DE60314915D1 - Kommunikationschnittstelle für diagnoseschaltungen einer integrierten schaltung - Google Patents

Kommunikationschnittstelle für diagnoseschaltungen einer integrierten schaltung

Info

Publication number
DE60314915D1
DE60314915D1 DE60314915T DE60314915T DE60314915D1 DE 60314915 D1 DE60314915 D1 DE 60314915D1 DE 60314915 T DE60314915 T DE 60314915T DE 60314915 T DE60314915 T DE 60314915T DE 60314915 D1 DE60314915 D1 DE 60314915D1
Authority
DE
Germany
Prior art keywords
integrated circuit
communication interface
diagnostic circuits
diagnostic
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60314915T
Other languages
English (en)
Other versions
DE60314915T2 (de
Inventor
Paul Kimelman
Ian Field
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ARM Ltd
Original Assignee
ARM Ltd
Advanced Risc Machines Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ARM Ltd, Advanced Risc Machines Ltd filed Critical ARM Ltd
Application granted granted Critical
Publication of DE60314915D1 publication Critical patent/DE60314915D1/de
Publication of DE60314915T2 publication Critical patent/DE60314915T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
    • G06F13/4282—Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
DE60314915T 2003-04-17 2003-09-17 Kommunikationschnittstelle für diagnoseschaltungen einer integrierten schaltung Expired - Lifetime DE60314915T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/417,330 US7197680B2 (en) 2003-04-17 2003-04-17 Communication interface for diagnostic circuits of an integrated circuit
US417330 2003-04-17
PCT/GB2003/004007 WO2004095041A1 (en) 2003-04-17 2003-09-17 Communication interface for diagnostic circuits of an integrated circuit

Publications (2)

Publication Number Publication Date
DE60314915D1 true DE60314915D1 (de) 2007-08-23
DE60314915T2 DE60314915T2 (de) 2008-03-13

Family

ID=33158877

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60314915T Expired - Lifetime DE60314915T2 (de) 2003-04-17 2003-09-17 Kommunikationschnittstelle für diagnoseschaltungen einer integrierten schaltung

Country Status (12)

Country Link
US (2) US7197680B2 (de)
EP (1) EP1613971B1 (de)
JP (1) JP3761562B1 (de)
KR (1) KR100981997B1 (de)
CN (1) CN100487472C (de)
AU (1) AU2003267574A1 (de)
DE (1) DE60314915T2 (de)
IL (1) IL167671A (de)
MY (1) MY138464A (de)
RU (1) RU2005132166A (de)
TW (1) TWI285303B (de)
WO (1) WO2004095041A1 (de)

Families Citing this family (78)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7444571B1 (en) * 2003-02-27 2008-10-28 Marvell International Ltd. Apparatus and method for testing and debugging an integrated circuit
US7216276B1 (en) 2003-02-27 2007-05-08 Marvell International Ltd. Apparatus and method for testing and debugging an integrated circuit
US7496818B1 (en) 2003-02-27 2009-02-24 Marvell International Ltd. Apparatus and method for testing and debugging an integrated circuit
US20040221312A1 (en) * 2003-05-01 2004-11-04 Genesis Microchip Inc. Techniques for reducing multimedia data packet overhead
US7567592B2 (en) * 2003-05-01 2009-07-28 Genesis Microchip Inc. Packet based video display interface enumeration method
US7068686B2 (en) * 2003-05-01 2006-06-27 Genesis Microchip Inc. Method and apparatus for efficient transmission of multimedia data packets
US7405719B2 (en) * 2003-05-01 2008-07-29 Genesis Microchip Inc. Using packet transfer for driving LCD panel driver electronics
US7088741B2 (en) * 2003-05-01 2006-08-08 Genesis Microchip Inc. Using an auxilary channel for video monitor training
US7839860B2 (en) 2003-05-01 2010-11-23 Genesis Microchip Inc. Packet based video display interface
US7620062B2 (en) * 2003-05-01 2009-11-17 Genesis Microchips Inc. Method of real time optimizing multimedia packet transmission rate
US8068485B2 (en) 2003-05-01 2011-11-29 Genesis Microchip Inc. Multimedia interface
US7733915B2 (en) 2003-05-01 2010-06-08 Genesis Microchip Inc. Minimizing buffer requirements in a digital video system
US8204076B2 (en) 2003-05-01 2012-06-19 Genesis Microchip Inc. Compact packet based multimedia interface
US6992987B2 (en) * 2003-05-01 2006-01-31 Genesis Microchip Inc. Enumeration method for the link clock rate and the pixel/audio clock rate
US7424558B2 (en) * 2003-05-01 2008-09-09 Genesis Microchip Inc. Method of adaptively connecting a video source and a video display
US8059673B2 (en) 2003-05-01 2011-11-15 Genesis Microchip Inc. Dynamic resource re-allocation in a packet based video display interface
US7800623B2 (en) 2003-09-18 2010-09-21 Genesis Microchip Inc. Bypassing pixel clock generation and CRTC circuits in a graphics controller chip
US7487273B2 (en) * 2003-09-18 2009-02-03 Genesis Microchip Inc. Data packet based stream transport scheduler wherein transport data link does not include a clock line
US7634090B2 (en) * 2003-09-26 2009-12-15 Genesis Microchip Inc. Packet based high definition high-bandwidth digital content protection
US20050204221A1 (en) * 2004-03-15 2005-09-15 Swoboda Gary L. Apparatus and method for exchanging non-JTAG signals with a core processor during selected JTAG modes
DE102004016387A1 (de) * 2004-04-02 2005-10-27 Texas Instruments Deutschland Gmbh Schnittstellenschaltung für einen einzelnen Logik-Eingangspin eines elektronischen Systems
US7793152B2 (en) * 2004-12-02 2010-09-07 Texas Instruments Incorporated Zero-bit scans defining command window and control level
US8219863B2 (en) * 2004-12-02 2012-07-10 Texas Instruments Incorporated TAP state count specifying advanced mode command and command data
US7552360B2 (en) 2005-03-21 2009-06-23 Texas Instruments Incorporated Debug and test system with format select register circuitry
KR100688516B1 (ko) * 2005-01-11 2007-03-02 삼성전자주식회사 단일 라인을 이용한 직렬 데이터 통신 방법 및 그 장치
US7701240B2 (en) * 2005-03-04 2010-04-20 Arm Limited Integrated circuit with error correction mechanisms to offset narrow tolerancing
US7558984B2 (en) * 2005-04-27 2009-07-07 Texas Instruments Incorporated Apparatus and method for test and debug of a processor/core having advanced power management
US7676698B2 (en) * 2005-04-27 2010-03-09 Texas Instruments Incorporated Apparatus and method for coupling a plurality of test access ports to external test and debug facility
US7536597B2 (en) * 2005-04-27 2009-05-19 Texas Instruments Incorporated Apparatus and method for controlling power, clock, and reset during test and debug procedures for a plurality of processor/cores
WO2007099479A2 (en) * 2006-03-01 2007-09-07 Koninklijke Philips Electronics N. V. Ic circuit with test access control circuit using a jtag interface
US7533315B2 (en) * 2006-03-06 2009-05-12 Mediatek Inc. Integrated circuit with scan-based debugging and debugging method thereof
US7526693B1 (en) * 2006-03-09 2009-04-28 Semiconductor Components Industries, Llc Initial decision-point circuit operation mode
US7650546B2 (en) * 2006-03-17 2010-01-19 Alcatel Lucent Flexible JTAG architecture
KR100817031B1 (ko) * 2006-08-25 2008-03-26 주식회사 케이이씨 단선 직렬 통신 모듈
US7818641B2 (en) 2006-10-18 2010-10-19 Texas Instruments Incorporated Interface to full and reduce pin JTAG devices
US7870455B2 (en) 2007-12-12 2011-01-11 Infineon Technologies Ag System-on-chip with master/slave debug interface
US8046650B2 (en) 2008-03-14 2011-10-25 Texas Instruments Incorporated TAP with control circuitry connected to device address port
EP2105750B1 (de) * 2008-03-28 2011-01-19 Micronas GmbH Schaltungsanordnung, Vorrichtung bzw. Verfahren zum seriellen Senden von Daten über einen Anschlusskontakt
US8464098B2 (en) * 2008-04-15 2013-06-11 Freescale Semiconductor, Inc. Microcontroller device, microcontroller debugging device, method of debugging a microcontroller device, microcontroller kit
US20090262667A1 (en) * 2008-04-21 2009-10-22 Stmicroelectronics, Inc. System and method for enabling topology mapping and communication between devices in a network
US20100183004A1 (en) * 2009-01-16 2010-07-22 Stmicroelectronics, Inc. System and method for dual mode communication between devices in a network
US8332641B2 (en) * 2009-01-30 2012-12-11 Freescale Semiconductor, Inc. Authenticated debug access for field returns
US8375250B2 (en) * 2009-03-04 2013-02-12 Infineon Technologies Ag System and method for testing a module
US8429440B2 (en) 2009-05-13 2013-04-23 Stmicroelectronics, Inc. Flat panel display driver method and system
US8760461B2 (en) * 2009-05-13 2014-06-24 Stmicroelectronics, Inc. Device, system, and method for wide gamut color space support
US8156238B2 (en) 2009-05-13 2012-04-10 Stmicroelectronics, Inc. Wireless multimedia transport method and apparatus
US8860888B2 (en) 2009-05-13 2014-10-14 Stmicroelectronics, Inc. Method and apparatus for power saving during video blanking periods
US8291207B2 (en) 2009-05-18 2012-10-16 Stmicroelectronics, Inc. Frequency and symbol locking using signal generated clock frequency and symbol identification
US8370554B2 (en) 2009-05-18 2013-02-05 Stmicroelectronics, Inc. Operation of video source and sink with hot plug detection not asserted
US8582452B2 (en) 2009-05-18 2013-11-12 Stmicroelectronics, Inc. Data link configuration by a receiver in the absence of link training data
US8468285B2 (en) 2009-05-18 2013-06-18 Stmicroelectronics, Inc. Operation of video source and sink with toggled hot plug detection
US8397195B2 (en) * 2010-01-22 2013-03-12 Synopsys, Inc. Method and system for packet switch based logic replication
US8638792B2 (en) 2010-01-22 2014-01-28 Synopsys, Inc. Packet switch based logic replication
TWI476422B (zh) * 2010-02-12 2015-03-11 Synopsys Shanghai Co Ltd Scanning Chain Reconfiguration Method and Device Based on Bidirectional Optimization Selection in Entity Design
US8671234B2 (en) 2010-05-27 2014-03-11 Stmicroelectronics, Inc. Level shifting cable adaptor and chip system for use with dual-mode multi-media device
US8949756B2 (en) 2010-12-10 2015-02-03 Apple Inc. Debug access with programmable return clock
US8781807B2 (en) * 2011-01-28 2014-07-15 Raymond E. Floyd Downhole sensor MODBUS data emulator
US10642709B2 (en) * 2011-04-19 2020-05-05 Microsoft Technology Licensing, Llc Processor cache tracing
US8732526B1 (en) * 2011-06-24 2014-05-20 Maxim Integrated Products, Inc. Single-wire data interface for programming, debugging and testing a programmable element
CN102662782B (zh) * 2012-04-17 2014-09-03 华为技术有限公司 一种监控系统总线的方法及装置
KR101910972B1 (ko) * 2012-10-24 2018-10-23 삼성전자주식회사 연료 전지 시스템 및 그것을 제어하는 전자 기기
US20150019775A1 (en) * 2013-03-14 2015-01-15 Microchip Technology Incorporated Single Wire Programming and Debugging Interface
DE102016109387A1 (de) 2015-05-26 2016-12-01 Samsung Electronics Co., Ltd. Ein-Chip-System mit Taktverwaltungseinheit und Verfahren zum Betreiben des Ein-Chip-Systems
KR102384347B1 (ko) * 2015-05-26 2022-04-07 삼성전자주식회사 클록 관리 유닛을 포함하는 시스템 온 칩 및 그 동작방법
DE102015218959A1 (de) 2015-09-30 2017-03-30 Zf Friedrichshafen Ag Diagnose eines Steuergeräts
TWI625534B (zh) * 2015-12-21 2018-06-01 瑞昱半導體股份有限公司 透過掃描測試的掃描鏈所執行的除錯方法及相關電路系統
US10067814B2 (en) 2016-04-28 2018-09-04 International Business Machines Corporation Method and system to decrease measured usage license charges for diagnostic data collection
US20180052203A1 (en) * 2016-08-22 2018-02-22 Prateek Sikka Method for enabling cpu-jtag debugger connection or improving its performance for multi-clock designs running on fpga or emulation systems
JP6342028B1 (ja) 2017-03-13 2018-06-13 三菱電機株式会社 車両用交流発電機の発電制御装置
TWI639847B (zh) * 2017-06-27 2018-11-01 Powerchip Technology Corporation 積體電路晶片及其檢查方法
US10361838B2 (en) * 2017-07-27 2019-07-23 Texas Instruments Incorporated Two-wire communication interface system
US11681843B2 (en) * 2018-01-17 2023-06-20 Siemens Industry Software Inc. Input data compression for machine learning-based chain diagnosis
US10963328B2 (en) 2018-09-05 2021-03-30 Mikroelektronika D.O.O. WiFi programmer and debugger for microcontroller and method thereof
US11119966B2 (en) * 2018-09-07 2021-09-14 Qualcomm Incorporated Mixed-mode radio frequency front-end interface
CN109857082B (zh) * 2018-12-29 2021-12-07 盛瑞传动股份有限公司 自动变速器诊断方法及装置
CN110032482A (zh) * 2019-04-11 2019-07-19 盛科网络（苏州）有限公司 片上调试装置和方法
CN113010344B (zh) * 2019-12-19 2022-10-11 瑞昱半导体股份有限公司 联合测试工作组存取接口装置、主机端以及目标系统
CN112527710B (zh) * 2020-12-17 2023-07-25 西安邮电大学 一种jtag数据捕获分析系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2768910B2 (ja) 1995-02-27 1998-06-25 日本モトローラ株式会社 半導体集積装置におけるスキャンテスト回路
GB9622682D0 (en) 1996-10-31 1997-01-08 Sgs Thomson Microelectronics An integrated circuit device and method of communication therewith
GB9622683D0 (en) * 1996-10-31 1997-01-08 Sgs Thomson Microelectronics Message protocol
US5842007A (en) * 1996-12-26 1998-11-24 Northern Telecom Limited Method and system for transferring high level control messaging framing and payload data in a serial stream in a communications system
US6041406A (en) * 1997-04-08 2000-03-21 Advanced Micro Devices, Inc. Parallel and serial debug port on a processor
US20020108011A1 (en) 2000-12-11 2002-08-08 Reza Tanha Dual interface serial bus
US6968472B2 (en) * 2002-04-22 2005-11-22 Silicon Labs Cp. Inc. Serial data interface

Also Published As

Publication number Publication date
DE60314915T2 (de) 2008-03-13
EP1613971A1 (de) 2006-01-11
AU2003267574A1 (en) 2004-11-19
WO2004095041A1 (en) 2004-11-04
JP3761562B1 (ja) 2006-03-29
MY138464A (en) 2009-06-30
JP2006514296A (ja) 2006-04-27
US20060242501A1 (en) 2006-10-26
CN100487472C (zh) 2009-05-13
EP1613971B1 (de) 2007-07-11
US7412633B2 (en) 2008-08-12
TWI285303B (en) 2007-08-11
KR100981997B1 (ko) 2010-09-13
TW200422811A (en) 2004-11-01
CN1764847A (zh) 2006-04-26
US20040210805A1 (en) 2004-10-21
RU2005132166A (ru) 2006-02-10
KR20060009260A (ko) 2006-01-31
US7197680B2 (en) 2007-03-27
IL167671A (en) 2009-09-22

Similar Documents

Publication Publication Date Title
DE60314915D1 (de) Kommunikationschnittstelle für diagnoseschaltungen einer integrierten schaltung
DE60303066D1 (de) Prüfspitze für integrierte Schaltungen
GB0409589D0 (en) Interconnect method for directly connected stacked integrated circuits
DE60216268D1 (de) Eingebaute Selbsttestschaltung für integrierte Schaltungen
DE60322826D1 (de) Integrierte Schaltung
DE602005025951D1 (de) Integrierter Halbleiterschaltkreis
EP1632999A4 (de) Batterieangebrachte integrierteschaltungseinrichtung
DE502004005579D1 (de) INSERTIONSVORRICHTUNG FüR DURCHSTECHVORRICHTUNGEN
GB2421847B (en) Integrated circuits
IL172668A0 (en) Interconnect structures in integrated circuit devices
DE602005026579D1 (de) Klebstoff für schaltkreisverbindungen
DE602005005430D1 (de) Integrierte Halbleiterschaltungsanordnung
DE60202401D1 (de) Eingangsschaltung für Sendeempfänger
GB0506556D0 (en) Communication semiconductor integrated circuit
DE60333289D1 (de) Chip verbunden mit einer integrierten schaltung
DE602004031698D1 (de) Integrierte Halbleiterschaltung
EP1774590A4 (de) Integrierte schaltungen mit modulintegration
DE60212034D1 (de) Multiplexerschaltung für einen schnellen getakteten Parallel/Serien-Wandler
DE502004009830D1 (de) Anschlussmodul für leistungsschalter
DE60229821D1 (de) Gehäuse für integrierte Schaltung
DE602004009750D1 (de) Gitterstiftsockel für integrierte Schaltung
DE60126385D1 (de) Steckvervindung für integrierte Schaltung
TW578910U (en) Integrated circuit probe card
GB0323021D0 (en) An integrated circuit device
DE502004010138D1 (de) Schaltungsmodul

Legal Events

Date Code Title Description
8381 Inventor (new situation)

Inventor name: KIMELMAN, PAUL, ALAMO, CA 94507, US

Inventor name: FIELD, IAN, WALNUT CREEK, CALIF., US

8364 No opposition during term of opposition