦精密工业（深圳）有限公司 探针回弹方向确定系统及方法
GB201204947D0 (en) * 2012-03-21 2012-05-02 Renishaw Plc Method and apparatus for inspecting workpieces
JP2014130091A (ja) * 2012-12-28 2014-07-10 Canon Inc 測定装置および測定方法
US10955238B1 (en) * 2013-03-15 2021-03-23 Kerr Machine Co. In-process automatic recalibration
GB201308467D0 (en) 2013-05-10 2013-06-19 Renishaw Plc Method and Apparatus for Inspecting Workpieces
GB201311600D0 (en) * 2013-06-28 2013-08-14 Renishaw Plc Calibration of a contact probe
EP3051253B1 (de) * 2015-02-02 2018-08-22 Rolls-Royce North American Technologies, Inc. Mehrachsiger kalibrierungskörper
JP6484108B2 (ja) * 2015-05-22 2019-03-13 株式会社ミツトヨ 形状測定装置の制御方法
CN109964098B (zh) 2016-11-16 2022-10-14 瑞尼斯豪公司 坐标定位设备以及操作方法
CN113188493B (zh) * 2021-03-31 2022-04-08 成都飞机工业（集团）有限责任公司 一种确定在线测量点位的测量轨迹的方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3986007A (en) * 1975-08-20 1976-10-12 The Bendix Corporation Method and apparatus for calibrating mechanical-visual part manipulating system
US4523450A (en) * 1981-11-07 1985-06-18 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method of calibrating probe pins on multicoordinate measurement machines
GB8713715D0 (en) 1987-06-11 1987-07-15 Renishaw Plc Workpiece inspection method
US4939678A (en) * 1987-11-19 1990-07-03 Brown & Sharpe Manufacturing Company Method for calibration of coordinate measuring machine
DE69211210T2 (de) * 1991-04-12 1996-10-10 Renishaw Transducer Syst Kalibriervorrichtung für Maschine
GB9224335D0 (en) * 1992-11-20 1993-01-13 Renishaw Metrology Ltd A method of measuring workpieces using a surface contacting measuring probe
DE4326551C2 (de) * 1993-08-07 1997-04-17 Heidenhain Gmbh Dr Johannes Kalibrier-Verfahren zum Ermitteln und Kompensieren unterschiedlicher Antastkraft-Verhältnisse bei Mehrkoordinaten-Tastsystemen
DE4436507A1 (de) 1994-10-13 1996-04-18 Zeiss Carl Fa Verfahren zur Koordinatenmessung an Werkstücken
US6161079A (en) * 1997-08-18 2000-12-12 Giddings & Lewis, Llc Method and apparatus for determining tolerance and nominal measurement values for a coordinate measuring machine
GB9907868D0 (en) * 1999-04-08 1999-06-02 Renishaw Plc Method of calibrating a scanning system

Also Published As

Publication number Publication date
EP1086356B1 (de) 2005-04-06
US20020174555A1 (en) 2002-11-28
DE60019219T2 (de) 2005-09-22
EP1086356A1 (de) 2001-03-28
JP2002541469A (ja) 2002-12-03
US6601311B2 (en) 2003-08-05
JP5042409B2 (ja) 2012-10-03
WO2000062015A1 (en) 2000-10-19
GB9907868D0 (en) 1999-06-02
US6434846B1 (en) 2002-08-20

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