DE60221346D1 - Gasanalysator unter Verwendung von thermischen Sensoren - Google Patents
Gasanalysator unter Verwendung von thermischen SensorenInfo
- Publication number
- DE60221346D1 DE60221346D1 DE60221346T DE60221346T DE60221346D1 DE 60221346 D1 DE60221346 D1 DE 60221346D1 DE 60221346 T DE60221346 T DE 60221346T DE 60221346 T DE60221346 T DE 60221346T DE 60221346 D1 DE60221346 D1 DE 60221346D1
- Authority
- DE
- Germany
- Prior art keywords
- gas analyzer
- thermal sensors
- sensors
- thermal
- analyzer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02396036A EP1347290B1 (de) | 2002-03-22 | 2002-03-22 | Gasanalysator unter Verwendung von thermischen Sensoren |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60221346D1 true DE60221346D1 (de) | 2007-09-06 |
DE60221346T2 DE60221346T2 (de) | 2008-04-17 |
Family
ID=27771969
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60221346T Expired - Lifetime DE60221346T2 (de) | 2002-03-22 | 2002-03-22 | Gasanalysator unter Verwendung von thermischen Sensoren |
Country Status (3)
Country | Link |
---|---|
US (1) | US6694800B2 (de) |
EP (1) | EP1347290B1 (de) |
DE (1) | DE60221346T2 (de) |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6617175B1 (en) * | 2002-05-08 | 2003-09-09 | Advanced Technology Materials, Inc. | Infrared thermopile detector system for semiconductor process monitoring and control |
US7129519B2 (en) * | 2002-05-08 | 2006-10-31 | Advanced Technology Materials, Inc. | Monitoring system comprising infrared thermopile detector |
US6766962B2 (en) * | 2002-07-15 | 2004-07-27 | Teleflex Canada Limited Partnership | Temperature maintaining apparatus and temperature control apparatus and method therefor |
US7228724B2 (en) * | 2002-10-17 | 2007-06-12 | Advanced Technology Materials, Inc. | Apparatus and process for sensing target gas species in semiconductor processing systems |
US7296458B2 (en) * | 2002-10-17 | 2007-11-20 | Advanced Technology Materials, Inc | Nickel-coated free-standing silicon carbide structure for sensing fluoro or halogen species in semiconductor processing systems, and processes of making and using same |
US7080545B2 (en) * | 2002-10-17 | 2006-07-25 | Advanced Technology Materials, Inc. | Apparatus and process for sensing fluoro species in semiconductor processing systems |
US6936496B2 (en) * | 2002-12-20 | 2005-08-30 | Hewlett-Packard Development Company, L.P. | Nanowire filament |
JP2004294214A (ja) * | 2003-03-26 | 2004-10-21 | Nippon Soken Inc | ガス検出装置 |
US7063097B2 (en) | 2003-03-28 | 2006-06-20 | Advanced Technology Materials, Inc. | In-situ gas blending and dilution system for delivery of dilute gas at a predetermined concentration |
WO2004088415A2 (en) * | 2003-03-28 | 2004-10-14 | Advanced Technology Materials Inc. | Photometrically modulated delivery of reagents |
DE10315864B4 (de) * | 2003-04-08 | 2006-01-12 | Dräger Medical AG & Co. KGaA | Vorrichtung und Verfahren zur Konzentrationsbestimmung mindestens einer Gaskomponente in einem Atemgasgemisch |
US7032431B2 (en) * | 2003-06-13 | 2006-04-25 | Baum Marc A | Non-invasive, miniature, breath monitoring apparatus |
US7132298B2 (en) | 2003-10-07 | 2006-11-07 | Hewlett-Packard Development Company, L.P. | Fabrication of nano-object array |
US7223611B2 (en) * | 2003-10-07 | 2007-05-29 | Hewlett-Packard Development Company, L.P. | Fabrication of nanowires |
DE102004006677A1 (de) * | 2004-02-11 | 2005-09-15 | Kendro Laboratory Products Gmbh | Infrarot-Gassensor und Verfahren zur Gaskonzentrationsmessung mit diesem Sensor |
US7407738B2 (en) * | 2004-04-02 | 2008-08-05 | Pavel Kornilovich | Fabrication and use of superlattice |
US7247531B2 (en) | 2004-04-30 | 2007-07-24 | Hewlett-Packard Development Company, L.P. | Field-effect-transistor multiplexing/demultiplexing architectures and methods of forming the same |
US20050241959A1 (en) * | 2004-04-30 | 2005-11-03 | Kenneth Ward | Chemical-sensing devices |
US7683435B2 (en) | 2004-04-30 | 2010-03-23 | Hewlett-Packard Development Company, L.P. | Misalignment-tolerant multiplexing/demultiplexing architectures |
US7069768B2 (en) * | 2004-06-08 | 2006-07-04 | Instrumentarium Corp. | Method and apparatus for eliminating and compensating thermal transients in gas analyzer |
DE102004028077A1 (de) * | 2004-06-09 | 2005-12-29 | Tyco Electronics Raychem Gmbh | Gassensoranordnung mit verkürzter Einschwingzeit |
US20060024814A1 (en) * | 2004-07-29 | 2006-02-02 | Peters Kevin F | Aptamer-functionalized electrochemical sensors and methods of fabricating and using the same |
US7375012B2 (en) * | 2005-02-28 | 2008-05-20 | Pavel Kornilovich | Method of forming multilayer film |
US20060211253A1 (en) * | 2005-03-16 | 2006-09-21 | Ing-Shin Chen | Method and apparatus for monitoring plasma conditions in an etching plasma processing facility |
WO2006121321A1 (en) * | 2005-05-10 | 2006-11-16 | Sensata Technologies Holland B.V. | Sensor module package |
US7659504B1 (en) * | 2005-05-18 | 2010-02-09 | Ric Investments, Llc | Optical sensor with an optical element transmissive to warming radiation |
TWI402098B (zh) * | 2005-06-22 | 2013-07-21 | Advanced Tech Materials | 整合式氣體混合用之裝置及方法 |
US20080006775A1 (en) * | 2006-06-22 | 2008-01-10 | Arno Jose I | Infrared gas detection systems and methods |
US7656302B2 (en) * | 2006-11-20 | 2010-02-02 | Honeywell International Inc. | Sensing chamber with enhanced ambient atmospheric flow |
US8383046B1 (en) * | 2007-04-16 | 2013-02-26 | Murthy Tata | Analyzer apparatus for measuring dissolved volatile substances and method |
US7824100B2 (en) * | 2007-08-08 | 2010-11-02 | General Electric Company | Temperature measurement device that estimates and compensates for incident radiation |
US7535007B1 (en) * | 2008-02-26 | 2009-05-19 | Honeywell International Inc. | Multiple chamber dual channel infrared gas detection system |
EP2169369A1 (de) | 2008-09-25 | 2010-03-31 | General Electric Company | Miniatur-Thermosäulensensor |
WO2010138930A2 (en) | 2009-05-29 | 2010-12-02 | Advanced Technology Materials, Inc. | Tpir apparatus for monitoring tungsten hexafluoride processing to detect gas phase nucleation, and method and system utilizing same |
DE102009037706A1 (de) * | 2009-08-17 | 2011-02-24 | Opsolution Nanophotonics Gmbh | Verfahren und Vorrichtung zur Bestimmung der Konzentration von NO2 in Gasgemischen |
WO2012126470A1 (en) * | 2011-03-23 | 2012-09-27 | Danfoss Ixa A/S | High temperature gas sensor |
AU2012346560B2 (en) * | 2011-12-02 | 2015-05-14 | Senseair Ab | Epoxy molded gas cell for optical measurement and method of forming |
GB2500238B (en) * | 2012-03-15 | 2014-04-30 | Crowcon Detection Instr Ltd | Passively cooled gas detector |
US9250126B2 (en) | 2012-10-26 | 2016-02-02 | Excelitas Technologies Singapore Pte. Ltd | Optical sensing element arrangement with integral package |
CN103884671A (zh) * | 2014-03-12 | 2014-06-25 | 中国计量学院 | 一种不分光红外(ndir)co2气体传感器 |
DE102016012971B4 (de) | 2016-10-28 | 2023-02-09 | Drägerwerk AG & Co. KGaA | Vorrichtung zur Konzentrationsbestimmung mindestens einer Gaskomponente in einem Atemgasgemisch |
US10466174B2 (en) * | 2016-12-13 | 2019-11-05 | Infineon Technologies Ag | Gas analyzer including a radiation source comprising a black-body radiator with at least one through-hole and a collimator |
US11047779B2 (en) | 2017-12-04 | 2021-06-29 | Montana Instruments Corporation | Analytical instruments, methods, and components |
CN110068375A (zh) * | 2019-05-27 | 2019-07-30 | 金卡智能集团股份有限公司 | 一种基于能量计量的燃气计量方法 |
US11956924B1 (en) | 2020-08-10 | 2024-04-09 | Montana Instruments Corporation | Quantum processing circuitry cooling systems and methods |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4772790A (en) * | 1986-10-14 | 1988-09-20 | Teledyne Industries, Inc. | Non-dispersive optical gas analyzer |
US5445158A (en) | 1988-12-06 | 1995-08-29 | Exergen Corporation | Radiation detector probe |
US5012813A (en) | 1988-12-06 | 1991-05-07 | Exergen Corporation | Radiation detector having improved accuracy |
US5081998A (en) | 1989-09-01 | 1992-01-21 | Critikon, Inc. | Optically stabilized infrared energy detector |
US5153436A (en) * | 1990-05-23 | 1992-10-06 | Ntc Technology, Inc. | Temperature controlled detectors for infrared-type gas analyzers |
US5296706A (en) * | 1992-12-02 | 1994-03-22 | Critikon, Inc. | Shutterless mainstream discriminating anesthetic agent analyzer |
FI934871A0 (fi) | 1993-11-03 | 1993-11-03 | Instrumentarium Oy | Foerfarande och anordning foer kompensering av vaermekrypningen hos en gasanalysator |
FI97082C (fi) * | 1994-07-11 | 1996-10-10 | Instrumentarium Oy | Kaasuanalysaattorin infrapunalähde sekä menetelmä infrapunasäteilyn muodostamiseksi |
US5793044A (en) * | 1995-11-09 | 1998-08-11 | Ntc Technology, Inc. | Infrared radiation detector units and methods of assembling transducers in which said units are incorporated |
US5747809A (en) * | 1996-06-11 | 1998-05-05 | Sri International | NDIR apparatus and method for measuring isotopic ratios in gaseous samples |
US5886348A (en) * | 1997-02-14 | 1999-03-23 | American Intell-Sensors Corporation | Non-dispersive infrared gas analyzer with interfering gas correction |
JPH11326250A (ja) * | 1998-05-19 | 1999-11-26 | Shinagawa Refract Co Ltd | 熱伝導率試験方法 |
US6277081B1 (en) | 1999-05-18 | 2001-08-21 | Invivo Research, Inc. | Anesthetic gas detection apparatus |
US20020026822A1 (en) * | 2000-07-26 | 2002-03-07 | Reading Andrew R. | Vehicle gas emission sampling and analysis assembly |
US6599253B1 (en) * | 2001-06-25 | 2003-07-29 | Oak Crest Institute Of Science | Non-invasive, miniature, breath monitoring apparatus |
-
2002
- 2002-03-22 EP EP02396036A patent/EP1347290B1/de not_active Expired - Lifetime
- 2002-03-22 DE DE60221346T patent/DE60221346T2/de not_active Expired - Lifetime
-
2003
- 2003-03-20 US US10/392,660 patent/US6694800B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US6694800B2 (en) | 2004-02-24 |
DE60221346T2 (de) | 2008-04-17 |
EP1347290A1 (de) | 2003-09-24 |
US20030177814A1 (en) | 2003-09-25 |
EP1347290B1 (de) | 2007-07-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |