DE60123315D1 - Analysegerät - Google Patents

Analysegerät

Info

Publication number
DE60123315D1
DE60123315D1 DE60123315T DE60123315T DE60123315D1 DE 60123315 D1 DE60123315 D1 DE 60123315D1 DE 60123315 T DE60123315 T DE 60123315T DE 60123315 T DE60123315 T DE 60123315T DE 60123315 D1 DE60123315 D1 DE 60123315D1
Authority
DE
Germany
Prior art keywords
analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60123315T
Other languages
English (en)
Other versions
DE60123315T2 (de
Inventor
Yuya Sone
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Science Corp
Original Assignee
SII NanoTechnology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SII NanoTechnology Inc filed Critical SII NanoTechnology Inc
Application granted granted Critical
Publication of DE60123315D1 publication Critical patent/DE60123315D1/de
Publication of DE60123315T2 publication Critical patent/DE60123315T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D9/00—Recording measured values
    • G01D9/005—Solid-state data loggers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
DE60123315T 2000-04-28 2001-04-24 Analysegerät Expired - Lifetime DE60123315T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000130828 2000-04-28
JP2000130828A JP2001311708A (ja) 2000-04-28 2000-04-28 分析装置

Publications (2)

Publication Number Publication Date
DE60123315D1 true DE60123315D1 (de) 2006-11-09
DE60123315T2 DE60123315T2 (de) 2007-04-05

Family

ID=18639844

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60123315T Expired - Lifetime DE60123315T2 (de) 2000-04-28 2001-04-24 Analysegerät

Country Status (4)

Country Link
US (1) US20020054055A1 (de)
EP (1) EP1150102B1 (de)
JP (1) JP2001311708A (de)
DE (1) DE60123315T2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7742833B1 (en) 2006-09-28 2010-06-22 Rockwell Automation Technologies, Inc. Auto discovery of embedded historians in network
US8181157B2 (en) * 2006-09-29 2012-05-15 Rockwell Automation Technologies, Inc. Custom language support for project documentation and editing
JP2008145145A (ja) * 2006-12-07 2008-06-26 Yokogawa Electric Corp 測定装置
US7930261B2 (en) * 2007-09-26 2011-04-19 Rockwell Automation Technologies, Inc. Historians embedded in industrial units
US20090089671A1 (en) * 2007-09-28 2009-04-02 Rockwell Automation Technologies, Inc. Programmable controller programming with embedded macro capability
US9336060B2 (en) * 2011-06-17 2016-05-10 Microsoft Technology Licensing, Llc Middleware services framework for on-premises and cloud deployment

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5305081A (en) * 1992-08-27 1994-04-19 Constar Plastics Inc. Bottle stress analysis system
JP2549251B2 (ja) * 1992-10-23 1996-10-30 インターナショナル・ビジネス・マシーンズ・コーポレイション ライブ・データ用の注釈記録の作成方法
US6004276A (en) * 1997-03-03 1999-12-21 Quinton Instrument Company Open architecture cardiology information system
US5953009A (en) * 1997-05-27 1999-09-14 Hewlett-Packard Company Graphical system and method for invoking measurements in a signal measurement system
US6261103B1 (en) * 1999-04-15 2001-07-17 Cb Sciences, Inc. System for analyzing and/or effecting experimental data from a remote location
US6707474B1 (en) * 1999-10-29 2004-03-16 Agilent Technologies, Inc. System and method for manipulating relationships among signals and buses of a signal measurement system on a graphical user interface
US6570592B1 (en) * 1999-10-29 2003-05-27 Agilent Technologies, Inc. System and method for specifying trigger conditions of a signal measurement system using graphical elements on a graphical user interface
US6791545B2 (en) * 2001-12-11 2004-09-14 Lecroy Corporation Measurement icons for digital oscilloscopes

Also Published As

Publication number Publication date
DE60123315T2 (de) 2007-04-05
JP2001311708A (ja) 2001-11-09
US20020054055A1 (en) 2002-05-09
EP1150102B1 (de) 2006-09-27
EP1150102A1 (de) 2001-10-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition