DE60214374D1 - Magnetoresistiver Speicher mit weichmagnetischen Referenzschichte - Google Patents

Magnetoresistiver Speicher mit weichmagnetischen Referenzschichte

Info

Publication number
DE60214374D1
DE60214374D1 DE60214374T DE60214374T DE60214374D1 DE 60214374 D1 DE60214374 D1 DE 60214374D1 DE 60214374 T DE60214374 T DE 60214374T DE 60214374 T DE60214374 T DE 60214374T DE 60214374 D1 DE60214374 D1 DE 60214374D1
Authority
DE
Germany
Prior art keywords
soft magnetic
reference layer
magnetoresistive memory
magnetic reference
magnetoresistive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60214374T
Other languages
English (en)
Other versions
DE60214374T2 (de
Inventor
Yoshiaki Fukuzumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE60214374D1 publication Critical patent/DE60214374D1/de
Publication of DE60214374T2 publication Critical patent/DE60214374T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
    • G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
DE60214374T 2002-09-10 2002-12-11 Magnetoresistiver Speicher mit weichmagnetischen Referenzschichte Expired - Lifetime DE60214374T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002264215 2002-09-10
JP2002264215A JP3788964B2 (ja) 2002-09-10 2002-09-10 磁気ランダムアクセスメモリ

Publications (2)

Publication Number Publication Date
DE60214374D1 true DE60214374D1 (de) 2006-10-12
DE60214374T2 DE60214374T2 (de) 2007-09-20

Family

ID=31884751

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60214374T Expired - Lifetime DE60214374T2 (de) 2002-09-10 2002-12-11 Magnetoresistiver Speicher mit weichmagnetischen Referenzschichte

Country Status (7)

Country Link
US (1) US6980464B2 (de)
EP (1) EP1398789B1 (de)
JP (1) JP3788964B2 (de)
KR (1) KR100697140B1 (de)
CN (1) CN100354973C (de)
DE (1) DE60214374T2 (de)
TW (1) TWI223260B (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006032464A (ja) 2004-07-13 2006-02-02 Toshiba Corp 磁気ランダムアクセスメモリ
KR100601994B1 (ko) * 2005-03-02 2006-07-18 삼성전자주식회사 외부 자기장 발생수단을 구비하는 메모리 장치와 그 동작및 제조 방법
KR100697282B1 (ko) 2005-03-28 2007-03-20 삼성전자주식회사 저항 메모리 셀, 그 형성 방법 및 이를 이용한 저항 메모리배열
EP1863034B1 (de) 2006-05-04 2011-01-05 Hitachi, Ltd. Magnetspeichervorrichtung
JP4923896B2 (ja) * 2006-09-15 2012-04-25 富士通株式会社 交換結合膜及び磁気デバイス
US8054677B2 (en) * 2008-08-07 2011-11-08 Seagate Technology Llc Magnetic memory with strain-assisted exchange coupling switch
US8223532B2 (en) 2008-08-07 2012-07-17 Seagate Technology Llc Magnetic field assisted STRAM cells
US20100053822A1 (en) * 2008-08-28 2010-03-04 Seagate Technology Llc Stram cells with ampere field assisted switching
US7746687B2 (en) 2008-09-30 2010-06-29 Seagate Technology, Llc Thermally assisted multi-bit MRAM
US8487390B2 (en) 2008-10-08 2013-07-16 Seagate Technology Llc Memory cell with stress-induced anisotropy
US8217478B2 (en) 2008-10-10 2012-07-10 Seagate Technology Llc Magnetic stack with oxide to reduce switching current
US8053255B2 (en) 2009-03-03 2011-11-08 Seagate Technology Llc STRAM with compensation element and method of making the same
DE102010055754A1 (de) * 2010-12-22 2012-06-28 Sensitec Gmbh Magnetoresistives Sensorelement
JP2012156167A (ja) * 2011-01-21 2012-08-16 Toshiba Corp 磁気ランダムアクセスメモリ及びその製造方法
JP5768494B2 (ja) 2011-05-19 2015-08-26 ソニー株式会社 記憶素子、記憶装置
NL1040700B1 (nl) 2014-03-03 2015-11-10 Heatpoint B V Kabelgoot.
US10460779B2 (en) * 2017-02-08 2019-10-29 Crocus Technology Inc. MRAM reference cell with shape anisotropy to establish a well-defined magnetization orientation between a reference layer and a storage layer
JP2018148159A (ja) * 2017-03-09 2018-09-20 ソニーセミコンダクタソリューションズ株式会社 磁気メモリ、磁気メモリの記録方法及び磁気メモリの読み出し方法

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US3483534A (en) 1966-07-15 1969-12-09 Ibm Nondestructive-readout memory device
US5578943A (en) * 1995-01-05 1996-11-26 Bell-Northern Research Ltd. Signal transmitter and apparatus incorporating same
US5587943A (en) * 1995-02-13 1996-12-24 Integrated Microtransducer Electronics Corporation Nonvolatile magnetoresistive memory with fully closed flux operation
US5579943A (en) 1995-05-24 1996-12-03 Phoenix Closures, Inc. Container and dispensing closure lid having a tear-away tab
JP3333670B2 (ja) * 1995-09-22 2002-10-15 ティーディーケイ株式会社 磁性薄膜メモリ
DE69835475D1 (de) 1997-04-28 2006-09-21 Canon Kk Magnetisches Dünnfilmspeicherelement unter Verwendung des GMR-Effekts und magnetischer Dünnfilmspeicher
JP3650735B2 (ja) 1998-08-12 2005-05-25 インフィネオン テクノロジース アクチエンゲゼルシャフト 磁気抵抗性素子
US6215695B1 (en) * 1998-12-08 2001-04-10 Canon Kabushiki Kaisha Magnetoresistance element and magnetic memory device employing the same
JP3589346B2 (ja) * 1999-06-17 2004-11-17 松下電器産業株式会社 磁気抵抗効果素子および磁気抵抗効果記憶素子
US6134138A (en) * 1999-07-30 2000-10-17 Honeywell Inc. Method and apparatus for reading a magnetoresistive memory
JP3891540B2 (ja) 1999-10-25 2007-03-14 キヤノン株式会社 磁気抵抗効果メモリ、磁気抵抗効果メモリに記録される情報の記録再生方法、およびｍｒａｍ
US6383534B1 (en) * 2000-01-18 2002-05-07 Lorin Dyrr Mineral water composition
JP3920564B2 (ja) * 2000-12-25 2007-05-30 株式会社東芝 磁気ランダムアクセスメモリ
JP4712204B2 (ja) * 2001-03-05 2011-06-29 ルネサスエレクトロニクス株式会社 記憶装置
US6404674B1 (en) * 2001-04-02 2002-06-11 Hewlett Packard Company Intellectual Property Administrator Cladded read-write conductor for a pinned-on-the-fly soft reference layer
US6538920B2 (en) 2001-04-02 2003-03-25 Manish Sharma Cladded read conductor for a pinned-on-the-fly soft reference layer
US6576969B2 (en) 2001-09-25 2003-06-10 Hewlett-Packard Development Company, L.P. Magneto-resistive device having soft reference layer
US6795281B2 (en) * 2001-09-25 2004-09-21 Hewlett-Packard Development Company, L.P. Magneto-resistive device including soft synthetic ferrimagnet reference layer
US6504221B1 (en) 2001-09-25 2003-01-07 Hewlett-Packard Company Magneto-resistive device including soft reference layer having embedded conductors
US6538917B1 (en) 2001-09-25 2003-03-25 Hewlett-Packard Development Company, L.P. Read methods for magneto-resistive device having soft reference layer
DE10149737A1 (de) 2001-10-09 2003-04-24 Infineon Technologies Ag Halbleiterspeicher mit sich kreuzenden Wort- und Bitleitungen, an denen magnetoresistive Speicherzellen angeordnet sind
US6750491B2 (en) 2001-12-20 2004-06-15 Hewlett-Packard Development Company, L.P. Magnetic memory device having soft reference layer
AU2002366899A1 (en) 2001-12-20 2003-07-09 Koninklijke Philips Electronics N.V. Increased magnetic stability devices suitable for use as sub-micron memories
US6606262B2 (en) * 2002-01-10 2003-08-12 Hewlett-Packard Development Company, L.P. Magnetoresistive random access memory (MRAM) with on-chip automatic determination of optimized write current method and apparatus
US6646910B2 (en) * 2002-03-04 2003-11-11 Hewlett-Packard Development Company, L.P. Magnetic memory using reverse magnetic field to improve half-select margin
US6593608B1 (en) 2002-03-15 2003-07-15 Hewlett-Packard Development Company, L.P. Magneto resistive storage device having double tunnel junction
US6850433B2 (en) 2002-07-15 2005-02-01 Hewlett-Packard Development Company, Lp. Magnetic memory device and method
US6654278B1 (en) 2002-07-31 2003-11-25 Motorola, Inc. Magnetoresistance random access memory
US6801451B2 (en) 2002-09-03 2004-10-05 Hewlett-Packard Development Company, L.P. Magnetic memory devices having multiple bits per memory cell

Also Published As

Publication number Publication date
DE60214374T2 (de) 2007-09-20
EP1398789A2 (de) 2004-03-17
KR100697140B1 (ko) 2007-03-20
CN100354973C (zh) 2007-12-12
US20040047177A1 (en) 2004-03-11
US6980464B2 (en) 2005-12-27
CN1495793A (zh) 2004-05-12
KR20040023764A (ko) 2004-03-18
TW200405334A (en) 2004-04-01
EP1398789B1 (de) 2006-08-30
JP2004103125A (ja) 2004-04-02
EP1398789A3 (de) 2004-06-02
TWI223260B (en) 2004-11-01
JP3788964B2 (ja) 2006-06-21

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Legal Events

Date Code Title Description
8381 Inventor (new situation)

Inventor name: FUKUZUMI, YOSHIAKI, MINATO-KU, TOKYO 105-8001, JP

8364 No opposition during term of opposition