DE60044417D1 - Elektronische Anordnung - Google Patents
Elektronische AnordnungInfo
- Publication number
- DE60044417D1 DE60044417D1 DE60044417T DE60044417T DE60044417D1 DE 60044417 D1 DE60044417 D1 DE 60044417D1 DE 60044417 T DE60044417 T DE 60044417T DE 60044417 T DE60044417 T DE 60044417T DE 60044417 D1 DE60044417 D1 DE 60044417D1
- Authority
- DE
- Germany
- Prior art keywords
- electronic arrangement
- electronic
- arrangement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1222—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/127—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78618—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure
- H01L29/78621—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure with LDD structure or an extension or an offset region or characterised by the doping profile
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78618—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure
- H01L29/78621—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure with LDD structure or an extension or an offset region or characterised by the doping profile
- H01L29/78627—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure with LDD structure or an extension or an offset region or characterised by the doping profile with a significant overlap between the lightly doped drain and the gate electrode, e.g. GOLDD
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/842—Containers
- H10K50/8426—Peripheral sealing arrangements, e.g. adhesives, sealants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/842—Containers
- H10K50/8428—Vertical spacers, e.g. arranged between the sealing arrangement and the OLED
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/846—Passivation; Containers; Encapsulations comprising getter material or desiccants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1213—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being TFTs
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP30786699 | 1999-10-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60044417D1 true DE60044417D1 (de) | 2010-07-01 |
Family
ID=17974117
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60044417T Expired - Lifetime DE60044417D1 (de) | 1999-10-29 | 2000-10-27 | Elektronische Anordnung |
Country Status (5)
Country | Link |
---|---|
US (3) | US6384427B1 (de) |
EP (1) | EP1096303B1 (de) |
JP (11) | JP4748842B2 (de) |
KR (1) | KR100682803B1 (de) |
DE (1) | DE60044417D1 (de) |
Families Citing this family (151)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6859548B2 (en) | 1996-09-25 | 2005-02-22 | Kabushiki Kaisha Toshiba | Ultrasonic picture processing method and ultrasonic picture processing apparatus |
JP3641342B2 (ja) * | 1997-03-07 | 2005-04-20 | Tdk株式会社 | 半導体装置及び有機elディスプレイ装置 |
US6384427B1 (en) * | 1999-10-29 | 2002-05-07 | Semiconductor Energy Laboratory Co., Ltd. | Electronic device |
JP4727029B2 (ja) * | 1999-11-29 | 2011-07-20 | 株式会社半導体エネルギー研究所 | El表示装置、電気器具及びel表示装置用の半導体素子基板 |
TW465122B (en) | 1999-12-15 | 2001-11-21 | Semiconductor Energy Lab | Light-emitting device |
US6611108B2 (en) * | 2000-04-26 | 2003-08-26 | Semiconductor Energy Laboratory Co., Ltd. | Electronic device and driving method thereof |
US6940223B2 (en) * | 2000-07-10 | 2005-09-06 | Semiconductor Energy Laboratory Co., Ltd. | Film forming apparatus and method of manufacturing light emitting device |
US7019457B2 (en) * | 2000-08-03 | 2006-03-28 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device having both electrodes formed on the insulating layer |
US6906458B2 (en) * | 2000-08-11 | 2005-06-14 | Seiko Epson Corporation | Method for manufacturing organic EL device, organic EL device and electronic apparatus |
US7430025B2 (en) | 2000-08-23 | 2008-09-30 | Semiconductor Energy Laboratory Co., Ltd. | Portable electronic device |
KR100365519B1 (ko) * | 2000-12-14 | 2002-12-18 | 삼성에스디아이 주식회사 | 유기 전계발광 디바이스 및 이의 제조 방법 |
US7009203B2 (en) * | 2000-12-14 | 2006-03-07 | Samsung Soi Co., Ltd. | Organic EL device and method for manufacturing the same |
US7112818B2 (en) * | 2001-01-29 | 2006-09-26 | Seiko Epson Corporation | Semiconductor film transistor |
JP4693253B2 (ja) * | 2001-01-30 | 2011-06-01 | 株式会社半導体エネルギー研究所 | 発光装置、電子機器 |
JP4037117B2 (ja) * | 2001-02-06 | 2008-01-23 | 株式会社日立製作所 | 表示装置 |
US7569849B2 (en) | 2001-02-16 | 2009-08-04 | Ignis Innovation Inc. | Pixel driver circuit and pixel circuit having the pixel driver circuit |
JP4443063B2 (ja) * | 2001-02-28 | 2010-03-31 | 株式会社日立製作所 | 電界効果トランジスタ及びそれを使用した画像表示装置 |
US6873540B2 (en) * | 2001-05-07 | 2005-03-29 | Advanced Micro Devices, Inc. | Molecular memory cell |
DE60220912T2 (de) * | 2001-05-07 | 2008-02-28 | Advanced Micro Devices, Inc., Sunnyvale | Speichervorrichtung mit einem sich selbst einbauenden polymer und verfahren zur herstellung derselben |
KR100895901B1 (ko) * | 2001-05-07 | 2009-05-04 | 어드밴스드 마이크로 디바이시즈, 인코포레이티드 | 메모리 효과를 갖는 스위치 요소 |
CN1276518C (zh) | 2001-05-07 | 2006-09-20 | 先进微装置公司 | 使用复合分子材料的浮置栅极存储装置 |
AU2002340793A1 (en) * | 2001-05-07 | 2002-11-18 | Coatue Corporation | Molecular memory device |
AU2002340795A1 (en) * | 2001-05-07 | 2002-11-18 | Advanced Micro Devices, Inc. | Reversible field-programmable electric interconnects |
KR20040002956A (ko) * | 2001-05-24 | 2004-01-07 | 오리온전기 주식회사 | 유기전계발광소자의 인캡슐레이션 용기 및 그 제조방법 |
KR100437765B1 (ko) * | 2001-06-15 | 2004-06-26 | 엘지전자 주식회사 | 고온용 기판을 이용한 박막트랜지스터 제조방법과 이를 이용한 표시장치의 제조방법 |
JP2004533022A (ja) * | 2001-06-22 | 2004-10-28 | インターナショナル・ビジネス・マシーンズ・コーポレーション | パッシブ駆動マトリクス・ディスプレイ |
US6838720B2 (en) * | 2001-08-13 | 2005-01-04 | Advanced Micro Devices, Inc. | Memory device with active passive layers |
US6858481B2 (en) | 2001-08-13 | 2005-02-22 | Advanced Micro Devices, Inc. | Memory device with active and passive layers |
US6768157B2 (en) | 2001-08-13 | 2004-07-27 | Advanced Micro Devices, Inc. | Memory device |
US6806526B2 (en) | 2001-08-13 | 2004-10-19 | Advanced Micro Devices, Inc. | Memory device |
WO2003017282A1 (fr) | 2001-08-13 | 2003-02-27 | Advanced Micro Devices, Inc. | Cellule de memoire |
JP4865165B2 (ja) | 2001-08-29 | 2012-02-01 | 株式会社半導体エネルギー研究所 | 発光装置の作製方法 |
US6590157B2 (en) * | 2001-09-21 | 2003-07-08 | Eastman Kodak Company | Sealing structure for highly moisture-sensitive electronic device element and method for fabrication |
US7488986B2 (en) * | 2001-10-26 | 2009-02-10 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US6956240B2 (en) * | 2001-10-30 | 2005-10-18 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
KR100763171B1 (ko) * | 2001-11-07 | 2007-10-08 | 엘지.필립스 엘시디 주식회사 | 액티브 매트릭스 유기전계발광소자 및 그 제조방법 |
JP4149168B2 (ja) | 2001-11-09 | 2008-09-10 | 株式会社半導体エネルギー研究所 | 発光装置 |
CN101009322B (zh) * | 2001-11-09 | 2012-06-27 | 株式会社半导体能源研究所 | 发光器件 |
US7042024B2 (en) * | 2001-11-09 | 2006-05-09 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting apparatus and method for manufacturing the same |
US8153184B2 (en) | 2001-11-26 | 2012-04-10 | Samsung Mobile Display Co., Ltd. | Organic EL display device and method of manufacturing the same |
KR100656490B1 (ko) * | 2001-11-26 | 2006-12-12 | 삼성에스디아이 주식회사 | 풀칼라 유기전계 발광표시소자 및 그의 제조방법 |
US6815903B2 (en) * | 2001-12-11 | 2004-11-09 | Seiko Epson Corporation | Display device and electronic apparatus |
CN1245703C (zh) * | 2001-12-11 | 2006-03-15 | 精工爱普生株式会社 | 显示装置及其电子机器 |
JP3939666B2 (ja) * | 2002-01-18 | 2007-07-04 | 株式会社半導体エネルギー研究所 | 発光装置及び電子機器 |
JP3706107B2 (ja) * | 2002-01-18 | 2005-10-12 | 株式会社半導体エネルギー研究所 | 発光装置及び電子機器 |
CN101673508B (zh) * | 2002-01-18 | 2013-01-09 | 株式会社半导体能源研究所 | 发光器件 |
JP4490403B2 (ja) * | 2002-01-18 | 2010-06-23 | 株式会社半導体エネルギー研究所 | 発光装置 |
SG143063A1 (en) * | 2002-01-24 | 2008-06-27 | Semiconductor Energy Lab | Light emitting device and method of manufacturing the same |
KR100433407B1 (ko) * | 2002-02-06 | 2004-05-31 | 삼성광주전자 주식회사 | 업라이트형 진공청소기 |
TWI285515B (en) * | 2002-02-22 | 2007-08-11 | Semiconductor Energy Lab | Light-emitting device and method of manufacturing the same, and method of operating manufacturing apparatus |
US7579771B2 (en) * | 2002-04-23 | 2009-08-25 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US7786496B2 (en) | 2002-04-24 | 2010-08-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacturing same |
JP2003317971A (ja) * | 2002-04-26 | 2003-11-07 | Semiconductor Energy Lab Co Ltd | 発光装置およびその作製方法 |
TWI272556B (en) * | 2002-05-13 | 2007-02-01 | Semiconductor Energy Lab | Display device |
US7897979B2 (en) | 2002-06-07 | 2011-03-01 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method thereof |
JP2004079512A (ja) * | 2002-06-17 | 2004-03-11 | Sanyo Electric Co Ltd | 有機elパネルおよびその製造方法 |
JP4216008B2 (ja) * | 2002-06-27 | 2009-01-28 | 株式会社半導体エネルギー研究所 | 発光装置およびその作製方法、ならびに前記発光装置を有するビデオカメラ、デジタルカメラ、ゴーグル型ディスプレイ、カーナビゲーション、パーソナルコンピュータ、dvdプレーヤー、電子遊技機器、または携帯情報端末 |
US6670772B1 (en) * | 2002-06-27 | 2003-12-30 | Eastman Kodak Company | Organic light emitting diode display with surface plasmon outcoupling |
US6642092B1 (en) * | 2002-07-11 | 2003-11-04 | Sharp Laboratories Of America, Inc. | Thin-film transistors formed on a metal foil substrate |
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CA2419704A1 (en) | 2003-02-24 | 2004-08-24 | Ignis Innovation Inc. | Method of manufacturing a pixel with organic light-emitting diode |
JP2004264633A (ja) * | 2003-03-03 | 2004-09-24 | Sanyo Electric Co Ltd | エレクトロルミネッセンス表示装置 |
JP4526771B2 (ja) | 2003-03-14 | 2010-08-18 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US7238963B2 (en) * | 2003-04-28 | 2007-07-03 | Tpo Displays Corp. | Self-aligned LDD thin-film transistor and method of fabricating the same |
KR100667063B1 (ko) * | 2003-05-08 | 2007-01-10 | 삼성에스디아이 주식회사 | 유기 전계 발광 소자용 기판의 제조방법 |
US7145209B2 (en) * | 2003-05-20 | 2006-12-05 | Tpo Displays Corp. | Thin film transistor and fabrication method thereof |
US7126270B2 (en) * | 2003-06-30 | 2006-10-24 | Semiconductor Energy Laboratory Co., Ltd. | Reflector for a light emitting device |
TWI248682B (en) * | 2003-09-18 | 2006-02-01 | Au Optronics Corp | Control TFT for OLDE display |
CA2443206A1 (en) | 2003-09-23 | 2005-03-23 | Ignis Innovation Inc. | Amoled display backplanes - pixel driver circuits, array architecture, and external compensation |
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-
2014
- 2014-11-10 JP JP2014227940A patent/JP5952375B2/ja not_active Expired - Lifetime
-
2016
- 2016-04-28 JP JP2016090253A patent/JP6154934B2/ja not_active Expired - Lifetime
- 2016-04-28 JP JP2016090255A patent/JP6259488B2/ja not_active Expired - Lifetime
-
2017
- 2017-06-29 JP JP2017127374A patent/JP2017207763A/ja not_active Withdrawn
-
2019
- 2019-04-24 JP JP2019082962A patent/JP2019164358A/ja not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
JP5723899B2 (ja) | 2015-05-27 |
EP1096303A3 (de) | 2006-05-17 |
JP2001195015A (ja) | 2001-07-19 |
EP1096303A2 (de) | 2001-05-02 |
KR100682803B1 (ko) | 2007-02-15 |
US6670637B2 (en) | 2003-12-30 |
JP2012054248A (ja) | 2012-03-15 |
JP6259488B2 (ja) | 2018-01-10 |
JP5138054B2 (ja) | 2013-02-06 |
KR20010070174A (ko) | 2001-07-25 |
JP2012083763A (ja) | 2012-04-26 |
JP4748842B2 (ja) | 2011-08-17 |
JP2011097104A (ja) | 2011-05-12 |
JP2014063194A (ja) | 2014-04-10 |
JP2017207763A (ja) | 2017-11-24 |
US20020134979A1 (en) | 2002-09-26 |
JP5688447B2 (ja) | 2015-03-25 |
US20040135146A1 (en) | 2004-07-15 |
JP5364774B2 (ja) | 2013-12-11 |
US7208765B2 (en) | 2007-04-24 |
JP5952375B2 (ja) | 2016-07-13 |
JP6154934B2 (ja) | 2017-06-28 |
JP2013137552A (ja) | 2013-07-11 |
JP2015064592A (ja) | 2015-04-09 |
JP2016167086A (ja) | 2016-09-15 |
US6384427B1 (en) | 2002-05-07 |
JP2019164358A (ja) | 2019-09-26 |
JP2016184167A (ja) | 2016-10-20 |
EP1096303B1 (de) | 2010-05-19 |
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