DE602004030054D1 - Untersuchungsvorrichtung für biologische Proben und chemische Proben - Google Patents
Untersuchungsvorrichtung für biologische Proben und chemische ProbenInfo
- Publication number
- DE602004030054D1 DE602004030054D1 DE602004030054T DE602004030054T DE602004030054D1 DE 602004030054 D1 DE602004030054 D1 DE 602004030054D1 DE 602004030054 T DE602004030054 T DE 602004030054T DE 602004030054 T DE602004030054 T DE 602004030054T DE 602004030054 D1 DE602004030054 D1 DE 602004030054D1
- Authority
- DE
- Germany
- Prior art keywords
- samples
- chemical
- testing biological
- biological samples
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1203—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
- G01N27/4148—Integrated circuits therefor, e.g. fabricated by CMOS processing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/671—Organic radiation-sensitive molecular electronic devices
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004012596A JP4065855B2 (ja) | 2004-01-21 | 2004-01-21 | 生体および化学試料検査装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE602004030054D1 true DE602004030054D1 (de) | 2010-12-23 |
Family
ID=34631899
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE602004030054T Active DE602004030054D1 (de) | 2004-01-21 | 2004-09-03 | Untersuchungsvorrichtung für biologische Proben und chemische Proben |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US20050156207A1 (de) |
| EP (2) | EP1950808B1 (de) |
| JP (1) | JP4065855B2 (de) |
| DE (1) | DE602004030054D1 (de) |
| TW (1) | TW200525145A (de) |
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| EP2677309B9 (de) | 2006-12-14 | 2014-11-19 | Life Technologies Corporation | Verfahren zur Sequenzierung einer Nukleinsäure mittels grosser FET-Arrays, geeignet zur Messung in einem begrenzten pH-Bereich |
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| FR2938703B1 (fr) | 2008-11-20 | 2011-04-22 | Commissariat Energie Atomique | Procede de realisation d'une puce de detection d'elements biologiques |
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| US20120261274A1 (en) | 2009-05-29 | 2012-10-18 | Life Technologies Corporation | Methods and apparatus for measuring analytes |
| EP2336757B1 (de) | 2009-12-07 | 2018-09-19 | ams international AG | Integrierte Schaltung mit Anordnung zur Erkennung der Anwesenheit von Wasser und Verfahren zu deren Herstellung |
| JP5517125B2 (ja) * | 2010-02-05 | 2014-06-11 | 国立大学法人 東京大学 | 細胞測定装置 |
| CN103154718B (zh) | 2010-06-30 | 2015-09-23 | 生命科技公司 | 感测离子的电荷堆积电路和方法 |
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| TWI539172B (zh) | 2010-06-30 | 2016-06-21 | 生命技術公司 | 用於測試離子感測場效電晶體（ｉｓｆｅｔ）陣列之裝置及方法 |
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| JP2004012596A (ja) | 2002-06-04 | 2004-01-15 | Ricoh Co Ltd | 光走査装置及び画像形成装置 |
| JP4092990B2 (ja) * | 2002-09-06 | 2008-05-28 | 株式会社日立製作所 | 生体および化学試料検査装置 |
| TW564476B (en) * | 2002-10-21 | 2003-12-01 | Univ Chung Yuan Christian | Method for fabricating a monolithic chip including pH, temperature and photo intensity multi-sensors and a readout circuit |
| JP4502173B2 (ja) * | 2003-02-03 | 2010-07-14 | ルネサスエレクトロニクス株式会社 | 半導体装置及びその製造方法 |
| US7361946B2 (en) * | 2004-06-28 | 2008-04-22 | Nitronex Corporation | Semiconductor device-based sensors |
-
2004
- 2004-01-21 JP JP2004012596A patent/JP4065855B2/ja not_active Expired - Fee Related
- 2004-09-01 TW TW093126366A patent/TW200525145A/zh not_active IP Right Cessation
- 2004-09-03 EP EP08007071A patent/EP1950808B1/de not_active Expired - Fee Related
- 2004-09-03 EP EP04021003A patent/EP1557884A3/de not_active Withdrawn
- 2004-09-03 US US10/933,339 patent/US20050156207A1/en not_active Abandoned
- 2004-09-03 DE DE602004030054T patent/DE602004030054D1/de active Active
-
2007
- 2007-10-29 US US11/976,831 patent/US7888708B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US7888708B2 (en) | 2011-02-15 |
| EP1950808B1 (de) | 2010-11-10 |
| EP1950808A3 (de) | 2008-09-17 |
| EP1557884A3 (de) | 2008-06-25 |
| EP1557884A2 (de) | 2005-07-27 |
| JP2005207797A (ja) | 2005-08-04 |
| TWI345057B (de) | 2011-07-11 |
| US20050156207A1 (en) | 2005-07-21 |
| JP4065855B2 (ja) | 2008-03-26 |
| EP1950808A2 (de) | 2008-07-30 |
| TW200525145A (en) | 2005-08-01 |
| US20080061323A1 (en) | 2008-03-13 |
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