DE69013428D1 - Verfahren zum Feststellen von Lageabweichungen. - Google Patents
Verfahren zum Feststellen von Lageabweichungen.Info
- Publication number
- DE69013428D1 DE69013428D1 DE69013428T DE69013428T DE69013428D1 DE 69013428 D1 DE69013428 D1 DE 69013428D1 DE 69013428 T DE69013428 T DE 69013428T DE 69013428 T DE69013428 T DE 69013428T DE 69013428 D1 DE69013428 D1 DE 69013428D1
- Authority
- DE
- Germany
- Prior art keywords
- procedure
- determining position
- position deviations
- deviations
- determining
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7023—Aligning or positioning in direction perpendicular to substrate surface
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7049—Technique, e.g. interferometric
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1186937A JP2704002B2 (ja) | 1989-07-18 | 1989-07-18 | 位置検出方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69013428D1 true DE69013428D1 (de) | 1994-11-24 |
DE69013428T2 DE69013428T2 (de) | 1995-03-30 |
Family
ID=16197331
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69013428T Expired - Fee Related DE69013428T2 (de) | 1989-07-18 | 1990-07-17 | Verfahren zum Feststellen von Lageabweichungen. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5114235A (de) |
EP (1) | EP0409573B1 (de) |
JP (1) | JP2704002B2 (de) |
DE (1) | DE69013428T2 (de) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5294980A (en) * | 1988-03-24 | 1994-03-15 | Canon Kabushiki Kaisha | Positioning detecting method and apparatus |
US5235408A (en) * | 1988-09-05 | 1993-08-10 | Canon Kabushiki Kaisha | Position detecting method and apparatus |
EP0455443B1 (de) * | 1990-05-01 | 1997-11-12 | Canon Kabushiki Kaisha | Verfahren und Apparat zur Detektion von Lageabweichungen |
US5200800A (en) * | 1990-05-01 | 1993-04-06 | Canon Kabushiki Kaisha | Position detecting method and apparatus |
JPH0540013A (ja) * | 1991-08-05 | 1993-02-19 | Canon Inc | ずれ測定方法及びこの方法を用いた露光装置 |
US5495336A (en) * | 1992-02-04 | 1996-02-27 | Canon Kabushiki Kaisha | Position detecting method for detecting a positional relationship between a first object and a second object |
JP3008654B2 (ja) * | 1992-02-21 | 2000-02-14 | キヤノン株式会社 | 位置検出装置 |
US5455679A (en) * | 1993-02-22 | 1995-10-03 | Canon Kabushiki Kaisha | Position detecting system |
JP3306972B2 (ja) * | 1993-02-26 | 2002-07-24 | キヤノン株式会社 | 位置検出装置及びそれを用いた半導体素子の製造方法 |
US6689519B2 (en) | 2000-05-04 | 2004-02-10 | Kla-Tencor Technologies Corp. | Methods and systems for lithography process control |
US7317531B2 (en) * | 2002-12-05 | 2008-01-08 | Kla-Tencor Technologies Corporation | Apparatus and methods for detecting overlay errors using scatterometry |
US7541201B2 (en) | 2000-08-30 | 2009-06-02 | Kla-Tencor Technologies Corporation | Apparatus and methods for determining overlay of structures having rotational or mirror symmetry |
US7130029B2 (en) * | 2000-09-20 | 2006-10-31 | Kla-Tencor Technologies Corp. | Methods and systems for determining an adhesion characteristic and a thickness of a specimen |
US7106425B1 (en) | 2000-09-20 | 2006-09-12 | Kla-Tencor Technologies Corp. | Methods and systems for determining a presence of defects and a thin film characteristic of a specimen |
US6694284B1 (en) | 2000-09-20 | 2004-02-17 | Kla-Tencor Technologies Corp. | Methods and systems for determining at least four properties of a specimen |
EP1319244A1 (de) | 2000-09-20 | 2003-06-18 | Kla-Tencor Inc. | Methode und system zur halbleiterherstellung |
US7349090B2 (en) * | 2000-09-20 | 2008-03-25 | Kla-Tencor Technologies Corp. | Methods and systems for determining a property of a specimen prior to, during, or subsequent to lithography |
US6891627B1 (en) | 2000-09-20 | 2005-05-10 | Kla-Tencor Technologies Corp. | Methods and systems for determining a critical dimension and overlay of a specimen |
US6782337B2 (en) | 2000-09-20 | 2004-08-24 | Kla-Tencor Technologies Corp. | Methods and systems for determining a critical dimension an a presence of defects on a specimen |
US6673637B2 (en) | 2000-09-20 | 2004-01-06 | Kla-Tencor Technologies | Methods and systems for determining a presence of macro defects and overlay of a specimen |
US6919957B2 (en) * | 2000-09-20 | 2005-07-19 | Kla-Tencor Technologies Corp. | Methods and systems for determining a critical dimension, a presence of defects, and a thin film characteristic of a specimen |
US6812045B1 (en) | 2000-09-20 | 2004-11-02 | Kla-Tencor, Inc. | Methods and systems for determining a characteristic of a specimen prior to, during, or subsequent to ion implantation |
US20030002043A1 (en) | 2001-04-10 | 2003-01-02 | Kla-Tencor Corporation | Periodic patterns and technique to control misalignment |
US6731380B2 (en) * | 2001-06-18 | 2004-05-04 | Applied Optics Center Of Delaware, Inc. | Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films |
US6724479B2 (en) * | 2001-09-28 | 2004-04-20 | Infineon Technologies Ag | Method for overlay metrology of low contrast features |
US7440105B2 (en) * | 2002-12-05 | 2008-10-21 | Kla-Tencor Technologies Corporation | Continuously varying offset mark and methods of determining overlay |
WO2008007363A2 (en) * | 2006-07-11 | 2008-01-17 | Camtek Ltd | System and method for probe mark analysis |
US10451412B2 (en) | 2016-04-22 | 2019-10-22 | Kla-Tencor Corporation | Apparatus and methods for detecting overlay errors using scatterometry |
US20200402871A1 (en) * | 2019-06-24 | 2020-12-24 | Magic Leap, Inc. | Polymer patterned disk stack manufacturing |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4037969A (en) * | 1976-04-02 | 1977-07-26 | Bell Telephone Laboratories, Incorporated | Zone plate alignment marks |
US4326805A (en) * | 1980-04-11 | 1982-04-27 | Bell Telephone Laboratories, Incorporated | Method and apparatus for aligning mask and wafer members |
FR2538923A1 (fr) * | 1982-12-30 | 1984-07-06 | Thomson Csf | Procede et dispositif d'alignement optique de motifs dans deux plans rapproches dans un appareil d'exposition comprenant une source de rayonnement divergent |
US4614433A (en) * | 1984-07-09 | 1986-09-30 | At&T Bell Laboratories | Mask-to-wafer alignment utilizing zone plates |
US4838693A (en) * | 1986-06-11 | 1989-06-13 | Kabushiki Kaisha Toshiba | Method and apparatus for setting a gap between first and second objects to a predetermined distance |
JPH01285803A (ja) * | 1988-05-13 | 1989-11-16 | Fujitsu Ltd | フレネル・ゾーン・プレートおよびそれを用いる位置合せ方法 |
-
1989
- 1989-07-18 JP JP1186937A patent/JP2704002B2/ja not_active Expired - Fee Related
-
1990
- 1990-07-17 EP EP90307816A patent/EP0409573B1/de not_active Expired - Lifetime
- 1990-07-17 US US07/553,315 patent/US5114235A/en not_active Expired - Lifetime
- 1990-07-17 DE DE69013428T patent/DE69013428T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0409573A3 (en) | 1991-10-23 |
EP0409573A2 (de) | 1991-01-23 |
DE69013428T2 (de) | 1995-03-30 |
EP0409573B1 (de) | 1994-10-19 |
US5114235A (en) | 1992-05-19 |
JP2704002B2 (ja) | 1998-01-26 |
JPH0348706A (ja) | 1991-03-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |