DE60025524D1 - Verfahren und vorrichtung zum korrigieren systematischer fehler in einem wellenlängenmessgerät - Google Patents

Verfahren und vorrichtung zum korrigieren systematischer fehler in einem wellenlängenmessgerät

Info

Publication number
DE60025524D1
DE60025524D1 DE60025524T DE60025524T DE60025524D1 DE 60025524 D1 DE60025524 D1 DE 60025524D1 DE 60025524 T DE60025524 T DE 60025524T DE 60025524 T DE60025524 T DE 60025524T DE 60025524 D1 DE60025524 D1 DE 60025524D1
Authority
DE
Germany
Prior art keywords
wave length
length measurement
systematic errors
measurement device
correcting systematic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60025524T
Other languages
English (en)
Inventor
A Davis
R Fournier
G Bellemore
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Weatherford Lamb Inc
Original Assignee
Weatherford Lamb Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Weatherford Lamb Inc filed Critical Weatherford Lamb Inc
Application granted granted Critical
Publication of DE60025524D1 publication Critical patent/DE60025524D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/18—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors using comparison with a reference electric value
DE60025524T 1999-11-23 2000-11-13 Verfahren und vorrichtung zum korrigieren systematischer fehler in einem wellenlängenmessgerät Expired - Lifetime DE60025524D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/448,003 US6403949B1 (en) 1999-11-23 1999-11-23 Method and apparatus for correcting systematic error in a wavelength measuring device
PCT/US2000/031057 WO2001038837A1 (en) 1999-11-23 2000-11-13 Method and apparatus for correcting systematic error in a wavelength measuring device

Publications (1)

Publication Number Publication Date
DE60025524D1 true DE60025524D1 (de) 2006-04-06

Family

ID=23778633

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60025524T Expired - Lifetime DE60025524D1 (de) 1999-11-23 2000-11-13 Verfahren und vorrichtung zum korrigieren systematischer fehler in einem wellenlängenmessgerät

Country Status (7)

Country Link
US (1) US6403949B1 (de)
EP (1) EP1236026B1 (de)
AU (1) AU1599901A (de)
CA (1) CA2391395C (de)
DE (1) DE60025524D1 (de)
NO (1) NO335932B1 (de)
WO (1) WO2001038837A1 (de)

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JP3829910B2 (ja) * 2000-06-29 2006-10-04 横河電機株式会社 波長多重信号光の解析方法及びその装置
US7180601B1 (en) * 2000-11-01 2007-02-20 Cidra Corporation Optical system featuring chirped Bragg grating etalon for providing precise reference wavelengths
US6947637B2 (en) * 2001-08-09 2005-09-20 Corning Incorporated Measurement of fiber strain during processing
US6915686B2 (en) 2003-02-11 2005-07-12 Optoplan A.S. Downhole sub for instrumentation
US7159653B2 (en) 2003-02-27 2007-01-09 Weatherford/Lamb, Inc. Spacer sub
US7245382B2 (en) * 2003-10-24 2007-07-17 Optoplan As Downhole optical sensor system with reference
US7145823B2 (en) * 2004-06-30 2006-12-05 Intel Corporation Method and apparatus to implement a temperature control mechanism on a memory device
US7603041B2 (en) * 2005-06-09 2009-10-13 Cubic Corporation Temperature compensated dynamic optical tag modulator system and method
US7413343B2 (en) * 2005-09-16 2008-08-19 Kyocera Wireless Corp. Apparatus for determining a temperature sensing element
TWI262289B (en) * 2005-09-23 2006-09-21 Univ Nat Chiao Tung Optical-fiber raster double-bearing type inclination sensor for sensing stratum displacement
US8027591B2 (en) * 2007-10-29 2011-09-27 Cubic Corporation Resonant quantum well modulator driver
JP5215060B2 (ja) * 2008-07-02 2013-06-19 テルモ株式会社 電子体温計及び作動制御方法
WO2011063086A1 (en) 2009-11-19 2011-05-26 Halliburton Energy Services, Inc. Downhole optical radiometry tool
WO2011078869A1 (en) * 2009-12-23 2011-06-30 Halliburton Energy Services, Inc. Interferometry-based downhole analysis tool
CA2794711C (en) 2010-06-01 2016-02-16 Halliburton Energy Services, Inc. Spectroscopic nanosensor logging systems and methods
CA2781331A1 (en) 2010-06-16 2011-12-22 Halliburton Energy Services, Inc. Downhole sources having enhanced ir emission
TWI445936B (zh) 2011-06-03 2014-07-21 Univ Nat Taiwan Science Tech 支持單點校正之溫度感測系統
US9562844B2 (en) 2014-06-30 2017-02-07 Baker Hughes Incorporated Systems and devices for sensing corrosion and deposition for oil and gas applications
WO2016153520A1 (en) * 2015-03-26 2016-09-29 Halliburton Energy Services, Inc. Photopeak location systems and methods
TWI577975B (zh) * 2015-06-02 2017-04-11 國立成功大學 光纖感測掃描設備及光纖感測掃描方法
WO2020009701A1 (en) * 2018-07-05 2020-01-09 Halliburton Energy Services, Inc. Intrinsic geological formation carbon to oxygen ratio measurements
US10527784B1 (en) * 2018-11-15 2020-01-07 General Electric Company Systems and methods for providing a stable wavelength reference in an integrated photonic circuit
CN112344973B (zh) * 2020-09-27 2022-07-26 北京遥测技术研究所 一种基于密闭腔金属板控温的光纤光栅标准具及使用方法
US11698308B2 (en) * 2020-10-05 2023-07-11 Openlight Photonics, Inc. Optical temperature measurements in photonic circuits

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Also Published As

Publication number Publication date
AU1599901A (en) 2001-06-04
EP1236026A1 (de) 2002-09-04
EP1236026B1 (de) 2006-01-11
CA2391395C (en) 2006-08-22
CA2391395A1 (en) 2001-05-31
WO2001038837A1 (en) 2001-05-31
NO20022416D0 (no) 2002-05-22
US6403949B1 (en) 2002-06-11
WO2001038837A8 (en) 2001-11-29
NO335932B1 (no) 2015-03-30
NO20022416L (no) 2002-07-18

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Legal Events

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8332 No legal effect for de