DE60335465D1 - Über den Inhalt anwählbare Speicherzelle - Google Patents
Über den Inhalt anwählbare SpeicherzelleInfo
- Publication number
- DE60335465D1 DE60335465D1 DE60335465T DE60335465T DE60335465D1 DE 60335465 D1 DE60335465 D1 DE 60335465D1 DE 60335465 T DE60335465 T DE 60335465T DE 60335465 T DE60335465 T DE 60335465T DE 60335465 D1 DE60335465 D1 DE 60335465D1
- Authority
- DE
- Germany
- Prior art keywords
- content
- memory cell
- selected via
- cell
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C15/00—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores
- G11C15/04—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores using semiconductor elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0004—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
- G11C14/0054—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a SRAM cell
- G11C14/009—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a SRAM cell and the nonvolatile element is a resistive RAM element, i.e. programmable resistors, e.g. formed of phase change or chalcogenide material
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C15/00—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores
- G11C15/04—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores using semiconductor elements
- G11C15/046—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores using semiconductor elements using non-volatile storage elements
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03103898A EP1526547B1 (de) | 2003-10-22 | 2003-10-22 | Über den Inhalt anwählbare Speicherzelle |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60335465D1 true DE60335465D1 (de) | 2011-02-03 |
Family
ID=34384685
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60335465T Expired - Lifetime DE60335465D1 (de) | 2003-10-22 | 2003-10-22 | Über den Inhalt anwählbare Speicherzelle |
Country Status (3)
Country | Link |
---|---|
US (1) | US7227765B2 (de) |
EP (2) | EP2261928B1 (de) |
DE (1) | DE60335465D1 (de) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7889544B2 (en) | 2004-04-05 | 2011-02-15 | Super Talent Electronics, Inc. | High-speed controller for phase-change memory peripheral device |
US7966429B2 (en) * | 2007-05-28 | 2011-06-21 | Super Talent Electronics, Inc. | Peripheral devices using phase-change memory |
US7471556B2 (en) * | 2007-05-15 | 2008-12-30 | Super Talent Electronics, Inc. | Local bank write buffers for accelerating a phase-change memory |
US7499303B2 (en) * | 2004-09-24 | 2009-03-03 | Integrated Device Technology, Inc. | Binary and ternary non-volatile CAM |
US7319608B2 (en) * | 2005-06-30 | 2008-01-15 | International Business Machines Corporation | Non-volatile content addressable memory using phase-change-material memory elements |
US7675765B2 (en) * | 2005-11-03 | 2010-03-09 | Agate Logic, Inc. | Phase-change memory (PCM) based universal content-addressable memory (CAM) configured as binary/ternary CAM |
US7505326B2 (en) | 2006-10-31 | 2009-03-17 | Atmel Corporation | Programming pulse generator |
US7417904B2 (en) | 2006-10-31 | 2008-08-26 | Atmel Corporation | Adaptive gate voltage regulation |
US20080270811A1 (en) * | 2007-04-26 | 2008-10-30 | Super Talent Electronics Inc. | Fast Suspend-Resume of Computer Motherboard Using Phase-Change Memory |
US7643334B1 (en) | 2007-04-26 | 2010-01-05 | Super Talent Electronics, Inc. | High-speed controller for phase-change memory peripheral device |
US7440316B1 (en) | 2007-04-30 | 2008-10-21 | Super Talent Electronics, Inc | 8/9 and 8/10-bit encoding to reduce peak surge currents when writing phase-change memory |
US7738274B1 (en) * | 2007-10-15 | 2010-06-15 | T-Ram Semiconductor, Inc. | Content-addressable memory architecture |
US8125829B2 (en) | 2008-05-02 | 2012-02-28 | Micron Technology, Inc. | Biasing system and method |
US7782646B2 (en) * | 2008-06-30 | 2010-08-24 | International Business Machines Corporation | High density content addressable memory using phase change devices |
US7881089B2 (en) | 2009-02-24 | 2011-02-01 | International Business Machines Corporation | Coding techniques for improving the sense margin in content addressable memories |
US8120937B2 (en) * | 2009-03-06 | 2012-02-21 | International Business Machines Corporation | Ternary content addressable memory using phase change devices |
US7872889B2 (en) | 2009-04-21 | 2011-01-18 | International Business Machines Corporation | High density ternary content addressable memory |
US8264862B2 (en) * | 2010-11-24 | 2012-09-11 | Lsi Corporation | Low power SRAM based content addressable memory |
JP5907524B2 (ja) * | 2011-02-25 | 2016-04-26 | 国立大学法人東北大学 | 不揮発機能メモリ装置 |
US8908407B1 (en) * | 2011-07-30 | 2014-12-09 | Rambus Inc. | Content addressable memory (“CAM”) |
US9588908B2 (en) | 2015-06-02 | 2017-03-07 | Bertrand F. Cambou | Memory circuit using resistive random access memory arrays in a secure element |
KR102367338B1 (ko) * | 2017-09-11 | 2022-02-25 | 삼성전자주식회사 | Tcam 장치 및 그것의 동작 방법 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3544977A (en) * | 1967-12-22 | 1970-12-01 | Int Standard Electric Corp | Associative memory matrix using series connected diodes having variable resistance values |
EP0230304A3 (de) * | 1986-01-21 | 1991-03-13 | Energy Conversion Devices, Inc. | Inhaltsadressierbarer Speicher |
JPH0743946B2 (ja) * | 1988-01-18 | 1995-05-15 | 三菱電機株式会社 | 不揮発性cam |
GB2230882B (en) * | 1988-02-23 | 1992-04-22 | Mitsubishi Electric Corp | Content addressable memory device |
US6317349B1 (en) | 1999-04-16 | 2001-11-13 | Sandisk Corporation | Non-volatile content addressable memory |
US6304477B1 (en) * | 2001-01-31 | 2001-10-16 | Motorola, Inc. | Content addressable magnetic random access memory |
US6560156B2 (en) * | 2001-02-08 | 2003-05-06 | Integrated Device Technology, Inc. | CAM circuit with radiation resistance |
EP1324345A1 (de) * | 2001-12-27 | 2003-07-02 | STMicroelectronics S.r.l. | Nichtflüchtige Speicheranordnung mit einziger Speisespannung mit Kaskode-Spaltendekodiererung |
US6909645B2 (en) * | 2002-07-16 | 2005-06-21 | Intel Corporation | Cluster based redundancy scheme for semiconductor memories |
US6868022B2 (en) * | 2003-03-28 | 2005-03-15 | Matrix Semiconductor, Inc. | Redundant memory structure using bad bit pointers |
-
2003
- 2003-10-22 DE DE60335465T patent/DE60335465D1/de not_active Expired - Lifetime
- 2003-10-22 EP EP10183801A patent/EP2261928B1/de not_active Expired - Lifetime
- 2003-10-22 EP EP03103898A patent/EP1526547B1/de not_active Expired - Lifetime
-
2004
- 2004-10-20 US US10/970,842 patent/US7227765B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP2261928A3 (de) | 2011-04-20 |
US20060018183A1 (en) | 2006-01-26 |
EP1526547A1 (de) | 2005-04-27 |
EP2261928A2 (de) | 2010-12-15 |
EP2261928B1 (de) | 2012-09-05 |
US7227765B2 (en) | 2007-06-05 |
EP1526547B1 (de) | 2010-12-22 |
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