DE68908347D1 - Messen der form eines objektes. - Google Patents

Messen der form eines objektes.

Info

Publication number
DE68908347D1
DE68908347D1 DE8989311582T DE68908347T DE68908347D1 DE 68908347 D1 DE68908347 D1 DE 68908347D1 DE 8989311582 T DE8989311582 T DE 8989311582T DE 68908347 T DE68908347 T DE 68908347T DE 68908347 D1 DE68908347 D1 DE 68908347D1
Authority
DE
Germany
Prior art keywords
measuring
shape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8989311582T
Other languages
English (en)
Other versions
DE68908347T2 (de
Inventor
Martin Phillip Smith
Robin Wyncliffe Smith
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anstalt Gersan
Original Assignee
Anstalt Gersan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anstalt Gersan filed Critical Anstalt Gersan
Application granted granted Critical
Publication of DE68908347D1 publication Critical patent/DE68908347D1/de
Publication of DE68908347T2 publication Critical patent/DE68908347T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
DE89311582T 1988-11-09 1989-11-09 Messen der Form eines Objektes. Expired - Fee Related DE68908347T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB888826224A GB8826224D0 (en) 1988-11-09 1988-11-09 Sensing shape of object

Publications (2)

Publication Number Publication Date
DE68908347D1 true DE68908347D1 (de) 1993-09-16
DE68908347T2 DE68908347T2 (de) 1993-11-25

Family

ID=10646564

Family Applications (1)

Application Number Title Priority Date Filing Date
DE89311582T Expired - Fee Related DE68908347T2 (de) 1988-11-09 1989-11-09 Messen der Form eines Objektes.

Country Status (10)

Country Link
US (1) US5076698A (de)
EP (1) EP0368647B1 (de)
JP (1) JPH03183904A (de)
AU (1) AU619056B2 (de)
CA (1) CA2002547C (de)
DE (1) DE68908347T2 (de)
GB (2) GB8826224D0 (de)
IE (1) IE62699B1 (de)
IL (1) IL92228A (de)
ZA (1) ZA898492B (de)

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JP3204406B2 (ja) * 1991-10-30 2001-09-04 株式会社ニコン 面位置検出方法及び装置、半導体露光装置、並びに前記方法を用いた露光方法
FR2685764B1 (fr) * 1991-12-30 1995-03-17 Kreon Ind Capteur optique compact et a haute resolution pour l'analyse de formes tridimensionnelles.
DE4413758C2 (de) * 1993-04-21 1998-09-17 Fraunhofer Ges Forschung Vorrichtung und Verfahren zur Prüfung der Gestalt einer Oberfläche eines zu vermessenden Objektes
JPH0918234A (ja) * 1995-04-27 1997-01-17 Seiko Epson Corp 温度補償圧電発振器
US6141105A (en) * 1995-11-17 2000-10-31 Minolta Co., Ltd. Three-dimensional measuring device and three-dimensional measuring method
US6873340B2 (en) 1997-05-15 2005-03-29 Visimatix, Inc. Method and apparatus for an automated reference indicator system for photographic and video images
WO1999004361A1 (en) * 1997-07-16 1999-01-28 Diversified Scientific, Inc. Method for acquiring, storing and analyzing crystal images
USD427243S (en) * 1997-12-15 2000-06-27 Visimatix, Inc. Reference indicator patch for use in an automated reference indicator system for photographic and video images
US6020954A (en) 1997-12-18 2000-02-01 Imagestatistics, Inc. Method and associated apparatus for the standardized grading of gemstones
US6980283B1 (en) 1997-12-18 2005-12-27 Imagestatistics, Inc. Method and associated apparatus for the standardized grading of gemstones
DE19911419A1 (de) 1998-03-16 1999-10-14 Cyberoptics Corp Digitales Bereichssensorsystem
IL126809A (en) * 1998-10-29 2001-08-26 Sarin Technologies Ltd Apparatus and method of examining the shape of gemstones
US7247490B2 (en) 1999-04-06 2007-07-24 Uab Research Foundation Method for screening crystallization conditions in solution crystal growth
US7244396B2 (en) 1999-04-06 2007-07-17 Uab Research Foundation Method for preparation of microarrays for screening of crystal growth conditions
US7214540B2 (en) * 1999-04-06 2007-05-08 Uab Research Foundation Method for screening crystallization conditions in solution crystal growth
US7250305B2 (en) 2001-07-30 2007-07-31 Uab Research Foundation Use of dye to distinguish salt and protein crystals under microcrystallization conditions
US20030022383A1 (en) * 1999-04-06 2003-01-30 Uab Research Foundation Method for screening crystallization conditions in solution crystal growth
US6208412B1 (en) 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
US6100990A (en) * 1999-06-14 2000-08-08 Ford Motor Company Method and apparatus for determining reflective optical quality using gray-scale patterns
US6630006B2 (en) * 1999-06-18 2003-10-07 The Regents Of The University Of California Method for screening microcrystallizations for crystal formation
AU779164B2 (en) * 1999-11-05 2005-01-06 Imagestatistics, Inc. Method and associated apparatus for the standardized grading of gemstones
US6603561B2 (en) 2001-02-20 2003-08-05 Thomas D. Ditto Chromatic diffraction range finder
US7670429B2 (en) 2001-04-05 2010-03-02 The California Institute Of Technology High throughput screening of crystallization of materials
AT410602B (de) * 2001-12-12 2003-06-25 Swarovski & Co Verfahren zur vermessung der oberfläche eines geschliffenen schmucksteines
US7436498B2 (en) * 2005-06-08 2008-10-14 Sarin Technologies Ltd. Apparatus for determining the shape of a gemstone
JP2012225700A (ja) * 2011-04-18 2012-11-15 Mitsutoyo Corp 形状測定装置
US11574282B2 (en) 2019-12-20 2023-02-07 International Business Machines Corporation Optimal cargo space utilization based on detection of items

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US751347A (en) * 1904-02-02 -scheimpflug
FR1534762A (fr) * 1967-05-18 1968-08-02 Cilas Procédé et dispositif de palpage optique
DE1673927A1 (de) * 1968-02-09 1971-08-12 Philips Patentverwaltung Verfahren und Anordnung zur Wiedererkennung eines Koerpers oder seiner Position und Orientierung im Raum
GB1184633A (en) * 1968-02-16 1970-03-18 Trw Inc Image Spectrophotometer.
DE2113522C3 (de) * 1971-03-19 1974-05-09 Siemens Ag Verfahren zuna berühningsfreien Messen eines Oberflächenprofils
BE789234A (fr) * 1971-09-29 1973-01-15 Colorant Schmuckstein G M B H Procede et dispositif pour l'enregistrement des qualites de pierres de bijouterie
BE789819A (fr) * 1971-10-08 1973-02-01 Western Electric Co Procede et dispositif pour mesurer une dimension d'une piece
US3758188A (en) * 1972-06-06 1973-09-11 American Optical Corp Image-transmitting optical system
GB1416568A (en) * 1972-10-20 1975-12-03 Wilson S S Method of and apparatus for evaluating registering and identifying gemstones
US3879131A (en) * 1974-02-06 1975-04-22 Bell Telephone Labor Inc Photomask inspection by real time diffraction pattern analysis
US3943278A (en) * 1974-08-22 1976-03-09 Stanford Research Institute Surface deformation gauging system by moire interferometry
US4202630A (en) * 1975-01-15 1980-05-13 Fuji Photo Optical Co., Ltd. Method of and apparatus for recording surface irregularity of object
US4017188A (en) * 1975-02-26 1977-04-12 The Bendix Corporation Surface profile measuring device and method
SE404549B (sv) * 1976-12-07 1978-10-09 Hard Av Segerstad Sverker Anordning for faststellande av konditionen hos en yta eller inhomogeniteter i en transparent volym
US4158507A (en) * 1977-07-27 1979-06-19 Recognition Equipment Incorporated Laser measuring system for inspection
US4168908A (en) * 1977-12-30 1979-09-25 The United States Of America As Represented By The Secretary Of The Air Force Precision pointing and tracking control system
DE2929694A1 (de) * 1979-07-21 1981-02-12 Roland Man Druckmasch Vorrichtung zum messen des anstelldruckes zwischen zwei schmitzringen
US4336989A (en) * 1979-11-29 1982-06-29 Canon Kabushiki Kaisha Focusing screen
HU182123B (en) * 1980-04-17 1983-12-28 Budapesti Mueszaki Egyetem Method and apparatus for mesuring the physical characteristics of materials in motion using coherent light source with heterodyn sensing of the reflected or scattered light from the materials
GB2081439B (en) * 1980-06-04 1984-08-08 Gersan Ets Examining a gem stone
GB2080712B (en) * 1980-06-04 1983-12-21 Gersan Ets Centering and working gem stones
EP0042361A1 (de) * 1980-06-17 1981-12-23 GRETAG Aktiengesellschaft Verfahren und Vorrichtung zur maschinellen Identifikation von Edelsteinen
US4463600A (en) * 1980-09-23 1984-08-07 University Of Birmingham Automatic measurement of areas
JPS5767815A (en) * 1980-10-16 1982-04-24 Mitsuhiro Ueda Measuring method for position of reflector using light
US4455087A (en) * 1981-04-06 1984-06-19 Hamamatsu Systems Inc. Monochromatic imaging apparatus
GB2096793B (en) * 1981-04-06 1985-02-20 Gersan Ets Visually examining a gem stone
GB2103355B (en) * 1981-08-03 1985-08-07 Gersan Ets Examining a gemstone
US4428676A (en) * 1981-10-23 1984-01-31 International Business Machines Corporation Optical system for oblique viewing
US4705396A (en) * 1982-09-04 1987-11-10 Bergstroem Arne Image monochromator
US4630925A (en) * 1982-11-01 1986-12-23 Hamamatsu Corp. Compact temporal spectral photometer
US4564295A (en) * 1983-03-07 1986-01-14 New York Institute Of Technology Apparatus and method for projection moire topography
GB2140503B (en) * 1983-05-27 1987-03-18 Graham Frank Loft Ejectors in i.c. engine exhaust systems
JPS6042606A (ja) * 1983-08-04 1985-03-06 ナノメトリツクス・インコ−ポレ−テツド 光学的寸法測定装置
US4657394A (en) * 1984-09-14 1987-04-14 New York Institute Of Technology Apparatus and method for obtaining three dimensional surface contours
SE447848B (sv) * 1985-06-14 1986-12-15 Anders Bengtsson Instrument for metning av ytors topografi
US4678324A (en) * 1985-12-04 1987-07-07 Thomas De Witt Range finding by diffraction
GB8603563D0 (en) * 1986-02-13 1986-03-19 Pilkington Brothers Plc Surface measurement
US4758093A (en) * 1986-07-11 1988-07-19 Robotic Vision Systems, Inc. Apparatus and method for 3-D measurement using holographic scanning
IE862086L (en) * 1986-08-05 1988-02-05 Bramleigh Ass Ltd Glass inspection
JPH0615972B2 (ja) * 1986-12-05 1994-03-02 ライトロン株式会社 距離測定方法及びその装置
US4786815A (en) * 1987-02-12 1988-11-22 K. J. Law Engineers, Inc. Non-contact sensor with particular utility for measurement of road profile
CA1297285C (en) * 1987-04-17 1992-03-17 Kevin G. Harding High accuracy structured light profiler
US4875777A (en) * 1987-09-30 1989-10-24 Industrial Technology Institute Off-axis high accuracy structured light profiler

Also Published As

Publication number Publication date
DE68908347T2 (de) 1993-11-25
ZA898492B (en) 1990-08-29
EP0368647A2 (de) 1990-05-16
GB2226133A (en) 1990-06-20
CA2002547A1 (en) 1990-05-09
IE62699B1 (en) 1995-02-22
GB8925307D0 (en) 1989-12-28
US5076698A (en) 1991-12-31
GB8826224D0 (en) 1988-12-14
EP0368647B1 (de) 1993-08-11
IL92228A0 (en) 1990-07-26
AU4443489A (en) 1990-05-17
JPH03183904A (ja) 1991-08-09
CA2002547C (en) 2002-01-08
AU619056B2 (en) 1992-01-16
EP0368647A3 (en) 1990-12-19
IL92228A (en) 1992-07-15
IE893612L (en) 1990-05-09
GB2226133B (en) 1993-05-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee