DE602004028511D1 - Bestrahlungsverfahren - Google Patents
BestrahlungsverfahrenInfo
- Publication number
- DE602004028511D1 DE602004028511D1 DE602004028511T DE602004028511T DE602004028511D1 DE 602004028511 D1 DE602004028511 D1 DE 602004028511D1 DE 602004028511 T DE602004028511 T DE 602004028511T DE 602004028511 T DE602004028511 T DE 602004028511T DE 602004028511 D1 DE602004028511 D1 DE 602004028511D1
- Authority
- DE
- Germany
- Prior art keywords
- transparent layer
- fluid
- imperfections
- resist
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70983—Optical system protection, e.g. pellicles or removable covers for protection of mask
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03104940 | 2003-12-23 | ||
EP04102397 | 2004-05-28 | ||
PCT/IB2004/052886 WO2005064409A2 (en) | 2003-12-23 | 2004-12-22 | Removable pellicle for immersion lithography |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602004028511D1 true DE602004028511D1 (de) | 2010-09-16 |
Family
ID=34740664
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602004028511T Active DE602004028511D1 (de) | 2003-12-23 | 2004-12-22 | Bestrahlungsverfahren |
Country Status (9)
Country | Link |
---|---|
US (1) | US8067147B2 (de) |
EP (1) | EP1700164B1 (de) |
JP (1) | JP4579927B2 (de) |
KR (1) | KR101163095B1 (de) |
CN (1) | CN100555083C (de) |
AT (1) | ATE476686T1 (de) |
DE (1) | DE602004028511D1 (de) |
TW (1) | TWI380138B (de) |
WO (1) | WO2005064409A2 (de) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0222514D0 (en) | 2002-09-27 | 2002-11-06 | Novartis Ag | Organic compounds |
EP2261741A3 (de) * | 2003-06-11 | 2011-05-25 | ASML Netherlands B.V. | Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung |
TWI245163B (en) | 2003-08-29 | 2005-12-11 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
US7050146B2 (en) | 2004-02-09 | 2006-05-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7385670B2 (en) * | 2004-10-05 | 2008-06-10 | Asml Netherlands B.V. | Lithographic apparatus, cleaning system and cleaning method for in situ removing contamination from a component in a lithographic apparatus |
US7880860B2 (en) * | 2004-12-20 | 2011-02-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7288362B2 (en) * | 2005-02-23 | 2007-10-30 | International Business Machines Corporation | Immersion topcoat materials with improved performance |
JP4684139B2 (ja) * | 2005-10-17 | 2011-05-18 | 信越化学工業株式会社 | レジスト保護膜材料及びパターン形成方法 |
US8125610B2 (en) * | 2005-12-02 | 2012-02-28 | ASML Metherlands B.V. | Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus |
US7969548B2 (en) * | 2006-05-22 | 2011-06-28 | Asml Netherlands B.V. | Lithographic apparatus and lithographic apparatus cleaning method |
JP5029611B2 (ja) * | 2006-09-08 | 2012-09-19 | 株式会社ニコン | クリーニング用部材、クリーニング方法、露光装置、並びにデバイス製造方法 |
DE102006046675A1 (de) * | 2006-09-29 | 2008-04-03 | Carl Zeiss Smt Ag | Mikrolithopraphische Projektionsbelichtungsanlage |
US8817226B2 (en) | 2007-02-15 | 2014-08-26 | Asml Holding N.V. | Systems and methods for insitu lens cleaning using ozone in immersion lithography |
US8654305B2 (en) * | 2007-02-15 | 2014-02-18 | Asml Holding N.V. | Systems and methods for insitu lens cleaning in immersion lithography |
US7900641B2 (en) * | 2007-05-04 | 2011-03-08 | Asml Netherlands B.V. | Cleaning device and a lithographic apparatus cleaning method |
US7866330B2 (en) * | 2007-05-04 | 2011-01-11 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
US8011377B2 (en) | 2007-05-04 | 2011-09-06 | Asml Netherlands B.V. | Cleaning device and a lithographic apparatus cleaning method |
US8947629B2 (en) * | 2007-05-04 | 2015-02-03 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
US20080311530A1 (en) | 2007-06-15 | 2008-12-18 | Allen Robert D | Graded topcoat materials for immersion lithography |
US7916269B2 (en) | 2007-07-24 | 2011-03-29 | Asml Netherlands B.V. | Lithographic apparatus and contamination removal or prevention method |
US20090025753A1 (en) * | 2007-07-24 | 2009-01-29 | Asml Netherlands B.V. | Lithographic Apparatus And Contamination Removal Or Prevention Method |
SG151198A1 (en) * | 2007-09-27 | 2009-04-30 | Asml Netherlands Bv | Methods relating to immersion lithography and an immersion lithographic apparatus |
NL1035942A1 (nl) * | 2007-09-27 | 2009-03-30 | Asml Netherlands Bv | Lithographic Apparatus and Method of Cleaning a Lithographic Apparatus. |
JP5017232B2 (ja) * | 2007-10-31 | 2012-09-05 | エーエスエムエル ネザーランズ ビー.ブイ. | クリーニング装置および液浸リソグラフィ装置 |
NL1036273A1 (nl) * | 2007-12-18 | 2009-06-19 | Asml Netherlands Bv | Lithographic apparatus and method of cleaning a surface of an immersion lithographic apparatus. |
NL1036306A1 (nl) * | 2007-12-20 | 2009-06-23 | Asml Netherlands Bv | Lithographic apparatus and in-line cleaning apparatus. |
US8339572B2 (en) | 2008-01-25 | 2012-12-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
JP2011028091A (ja) * | 2009-07-28 | 2011-02-10 | Shin-Etsu Chemical Co Ltd | ペリクル |
CA2784148A1 (en) * | 2009-12-28 | 2011-07-28 | Pioneer Hi-Bred International, Inc. | Sorghum fertility restorer genotypes and methods of marker-assisted selection |
US11761905B2 (en) * | 2021-08-26 | 2023-09-19 | Taiwan Semiconductor Manufacturing Company Limited | Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defects |
CN113731863B (zh) * | 2021-09-18 | 2023-06-16 | 浙江晶科能源有限公司 | 电池片分选设备及电池片的分选方法 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2373289A (en) * | 1943-04-10 | 1945-04-10 | Defender Photo Supply Co Inc | Photographic structure |
US4131363A (en) * | 1977-12-05 | 1978-12-26 | International Business Machines Corporation | Pellicle cover for projection printing system |
EP0025805B1 (de) * | 1979-09-21 | 1983-04-06 | CENSOR Patent- und Versuchs-Anstalt | Verfahren zur Übertragung eines Musters auf eine Halbleiterscheibe |
US4509852A (en) * | 1980-10-06 | 1985-04-09 | Werner Tabarelli | Apparatus for the photolithographic manufacture of integrated circuit elements |
US5373806A (en) * | 1985-05-20 | 1994-12-20 | Applied Materials, Inc. | Particulate-free epitaxial process |
JPS648583A (en) * | 1987-07-01 | 1989-01-12 | Hitachi Ltd | Manufacture of magnetic memory device |
US6040116A (en) * | 1989-03-17 | 2000-03-21 | Basf Aktiengesellschaft | Photosensitive recording element having a recording layer and a top layer possessing different solubility properties, and its development in one operation |
CA2067297C (en) * | 1991-05-31 | 1998-07-21 | Kevin Yu | Protected photosensitive recording films |
JP2520801B2 (ja) * | 1991-07-12 | 1996-07-31 | 株式会社荏原総合研究所 | 中空液滴流による液体移動装置 |
JP2753930B2 (ja) * | 1992-11-27 | 1998-05-20 | キヤノン株式会社 | 液浸式投影露光装置 |
US5366559A (en) * | 1993-05-27 | 1994-11-22 | Research Triangle Institute | Method for protecting a substrate surface from contamination using the photophoretic effect |
JPH0729799A (ja) * | 1993-07-14 | 1995-01-31 | Oki Electric Ind Co Ltd | レジストパターンの形成方法 |
JPH07220990A (ja) | 1994-01-28 | 1995-08-18 | Hitachi Ltd | パターン形成方法及びその露光装置 |
US5900354A (en) * | 1997-07-03 | 1999-05-04 | Batchelder; John Samuel | Method for optical inspection and lithography |
US6153044A (en) | 1998-04-30 | 2000-11-28 | Euv Llc | Protection of lithographic components from particle contamination |
US6555234B1 (en) * | 2001-02-01 | 2003-04-29 | Advanced Micro Devices, Inc. | Barrier for and a method of reducing outgassing from a photoresist material |
US7175968B2 (en) * | 2003-07-28 | 2007-02-13 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and a substrate |
US7579135B2 (en) * | 2003-08-11 | 2009-08-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | Lithography apparatus for manufacture of integrated circuits |
JP4265766B2 (ja) * | 2003-08-25 | 2009-05-20 | 東京応化工業株式会社 | 液浸露光プロセス用レジスト保護膜形成用材料、該保護膜形成材料からなるレジスト保護膜、および該レジスト保護膜を用いたレジストパターン形成方法 |
JP3993549B2 (ja) * | 2003-09-30 | 2007-10-17 | 株式会社東芝 | レジストパターン形成方法 |
US7432042B2 (en) * | 2003-12-03 | 2008-10-07 | United Microelectronics Corp. | Immersion lithography process and mask layer structure applied in the same |
-
2004
- 2004-12-22 KR KR1020067012537A patent/KR101163095B1/ko active IP Right Grant
- 2004-12-22 DE DE602004028511T patent/DE602004028511D1/de active Active
- 2004-12-22 JP JP2006546462A patent/JP4579927B2/ja not_active Expired - Fee Related
- 2004-12-22 AT AT04806612T patent/ATE476686T1/de not_active IP Right Cessation
- 2004-12-22 WO PCT/IB2004/052886 patent/WO2005064409A2/en not_active Application Discontinuation
- 2004-12-22 CN CNB2004800384773A patent/CN100555083C/zh not_active Expired - Fee Related
- 2004-12-22 EP EP04806612A patent/EP1700164B1/de not_active Not-in-force
- 2004-12-22 US US10/596,647 patent/US8067147B2/en not_active Expired - Fee Related
- 2004-12-23 TW TW093140282A patent/TWI380138B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP4579927B2 (ja) | 2010-11-10 |
KR101163095B1 (ko) | 2012-07-06 |
EP1700164A2 (de) | 2006-09-13 |
WO2005064409A2 (en) | 2005-07-14 |
CN1898608A (zh) | 2007-01-17 |
US8067147B2 (en) | 2011-11-29 |
KR20060128895A (ko) | 2006-12-14 |
JP2007520058A (ja) | 2007-07-19 |
US20070064215A1 (en) | 2007-03-22 |
ATE476686T1 (de) | 2010-08-15 |
EP1700164B1 (de) | 2010-08-04 |
WO2005064409A3 (en) | 2006-03-09 |
CN100555083C (zh) | 2009-10-28 |
TWI380138B (en) | 2012-12-21 |
TW200532390A (en) | 2005-10-01 |
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