DE60137959D1 - Motorenlagerinspektionssystem - Google Patents

Motorenlagerinspektionssystem

Info

Publication number
DE60137959D1
DE60137959D1 DE60137959T DE60137959T DE60137959D1 DE 60137959 D1 DE60137959 D1 DE 60137959D1 DE 60137959 T DE60137959 T DE 60137959T DE 60137959 T DE60137959 T DE 60137959T DE 60137959 D1 DE60137959 D1 DE 60137959D1
Authority
DE
Germany
Prior art keywords
light line
stationary
beam splitter
reflected images
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60137959T
Other languages
English (en)
Inventor
Tzyy-Shuh Chang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OG TECHNOLOGIES Inc
Original Assignee
OG TECHNOLOGIES Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by OG TECHNOLOGIES Inc filed Critical OG TECHNOLOGIES Inc
Application granted granted Critical
Publication of DE60137959D1 publication Critical patent/DE60137959D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
DE60137959T 2000-08-24 2001-08-22 Motorenlagerinspektionssystem Expired - Lifetime DE60137959D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US22753800P 2000-08-24 2000-08-24
US09/934,151 US6661506B2 (en) 2000-08-24 2001-08-21 Engine bearing inspection system
PCT/US2001/026222 WO2002016787A2 (en) 2000-08-24 2001-08-22 Engine bearing inspection system

Publications (1)

Publication Number Publication Date
DE60137959D1 true DE60137959D1 (de) 2009-04-23

Family

ID=26921527

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60137959T Expired - Lifetime DE60137959D1 (de) 2000-08-24 2001-08-22 Motorenlagerinspektionssystem

Country Status (7)

Country Link
US (1) US6661506B2 (de)
EP (1) EP1336302B1 (de)
JP (1) JP3905475B2 (de)
AT (1) ATE425451T1 (de)
AU (1) AU2001286623A1 (de)
DE (1) DE60137959D1 (de)
WO (1) WO2002016787A2 (de)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4197157B2 (ja) * 2001-07-16 2008-12-17 デピュイ・プロダクツ・インコーポレイテッド 軟骨修復再生装置および方法
US9116133B2 (en) * 2010-03-09 2015-08-25 Federal-Mogul Corporation Bore inspection system and method of inspection therewith
CN107436307A (zh) * 2017-07-07 2017-12-05 柳州杰诺瑞汽车电器系统制造有限公司 视觉自动检测系统及其检测方法
CN112639394B (zh) * 2018-08-21 2023-05-12 瓦锡兰芬兰有限公司 滑动轴承紧余量高度测量方法和装置
CN110470472B (zh) * 2019-09-20 2020-11-17 台州浙盛轴承科技有限公司 一种轴承内圈磨损程度检测设备

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US3761186A (en) * 1972-01-17 1973-09-25 Itt Apparatus for optically inspecting the condition of a surface having known variations in the condition
US4561731A (en) 1980-03-10 1985-12-31 Kley Victor B Electronic illumination control
IT1130474B (it) 1980-05-28 1986-06-11 Fiat Auto Spa Procedimento e dispositivo per l ispezione ed il controllo della superficie interna di un pezzo cilindrico cavo che ha subito una lavorazione meccanica
US4622462A (en) 1981-06-11 1986-11-11 Mts Vektronics Corporation Method and apparatus for three-dimensional scanning
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US4527055A (en) * 1982-11-15 1985-07-02 Honeywell Inc. Apparatus for selectively viewing either of two scenes of interest
JPS60229006A (ja) * 1984-04-27 1985-11-14 Nec Corp 回転多面鏡の面倒れ角補正装置
US4750045A (en) * 1985-08-15 1988-06-07 Fuji Photo Film Co., Ltd. Light beam scanning system
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US4886975A (en) 1986-02-14 1989-12-12 Canon Kabushiki Kaisha Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces
US4725883A (en) 1986-07-18 1988-02-16 Westinghouse Electric Corp. Optical profilometry system for tubular products
GB8626812D0 (en) * 1986-11-10 1986-12-10 Sira Ltd Surface inspection
US4849643A (en) 1987-09-18 1989-07-18 Eaton Leonard Technologies Optical probe with overlapping detection fields
US5008555A (en) 1988-04-08 1991-04-16 Eaton Leonard Technologies, Inc. Optical probe with overlapping detection fields
FR2631697B1 (fr) 1988-05-17 1991-07-26 Hispano Suiza Sa Appareil pour le controle optique du profil interne d'un tube ou d'un alesage
EP0388454A4 (en) * 1988-08-26 1993-05-12 Libbey-Owens-Ford Company Apparatus and method for inspecting glass sheets
JPH0762654B2 (ja) * 1988-10-25 1995-07-05 松下電器産業株式会社 実装基板検査装置
GB8908507D0 (en) 1989-04-14 1989-06-01 Fokker Aircraft Bv Method of and apparatus for non-destructive composite laminatecharacterisation
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JP3048168B2 (ja) 1990-07-19 2000-06-05 キヤノン株式会社 表面状態検査装置及びこれを備える露光装置
US5060063A (en) 1990-07-30 1991-10-22 Mpm Corporation Viewing and illuminating video probe with viewing means for simultaneously viewing object and device images along viewing axis and translating them along optical axis
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US5416589A (en) 1991-10-04 1995-05-16 Kms Fusion, Inc. Electro-optical system for gauging surface profile deviations
US5465153A (en) 1991-10-04 1995-11-07 Kms Fusion, Inc. Electro-optical system for gauging specular surface profile deviations
US5289267A (en) 1991-10-04 1994-02-22 Kms Fusion, Inc. Electro-optical system for gauging surface profile deviations
US5237444A (en) * 1992-06-26 1993-08-17 General Scanning, Inc. Optical scanning system
US5392113A (en) 1992-09-30 1995-02-21 Vlsi Technology, Inc. Semiconductor wafer defect monitoring
DE4304991C1 (de) * 1993-02-18 1994-10-20 Optel Mestechnik Gmbh Vorrichtung zur Vermessung der Lage und Orientierung von großflächigen Werkstücken
US5519494A (en) 1993-06-08 1996-05-21 Kabushiki Kaisha Kobe Seiko Sho Pipe inner surface measuring method and apparatus
JPH0783841A (ja) * 1993-09-16 1995-03-31 Fujitsu Ltd バイアホールの残渣検出装置および残渣観察装置
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US5652617A (en) 1995-06-06 1997-07-29 Barbour; Joel Side scan down hole video tool having two camera
US5717455A (en) 1996-07-02 1998-02-10 Raax Co., Ltd. System and method for three dimensional image acquisition and processing of a borehole wall
DE19643018B4 (de) * 1996-10-18 2010-06-17 Isra Surface Vision Gmbh Verfahren und Vorrichtung zum Messen des Verlaufs reflektierender Oberflächen
IL119850A (en) * 1996-12-17 2000-11-21 Prolaser Ltd Optical method and apparatus for detecting low frequency defects
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US5774212A (en) 1997-03-19 1998-06-30 General Electric Co. Method and apparatus for detecting and analyzing directionally reflective surface flaws
JPH10267624A (ja) * 1997-03-27 1998-10-09 Ono Sokki Co Ltd 三次元形状測定装置
DE19714202A1 (de) * 1997-04-07 1998-10-15 Bosch Gmbh Robert Vorrichtung zum optischen Prüfen von Oberflächen
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US6002495A (en) * 1997-06-04 1999-12-14 Agfa Corporation Imaging system with moveable registration pins
US6057537A (en) * 1997-09-29 2000-05-02 Eastman Kodak Company Optical scanner feedback system having a reflected cylinder lens
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US6002524A (en) * 1997-09-29 1999-12-14 Imation Corp. Flexible lens
US6094287A (en) * 1998-12-03 2000-07-25 Eastman Kodak Company Wobble correcting monogon scanner for a laser imaging system

Also Published As

Publication number Publication date
US20020024658A1 (en) 2002-02-28
US6661506B2 (en) 2003-12-09
ATE425451T1 (de) 2009-03-15
JP3905475B2 (ja) 2007-04-18
EP1336302A4 (de) 2006-01-11
EP1336302A2 (de) 2003-08-20
WO2002016787A2 (en) 2002-02-28
AU2001286623A1 (en) 2002-03-04
JP2004522936A (ja) 2004-07-29
WO2002016787A3 (en) 2002-05-10
EP1336302B1 (de) 2009-03-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition