DE602008001540D1 - Vorrichtung zum Messen von Brillenrahmen - Google Patents

Vorrichtung zum Messen von Brillenrahmen

Info

Publication number
DE602008001540D1
DE602008001540D1 DE602008001540T DE602008001540T DE602008001540D1 DE 602008001540 D1 DE602008001540 D1 DE 602008001540D1 DE 602008001540 T DE602008001540 T DE 602008001540T DE 602008001540 T DE602008001540 T DE 602008001540T DE 602008001540 D1 DE602008001540 D1 DE 602008001540D1
Authority
DE
Germany
Prior art keywords
spectacle frames
measuring spectacle
measuring
frames
spectacle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602008001540T
Other languages
English (en)
Inventor
Yoshinori Matsuyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
Original Assignee
Nidek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Publication of DE602008001540D1 publication Critical patent/DE602008001540D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C13/00—Assembling; Repairing; Cleaning
DE602008001540T 2007-09-11 2008-09-11 Vorrichtung zum Messen von Brillenrahmen Active DE602008001540D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007236032A JP5259144B2 (ja) 2007-09-11 2007-09-11 レンズ枠形状測定装置

Publications (1)

Publication Number Publication Date
DE602008001540D1 true DE602008001540D1 (de) 2010-07-29

Family

ID=40010743

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602008001540T Active DE602008001540D1 (de) 2007-09-11 2008-09-11 Vorrichtung zum Messen von Brillenrahmen

Country Status (6)

Country Link
US (1) US7631431B2 (de)
EP (1) EP2037210B1 (de)
JP (1) JP5259144B2 (de)
KR (1) KR101523096B1 (de)
DE (1) DE602008001540D1 (de)
ES (1) ES2346372T3 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080031483A1 (en) * 2006-08-04 2008-02-07 Hill James W Insulated cooler with internal audio system docking station and integral speakers
US7874079B2 (en) * 2007-02-06 2011-01-25 National Optronics, Inc. Holding mechanism for use with an ophthalmic tracer, and method
JP5204527B2 (ja) * 2008-03-28 2013-06-05 株式会社トプコン 玉型形状測定装置
JP5204597B2 (ja) * 2008-09-16 2013-06-05 株式会社トプコン 眼鏡レンズ枠形状測定装置
JP5435918B2 (ja) * 2008-09-30 2014-03-05 株式会社トプコン 玉型形状測定方法及びその装置
JP5562624B2 (ja) * 2009-12-09 2014-07-30 株式会社ニデック 眼鏡枠形状測定装置
JP5586930B2 (ja) * 2009-12-09 2014-09-10 株式会社ニデック 眼鏡枠形状測定装置
KR101917394B1 (ko) * 2011-09-21 2018-11-09 가부시키가이샤 니데크 안경 프레임 형상 측정 장치
JP5983139B2 (ja) * 2012-07-23 2016-08-31 株式会社ニデック 眼鏡枠形状測定装置
US9535269B2 (en) 2013-06-24 2017-01-03 Nidek Co., Ltd. Eyeglass frame shape measuring apparatus
CN105216489B (zh) * 2015-10-25 2017-01-18 济南大学 现场测绘用具组合
CN105216488B (zh) * 2015-10-25 2017-01-18 济南大学 现场测绘用具组合的应用
CN107179063A (zh) * 2016-03-11 2017-09-19 上海强精金属制品有限公司 一种按摩椅焊接框检测装置
JP6766400B2 (ja) * 2016-03-28 2020-10-14 株式会社ニデック 眼鏡レンズ加工装置、及び眼鏡レンズ加工プログラム
JP7276050B2 (ja) * 2019-09-30 2023-05-18 株式会社ニデック 眼鏡枠形状測定装置、及びレンズ加工装置
CN110579153B (zh) * 2019-10-23 2021-05-25 奇瑞汽车股份有限公司 机盖锁的检具

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2925685B2 (ja) * 1990-08-02 1999-07-28 株式会社ニデック フレーム形状測定装置
US5121550A (en) * 1990-12-03 1992-06-16 Gerber Optial, Inc. Automatic surface tracer
JP2526584Y2 (ja) * 1991-12-25 1997-02-19 ホーヤ株式会社 フレーム形状測定装置
JPH0815706B2 (ja) * 1992-07-27 1996-02-21 株式会社トプコン レンズ枠形状測定装置
US5515612A (en) 1993-01-08 1996-05-14 Hoya Corporation Apparatus for measuring the shape of a frame of spectacles
JP3819091B2 (ja) 1996-11-22 2006-09-06 株式会社トプコン 眼鏡フレームの玉型形状測定装置
EP0844047B1 (de) 1996-11-22 2002-07-17 Kabushiki Kaisha Topcon Vorrichtung zum Messen des Umfangs einer linsenförmigen Schablone gefertigt zur Montage in den Rahmen eines Brillengestells
JPH11129149A (ja) 1997-10-31 1999-05-18 Topcon Corp 眼鏡フレームの玉型形状測定装置
JP3695988B2 (ja) 1999-04-30 2005-09-14 株式会社ニデック 眼鏡枠形状測定装置
JP2000314647A (ja) 1999-05-07 2000-11-14 Hitachi Ltd 空気流量測定装置
CA2283495A1 (en) * 1999-09-23 2001-03-23 Elision Technology Inc. Eyeglass frame and lens tracing apparatus and method
JP4588828B2 (ja) 1999-12-22 2010-12-01 株式会社トプコン 眼鏡の玉型形状測定装置
JP4566372B2 (ja) 2000-07-19 2010-10-20 株式会社トプコン レンズ枠形状測定装置
JP4429535B2 (ja) * 2001-02-06 2010-03-10 株式会社トプコン レンズ形状測定装置
JP2003172618A (ja) * 2001-12-06 2003-06-20 Topcon Corp レンズ枠形状測定装置
JP2004003944A (ja) * 2002-04-08 2004-01-08 Hoya Corp 眼鏡枠形状測定装置
FR2870933B1 (fr) * 2004-05-28 2008-03-14 Essilor Int Appareil de lecture de contour comportant un capteur d'effort
FR2890189B1 (fr) * 2005-08-31 2008-02-01 Essilor Int Methode de pilotage de palpeur pour lecture de drageoir de monture de lunettes

Also Published As

Publication number Publication date
US7631431B2 (en) 2009-12-15
EP2037210A1 (de) 2009-03-18
JP2009068925A (ja) 2009-04-02
JP5259144B2 (ja) 2013-08-07
KR20090027170A (ko) 2009-03-16
ES2346372T3 (es) 2010-10-14
KR101523096B1 (ko) 2015-05-26
EP2037210B1 (de) 2010-06-16
US20090064512A1 (en) 2009-03-12

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